JPH082596Y2 - 偏光顕微鏡試料作製機用偏光照明付き薄片試料研磨ホルダー - Google Patents

偏光顕微鏡試料作製機用偏光照明付き薄片試料研磨ホルダー

Info

Publication number
JPH082596Y2
JPH082596Y2 JP1989036980U JP3698089U JPH082596Y2 JP H082596 Y2 JPH082596 Y2 JP H082596Y2 JP 1989036980 U JP1989036980 U JP 1989036980U JP 3698089 U JP3698089 U JP 3698089U JP H082596 Y2 JPH082596 Y2 JP H082596Y2
Authority
JP
Japan
Prior art keywords
sample
thin
polarizing plate
thin sample
light source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1989036980U
Other languages
English (en)
Japanese (ja)
Other versions
JPH02128941U (enExample
Inventor
正継 小笠原
Original Assignee
工業技術院長
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 工業技術院長 filed Critical 工業技術院長
Priority to JP1989036980U priority Critical patent/JPH082596Y2/ja
Publication of JPH02128941U publication Critical patent/JPH02128941U/ja
Application granted granted Critical
Publication of JPH082596Y2 publication Critical patent/JPH082596Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
JP1989036980U 1989-03-30 1989-03-30 偏光顕微鏡試料作製機用偏光照明付き薄片試料研磨ホルダー Expired - Lifetime JPH082596Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1989036980U JPH082596Y2 (ja) 1989-03-30 1989-03-30 偏光顕微鏡試料作製機用偏光照明付き薄片試料研磨ホルダー

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1989036980U JPH082596Y2 (ja) 1989-03-30 1989-03-30 偏光顕微鏡試料作製機用偏光照明付き薄片試料研磨ホルダー

Publications (2)

Publication Number Publication Date
JPH02128941U JPH02128941U (enExample) 1990-10-24
JPH082596Y2 true JPH082596Y2 (ja) 1996-01-29

Family

ID=31543687

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1989036980U Expired - Lifetime JPH082596Y2 (ja) 1989-03-30 1989-03-30 偏光顕微鏡試料作製機用偏光照明付き薄片試料研磨ホルダー

Country Status (1)

Country Link
JP (1) JPH082596Y2 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5633078B2 (ja) * 2012-12-27 2014-12-03 独立行政法人産業技術総合研究所 乾式研磨法による脆弱試料薄片の作製法
JP6304657B2 (ja) * 2014-06-27 2018-04-04 国立研究開発法人産業技術総合研究所 乾式研磨法による生体薄片試料の作製方法及び該試料を用いた観察・分析方法

Also Published As

Publication number Publication date
JPH02128941U (enExample) 1990-10-24

Similar Documents

Publication Publication Date Title
SE8502977D0 (sv) Instrument for metning av ytors topografi
JPH0752032A (ja) ウエハ研磨方法及びその装置
US5867259A (en) Hidden-mark observing apparatus and hidden-mark observable lens-meter
WO2007046528B1 (en) Imprint apparatus, imprint method, and mold for imprint
EP1093907A2 (en) A method and apparatus for automatic attachment of a finishing block to a lens
CN102177410A (zh) 背光视觉机器
KR20170117878A (ko) 평면 연마 장치
KR20200124155A (ko) 두께 계측 장치
US1766037A (en) Piezo-electric crystal apparatus
CN110530821B (zh) 一种光学材料折射率的测量装置及其测量方法
US2144653A (en) Illuminator
IL152954A (en) Process for measuring the surface of a polished precious stone
CN1381707A (zh) 被测物的厚度测定方法及其装置
US3355810A (en) Measuring device
US3398630A (en) Non-contact type of measuring microscope
SU408200A1 (ru) УСТРОЙСТВО дл ДЕФЕКТОСКОПИИ ПРОЗРАЧНЫХ
US2470176A (en) Surface comparison microscope having light conducting members providing grazing and diffuse illumination
JPH1190783A (ja) 工具測定機
CN214584850U (zh) 晶片r轴精定装置
US3266368A (en) Dual reticle lens testing apparatus
JP2544288B2 (ja) 光学式測長装置
SU156715A1 (enExample)
US1977446A (en) Segment locator for bifocal lenses
CN223986048U (zh) 一种宝石鉴定仪
US2016546A (en) Reflector device

Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term