JPH082596Y2 - 偏光顕微鏡試料作製機用偏光照明付き薄片試料研磨ホルダー - Google Patents
偏光顕微鏡試料作製機用偏光照明付き薄片試料研磨ホルダーInfo
- Publication number
- JPH082596Y2 JPH082596Y2 JP1989036980U JP3698089U JPH082596Y2 JP H082596 Y2 JPH082596 Y2 JP H082596Y2 JP 1989036980 U JP1989036980 U JP 1989036980U JP 3698089 U JP3698089 U JP 3698089U JP H082596 Y2 JPH082596 Y2 JP H082596Y2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- thin
- polarizing plate
- thin sample
- light source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000005498 polishing Methods 0.000 title claims description 27
- 238000005286 illumination Methods 0.000 title claims description 8
- 230000010287 polarization Effects 0.000 claims description 9
- 230000005855 radiation Effects 0.000 claims description 5
- 230000005540 biological transmission Effects 0.000 description 4
- 230000006866 deterioration Effects 0.000 description 3
- 229910052500 inorganic mineral Inorganic materials 0.000 description 3
- 239000011707 mineral Substances 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 2
- 229910001220 stainless steel Inorganic materials 0.000 description 2
- 239000010935 stainless steel Substances 0.000 description 2
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 1
- 239000003086 colorant Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 239000011435 rock Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Sampling And Sample Adjustment (AREA)
- Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1989036980U JPH082596Y2 (ja) | 1989-03-30 | 1989-03-30 | 偏光顕微鏡試料作製機用偏光照明付き薄片試料研磨ホルダー |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1989036980U JPH082596Y2 (ja) | 1989-03-30 | 1989-03-30 | 偏光顕微鏡試料作製機用偏光照明付き薄片試料研磨ホルダー |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH02128941U JPH02128941U (cg-RX-API-DMAC7.html) | 1990-10-24 |
| JPH082596Y2 true JPH082596Y2 (ja) | 1996-01-29 |
Family
ID=31543687
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1989036980U Expired - Lifetime JPH082596Y2 (ja) | 1989-03-30 | 1989-03-30 | 偏光顕微鏡試料作製機用偏光照明付き薄片試料研磨ホルダー |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH082596Y2 (cg-RX-API-DMAC7.html) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5633078B2 (ja) * | 2012-12-27 | 2014-12-03 | 独立行政法人産業技術総合研究所 | 乾式研磨法による脆弱試料薄片の作製法 |
| JP6304657B2 (ja) * | 2014-06-27 | 2018-04-04 | 国立研究開発法人産業技術総合研究所 | 乾式研磨法による生体薄片試料の作製方法及び該試料を用いた観察・分析方法 |
-
1989
- 1989-03-30 JP JP1989036980U patent/JPH082596Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH02128941U (cg-RX-API-DMAC7.html) | 1990-10-24 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |