JPH08236492A - Optical cleaning method - Google Patents

Optical cleaning method

Info

Publication number
JPH08236492A
JPH08236492A JP6011895A JP6011895A JPH08236492A JP H08236492 A JPH08236492 A JP H08236492A JP 6011895 A JP6011895 A JP 6011895A JP 6011895 A JP6011895 A JP 6011895A JP H08236492 A JPH08236492 A JP H08236492A
Authority
JP
Japan
Prior art keywords
cleaning
lamp
lamps
cleaned
ultraviolet
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6011895A
Other languages
Japanese (ja)
Other versions
JP3085128B2 (en
Inventor
Shinichi Iso
慎一 磯
Hiromitsu Matsuno
博光 松野
Ryushi Igarashi
龍志 五十嵐
Hiroshi Sugawara
寛 菅原
Tatsumi Hiramoto
立躬 平本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ushio Denki KK
Ushio Inc
Original Assignee
Ushio Denki KK
Ushio Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
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Application filed by Ushio Denki KK, Ushio Inc filed Critical Ushio Denki KK
Priority to JP07060118A priority Critical patent/JP3085128B2/en
Publication of JPH08236492A publication Critical patent/JPH08236492A/en
Application granted granted Critical
Publication of JP3085128B2 publication Critical patent/JP3085128B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Cleaning In General (AREA)
  • Drying Of Semiconductors (AREA)
  • Cleaning Or Drying Semiconductors (AREA)

Abstract

PURPOSE: To improve th cleaning efficiency of an optical cleaning method and, at the same time, to reduce the damage to an object to be cleaned by ultraviolet rays or heat by turning on and turning off ultraviolet lamps while the object is cleaned by repeatedly turning on and turning off the power source of the ultraviolet lamps. CONSTITUTION: About five dielectric barrier discharge lamps 4 which are composed of ultraviolet lamps are arranged closely to an object 8 to be cleaned in a cleaning duct 3 while the lamps 4 are connected in parallel with one power source 10 and the object 8 is supported by a supporting jig 5. The object 8 is cleaned by using such an irradiating device by turning on and turning off the lamps 4 while the object 8 is cleaned by repeatedly turning on and turning off the power source 10. When the lamps 4 are turned on, the object 8 is cleaned by the same action as that of the prior art optical cleaning. In addition, even when the lamps 4 are turned off, the object 8 is cleaned, because contaminants are decomposed as a result of a reaction between the contaminants and the active oxygen species remaining in the duct 3. Therefore, the object 8 can be cleaned with a cleaning efficiency which is higher than that obtained when the lamps 4 are continuously turned on. In addition, the object 8 is not damage by heat, because the temperatures of the lamps 4 do not rise.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明はガラス、シリコン半導体
ウエハ、半導体用フォトマスク、セラミックス、プラス
チックス等に付着した数分子から数十分子層の汚染物を
洗浄、除去するいわゆる光洗浄方法あるいは不要なフォ
トレジストの除去に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention is a so-called photo-cleaning method for cleaning and removing contaminants of several tens of molecular layers from several molecules adhering to glass, silicon semiconductor wafers, semiconductor photomasks, ceramics, plastics, etc. Photoresist removal.

【0002】[0002]

【従来の技術】本発明に関連した技術としては、例え
ば、日本国公開特許公報平1−144560号があり、
そこには誘電体バリア放電(別名オゾナイザ放電あるい
は無声放電。電気学会発行改定新版「放電ハンドブッ
ク」平成1年6月再版7刷発行第263ページ参照)を
使用したランプについて記載されている。このランプで
は、キセノンを封入した波長172nmに中心波長を持
つ誘電体バリア放電ランプが低圧水銀ランプに比べて高
い酸化力のある活性な酸素種の生成能力を持っているこ
とが知られている。
2. Description of the Related Art As a technique related to the present invention, for example, there is JP-A-1-144560.
It describes a lamp using a dielectric barrier discharge (also known as ozonizer discharge or silent discharge. See the revised edition of the "Discharge Handbook" published by the Institute of Electrical Engineers of Japan, June 2001, 7th edition, page 263). In this lamp, it is known that a dielectric barrier discharge lamp having a central wavelength at a wavelength of 172 nm, which is filled with xenon, has an ability to generate active oxygen species having a higher oxidizing power than a low pressure mercury lamp.

【0003】一方、近年、被照射物に非接触でその表面
の有機汚染物質の除去、不要フォトレジストの除去、ド
ライ精密洗浄などを行う方法として、紫外線とオゾンの
協働作用を利用した「UV/O3 処理」が開発され、実
用化に至っている。「UV/O3 」処理については例え
ば単行本「オゾン利用の新技術」(三ゆう書房発行、昭
和61年11月20日)の第9章(第301頁から第3
13頁)に原理、装置、洗浄効果、用途が詳細に解説さ
れているが、それによると、オゾンは低圧水銀ランプか
ら放射される真空紫外光185nmの光を、空気や、酸
素を加えた空気や、酸素ガスに照射して発生させてい
る。そして、同一の低圧水銀ランプから放射される遠紫
外光254nmの光で前記オゾンの一部を分解し、オゾ
ンとオゾン分解ガスを被処理物体表面と接触させて、当
該表面上の有機汚染物を酸化させ、二酸化炭素や水など
の低分子酸化物に変化させ、除去することによって当該
表面をドライ精密洗浄している。
On the other hand, in recent years, as a method for removing organic pollutants on the surface of an object to be irradiated without contacting the object, removing unnecessary photoresist, and precision dry cleaning, "UV" utilizing the cooperative action of ultraviolet rays and ozone is used. / O 3 treatment ”has been developed and put to practical use. Regarding the “UV / O 3 ” processing, for example, the book “New Technology of Utilizing Ozone” (published by San Yu Shobo, November 20, 1986), Chapter 9 (pages 301 to 3)
(Page 13) describes the principle, equipment, cleaning effect, and application in detail. According to this, ozone emits vacuum ultraviolet light of 185 nm emitted from a low-pressure mercury lamp to air or air to which oxygen is added. Or, it is generated by irradiating oxygen gas. Then, a part of the ozone is decomposed by the light of far ultraviolet light 254 nm emitted from the same low-pressure mercury lamp, and the ozone and the ozone decomposition gas are brought into contact with the surface of the object to be treated to remove the organic contaminants on the surface. The surface is dry and precision cleaned by oxidizing it, converting it to a low molecular weight oxide such as carbon dioxide or water, and removing it.

【0004】上記で述べられた方法は低圧水銀ランプ
(波長254nmと185nm)を連続に照射する方法
であったが、以下の欠点があった。 (1)洗浄効率が十分でなく、洗浄速度が不十分であ
る。 (2)紫外線の量が制御しにくく、被処理物への過剰の
紫外線によって被照射物にダメージが発生する。 (3)発熱量が多いので被照射物への熱的ダメージが避
けられない。 (4)連続点灯しかできず、被照射物に照射を行わない
時にもランプを点灯しておかねばならず、消費電力が大
きくまたランプ交換の頻度も多い。 (5)洗浄ムラができたり、複数本のランプを一度に一
つの電源で点灯、消灯をすることができないために大面
積を均一に洗浄しにくい。
The method described above is a method of continuously irradiating a low pressure mercury lamp (wavelengths 254 nm and 185 nm), but has the following drawbacks. (1) The cleaning efficiency is insufficient and the cleaning speed is insufficient. (2) It is difficult to control the amount of ultraviolet rays, and excessive ultraviolet rays to the object to be processed cause damage to the object to be irradiated. (3) Since a large amount of heat is generated, thermal damage to the irradiated object cannot be avoided. (4) Only continuous lighting is possible, and the lamp has to be turned on even when the object to be irradiated is not irradiated, resulting in high power consumption and frequent lamp replacement. (5) It is difficult to uniformly wash a large area because uneven cleaning occurs and a plurality of lamps cannot be turned on and off with one power source at a time.

【0005】[0005]

【発明が解決しようとする課題】本発明は上記事情に鑑
みなされたものであって、その目的は洗浄効率が高く、
紫外線や熱によるダメージが少なく、ランプ交換頻度が
少なく、大面積を精密洗浄できる光洗浄方法を提供する
ことである。
SUMMARY OF THE INVENTION The present invention has been made in view of the above circumstances, and an object thereof is high cleaning efficiency.
It is an object of the present invention to provide an optical cleaning method which is less likely to be damaged by ultraviolet rays and heat, has a low lamp replacement frequency, and can precisely clean a large area.

【0006】[0006]

【問題を解決するための手段】上記課題を解決するた
め、本発明の請求項1の発明は、被照射物を酸素を含む
雰囲気中に配置して酸素と被照射物に紫外線ランプから
の紫外線を照射するUV/O3 洗浄方法において、紫外
線ランプへの電気入力の入力と遮断の繰り返しによって
洗浄中に該紫外線ランプの点灯と消灯を行うものであ
る。
In order to solve the above-mentioned problems, the invention according to claim 1 of the present invention is arranged such that an object to be irradiated is placed in an atmosphere containing oxygen, and the oxygen and the object to be irradiated are irradiated with ultraviolet rays from an ultraviolet lamp. In the UV / O 3 cleaning method of irradiating with UV light, the UV lamp is turned on and off during cleaning by repeatedly inputting and shutting off an electric input to the UV lamp.

【0007】本発明の請求項2の発明は、請求項1の発
明において、該紫外線ランプとして誘電体バリア放電ラ
ンプを用いたものである。
According to a second aspect of the present invention, in the first aspect of the invention, a dielectric barrier discharge lamp is used as the ultraviolet lamp.

【0008】本発明の請求項3の発明は、請求項1また
は請求項2のいずれかの発明において、消灯時間を30
秒間以下で行うものである。
According to a third aspect of the present invention, in any one of the first or second aspect of the invention, the turn-off time is 30
It is done in less than a second.

【0009】本発明の請求項4の発明は、請求項1,2
または請求項3のいずれかの発明において、該消灯時間
と該点灯時間の比を変えることによって1周期当たりの
紫外線の量を調整して行うものである。
The invention of claim 4 of the present invention is the same as claims 1 and 2.
Alternatively, in the invention of any one of claims 3 to 6, the amount of ultraviolet rays per one cycle is adjusted by changing the ratio of the turn-off time and the turn-on time.

【0010】本発明の請求項5の発明は、請求項4の発
明において、洗浄開始頃の紫外線照射量よりも洗浄終了
頃の紫外線照射量が少なくするものである。
According to a fifth aspect of the present invention, in the fourth aspect of the invention, the ultraviolet ray irradiation amount at the end of cleaning is smaller than the ultraviolet ray irradiation amount at the start of cleaning.

【0011】本発明の請求項6の発明は、請求項2,
3,4または請求項5のいずれかの発明において、1個
の電源に複数個の該誘電体バリア放電ランプを並列に接
続して使用したものである。
The invention of claim 6 of the present invention is the invention of claim 2
In the invention of any one of claims 3 and 4 or claim 5, a plurality of the dielectric barrier discharge lamps are connected in parallel to one power source and used.

【0012】[0012]

【作用】本発明の請求項1の発明においては、被照射物
を酸素を含む雰囲気中に配置して酸素と被照射物に紫外
線を照射するUV/O3 洗浄方法において、紫外線ラン
プへの電気入力の入力と遮断の繰り返しによって洗浄中
にランプの点灯と消灯を行うので、ランプの点灯中は、
従来の光洗浄と同一の作用で洗浄が行われる。加えて、
消灯中にも残存する活性酸素種と汚染物との反応、分解
が起こり、洗浄がなされる。活性な酸素種のライフタイ
ムはO( 1D)が110秒間、O2 * 1Δg)が数分
間であることが知られており、これらの活性酸素種が消
灯中でも汚染物と反応し、分解、洗浄がなされる。した
がって、点滅を繰り返すと同一電気入力では洗浄速度が
上がる。
According to the first aspect of the present invention, in the UV / O 3 cleaning method of arranging an object to be irradiated in an atmosphere containing oxygen and irradiating the oxygen and the object with ultraviolet rays, electricity to an ultraviolet lamp is applied. The lamp is turned on and off during cleaning by repeatedly inputting and shutting off the input.
Cleaning is performed by the same action as conventional light cleaning. in addition,
Even when the light is turned off, the reaction and decomposition of the remaining active oxygen species and contaminants occur, and cleaning is performed. It is known that the lifetime of active oxygen species is 110 seconds for O ( 1 D) and several minutes for O 2 * ( 1 Δg), and these active oxygen species react with pollutants even when turned off, Disassembled and washed. Therefore, if the blinking is repeated, the cleaning speed increases with the same electric input.

【0013】本発明の請求項2の発明においては、請求
項1の発明において、紫外線ランプとして放電ガスとし
てキセノンあるいはアルゴンと塩素の混合ガスを含んだ
誘電体バリア放電ランプを用いたので、波長172nm
あるいは波長175nmの真空紫外線が高効率で発光
し、この波長175nm以下の紫外線では酸素分子O2
3Σg- )が直接解離して、オゾンO3 に加えて高効
率で強い酸化力を持ったO( 1D)、O2 * 1Δg)
などの活性酸素種を生成することができるので、洗浄速
度がよりいっそう上昇する。
According to the second aspect of the present invention, since the dielectric barrier discharge lamp containing xenon or the mixed gas of argon and chlorine as the discharge gas is used as the ultraviolet lamp in the first aspect of the invention, the wavelength is 172 nm.
Alternatively, vacuum ultraviolet light having a wavelength of 175 nm emits light with high efficiency, and oxygen molecules O 2 are emitted in the ultraviolet light having a wavelength of 175 nm or less.
(3 Σg -) is dissociated directly, O (1 D) having a strong oxidizing power with high efficiency in addition to ozone O 3, O 2 * (1 Δg)
Since the active oxygen species such as can be generated, the cleaning rate is further increased.

【0014】また本発明者等は誘電体バリア放電ランプ
が点灯と消灯とを繰り返しても、ランプ寿命が短くなら
ないことを発見した。すなわち上記したような点滅点灯
を繰り返しても誘電体バリア放電ランプを使用したので
長寿命ランプの装置が得られる。
The present inventors have also found that even if the dielectric barrier discharge lamp is repeatedly turned on and off, the lamp life is not shortened. That is, even if the above blinking lighting is repeated, the dielectric barrier discharge lamp is used, so that a long-life lamp device can be obtained.

【0015】本発明の請求項3の発明においては、請求
項1または請求項2のいずれかの発明において、消灯時
間が30秒間以下にしたので、消灯時間が30秒間以内
においては活性な酸素種が十分に存在しており、消灯中
にも十分な洗浄速度が得られる。本発明者等は消灯時間
が30秒間以内のときに総点灯時間で比較した場合、連
続点灯の低圧水銀ランプや誘電体バリア放電ランプに比
べて高い洗浄効率となることを発見した。なお、消灯時
間が0.1秒から5秒の間では上記効果、作用は特に著
しかった。
In the invention of claim 3 of the present invention, in either of the invention of claim 1 or claim 2, the extinguishing time is set to 30 seconds or less. Is sufficiently present, and a sufficient cleaning speed can be obtained even when the lamp is turned off. The present inventors have found that when compared with the total lighting time when the extinguishing time is within 30 seconds, the cleaning efficiency is higher than that of a continuously lighting low-pressure mercury lamp or a dielectric barrier discharge lamp. The above effects and actions were particularly remarkable when the extinguishing time was 0.1 seconds to 5 seconds.

【0016】本発明の請求項4の発明においては、請求
項1,2または請求項3のいずれかの発明において、該
消灯時間と該点灯時間の比を変えることによって1周期
当たりの紫外線量を調整可能にしたので、被洗浄物の種
類に応じて紫外線照射量を可変できること、および洗浄
の過程において紫外線照射量が可変できるようになり、
紫外線量の過不足のない低ダメージの洗浄が容易にでき
る。さらに、熱によるダメージの低減にも寄与する。
According to a fourth aspect of the present invention, in the invention according to any one of the first, second and third aspects, the ultraviolet ray amount per one cycle is changed by changing the ratio of the turn-off time and the turn-on time. Since it is adjustable, the amount of UV irradiation can be changed according to the type of object to be cleaned, and the amount of UV irradiation can be changed during the cleaning process.
Easy cleaning with low damage and no excess or deficiency of ultraviolet rays. Furthermore, it also contributes to the reduction of damage due to heat.

【0017】本発明の請求項5の発明においては、請求
項4の発明において、洗浄開始頃の紫外線照射量よりも
洗浄終了頃の紫外線照射量を少なくした。これによっ
て、洗浄が進み汚染物が除去されて、被照射物が露出し
てきた時期での紫外線量を減らして、被照射物への紫外
線量の制御を行い被照射物へのダメージを少なくし、過
不足のない最適化の洗浄を行い、低ダメージの洗浄がで
きる。
According to a fifth aspect of the present invention, in the fourth aspect of the invention, the ultraviolet irradiation amount at the end of cleaning is smaller than the ultraviolet irradiation amount at the start of cleaning. As a result, the cleaning progresses and the contaminants are removed, and the ultraviolet ray amount at the time when the irradiated object is exposed is reduced, the ultraviolet ray amount to the irradiated object is controlled, and the damage to the irradiated object is reduced, Optimum cleaning without excess or deficiency can be performed with low damage.

【0018】本発明の請求項6の発明においては、請求
項2,3,4または請求項5のいずれかに記載の光洗浄
方法において、1個の電源に複数個の該誘電体バリア放
電ランプを並列に点灯したので、1個の電源の入力、遮
断によってこのランプの点滅が可能になり、大面積の照
射を行うことができ、なおかつ電源装置が安価になる。
According to a sixth aspect of the present invention, in the photocleaning method according to any one of the second, third, fourth and fifth aspects, one power source includes a plurality of dielectric barrier discharge lamps. Since the lights are turned on in parallel, this lamp can be turned on and off by inputting and shutting off one power supply, irradiation of a large area can be performed, and the power supply device is inexpensive.

【0019】点滅による調光の方法はプラズマディスプ
レイ、液晶用バックライト等で応用されており、よく知
られている。しかし本発明は、ランプの消灯中にも洗浄
が行われるという発見に基づくもので、特に請求項2か
ら請求項5に記載の誘電体バリア放電ランプの点滅点灯
による光洗浄方法は下記に示す新しい発見に基づくもの
である。すなわち、 (1)キセノンあるいはアルゴンと塩素の混合ガスを封
入した誘電体バリア放電ランプを用いることにより波長
172nmあるいは波長175nmに中心波長を有する
真空紫外線が放射される。これらの真空紫外線は低圧水
銀ランプの放射する波長185nmの紫外線と比較する
と、空気中の酸素分子の吸収係数が、キセノンを封入し
た中心波長172nmの場合が18倍、アルゴンと塩素
の混合ガスを封入した中心波長175nmの場合が12
倍大きく、ランプ近傍の極めて狭い範囲で活性酸素種の
密度が極めて大きい。したがって被照射物を該ランプの
近傍に配置すると、活性酸素種の被照射物上の汚染物へ
の衝突頻度が極めて高く、また消灯中には活性酸素種が
被照射物上へ拡散しやすく、その結果、反応、分解、洗
浄の効率が極めて高くなる。 (2)点滅によってランプの寿命が短くならない。 (3)点滅の比によって発光スペクトルの形が変わらな
い。 (4)1個の電源で多数のランプを並列に均一に点灯で
きる。 (5)高効率で真空紫外線を発光できるので、被照射物
への熱的なダメージが極めて少ない。 従来の放電ランプでは実現できなかった、上記(1)か
ら(5)までの事項を光洗浄方法に適用することによっ
て、全く新しい高性能光洗浄が可能になった。
The method of dimming by blinking has been applied to plasma displays, liquid crystal backlights and the like, and is well known. However, the present invention is based on the finding that cleaning is performed even while the lamp is off, and in particular, the light cleaning method by flashing lighting of the dielectric barrier discharge lamp according to claims 2 to 5 is as follows. It is based on discovery. That is, (1) by using a dielectric barrier discharge lamp filled with xenon or a mixed gas of argon and chlorine, vacuum ultraviolet rays having a central wavelength of 172 nm or 175 nm are emitted. These vacuum ultraviolet rays have 18 times the absorption coefficient of oxygen molecules in the air when the central wavelength is 172 nm with xenon enclosed, compared with ultraviolet rays with a wavelength of 185 nm emitted by a low-pressure mercury lamp, and a mixed gas of argon and chlorine is enclosed. 12 when the center wavelength is 175 nm
It is twice as large and the density of active oxygen species is extremely high in an extremely narrow range near the lamp. Therefore, when the irradiation target is arranged in the vicinity of the lamp, the frequency of collision of the active oxygen species with the contaminants on the irradiation target is extremely high, and the active oxygen species easily diffuses onto the irradiation target during the extinguishing, As a result, the efficiency of reaction, decomposition and washing becomes extremely high. (2) Flashing does not shorten the lamp life. (3) The shape of the emission spectrum does not change depending on the blinking ratio. (4) A large number of lamps can be uniformly lit in parallel with one power source. (5) Since the vacuum ultraviolet ray can be emitted with high efficiency, thermal damage to the object to be irradiated is extremely small. By applying the above items (1) to (5), which could not be realized by the conventional discharge lamp, to the optical cleaning method, a completely new high-performance optical cleaning becomes possible.

【0020】[0020]

【実施例】本発明の第一の実施例である光洗浄方法の概
略図を図1に示す。誘電体バリア放電ランプ4を1個の
電源10に5本並列につないだ。洗浄ダクト3内に5本
の誘電体バリア放電ランプ4が被洗浄物8に近接して設
けられている。被洗浄物8は支持具5によって支持され
ており、該支持具5は、該被洗浄物8の温度を変えるた
めの通常の手段、例えば電気ヒータと、該被洗浄物と誘
電体バリア放電ランプ4との間の距離を調整するための
移動機構を有している。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1 shows a schematic view of a light cleaning method according to a first embodiment of the present invention. Five dielectric barrier discharge lamps 4 were connected in parallel to one power supply 10. Five dielectric barrier discharge lamps 4 are provided in the cleaning duct 3 close to the object to be cleaned 8. The article to be cleaned 8 is supported by a support 5, which is a conventional means for changing the temperature of the article 8 to be cleaned, such as an electric heater, the article to be cleaned and a dielectric barrier discharge lamp. 4 has a moving mechanism for adjusting the distance between the two.

【0021】図2は、本発明に使用する誘電体バリア放
電ランプの概略の説明図である。図2において放電容器
13は全長250mmの合成石英製で、外径14mm肉
厚1mmの内側管14、内径24mm肉厚1mmの外側
管15を同軸に配置して中空円筒状の放電空間20を形
成した構造である。外側管15は誘電体バリア放電の誘
電体バリアと光取り出し窓部材を兼用しており、メッシ
ュ電極17が設けられている。内側管14の内面には光
の反射板と誘電体バリア放電の電極を兼ねたアルミニウ
ム薄膜電極16が設けられている。放電容器の放電空間
20に放電ガスとして250トールのキセノンガスを封
入した。ゲッター室にはゲッター18が設けられてい
る。ランプの内側空所19には、必要に応じて冷却流体
例えば冷却窒素ガスが流せるようになっている。ここで
電源21によって、該誘電体バリア放電ランプを一本当
たりの入力を50Wで点灯した。その結果、波長172
nmに最大放射値を有する紫外線が効率よく放射され
た。
FIG. 2 is a schematic explanatory view of a dielectric barrier discharge lamp used in the present invention. In FIG. 2, the discharge vessel 13 is made of synthetic quartz having a total length of 250 mm, and an inner tube 14 having an outer diameter of 14 mm and a wall thickness of 1 mm and an outer tube 15 having an inner diameter of 24 mm and a wall thickness of 1 mm are coaxially arranged to form a hollow cylindrical discharge space 20. It is a structure. The outer tube 15 also serves as a dielectric barrier for dielectric barrier discharge and a light extraction window member, and is provided with a mesh electrode 17. On the inner surface of the inner tube 14, an aluminum thin film electrode 16 which also serves as a light reflecting plate and an electrode for dielectric barrier discharge is provided. The discharge space 20 of the discharge container was filled with 250 torr of xenon gas as a discharge gas. A getter 18 is provided in the getter chamber. If necessary, a cooling fluid such as cooling nitrogen gas can flow into the inner space 19 of the lamp. Here, the power source 21 turned on the dielectric barrier discharge lamp at 50 W per input. As a result, the wavelength 172
Ultraviolet rays having a maximum emission value in nm were efficiently emitted.

【0022】このような照射装置を使用して上記ランプ
のランプ1本当たりの電気入力を50Wとして、点滅間
隔を変化せしめた際の紫外線の総照射時間に対する洗浄
速度を調べた。評価には石英ガラスを前処理としてイソ
プロピルアルコール中で5分間超音波洗浄をし、自然乾
燥後大気中に2、3日間放置したものを用いた。また、
総照射時間は点灯時間の合計時間とし、洗浄速度の評価
は純水の接触角を接触角計で測定した。表面の有機汚染
層の厚さが厚い方が接触角が大きく、接触角が3度で約
0.1分子層以下であると言われている。また今回の石
英ガラスの紫外線未照射のものの接触角は56度であっ
た。
Using such an irradiation device, the electric input per lamp of the above lamp was set to 50 W, and the cleaning speed with respect to the total irradiation time of ultraviolet rays when the blinking interval was changed was examined. In the evaluation, quartz glass was pretreated with ultrasonic cleaning in isopropyl alcohol for 5 minutes, naturally dried, and left in the atmosphere for a few days. Also,
The total irradiation time was the total lighting time, and the cleaning rate was evaluated by measuring the contact angle of pure water with a contact angle meter. It is said that the thicker the surface organic contamination layer is, the larger the contact angle is, and the contact angle is 3 degrees and the contact angle is about 0.1 molecular layer or less. Further, the contact angle of the quartz glass not irradiated with ultraviolet rays this time was 56 degrees.

【0023】比較のために450W入力の電源1個を使
用して高効率タイプの低圧水銀ランプ1本を連続点灯し
て同様な洗浄を行いデータを得た。この際に被洗浄物の
ガラス表面の温度はランプからの熱放射によって加熱さ
れて表面温度が48℃になった。
For comparison, one 450 W input power source was used to continuously light one high-efficiency type low-pressure mercury lamp, and similar cleaning was performed to obtain data. At this time, the temperature of the glass surface of the object to be cleaned was heated by heat radiation from the lamp, and the surface temperature became 48 ° C.

【0024】結果は図3に示す通りである。図3は総照
射時間に対する洗浄速度を水の接触角で評価したデータ
の説明図である。この結果から総照射時間で比較した場
合、未照射の接触角から洗浄が完全に終了したと考えら
れる3度の接触角までの所要時間を比較してみると低圧
水銀ランプでは240秒間、連続点灯の誘電体バリア放
電ランプでは120秒間、本発明の点滅点灯の誘電体バ
リア放電ランプでは点灯時間と消灯時間の比が1:3で
は47秒間、1:1では77秒間で洗浄しており、連続
点灯の低圧水銀ランプや誘電体バリア放電ランプよりも
著しく高い洗浄効率で洗浄が可能となることがわかる。
The results are shown in FIG. FIG. 3 is an explanatory diagram of data in which the cleaning rate with respect to the total irradiation time is evaluated by the contact angle of water. From this result, when comparing the total irradiation time, comparing the time required from the non-irradiated contact angle to the contact angle of 3 degrees, which is considered to have completed the cleaning, the low pressure mercury lamp continuously lit for 240 seconds. Of the dielectric barrier discharge lamp of the present invention for 120 seconds, and for the dielectric barrier discharge lamp of the present invention of blinking lighting for 47 seconds when the ratio of the lighting time and the extinction time is 1: 3, and 77 seconds when 1: 1. It can be seen that cleaning can be performed with significantly higher cleaning efficiency than that of a low-pressure mercury lamp or a dielectric barrier discharge lamp that is lit.

【0025】また該誘電体バリア放電ランプの場合では
該石英ガラス面での温度上昇は全く確認されず、加熱に
よる被洗浄物へのダメージは皆無である。
In the case of the dielectric barrier discharge lamp, no temperature rise was observed on the surface of the quartz glass, and the object to be cleaned was not damaged by heating.

【0026】本発明の第二の実施例は、洗浄装置の構成
は第一の実施例と同一で、被洗浄物を半導体シリコンウ
エハに変えて、光洗浄工程の後半1/3工程における単
位時間当たりの紫外線照射量を、前半2/3工程におけ
る照射量の約50%に減少させたものである。その結果
ダメージはほとんどなかった。一般的に半導体シリコン
ウエハは短波長の紫外線ではダメージが大きいとされて
いる。しかし本発明によって紫外線のダメージのほとん
どない光洗浄方法が実現できた。
In the second embodiment of the present invention, the structure of the cleaning device is the same as that of the first embodiment, the object to be cleaned is changed to a semiconductor silicon wafer, and the unit time in the latter half 1/3 step of the optical cleaning step is changed. The ultraviolet irradiation amount per unit is reduced to about 50% of the irradiation amount in the first half 2/3 step. As a result, there was almost no damage. Generally, semiconductor silicon wafers are said to be greatly damaged by ultraviolet rays of short wavelength. However, the present invention has realized a photo-cleaning method with almost no damage by ultraviolet rays.

【0027】本発明の第三の実施例に使用した紫外線ラ
ンプ装置の説明図を図4に示す。該紫外線ランプ装置は
従来の低圧水銀ランプ40と電極41a、41bを通電
加熱するための電極装置42a、42bと該低圧水銀ラ
ンプにランプ電力を供給する主電源43から成り立って
いる。該低圧水銀ランプ40の点灯と消灯を繰り返すと
きには、主電源43によってランプ電圧を供給する前に
あらかじめ通電加熱用電源42a、42bによって電極
41a、41bを予熱しておく。このような手段によっ
て、該ランプの放電開始時における電極41a、42b
の損耗が少なく、点滅を繰り返しても寿命が短くならな
い低圧水銀ランプ装置が得られる。
An explanatory view of the ultraviolet lamp device used in the third embodiment of the present invention is shown in FIG. The ultraviolet lamp device comprises a conventional low pressure mercury lamp 40, electrode devices 42a and 42b for electrically heating the electrodes 41a and 41b, and a main power supply 43 for supplying lamp power to the low pressure mercury lamp. When the lighting and extinction of the low-pressure mercury lamp 40 are repeated, the electrodes 41a and 41b are preheated by the power sources 42a and 42b for electric heating before the lamp voltage is supplied from the main power source 43. By such means, the electrodes 41a, 42b at the start of discharge of the lamp
It is possible to obtain a low-pressure mercury lamp device which is less worn out and whose life is not shortened even if blinking is repeated.

【0028】該低圧水銀ランプ40を点滅点灯すると、
ランプの中央部の管壁に水銀が付着して、該水銀に紫外
線が吸収され、その結果紫外線出力が低下することがあ
った。本発明者等は、試行錯誤の結果、該低圧水銀ラン
プ40の点滅点灯を行う場合には、点灯状態におけるラ
ンプの中央部の管壁の温度を100℃以上、望ましくは
150℃以上に保持すると、上記した水銀の付着現象が
なくなることを発見した。
When the low-pressure mercury lamp 40 is turned on and off,
In some cases, mercury adhered to the tube wall of the central part of the lamp and the ultraviolet rays were absorbed by the mercury, resulting in a decrease in the ultraviolet ray output. As a result of trial and error, the present inventors hold the temperature of the tube wall at the central portion of the lamp at 100 ° C. or higher, preferably 150 ° C. or higher when the low-pressure mercury lamp 40 blinks and lights. Have found that the above-mentioned mercury adhesion phenomenon disappears.

【0029】光洗浄装置は、第一の実施例における光洗
浄装置において、誘電体バリア放電ランプとその電源を
図4の低圧水銀ランプとその電源に替えたものである。
被洗浄物を該洗浄装置内に設置したのち、該低圧水銀ラ
ンプ40の点灯を開始した。主電源43および通電加熱
用電源42a、42bを40kHzの高周波電源とし、
光洗浄工程中には、常時、電極41a、41bを通電加
熱しながら50msの点灯時間、50msの消灯時間の
繰り返しで点灯し、かつ、該低圧水銀ランプ40の点灯
中の管壁負荷を約0.2W/cm2 にすることによって
点灯中の管壁温度を100℃以上で点灯した。その結
果、十分な洗浄速度が得られるとともに、被照射物を光
洗浄装置内に設置している途中は該低圧水銀ランプを消
灯しているので、有害な紫外線に作業者が曝されること
が少なくなるという利点も生じた。
The light cleaning apparatus is the same as the light cleaning apparatus in the first embodiment except that the dielectric barrier discharge lamp and its power source are replaced with the low pressure mercury lamp and its power source shown in FIG.
After the object to be cleaned was installed in the cleaning device, the low pressure mercury lamp 40 was turned on. The main power supply 43 and the power supplies 42a and 42b for energization heating are high-frequency power supplies of 40 kHz,
During the light cleaning step, the electrodes 41a and 41b are constantly energized and heated, and the electrodes 41a and 41b are lit by repeating the lighting time of 50 ms and the extinction time of 50 ms, and the tube wall load during lighting of the low-pressure mercury lamp 40 is about 0. The temperature of the tube wall during lighting was turned on at 100 ° C. or higher by setting it to 0.2 W / cm 2 . As a result, a sufficient cleaning speed can be obtained, and since the low-pressure mercury lamp is turned off while the object to be irradiated is installed in the light cleaning device, the worker may be exposed to harmful ultraviolet rays. There was also the advantage of being less.

【0030】[0030]

【発明の効果】以上説明したように、本発明によれば、
点滅点灯を行うことによって、洗浄速度が大きく、紫外
線や熱によるダメージが少なく、ランプの交換頻度が少
なく、大面積を洗浄できる光洗浄方法を提供することが
できる。
As described above, according to the present invention,
By performing blinking lighting, it is possible to provide a light cleaning method which has a high cleaning speed, less damage by ultraviolet rays and heat, less frequent lamp replacement, and a large area can be cleaned.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施例の概要を示す説明図である。FIG. 1 is an explanatory diagram showing an outline of an embodiment of the present invention.

【図2】本発明に使用する誘電体バリア放電ランプの一
例の説明図である。
FIG. 2 is an explanatory diagram of an example of a dielectric barrier discharge lamp used in the present invention.

【図3】本発明の実施例の総照射時間に対する水の接触
角のデータの説明図である。
FIG. 3 is an explanatory diagram of data of the contact angle of water with respect to the total irradiation time in the example of the present invention.

【図4】本発明の別の実施例の説明図である。FIG. 4 is an explanatory diagram of another embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1 処理用流体空気 2 処理用流体供給口 3 洗浄ダクト 4 誘電体バリア放電ランプ 5 支持具 8 被照射物 10 電源 14 内側管 15 外側管 16,17 電極 19 冷却用流体 20 放電空間 21 交流電源 40 低圧水銀ランプ 41a,41b 電極 42a,42b 通電加熱用電源 43 主電源 1 Processing Fluid Air 2 Processing Fluid Supply Port 3 Cleaning Duct 4 Dielectric Barrier Discharge Lamp 5 Support Tool 8 Irradiation Object 10 Power Supply 14 Inner Tube 15 Outer Tube 16, 17 Electrode 19 Cooling Fluid 20 Discharge Space 21 AC Power Supply 40 Low-pressure mercury lamp 41a, 41b Electrode 42a, 42b Power supply for electrification heating 43 Main power supply

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.6 識別記号 庁内整理番号 FI 技術表示箇所 H01L 21/302 H01L 21/302 Z (72)発明者 菅原 寛 兵庫県姫路市別所町佐土1194番地 ウシオ 電機株式会社内 (72)発明者 平本 立躬 兵庫県姫路市別所町佐土1194番地 ウシオ 電機株式会社内─────────────────────────────────────────────────── ─── Continuation of the front page (51) Int.Cl. 6 Identification number Reference number within the agency FI Technical display location H01L 21/302 H01L 21/302 Z (72) Inventor Hiroshi Sugawara 1194 Sasato, Bessho-cho, Himeji-shi, Hyogo Address Ushio Electric Co., Ltd. (72) Inventor Tateman Hiramoto 1194 Sato, Bessho-cho, Himeji City, Hyogo Prefecture Ushio Electric Co., Ltd

Claims (6)

【特許請求の範囲】[Claims] 【請求項1】 被照射物を酸素を含む雰囲気中に配置し
て酸素と被照射物に紫外線ランプからの紫外線を照射す
るUV/O3 洗浄方法において、紫外線ランプへの電気
入力の入力と遮断の繰り返しによって洗浄中に該紫外線
ランプの点灯と消灯を行うことを特徴とした光洗浄方
法。
1. A UV / O 3 cleaning method in which an object to be irradiated is placed in an atmosphere containing oxygen and the oxygen and the object to be irradiated are irradiated with ultraviolet rays from an ultraviolet lamp. The optical cleaning method characterized in that the ultraviolet lamp is turned on and off during cleaning by repeating the above procedure.
【請求項2】 該紫外線ランプとして誘電体バリア放電
ランプを用いることを特徴とした請求項1に記載の光洗
浄方法。
2. The photocleaning method according to claim 1, wherein a dielectric barrier discharge lamp is used as the ultraviolet lamp.
【請求項3】 消灯時間が30秒間以下であることを特
徴とした請求項1または請求項2のいずれかに記載した
光洗浄方法。
3. The photocleaning method according to claim 1, wherein the turn-off time is 30 seconds or less.
【請求項4】 該消灯時間と該点灯時間の比を変えるこ
とによって1周期当たりの紫外線の量を調整可能にした
請求項1,2または請求項3のいずれかに記載の光洗浄
方法。
4. The photocleaning method according to claim 1, wherein the amount of ultraviolet rays per cycle can be adjusted by changing the ratio of the turn-off time and the turn-on time.
【請求項5】 洗浄開始頃の紫外線照射量よりも洗浄終
了頃の紫外線照射量が少ないことを特徴とした請求項4
に記載の光洗浄方法。
5. The ultraviolet irradiation amount at the end of cleaning is smaller than the ultraviolet irradiation amount at the start of cleaning.
The optical cleaning method described in.
【請求項6】 1個の電源に複数個の該誘電体バリア放
電ランプを並列に接続したことを特徴とする請求項2,
3,4または請求項5のいずれかに記載の光洗浄方法。
6. A plurality of dielectric barrier discharge lamps are connected in parallel to one power source.
The photocleaning method according to claim 3, 4, or 5.
JP07060118A 1995-02-24 1995-02-24 Light cleaning method Expired - Lifetime JP3085128B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP07060118A JP3085128B2 (en) 1995-02-24 1995-02-24 Light cleaning method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP07060118A JP3085128B2 (en) 1995-02-24 1995-02-24 Light cleaning method

Publications (2)

Publication Number Publication Date
JPH08236492A true JPH08236492A (en) 1996-09-13
JP3085128B2 JP3085128B2 (en) 2000-09-04

Family

ID=13132896

Family Applications (1)

Application Number Title Priority Date Filing Date
JP07060118A Expired - Lifetime JP3085128B2 (en) 1995-02-24 1995-02-24 Light cleaning method

Country Status (1)

Country Link
JP (1) JP3085128B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10189699A (en) * 1996-12-27 1998-07-21 Kyocera Corp Method of cleaning electrostatic chuck
WO2001061409A2 (en) * 2000-02-15 2001-08-23 Asml Us, Inc. Apparatus and method of cleaning reticles for use in a lithography tool
EP2354846A2 (en) 2010-01-28 2011-08-10 Ushiodenki Kabushiki Kaisha Optical irradiation equipment and optical irradiation method for nanoimprint lithography
US9050633B2 (en) 2012-06-04 2015-06-09 Ushio Denki Kabushiki Kaisha Template washing method, pattern forming method, photowashing apparatus, and nanoimprint apparatus

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10189699A (en) * 1996-12-27 1998-07-21 Kyocera Corp Method of cleaning electrostatic chuck
WO2001061409A2 (en) * 2000-02-15 2001-08-23 Asml Us, Inc. Apparatus and method of cleaning reticles for use in a lithography tool
WO2001061409A3 (en) * 2000-02-15 2002-02-21 Silicon Valley Group Apparatus and method of cleaning reticles for use in a lithography tool
US6387602B1 (en) 2000-02-15 2002-05-14 Silicon Valley Group, Inc. Apparatus and method of cleaning reticles for use in a lithography tool
EP2354846A2 (en) 2010-01-28 2011-08-10 Ushiodenki Kabushiki Kaisha Optical irradiation equipment and optical irradiation method for nanoimprint lithography
US8522802B2 (en) 2010-01-28 2013-09-03 Ushio Denki Kabushiki Kaisha Optical irradiation equipment and optical irradiation method
US9050633B2 (en) 2012-06-04 2015-06-09 Ushio Denki Kabushiki Kaisha Template washing method, pattern forming method, photowashing apparatus, and nanoimprint apparatus
TWI583525B (en) * 2012-06-04 2017-05-21 Ushio Electric Inc A template cleaning method, a pattern forming method, a light cleaning apparatus, and a nanoimprint apparatus

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