JPH08159715A - Inspection instrument for deviation of mounting position of electronic component - Google Patents

Inspection instrument for deviation of mounting position of electronic component

Info

Publication number
JPH08159715A
JPH08159715A JP30368594A JP30368594A JPH08159715A JP H08159715 A JPH08159715 A JP H08159715A JP 30368594 A JP30368594 A JP 30368594A JP 30368594 A JP30368594 A JP 30368594A JP H08159715 A JPH08159715 A JP H08159715A
Authority
JP
Japan
Prior art keywords
inspection
package
illuminance
deviation
mounting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP30368594A
Other languages
Japanese (ja)
Inventor
Shigeyuki Murata
茂幸 村田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Denshi KK
Original Assignee
Hitachi Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Denshi KK filed Critical Hitachi Denshi KK
Priority to JP30368594A priority Critical patent/JPH08159715A/en
Publication of JPH08159715A publication Critical patent/JPH08159715A/en
Pending legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE: To enable the mounting deviation to be inspected recognizing the mounted position of a part, regardless of the amount and quality of a solder by detecting the package position of an object to be inspected and comparing it with the package position in the normal mounting to examine a positional deviation. CONSTITUTION: At a package illuminance recognizing section 91, a window for recognizing package illuminance is generated at the center position in the normal mounting of a part 4 to be inspected to obtain an illuminance data of a package part of an angular chip part. At a package position recognizing section 92, a position outside a range of illuminance obtained by the illuminance recognizing section 91 is detected from the center position in the normal mounting of the part 4 to be inspected. At a mounting deviation judging section 93, a difference is inspected between the width and length in the longitudinal direction detected of the part and those specified originally thereof at a package position of the part to be inspected detected. When the difference is large, non-mounting deviation without the part to be inspected is determined. Thereafter, a comparison is performed between the package position and the position of the end of the part mounted normally to determine the distance and when a separation therebetween is large exceeding a threshold, a mounting deviation is determined.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、テレビカメラ等により
検査対象物を撮像し、その映像信号から検査対象物の位
置ずれを検出する技術に関するもので、例えば、プリン
ト配線板上における電子部品の形状、寸法等を計測し、
実装状態を良否判定する検査装置に適用するものであ
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a technique for picking up an image of an object to be inspected with a television camera or the like and detecting a positional deviation of the object to be inspected from the video signal thereof. Measure the shape and dimensions,
The present invention is applied to an inspection device that determines the quality of mounting.

【0002】[0002]

【従来の技術】ここで検査対象をプリント配線板上に搭
載された角形のチップ部品を例に上げ、図7により説明
する。まず、検査対象部を中心としてテレビカメラ6の
視野における各段照明ごとの映像を撮る。この一部を図
6に示す。この映像より、検査対象のチップ部品4のは
んだ付け部であるランドに一致した形で検査ウインド1
3が形成される。この検査ウインド内で通常、はんだの
過不足、位置ずれ等の不良検査を行なっている。
2. Description of the Related Art Here, an example of a rectangular chip component mounted on a printed wiring board as an inspection target will be described with reference to FIG. First, an image of each stage illumination in the field of view of the TV camera 6 is taken centering on the inspection target part. A part of this is shown in FIG. From this image, the inspection window 1 in a form that matches the land that is the soldering portion of the chip component 4 to be inspected
3 is formed. In this inspection window, defect inspections such as excess or deficiency of solder and positional deviation are usually performed.

【0003】このうち位置ずれの検査は、大きく2つの
方法を用いている。
Of these, the inspection of the positional deviation uses two methods.

【0004】一つ目は、図6に示すように、ランドに一
致した検査ウインド内における角形チップ部品の電極部
11の幅Wを検出し、実際の電極幅に比べ、比較的短い
場合、実装位置ずれであると判定する。
First, as shown in FIG. 6, the width W of the electrode portion 11 of the rectangular chip part in the inspection window corresponding to the land is detected, and if it is relatively shorter than the actual electrode width, the mounting is performed. It is determined that there is a displacement.

【0005】二つ目は、図5に示すように、ランド12
と平行に、位置ずれ検査用ウインド13を設定する。こ
の位置ずれ検査用ウインド内において、角形チップ部品
の電極部11が検出された場合、実装位置ずれであると
判定する。この角形チップ部品電極部の検出方法は、電
極部が平坦で光反射率のよいことから、特に高い反射し
ている集合を検出し、電極部と推定する。
The second is the land 12 as shown in FIG.
In parallel with the above, the positional deviation inspection window 13 is set. If the electrode portion 11 of the rectangular chip component is detected in the positional deviation inspection window, it is determined that the mounting positional deviation has occurred. In this method of detecting the electrode portion of the rectangular chip component, since the electrode portion is flat and has a high light reflectance, a group having particularly high reflection is detected and estimated as the electrode portion.

【0006】[0006]

【発明が解決しようとする課題】このように電子部品の
実装位置ずれ検査を、はんだ付けポイント内におけるリ
ードの実装位置や、ランド横に設定したリードずれ検査
用ウインドにおけるリードの有無から実装ずれ検査を行
なっている。しかし、はんだ付け検査ポイント内におけ
るはんだが非常に多い場合は、リードの有無さえ認識で
きなくなり、また、ランド横に設定したずれ検査用ウイ
ンドの中には、配線パターンや、シルクといった多種多
様の状態があるため、誤ってリードを検出するなど、検
出能力を低下させる要因となっている。
As described above, the mounting position deviation inspection of the electronic component is carried out based on the mounting position of the lead within the soldering point or the presence or absence of the lead in the lead deviation inspection window set beside the land. Are doing. However, if there is too much solder in the soldering inspection point, it will not be possible to recognize even the presence of leads, and the misalignment inspection window set beside the land will have various patterns such as wiring patterns and silk. Therefore, it is a factor that reduces the detection capability such as erroneously detecting a lead.

【0007】[0007]

【課題を解決するための手段】前記問題点を解決するた
め、本発明は、検査対象部品の位置ずれ検査を、検査対
象部品のパッケージ(本体、すなわち、リード部ではな
い)位置を検出し、正規実装された場合のパッケージ位
置と比較し、位置ずれ検査を行なうものである。この検
査対象部品のパッケージ検出方法は、対象部品の正規実
装位置中央部における照度データの範囲を求める。検査
対象である電子部品のパッケージ照度は、一様であるこ
とから限られた範囲の照度範囲を得ることができる。こ
の範囲から外れた照度データがある位置を検出すること
で、パッケージ位置を検出する方法である。
SUMMARY OF THE INVENTION In order to solve the above problems, the present invention detects the position of a package (main body, that is, not the lead portion) of a component to be inspected by performing a displacement inspection of the component to be inspected. The position shift inspection is performed by comparing with the package position in the case of regular mounting. In this package detection method for the inspection target component, the range of illuminance data at the center of the regular mounting position of the target component is obtained. Since the package illuminance of the electronic component to be inspected is uniform, it is possible to obtain a limited illuminance range. This is a method of detecting the package position by detecting the position where the illuminance data deviates from this range.

【0008】[0008]

【作用】パッケージ上の照度データは、一様であること
から、プリント基板上がいかなる場合でもパッケージ上
の照度データは変化をするため、検査対象部品のパッケ
ージ上ではないということが分かる。また、検査対象部
品のパッケージ部分のデータを使用し検査するため、は
んだの量、質に関係なく部品の実装位置が認識でき、実
装ずれ検査を行なうことができる。
Since the illuminance data on the package is uniform, it can be seen that the illuminance data on the package changes in any case on the printed circuit board and is not on the package of the component to be inspected. Further, since the inspection is performed by using the data of the package portion of the inspection target component, the mounting position of the component can be recognized regardless of the amount and quality of solder, and the mounting deviation inspection can be performed.

【0009】[0009]

【実施例】本発明の実施例を以下の図に従って説明す
る。
Embodiments of the present invention will be described with reference to the following drawings.

【0010】本発明の実装ずれ検査装置を図1、図2、
図3に基づき説明する。
The mounting deviation inspection apparatus of the present invention is shown in FIGS.
It will be described with reference to FIG.

【0011】検査対象は、プリント配線板上の角形チッ
プ部品と仮定する。
The inspection target is assumed to be a rectangular chip part on a printed wiring board.

【0012】照明器5で照射した光は検査対象角形チッ
プ4で反射しテレビカメラ6で受光する。つぎに、本発
明の対象部品の実装ずれを検査装置9で検査する。ここ
で、実装ずれ検査を行う際は、テレビカメラ6で入力さ
れた映像信号を使用する。
The light emitted from the illuminator 5 is reflected by the rectangular chip 4 to be inspected and received by the television camera 6. Next, the mounting deviation of the target component of the present invention is inspected by the inspection device 9. Here, when the mounting deviation inspection is performed, the video signal input by the television camera 6 is used.

【0013】まず、パッケージ照度認識部91では、図
1に示すように、検査対象部品が正規に実装された場合
の中心位置において、パッケージ照度認識用ウインド1
4を作成し、角形チップ部品のパッケージ部(本体)の
照度データを得る。パッケージ上は平坦であるが鏡面で
ないため、光を反射することなく一様なデータを得るこ
とになる。この時、パッケージ上にある文字などのノイ
ズを除去するため、パッケージ照度認識用ウインド内の
8割を占める映像データ範囲(図示せず)を認識するこ
とにする。
First, in the package illuminance recognizing section 91, as shown in FIG. 1, the package illuminance recognizing window 1 is located at the center position when the inspection target component is properly mounted.
4 is created, and the illuminance data of the package part (main body) of the rectangular chip part is obtained. Since the package is flat but not a mirror surface, uniform data can be obtained without reflecting light. At this time, in order to remove noise such as characters on the package, a video data range (not shown) occupying 80% of the package illuminance recognition window is recognized.

【0014】つぎに、パッケージ位置認識部92では、
例えば部品幅方向の実装位置を認識する場合は、図2に
示すように検査対象部品が正規に実装された場合の中心
位置aから、b、c方向へパッケージ照度認識部91で
得られた照度範囲外となる位置(h1、h2)を検出す
る。同様に、部品縦方向の実装位置認識する場合は、a
から両ランド方向に向けパッケージ照度範囲の範囲外の
データが現れる位置(v1、v2いずれも図示せず)を
検出する。
Next, in the package position recognition section 92,
For example, when recognizing the mounting position in the component width direction, the illuminance obtained by the package illuminance recognizing unit 91 in the b and c directions from the center position a when the inspection target component is properly mounted as shown in FIG. The position (h1, h2) outside the range is detected. Similarly, when recognizing the mounting position in the vertical direction of the component,
The position (v1 and v2 not shown) where the data outside the range of the package illuminance appears from is detected.

【0015】実装ずれ判定部93では、検出した対象部
品のパッケージ位置で、部品幅方向の検出幅h1とh2
の距離が、本来の部品幅とあまり差がなく、縦方向も同
様に検出長さv1とv2が本来の部品長と差がないか検
査する。この差が大きい場合は、検出したものがパッケ
ージでない、つまり対象部品が無かったとして実装ずれ
と判定する。その後、パッケージ位置認識で、検出した
パッケージ位置(h1、h2、v1、v2)と、正規実
装された場合の部品端位置の距離を比較し、しきい値以
上離れた場合、実装ずれと判定する。
In the mounting deviation determining section 93, the detection widths h1 and h2 in the component width direction are detected at the detected package position of the target component.
Is not much different from the original part width, and it is also checked in the vertical direction whether the detected lengths v1 and v2 are different from the original part length. If the difference is large, it is determined that the detected one is not the package, that is, there is no target component, and it is a mounting deviation. Then, in the package position recognition, the detected package position (h1, h2, v1, v2) is compared with the distance between the component end positions in the case of regular mounting, and if the distance is equal to or more than the threshold value, it is determined that there is mounting deviation. .

【0016】つぎに、本発明の実装ずれ検査装置9を段
差照明式検査装置に用いた場合の実施例を図4に基づき
説明する。
Next, an embodiment in which the mounting deviation inspection device 9 of the present invention is used in a step illumination type inspection device will be described with reference to FIG.

【0017】プリント配線板上の電子部品を検査する、
多段照明による周知の検査方法(例えば、特公平5−2
1403)がある。
Inspecting electronic components on a printed wiring board,
Well-known inspection method by multi-stage illumination (for example, Japanese Patent Publication 5-2
1403).

【0018】図4は、この多段照明式はんだ付け検査装
置の基本システム構成を示す。
FIG. 4 shows the basic system configuration of this multi-stage lighting type soldering inspection apparatus.

【0019】同図において、検査対象4に投射角の異な
る多段の照明器5から照射された光は、検査対象で反射
し、テレビカメラ6で受光される。この照明を上下切替
ることにより得られる映像信号はコード生成部7で組み
合わせ、対象面の角度を示す傾斜コード(例えば1〜
8)を生成する。この傾斜コードとは、検査対象に垂直
方向である上からの照明は、平坦部で高い反射光を返
し、斜めからの照明は、傾斜角の高い部分の反射光が高
くなることから、各段の照明により得られる画像を組み
合わせ、対象面の角度をコードで表したものである。こ
のようにして、得られた傾斜コードは、検査対象物の形
状に合わせて配置した傾斜コードパターンとして、認識
処理部8に送られ、検査対象の立体形状認識、ならびに
良否判定を行なう。
In the figure, the light emitted from the multistage illuminator 5 having different projection angles to the inspection object 4 is reflected by the inspection object and received by the television camera 6. The video signals obtained by switching the illumination up and down are combined in the code generation unit 7, and a tilt code (for example, 1 to 1) indicating the angle of the target surface is combined.
8) is generated. This tilt code is a direction perpendicular to the inspection object, and the illumination from above returns high reflected light at the flat part, and the illumination from diagonally increases the reflected light at the part with a high inclination angle. Is a combination of images obtained by illuminating, and the angle of the target surface is represented by a code. In this way, the obtained inclination code is sent to the recognition processing unit 8 as an inclination code pattern arranged according to the shape of the inspection object, and the three-dimensional shape of the inspection object is recognized and the quality is determined.

【0020】検査対象は、図3と同じく、プリント配線
板上の角形チップ部品と仮定する。
It is assumed that the object to be inspected is a rectangular chip part on the printed wiring board, as in FIG.

【0021】照明器5で照射した光は検査対象4で反射
しテレビカメラ6で受光する。この各段の照明を切り替
えて得られる映像データは、コード生成部7でランドに
一致した形の検査ウインド内を対象面の角度を示す傾斜
コードに生成する。つぎに、認識処理部8ではんだ付け
の検査を行うが、その前に本発明の対象部品の実装ずれ
検査9を行う。ここで、実装ずれ検査を行う際は、テレ
ビカメラで入力された映像信号を使用する。
The light emitted from the illuminator 5 is reflected by the inspection object 4 and received by the television camera 6. The image data obtained by switching the illumination of each stage is generated by the code generation unit 7 into an inclination code indicating the angle of the target surface within the inspection window having a shape matching the land. Next, the recognition processing unit 8 performs a soldering inspection, but before that, a mounting deviation inspection 9 of the target component of the present invention is performed. Here, when performing the mounting deviation inspection, the video signal input by the television camera is used.

【0022】まず、パッケージ照度認識部91では、図
1に示すように、検査対象部品が正規に実装された場合
の中心位置において、パッケージ照度認識用ウインド1
4を作成し、角形チップ部品のパッケージ部(本体)の
照度データを得る。この場合、上からの照明による映像
データを使用すると、パッケージ上は平坦であるが鏡面
でないため、光を反射することなく一様なデータを得る
ことになる。この時、パッケージ上にある文字などのノ
イズを除去するため、パッケージ照度認識用ウインド内
の例えば8割を占める映像データ範囲(図示せず)を認
識することにする。以下の動作は図3の実施例と同じで
ある。
First, in the package illuminance recognition section 91, as shown in FIG. 1, the package illuminance recognition window 1 is located at the center position when the inspection target component is properly mounted.
4 is created, and the illuminance data of the package part (main body) of the rectangular chip part is obtained. In this case, if image data obtained by illumination from above is used, uniform data can be obtained without reflecting light because the package is flat but not a mirror surface. At this time, in order to remove noise such as characters on the package, a video data range (not shown) occupying, for example, 80% in the package illuminance recognition window is recognized. The following operation is the same as that of the embodiment shown in FIG.

【0023】パッケージ位置認識で、検出したパッケー
ジ位置と、正規実装された場合の部品端位置の距離を比
較し、しきい値以上離れた場合、実装ずれと判定する。
In the package position recognition, the distance between the detected package position and the component end position in the case of normal mounting is compared, and if the distance is equal to or more than the threshold value, it is determined that there is mounting deviation.

【0024】なお、ここでは、上からの照明による映像
データを使用したが、対象部品の反射特性上、斜めから
の照明を使用することもできる。
Although the image data obtained by the illumination from above is used here, it is also possible to use the illumination at an angle due to the reflection characteristics of the target component.

【0025】[0025]

【発明の効果】以上述べたように、検査対象部品の実装
ずれを検査する方法として、パッケージ上の照度範囲か
ら外れた照度データを検出することで、パッケージ位置
を容易に認識することができ、正規実装位置との比較
で、位置ずれを検査することから、プリント基板上のパ
ターンや、はんだ付けの形状、はんだ量等に影響を受け
ることなく、実装ずれを検査できるため、検査装置にお
ける性能向上に著しい効果がある。
As described above, the package position can be easily recognized by detecting the illuminance data outside the illuminance range on the package as a method for inspecting the mounting deviation of the inspection target component. Since the displacement is inspected by comparing with the regular mounting position, the mounting displacement can be inspected without being affected by the pattern on the printed circuit board, the shape of soldering, the amount of solder, etc. Has a significant effect on

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明を説明するパッケージ照度認識のモデル
図。
FIG. 1 is a model diagram of package illuminance recognition for explaining the present invention.

【図2】本発明を説明するパッケージ照度認識のモデル
図。
FIG. 2 is a model diagram of package illuminance recognition for explaining the present invention.

【図3】本発明の実施例の検査装置の基本構成図。FIG. 3 is a basic configuration diagram of an inspection device according to an embodiment of the present invention.

【図4】本発明の実施例の多段照明式外観検査装置の基
本構成図。
FIG. 4 is a basic configuration diagram of a multi-stage illumination type visual inspection apparatus according to an embodiment of the present invention.

【図5】従来技術を説明するスリット式実装ずれ検出の
モデル図。
FIG. 5 is a model diagram of slit type mounting deviation detection for explaining a conventional technique.

【図6】従来技術を説明する電極検出幅による実装ずれ
検出のモデル図。
FIG. 6 is a model diagram of mounting displacement detection based on an electrode detection width for explaining a conventional technique.

【図7】従来技術の検査装置の基本構成図。FIG. 7 is a basic configuration diagram of a conventional inspection device.

【符号の説明】[Explanation of symbols]

4 検査対象(角形チップ)、 5 照明器、 6 受
光センサ(テレビカメラ)、 7 コード生成部、 8
認識処理部、 9 実装ずれ検査装置、 91 パッ
ケージ照度認識部、 92 パッケージ位置認識部、
93 実装ずれ判定部、 11 角形チップの電極部、
12 ランド、 13 検査ウインド、 14 パッ
ケージ照度認識用ウインド、
4 Inspection target (square chip), 5 Illuminator, 6 Light receiving sensor (TV camera), 7 Code generator, 8
Recognition processing unit, 9 mounting deviation inspection device, 91 package illuminance recognition unit, 92 package position recognition unit,
93 mounting deviation determination section, 11 rectangular chip electrode section,
12 lands, 13 inspection windows, 14 package illuminance recognition windows,

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 検査対象物を撮像し、得られた画像情報
から検査対象物の実装ずれを検査する装置において、該
検査対象物の一部の映像を取り出すウインドを該検査対
象物上で移動し、得られる該検査対象物の映像の長さを
前記検査対象物の正規実装位置の長さと比較し、得られ
た結果から検査結果を判定することを特徴とした電子部
品の実装位置ずれ検査装置。
1. An apparatus for imaging an inspection object and inspecting mounting deviation of the inspection object from the obtained image information, moving a window for extracting a part of the image of the inspection object on the inspection object. Then, the mounting position shift inspection of the electronic component is characterized in that the length of the obtained image of the inspection target is compared with the length of the regular mounting position of the inspection target, and the inspection result is determined from the obtained result. apparatus.
【請求項2】 検査対象への投光角度が相違する複数組
の照明光源と、該照明光源による前記検査対象からの反
射光を照度分布として受光し、電気信号データとして出
力するための受光センサと、前記出力された電気信号の
分布状態を基に前記検査対象の立体形状を認識すること
が可能な認識処理と、を有する実装ずれ検査装置におい
て、前記検査対象物上の照度情報を認識し、前記照度情
報から外れた照度情報を検知し、前記検査対象物の一部
の映像を取り出すウインドを該検査対象物上で移動し、
得られる該検査対象物の映像の長さを前記検査対象物の
正規実装位置の長さと比較し、得られた結果から検査結
果を判定することを特徴とした電子部品の実装位置ずれ
検査装置。
2. A plurality of sets of illumination light sources having different projection angles to an inspection target, and a light receiving sensor for receiving reflected light from the inspection target by the illumination light sources as an illuminance distribution and outputting it as electrical signal data. And a recognition process capable of recognizing the three-dimensional shape of the inspection object based on the distribution state of the output electric signal, the illuminance information on the inspection object is recognized in a mounting deviation inspection device having Detecting illuminance information deviating from the illuminance information, moving a window for extracting a part of the image of the inspection object on the inspection object,
An electronic component mounting position deviation inspection device, characterized in that the length of the obtained image of the inspection target is compared with the length of the regular mounting position of the inspection target, and the inspection result is determined from the obtained result.
JP30368594A 1994-12-07 1994-12-07 Inspection instrument for deviation of mounting position of electronic component Pending JPH08159715A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP30368594A JPH08159715A (en) 1994-12-07 1994-12-07 Inspection instrument for deviation of mounting position of electronic component

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP30368594A JPH08159715A (en) 1994-12-07 1994-12-07 Inspection instrument for deviation of mounting position of electronic component

Publications (1)

Publication Number Publication Date
JPH08159715A true JPH08159715A (en) 1996-06-21

Family

ID=17924011

Family Applications (1)

Application Number Title Priority Date Filing Date
JP30368594A Pending JPH08159715A (en) 1994-12-07 1994-12-07 Inspection instrument for deviation of mounting position of electronic component

Country Status (1)

Country Link
JP (1) JPH08159715A (en)

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