JPH08153995A - Method for aligning semiconductor device - Google Patents

Method for aligning semiconductor device

Info

Publication number
JPH08153995A
JPH08153995A JP6292466A JP29246694A JPH08153995A JP H08153995 A JPH08153995 A JP H08153995A JP 6292466 A JP6292466 A JP 6292466A JP 29246694 A JP29246694 A JP 29246694A JP H08153995 A JPH08153995 A JP H08153995A
Authority
JP
Japan
Prior art keywords
semiconductor device
line
semiconductor element
wiring board
aligning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6292466A
Other languages
Japanese (ja)
Inventor
Masaya Sakurai
雅也 櫻井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Oki Electric Industry Co Ltd
Original Assignee
Oki Electric Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oki Electric Industry Co Ltd filed Critical Oki Electric Industry Co Ltd
Priority to JP6292466A priority Critical patent/JPH08153995A/en
Publication of JPH08153995A publication Critical patent/JPH08153995A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161Disposition
    • H01L2224/16151Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/81Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/91Methods for connecting semiconductor or solid state bodies including different methods provided for in two or more of groups H01L2224/80 - H01L2224/90
    • H01L2224/92Specific sequence of method steps
    • H01L2224/921Connecting a surface with connectors of different types
    • H01L2224/9212Sequential connecting processes
    • H01L2224/92122Sequential connecting processes the first connecting process involving a bump connector
    • H01L2224/92125Sequential connecting processes the first connecting process involving a bump connector the second connecting process involving a layer connector

Abstract

PURPOSE: To provide a semiconductor device aligning method by which a semiconductor device can be easily and surely mounted on a wiring board. CONSTITUTION: A semiconductor device aligning method contains a process in which a semiconductor element 10 with solder bumps 11 is seen through with X rays and first lines are drawn on the rear surface 10a of the element 10 with a laser beam in accordance with the arrangement of the bumps 11, process in which second lines 22 are drawn on the rear surface of a wiring board 20 on which the element 10 is mounted in accordance with the arrangement of pads 21, and process in which the first lines 12 are aligned with the second lines 22 with an image pickup device positioned on the rear surface 10a side of the element 10 and the bumps 11 of the element 10 are connected to the pads 21 on the board 20.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、半田バンプの付いた半
導体装置の搭載基板上への位置合わせ方法の技術に関す
るものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a technique for aligning a semiconductor device having solder bumps on a mounting substrate.

【0002】[0002]

【従来の技術】従来、このような分野の技術としては、
例えば、以下に示すようなものがあった。図3はかかる
従来の第1の半田バンプの付いた半導体素子の位置合わ
せ方法の説明図である。
2. Description of the Related Art Conventionally, techniques in such a field include:
For example, there were the following. FIG. 3 is an explanatory view of such a conventional alignment method for a semiconductor element having a first solder bump.

【0003】図3(a)に示すように、搭載基板3と半
導体素子1との間に、搭載基板側と半導体素子側を同時
に写すことのできるカメラ2を入れる。カメラ2で搭載
基板3上のパッド4と半導体素子1側のバンプ5を同時
に写し、1つの画面上に合成して映し出す。人間または
機械が、パッド4と対応するバンプ5が一致するように
搭載基板3又は半導体素子1を動かして調整する。
As shown in FIG. 3A, a camera 2 capable of simultaneously photographing the mounting substrate side and the semiconductor element side is inserted between the mounting substrate 3 and the semiconductor element 1. The pads 4 on the mounting substrate 3 and the bumps 5 on the semiconductor element 1 side are simultaneously imaged by the camera 2 and are combined and displayed on one screen. A human or machine moves and adjusts the mounting substrate 3 or the semiconductor element 1 so that the pads 4 and the corresponding bumps 5 are aligned with each other.

【0004】両者が一致したら、図3(b)に示すよう
に、カメラ2を引き抜き、半導体素子1を搭載基板3に
搭載する。また、図4は従来の第2の半田バンプの付い
た半導体素子の位置合わせ方法の説明図である。図4
(a)に示すように、予め搭載基板2の半導体素子搭載
予定位置に半導体素子1の形状と同一の、または形状が
分かるような線6を引いておく。その後、図4(b)に
示すように、半導体素子1を予め引かれた線6に合うよ
うに搭載する。
If the two match, the camera 2 is pulled out and the semiconductor element 1 is mounted on the mounting substrate 3, as shown in FIG. In addition, FIG. 4 is an explanatory diagram of a conventional method for aligning a semiconductor element having a second solder bump. FIG.
As shown in (a), a line 6 that is the same as the shape of the semiconductor element 1 or the shape of which can be understood is drawn in advance at the position where the semiconductor element is to be mounted on the mounting substrate 2. After that, as shown in FIG. 4B, the semiconductor element 1 is mounted so as to be aligned with the previously drawn line 6.

【0005】このように、従来、半田バンプの付いた半
導体素子の基板への搭載位置合わせは、上記第1及び第
2の方法が採られていた。
As described above, conventionally, the above-mentioned first and second methods have been adopted for the mounting alignment of the semiconductor element having the solder bump on the substrate.

【0006】[0006]

【発明が解決しようとする課題】しかしながら、上記し
た従来の半田バンプの付いた半導体素子の基板への搭載
位置合わせ方法では、以下の問題がある。 (1)第1の方法(図3参照)によると、ほぼ確実に半
導体素子のバンプをパッド上に搭載することができる
が、2方向を同時に写すことのできるカメラが必要にな
り、製造設備が高価になってしまう。
However, the above-described conventional method for mounting and mounting a semiconductor element having solder bumps on a substrate has the following problems. (1) According to the first method (see FIG. 3), the bumps of the semiconductor element can be almost certainly mounted on the pad, but a camera capable of simultaneously capturing two directions is required, and the manufacturing equipment is required. It becomes expensive.

【0007】(2)第2の方法(図4参照)によると、
チップの外形で位置合わせをすることになり、チップの
ダイシングの精度が悪いと、半導体素子のバンプをパッ
ド上に正確に搭載することが困難である。本発明は、上
記問題点を除去し、半導体装置の裏面に予めバンプの配
列に合わせて線を引いておき、一方、配線基板上にも予
めパッドの配列に合わせて線を引いておき、搭載時に上
方から見てそれらの線を合わせることにより、配線基板
上に、半導体装置を簡単かつ確実に搭載することができ
る半導体装置の位置合わせ方法を提供することを目的と
する。
(2) According to the second method (see FIG. 4),
Positioning is performed by the outer shape of the chip, and if the dicing accuracy of the chip is poor, it is difficult to accurately mount the bump of the semiconductor element on the pad. The present invention eliminates the above problems and draws a line on the back surface of a semiconductor device in advance according to the arrangement of bumps, while drawing a line on the wiring board in advance according to the arrangement of pads. An object of the present invention is to provide a method for aligning a semiconductor device that can easily and surely mount the semiconductor device on a wiring board by aligning those lines when viewed from above.

【0008】[0008]

【課題を解決するための手段】本発明は、上記目的を達
成するために、 (1)配線基板への半田バンプの付いた半導体装置の位
置合わせ方法において、半田バンプの付いた半導体装置
をX線で透過し、この半導体装置の裏面にレーザーで半
田バンプ配列に合わせた第1の線を付す工程と、前記半
導体装置が搭載される配線基板の裏面にパッド配列に合
わせた第2の線を付す工程と、前記半導体装置の裏面側
に位置する撮像装置により前記第2の線に前記第1の線
を合わせ前記配線基板のパッドに前記半導体装置の半田
バンプを接続する工程とを施すようにしたものである。
In order to achieve the above object, the present invention provides: (1) In a method of aligning a semiconductor device having solder bumps on a wiring board, a semiconductor device having solder bumps A step of attaching a first line aligned with the solder bump array to the back surface of the semiconductor device with a laser, and a second line aligned with the pad array on the back surface of the wiring board on which the semiconductor device is mounted. And a step of aligning the first line with the second line by an image pickup device located on the back side of the semiconductor device and connecting a solder bump of the semiconductor device to a pad of the wiring board. It was done.

【0009】(2)上記(1)記載の半導体装置の位置
合わせ方法において、前記半導体装置は半導体素子であ
り、配線基板は半導体素子のパッケージである。
(2) In the method of aligning a semiconductor device described in (1) above, the semiconductor device is a semiconductor element, and the wiring board is a package of the semiconductor element.

【0010】[0010]

【作用】本発明によれば、上記したように、半導体バン
プの付いた半導体装置の裏面にバンプ配列に合わせて第
1の線を引いておき、一方、配線基板上には予めパッド
配線に合わせて第2の線を引いておく。そこで、半導体
装置の第1の線を配線基板の第2の線に合わせて、配線
基板のパッドに半導体素子の半田バンプを接続する。
According to the present invention, as described above, the first line is drawn on the back surface of the semiconductor device having the semiconductor bumps in accordance with the bump arrangement, and on the other hand, the wiring is preliminarily aligned with the pad wiring. And draw the second line. Therefore, the first wire of the semiconductor device is aligned with the second wire of the wiring board, and the solder bumps of the semiconductor element are connected to the pads of the wiring board.

【0011】なお、ここで、半導体装置(フリップチッ
プ)の表面とは、回路形成面、つまり、半田バンプの付
いている面を言い、半導体装置(フリップチップ)の裏
面とは、回路形成面の反対側の面、つまり、半田バンプ
の付いていない面を言う。
Here, the front surface of the semiconductor device (flip chip) means a circuit forming surface, that is, a surface having solder bumps, and the back surface of the semiconductor device (flip chip) means a circuit forming surface. The opposite surface, that is, the surface without solder bumps.

【0012】[0012]

【実施例】以下、本発明の実施例について図を用いて説
明する。図1は本発明の第1実施例を示す半導体素子の
位置合わせ方法の説明図である。まず、本発明の第1実
施例を図1を参照しながら説明する。
Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is an explanatory diagram of a semiconductor element alignment method showing a first embodiment of the present invention. First, a first embodiment of the present invention will be described with reference to FIG.

【0013】(1)まず、図1(a)に示すように、半
田バンプ11付きの半導体素子10を用意する。ここ
で、半導体素子10は所謂フリップチップとよばれるも
ので、この半導体素子10の表面には、直径100μm
程度の半田バンプ11がメッキ等で形成されている。な
お、半導体装置(フリップチップ)の表面とは、回路形
成面、つまり、半田バンプの付いている面を言い、半導
体装置(フリップチップ)の裏面とは、回路形成面の反
対側の面、つまり、半田バンプの付いていない面を言
う。
(1) First, as shown in FIG. 1A, a semiconductor element 10 with solder bumps 11 is prepared. Here, the semiconductor element 10 is a so-called flip chip, and the surface of the semiconductor element 10 has a diameter of 100 μm.
Some solder bumps 11 are formed by plating or the like. The front surface of the semiconductor device (flip chip) means a circuit formation surface, that is, a surface having solder bumps, and the back surface of the semiconductor device (flip chip) means a surface opposite to the circuit formation surface, that is, , The surface without solder bumps.

【0014】(2)次に、図1(b)に示すように、そ
の半田バンプ11付きの半導体素子10を、表面を下側
に向けてX線装置(図示なし)に入れ、透過しながら半
田バンプ11の配列に合わせて半導体素子10の裏面1
0aにレーザーで第1の線12を書き込む。ここで、第
1の線12はバンプの配列全てについて描いてもよい
し、また後で位置合わせができる程度の本数でもよい。
(2) Next, as shown in FIG. 1 (b), the semiconductor element 10 with the solder bumps 11 is put into an X-ray device (not shown) with the surface facing downward, and while passing through. The back surface 1 of the semiconductor element 10 according to the arrangement of the solder bumps 11.
The first line 12 is written with a laser on 0a. Here, the first line 12 may be drawn for the entire bump array, or the number may be such that alignment can be performed later.

【0015】(3)図1(c)に示すように、配線基板
20側も同様に、パッド21の配列に合わせて予め第2
の線22を引くが、これもパッド21の配列全てについ
て描いてもよいし、また後で位置合わせができる程度の
本数でもよい。ただし、第1の線12と第2の線22は
それぞれ対応するように形成する。ここで、配線基板2
0とは、主にQFP(Quad Flat Packa
ge)、PGA(Pin Grid Array)、B
GA(Ball Grid Array)などのパッケ
ージの基板を指している。
(3) As shown in FIG. 1 (c), the wiring board 20 side is also secondly preliminarily arranged in accordance with the arrangement of the pads 21.
Line 22 is drawn, but this may also be drawn for the entire arrangement of the pads 21, or the number may be such that alignment is possible later. However, the first line 12 and the second line 22 are formed so as to correspond to each other. Here, the wiring board 2
0 is mainly QFP (Quad Flat Packa).
ge), PGA (Pin Grid Array), B
It refers to a substrate of a package such as GA (Ball Grid Array).

【0016】(4)図1(d)に示すように、予めこの
第1の線12の引かれた半導体素子10を、機械によっ
て配線基板20から上方に離して設置する。 (5)次いで、半導体素子10上に垂直に設置された撮
像装置としてのカメラ(図示なし)によって、図1
(e)に示すように、第1の線12と第2の線22を画
面上に映し出す。機械もしくは人間が画面上で第1の線
12と第2の線22が一致するように調整し、その後、
半導体素子10を降下させて配線基板20上に搭載す
る。
(4) As shown in FIG. 1 (d), the semiconductor element 10 with the first line 12 drawn in advance is installed by a machine so as to be separated upward from the wiring board 20. (5) Next, by using a camera (not shown) as an image pickup device installed vertically on the semiconductor element 10, FIG.
As shown in (e), the first line 12 and the second line 22 are projected on the screen. A machine or human makes adjustments so that the first line 12 and the second line 22 match on the screen, and then
The semiconductor element 10 is lowered and mounted on the wiring board 20.

【0017】(6)このようにして、図1(f)に示す
ように、配線基板20のパッド21に、半導体素子10
の半田バンプ11を正確に位置合わせすることによっ
て、正しく接続することができる。次に、本発明の第2
実施例を図2を参照しながら説明する。この実施例で
は、本発明をBGAパッケージに適用した例を示す。
(6) In this way, as shown in FIG. 1F, the semiconductor element 10 is attached to the pad 21 of the wiring board 20.
By accurately aligning the solder bumps 11 of 1, the correct connection can be achieved. Next, the second aspect of the present invention
An embodiment will be described with reference to FIG. This embodiment shows an example in which the present invention is applied to a BGA package.

【0018】(1)まず、図2(a)に示すように、半
田バンプ31付きのBGAパッケージ30を用意する。
ここで、BGAパッケージ30の裏面には直径500〜
1000μm程度の半田バンプ31が半田ボール搭載、
印刷等の方法で形成されている。 (2)次に、図2(b)に示すように、その半田バンプ
31付きのBGAパッケージ30の表面には、例えば、
IC等を封止したキャップ33が存在し、また、既にB
GAパッケージ30の位置決めのための第1の線34が
書き込まれている。つまり、線34はBGAパッケージ
30の作製時にパターンとして予め形成されるものとす
る。
(1) First, as shown in FIG. 2A, a BGA package 30 with solder bumps 31 is prepared.
Here, on the back surface of the BGA package 30, a diameter of 500 to
Solder balls 31 with solder bumps 31 of about 1000 μm mounted,
It is formed by a method such as printing. (2) Next, as shown in FIG. 2B, on the surface of the BGA package 30 with the solder bumps 31, for example,
There is a cap 33 that seals the IC, etc.
A first line 34 for positioning the GA package 30 is written. That is, the line 34 is preliminarily formed as a pattern when the BGA package 30 is manufactured.

【0019】(3)一方、図2(c)に示すように、マ
ザーボード40側も同様に、パッド41の配列に合わせ
て予め第2の線42を引くが、これはパッド41の配列
全てについて描いてもよいし、また後で位置合わせがで
きる程度の本数でもよい。ただし、第2の線42と第1
の線34はそれぞれ対応するように形成する。 (4)図2(d)に示すように、この予め第1の線34
が引かれたBGAパッケージ30を、機械によってマザ
ーボード40から上方に離して設置する。
(3) On the other hand, as shown in FIG. 2C, the second line 42 is also drawn in advance on the motherboard 40 side in accordance with the arrangement of the pads 41. This is for all the arrangements of the pads 41. It may be drawn, or the number may be such that it can be aligned later. However, the second line 42 and the first
The lines 34 of are formed so as to correspond to each other. (4) As shown in FIG. 2D, the first line 34 is previously formed.
The BGA package 30 in which is pulled is installed by a machine away from the motherboard 40 upward.

【0020】(5)次に、BGAパッケージ30上に垂
直に設置された撮像装置としてのカメラ(図示なし)に
よって、図2(e)に示すように、BGAパッケージ3
0の第1の線34と、マザーボード40上の第2の線4
2を画面上に映し出す。機械もしくは人間が画面上で第
1の線34と第2の線42が一致するように調整し、そ
の後、BGAパッケージ30を降下させてマザーボード
40上に搭載する。
(5) Next, as shown in FIG. 2E, the BGA package 3 is mounted on the BGA package 30 by a camera (not shown) vertically installed on the BGA package 30.
0 first line 34 and second line 4 on motherboard 40
Project 2 on the screen. A machine or a person adjusts the first line 34 and the second line 42 on the screen so that they coincide with each other, and then the BGA package 30 is lowered and mounted on the motherboard 40.

【0021】(6)このようにして、図2(f)に示す
ように、マザーボード40のパッド41に、BGAパッ
ケージ30の半田バンプ31を、正確に位置合わせする
ことによって、正しく接続される。このように、BGA
パッケージにも適用が可能である。なお、本発明は上記
実施例に限定されるものではなく、本発明の趣旨に基づ
き種々の変形が可能であり、それらを本発明の範囲から
排除するものではない。
(6) In this way, as shown in FIG. 2F, the solder bumps 31 of the BGA package 30 are correctly aligned with the pads 41 of the mother board 40 so that they are correctly connected. Thus, BGA
It can also be applied to packages. It should be noted that the present invention is not limited to the above-described embodiments, and various modifications can be made based on the spirit of the present invention, and they are not excluded from the scope of the present invention.

【0022】[0022]

【発明の効果】以上、詳細に説明したように、本発明に
よれば、半田バンプの付いた半導体装置の裏面にバンプ
配列に合わせて第1の線を、配線基板上には予めパッド
配線に合わせて第2の線を引いておくことにより、予め
パッド配線に合わせて線の引いてある配線基板上に、半
導体装置を簡単かつ確実に搭載することができる。
As described above in detail, according to the present invention, the first line is formed on the back surface of the semiconductor device having the solder bumps in accordance with the bump arrangement, and the pad wiring is previously formed on the wiring board. By drawing the second line together, the semiconductor device can be mounted easily and surely on the wiring board in which the line is drawn in advance according to the pad wiring.

【0023】特に、微細な寸法に配置された半導体素子
の半田バンプと、微細な寸法に配置された配線基板とし
てのパッケージのパッドとを正確に位置合わせして、確
実に接続することができる。
In particular, it is possible to accurately align the solder bumps of the semiconductor element arranged in the fine dimension with the pads of the package as the wiring board arranged in the fine dimension to ensure reliable connection.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の第1実施例を示す半導体素子の位置合
わせ方法の説明図である。
FIG. 1 is an explanatory diagram of a semiconductor element alignment method according to a first embodiment of the present invention.

【図2】本発明の第2実施例を示す半導体素子の位置合
わせ方法の説明図である。
FIG. 2 is an explanatory diagram of a semiconductor element alignment method showing a second embodiment of the present invention.

【図3】従来の第1の半田バンプの付いた半導体素子の
位置合わせ方法の説明図である。
FIG. 3 is an explanatory diagram of a conventional alignment method for a semiconductor element having a first solder bump.

【図4】従来の第2の半田バンプの付いた半導体素子の
位置合わせ方法の説明図である。
FIG. 4 is an explanatory diagram of a conventional method for aligning a semiconductor element having a second solder bump.

【符号の説明】[Explanation of symbols]

10 半導体素子 10a 半導体素子の表面 11,31 半田バンプ 12,34 第1の線 20 配線基板 21,41 パッド 22,42 第2の線 30 BGAパッケージ 33 ICチップ 40 マザーボード 10 semiconductor element 10a surface of semiconductor element 11,31 solder bump 12,34 first line 20 wiring board 21,41 pad 22,42 second line 30 BGA package 33 IC chip 40 motherboard

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 配線基板への半田バンプの付いた半導体
装置の位置合わせ方法において、 (a)半田バンプの付いた半導体装置をX線で透過し、
該半導体装置の裏面にレーザーで半田バンプ配列に合わ
せた第1の線を付す工程と、 (b)前記半導体装置が搭載される配線基板の裏面にパ
ッド配列に合わせた第2の線を付す工程と、 (c)前記半導体装置の裏面側に位置する撮像装置によ
り前記第2の線に前記第1の線を合わせ前記配線基板の
パッドに前記半導体装置の半田バンプを接続する工程と
を施すことを特徴とする半導体装置の位置合わせ方法。
1. A method of aligning a semiconductor device having a solder bump on a wiring board, comprising: (a) transmitting a semiconductor device having a solder bump with X-rays;
A step of attaching a first line aligned with the solder bump arrangement to the back surface of the semiconductor device with a laser; and (b) a step of attaching a second line aligned with the pad array on the back surface of the wiring board on which the semiconductor device is mounted. And (c) aligning the first line with the second line by an imaging device located on the back side of the semiconductor device and connecting the solder bumps of the semiconductor device to the pads of the wiring board. A method for aligning a semiconductor device, comprising:
【請求項2】 請求項1記載の半導体装置の位置合わせ
方法において、前記半導体装置は半導体素子であり、配
線基板は半導体素子のパッケージである半導体装置の位
置合わせ方法。
2. The method of aligning a semiconductor device according to claim 1, wherein the semiconductor device is a semiconductor element, and the wiring board is a package of the semiconductor element.
JP6292466A 1994-11-28 1994-11-28 Method for aligning semiconductor device Pending JPH08153995A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6292466A JPH08153995A (en) 1994-11-28 1994-11-28 Method for aligning semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6292466A JPH08153995A (en) 1994-11-28 1994-11-28 Method for aligning semiconductor device

Publications (1)

Publication Number Publication Date
JPH08153995A true JPH08153995A (en) 1996-06-11

Family

ID=17782180

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6292466A Pending JPH08153995A (en) 1994-11-28 1994-11-28 Method for aligning semiconductor device

Country Status (1)

Country Link
JP (1) JPH08153995A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006118018A1 (en) * 2005-04-28 2006-11-09 Toray Engineering Co., Ltd. Flip chip mounting shift inspecting method and mounting apparatus
JP2018082096A (en) * 2016-11-17 2018-05-24 ハンファテクウィン株式会社Hanwha Techwin Co.,Ltd. Electronic component mounting system and electronic component mounting method
JP2018082097A (en) * 2016-11-17 2018-05-24 ハンファテクウィン株式会社Hanwha Techwin Co.,Ltd. Electronic component mounting system and electronic component mounting method

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006118018A1 (en) * 2005-04-28 2006-11-09 Toray Engineering Co., Ltd. Flip chip mounting shift inspecting method and mounting apparatus
JP2018082096A (en) * 2016-11-17 2018-05-24 ハンファテクウィン株式会社Hanwha Techwin Co.,Ltd. Electronic component mounting system and electronic component mounting method
JP2018082097A (en) * 2016-11-17 2018-05-24 ハンファテクウィン株式会社Hanwha Techwin Co.,Ltd. Electronic component mounting system and electronic component mounting method
KR20180055675A (en) * 2016-11-17 2018-05-25 한화에어로스페이스 주식회사 An electronic device mounting system and method for mounting electronic device

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