JPH0776744B2 - Spatially developed sample pattern measuring device - Google Patents

Spatially developed sample pattern measuring device

Info

Publication number
JPH0776744B2
JPH0776744B2 JP59183589A JP18358984A JPH0776744B2 JP H0776744 B2 JPH0776744 B2 JP H0776744B2 JP 59183589 A JP59183589 A JP 59183589A JP 18358984 A JP18358984 A JP 18358984A JP H0776744 B2 JPH0776744 B2 JP H0776744B2
Authority
JP
Japan
Prior art keywords
sample
sample stage
data
spot
measuring device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59183589A
Other languages
Japanese (ja)
Other versions
JPS6161039A (en
Inventor
邦彦 大久保
和也 新屋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP59183589A priority Critical patent/JPH0776744B2/en
Publication of JPS6161039A publication Critical patent/JPS6161039A/en
Publication of JPH0776744B2 publication Critical patent/JPH0776744B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/26Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
    • G01N27/416Systems
    • G01N27/447Systems using electrophoresis
    • G01N27/44704Details; Accessories
    • G01N27/44717Arrangements for investigating the separated zones, e.g. localising zones
    • G01N27/44721Arrangements for investigating the separated zones, e.g. localising zones by optical means

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Molecular Biology (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Description

【発明の詳細な説明】 イ.産業上の利用分野 本発明は生体液分析を目的とする二次元電気泳動ゲル或
は薄層プレート等の画像続取り装置に関する。
Detailed Description of the Invention a. BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an image acquisition device such as a two-dimensional electrophoretic gel or a thin plate for the purpose of analyzing biological fluids.

ロ.従来の技術 上述したような分析における二次元電気泳動グル或は薄
層プレートでは試料成分のスポツトは約15cm四方の面に
一面に星のように分布しており、その数は1000個以上に
もなる。従来はこのように二次的に展開された試料成分
のスポツトから定量的な情報を得るために、ゲル或は薄
層の全面を走査していた。この全面走査には細い光ビー
ムによる全面のジグザグ走査法或は一次元ホトダイオー
ドアレイのような画像素子を用いて、ゲル面等の像をこ
の画像素子上に形成し、画像素子を電気的に走査すると
云う動作を、ゲル面の全体について行う方法等が用いら
れていた。前者の方法は15cm角と云う広い面を微細な光
ビームで隙間なく走査するので非常に時間がかゝる。後
者の方法はゲル面を適当な幅で区分して、各区分を走査
するので、前者の方法よりは測定所要時間が短縮される
が、試料面の全幅を縮小して画像素子上に投影すると、
画像分解能が低下し、照射照度が低下するので、定量精
度が低下するから、縮小投影はできず画像素子が一度に
カバーできる試料上の幅は試料面全体に比して小さく、
試料面全面を測定するにはやはりかなりの時間がかゝ
る。
B. 2. Description of the Related Art In the two-dimensional electrophoresis gluing or thin layer plate in the above-mentioned analysis, the spots of the sample components are distributed like a star on one side of a 15 cm square and the number is more than 1000. Become. In the past, the entire surface of the gel or thin layer was scanned in order to obtain quantitative information from the spots of the sample components secondarily developed in this way. For this entire surface scanning, an image element such as a zigzag scanning method or a one-dimensional photodiode array for the entire surface using a thin light beam is used to form an image of a gel surface or the like on this image element and the image element is electrically scanned A method of performing such an operation on the entire gel surface has been used. The former method is very time consuming because it scans a wide surface of 15 cm square with a fine light beam without gaps. The latter method divides the gel surface into appropriate widths and scans each division, so the time required for measurement is shorter than the former method, but when the entire width of the sample surface is reduced and projected onto the image element, ,
Since the image resolution is reduced and the illumination illuminance is reduced, the quantitative accuracy is reduced, and therefore reduction projection cannot be performed and the width on the sample that the image element can cover at one time is smaller than the entire sample surface.
After all, it takes a considerable time to measure the entire surface of the sample.

ハ.発明が解決しようとする問題点 本発明は広い面積に分布している多数の試料成分スポツ
トについて定量測定を行う場合における時間損失をでき
るだけ少くしようとするものである。
C. DISCLOSURE OF THE INVENTION Problems to be Solved by the Invention The present invention is intended to minimize the time loss when performing quantitative measurement on a large number of sample component spots distributed over a wide area.

ニ.問題解決のための手段 二次元電気泳動法でゲル上に形成されるスポツトは1000
個以上と云つた多数であるが、このうち実際に定量が必
要なスポツトの数は十数個乃至数十個である場合が多
い。従来は定量の必要のない大多数のスポツトに対して
も一律に定量測定を実行することによつて時間を無駄に
していたと云える。本発明は、試料ステージ面の一定位
置を中心に一定範囲を照射する光源装置と、試料ステー
ジ面でx方向及びy方向に夫々指定量だけ移動可能な試
料ステージと、上記光源装置によつて照射される試料面
からの反射光或は透過光によつて試料の像が結像される
画像素子と、試料ステージをメモリに入力されたx,y両
座標データに基いて、その座標値に相当する量だけx,y
各方向に駆動する制御手段とを備え、二次元電気泳動ゲ
ル或は薄層プレート上の定量測定をすべきスポットの座
標及びそのスポットの大きさに応じて設定される任意の
測定範囲のデータをメモリに記憶させ、この記憶された
測定範囲のデータによって上記制御手段を介して、定量
測定をすべきスポツトだけを光照射位置に順次位置させ
るようにした二次元的試料測定装置である。
D. Measures to solve problems 1000 spots formed on gel by two-dimensional electrophoresis.
Although the number is more than one, the number of spots that actually need to be quantified is often ten to several tens. It can be said that conventionally, time is wasted by uniformly performing quantitative measurement for the majority of spots that do not require quantification. The present invention provides a light source device that irradiates a certain range around a certain position on the sample stage surface, a sample stage that can be moved by a designated amount in the x direction and the y direction on the sample stage surface, and the above light source device. Corresponding to the coordinate value based on the image element where the image of the sample is formed by the reflected or transmitted light from the sample surface and the x and y coordinate data input to the sample stage memory Only x, y
A control means for driving in each direction is provided, and data of an arbitrary measurement range set according to the coordinates of a spot to be quantitatively measured on a two-dimensional electrophoretic gel or a thin layer plate and the size of the spot is displayed. This is a two-dimensional sample measuring device which is stored in a memory, and only the spot to be quantitatively measured is sequentially positioned at the light irradiation position through the control means by the data of the stored measuring range.

ホ.作用 本発明によれば広い試料面の全体について一律に測定を
行うのでなく、必要箇所だけを順次測定して行くので、
前項で述べたような画像素子を用いて電気的に走査する
場合はもちろん、指定された測定箇所だけを細い光ビー
ムで走査する方式であつても、無駄な測定を行つている
時間がなくなるから全体の測定所要時間が短縮される。
E. Effect According to the present invention, not a uniform measurement is performed on the entire wide sample surface, but only the necessary portions are sequentially measured.
Not only in the case of electrically scanning using the image element as described in the previous section, but also in the method of scanning only the designated measurement point with a thin light beam, there is no time for performing unnecessary measurement. Overall measurement time is reduced.

ヘ.実施例 図は本発明の一実施例を示す。sは試料ステージでx,y
は試料ステージsをx方向,y方向に移動させるパルスモ
ータであり、D1はこれらのパルスモータの駆動回路であ
る。Lは光源装置で試料ステージ上のx軸に平行な線分
C上に集光するようになつている。1はコンピユータで
駆動回路D1を制御しており、モータX,Yの駆動パルスを
カウントして光照射範囲Cの中心点Oの試料ステージS
に固定した座標におけるx,y座標値を検出している。2
は試料ステージS上に載置された試料の電気泳動ゲル或
は薄層プレートである。PはCCDラインセンサのような
一次元画像素子であり、レンズGによつて試料2上の光
照射域Cの像が、画像素子Pの受光面上に形成される。
F. Embodiment FIG. Shows an embodiment of the present invention. s is the sample stage x, y
Is a pulse motor for moving the sample stage s in the x and y directions, and D1 is a drive circuit for these pulse motors. L is a light source device that focuses light on a line segment C parallel to the x-axis on the sample stage. Reference numeral 1 controls the drive circuit D1 by a computer, counts the drive pulses of the motors X and Y, and measures the sample stage S at the center point O of the light irradiation range C.
The x and y coordinate values at the coordinates fixed to are detected. Two
Is an electrophoretic gel or a thin layer plate of the sample placed on the sample stage S. P is a one-dimensional image element such as a CCD line sensor, and an image of the light irradiation area C on the sample 2 is formed on the light receiving surface of the image element P by the lens G.

オペレータは試料2を試料ステージS上にセツトし、光
源装置Lを点灯して、xy移動キー3を操作し、定量しよ
うとするスポツトの中心が光照射域Cの中心Oに来るよ
うに試料ステージを移動させ、測定しようとするスポツ
トを丁度良く含むように測定範囲を設定し、読込みキー
5を押すと、コンピユータはそのときの試料ステージS
の座標値及びその座標を中心とする測定範囲のデータを
メモリMに記憶させる。以下定量しようと思うスポツト
に対して次々に同じ入力操作を行い、その後スタートの
指令をコンピユータ1に与えると、コンピユータ1はメ
モリに記憶された各スポツトに関する座標データと測定
範囲のデータを読出しでは、試料ステージSを駆動し、
画像素子Pを走査して同素子から読出された映像信号を
メモリMの所定のエリヤに格納して行く。
The operator sets the sample 2 on the sample stage S, lights the light source device L, operates the xy movement key 3, and moves the sample stage so that the center of the spot to be quantified comes to the center O of the light irradiation area C. Is moved, the measurement range is set so that the spots to be measured are exactly included, and the read key 5 is pressed.
The coordinate values of and the data of the measurement range centered on the coordinates are stored in the memory M. Perform the same input operation one after another for the spots to be quantified, and then give a start command to the computer 1, the computer 1 reads the coordinate data and the measurement range data for each spot stored in the memory. Drive the sample stage S,
The image element P is scanned and the video signal read from the element is stored in a predetermined area of the memory M.

ト.効果 本発明によるときは、画像走査は電気泳動ゲル或は薄層
プレート上の箇数的に限定された小領域についてのみ行
うので、全面を走査するのに比し、測定所要時間が著る
しく短縮される。また定量すべき領域を一つのスポツト
についてもその大きさに応じて必要範囲に設定している
ので、近傍の別のスポツトの測定信号が採取したデータ
に混入することなく、メモリに記憶させるべき映像信号
のデータ量が必要限度に留められ、メモリの容量も節約
できる。
G. Effect According to the present invention, the image scanning is performed only on a small number of small areas on the electrophoretic gel or the thin layer plate. Shortened. Also, the area to be quantified is set to the required range according to the size of one spot, so the measurement signal of another nearby spot should be stored in the memory without being mixed with the collected data. The amount of signal data is limited to the required amount, and the memory capacity can be saved.

上述実施例ではスポツトの像を画像素子上に投影して、
それを電気的に走査しているが、本発明は光ビームで試
料面を走査する方式でも適用でき、そのときでも、走査
範囲が限定されることによる測定時間短縮の効果は同じ
である。
In the above embodiment, the spot image is projected on the image element,
Although it is electrically scanned, the present invention can also be applied to a method of scanning the sample surface with a light beam, and even at that time, the effect of shortening the measurement time due to the limited scanning range is the same.

なお本発明は試料成分を一次元的に展開した場合でも適
用でき、その場合必要とされるスポツトの部分でだけ測
定を行い、その他の部分は飛ばせばよい。
The present invention can be applied even when the sample components are developed one-dimensionally, in which case the measurement is performed only at the spots required and the other portions may be skipped.

【図面の簡単な説明】[Brief description of drawings]

図面は本発明の一実施例を示すブロツク図である。 The drawings are block diagrams showing an embodiment of the present invention.

───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 昭51−23795(JP,A) 特開 昭49−130293(JP,A) 特開 昭57−57258(JP,A) 実開 昭57−118348(JP,U) ─────────────────────────────────────────────────── ─── Continuation of front page (56) References JP-A-51-23795 (JP, A) JP-A-49-130293 (JP, A) JP-A-57-57258 (JP, A) Practical application Sho-57- 118348 (JP, U)

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】試料ステージ面の一定位置を中心に一定範
囲を照射する光源装置と、試料ステージの位置座標を検
知する手段と、試料面からの反射或は透過光を受光する
受光素子と、試料ステージ上の試料が展開された層にお
ける定量測定すべきスポットの座標及びそのスポットの
大きさに応じて設定される任意の測定範囲のデータを記
憶させるメモリと、このメモリに記憶された測定範囲の
データに基いて上記受光素子から測定データを採取する
制御手段を備えた空間的に展開された試料パターン測定
装置。
1. A light source device for irradiating a fixed range around a fixed position on the sample stage surface, a means for detecting the position coordinates of the sample stage, and a light receiving element for receiving the reflected or transmitted light from the sample surface. A memory for storing the data of an arbitrary measurement range set according to the coordinates of the spot to be quantitatively measured on the layer on which the sample on the sample stage is developed and the size of the spot, and the measurement range stored in this memory A spatially developed sample pattern measuring device comprising a control means for collecting measurement data from the light receiving element based on the data of 1.
JP59183589A 1984-08-31 1984-08-31 Spatially developed sample pattern measuring device Expired - Lifetime JPH0776744B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59183589A JPH0776744B2 (en) 1984-08-31 1984-08-31 Spatially developed sample pattern measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59183589A JPH0776744B2 (en) 1984-08-31 1984-08-31 Spatially developed sample pattern measuring device

Publications (2)

Publication Number Publication Date
JPS6161039A JPS6161039A (en) 1986-03-28
JPH0776744B2 true JPH0776744B2 (en) 1995-08-16

Family

ID=16138460

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59183589A Expired - Lifetime JPH0776744B2 (en) 1984-08-31 1984-08-31 Spatially developed sample pattern measuring device

Country Status (1)

Country Link
JP (1) JPH0776744B2 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6321556A (en) * 1986-07-15 1988-01-29 Hitachi Ltd Dna base sequence determining apparatus
JPS63189793A (en) * 1987-02-02 1988-08-05 Mitsubishi Electric Corp Heat transfer pipe for evaporation and condensation
JPH0781947B2 (en) * 1990-02-14 1995-09-06 株式会社島津製作所 Two-dimensional spectroscopic image analyzer
CN102012413B (en) 2000-09-25 2012-11-21 松下电器产业株式会社 Device for chromatographic quantitative measurement
JP4797233B2 (en) * 2000-09-25 2011-10-19 パナソニック株式会社 Compact sample concentration measuring device

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5433555B2 (en) * 1973-04-13 1979-10-22
JPS5123795A (en) * 1974-08-21 1976-02-25 Shimadzu Corp
JPS5757258A (en) * 1980-09-24 1982-04-06 Hitachi Ltd Device for measuring microscope sample
JPS57118348U (en) * 1981-01-19 1982-07-22

Also Published As

Publication number Publication date
JPS6161039A (en) 1986-03-28

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