JPH0752625Y2 - 温度特性試験槽 - Google Patents
温度特性試験槽Info
- Publication number
- JPH0752625Y2 JPH0752625Y2 JP1987034740U JP3474087U JPH0752625Y2 JP H0752625 Y2 JPH0752625 Y2 JP H0752625Y2 JP 1987034740 U JP1987034740 U JP 1987034740U JP 3474087 U JP3474087 U JP 3474087U JP H0752625 Y2 JPH0752625 Y2 JP H0752625Y2
- Authority
- JP
- Japan
- Prior art keywords
- air
- test
- temperature
- curtain
- test chamber
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000012360 testing method Methods 0.000 title claims description 62
- 238000001816 cooling Methods 0.000 claims description 9
- 230000003028 elevating effect Effects 0.000 claims description 6
- 238000010438 heat treatment Methods 0.000 claims description 6
- 238000009423 ventilation Methods 0.000 claims description 3
- 230000000149 penetrating effect Effects 0.000 claims description 2
- 230000005494 condensation Effects 0.000 description 14
- 238000009833 condensation Methods 0.000 description 14
- 239000003507 refrigerant Substances 0.000 description 10
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 7
- 239000004020 conductor Substances 0.000 description 4
- 238000007791 dehumidification Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 239000003990 capacitor Substances 0.000 description 2
- 238000004891 communication Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 2
- 230000005856 abnormality Effects 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000010365 information processing Effects 0.000 description 1
- 230000009545 invasion Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 229920003002 synthetic resin Polymers 0.000 description 1
- 239000000057 synthetic resin Substances 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987034740U JPH0752625Y2 (ja) | 1987-03-10 | 1987-03-10 | 温度特性試験槽 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987034740U JPH0752625Y2 (ja) | 1987-03-10 | 1987-03-10 | 温度特性試験槽 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63142771U JPS63142771U (enExample) | 1988-09-20 |
| JPH0752625Y2 true JPH0752625Y2 (ja) | 1995-11-29 |
Family
ID=30843578
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1987034740U Expired - Lifetime JPH0752625Y2 (ja) | 1987-03-10 | 1987-03-10 | 温度特性試験槽 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0752625Y2 (enExample) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006275326A (ja) * | 2005-03-28 | 2006-10-12 | Sanyo Electric Co Ltd | 恒温庫 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS54143668A (en) * | 1978-04-28 | 1979-11-09 | Toshiba Corp | Continuous environment testing apparatus |
| JPS5896241U (ja) * | 1981-12-23 | 1983-06-30 | ソニー株式会社 | 環境試験装置 |
-
1987
- 1987-03-10 JP JP1987034740U patent/JPH0752625Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS63142771U (enExample) | 1988-09-20 |
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