JPH074610Y2 - 半導体素子発振特性測定治具 - Google Patents

半導体素子発振特性測定治具

Info

Publication number
JPH074610Y2
JPH074610Y2 JP1987085093U JP8509387U JPH074610Y2 JP H074610 Y2 JPH074610 Y2 JP H074610Y2 JP 1987085093 U JP1987085093 U JP 1987085093U JP 8509387 U JP8509387 U JP 8509387U JP H074610 Y2 JPH074610 Y2 JP H074610Y2
Authority
JP
Japan
Prior art keywords
semiconductor element
pattern
oscillation
characteristic measuring
insulator
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1987085093U
Other languages
English (en)
Japanese (ja)
Other versions
JPS63193372U (enrdf_load_stackoverflow
Inventor
惣一郎 椿山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP1987085093U priority Critical patent/JPH074610Y2/ja
Publication of JPS63193372U publication Critical patent/JPS63193372U/ja
Application granted granted Critical
Publication of JPH074610Y2 publication Critical patent/JPH074610Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP1987085093U 1987-05-30 1987-05-30 半導体素子発振特性測定治具 Expired - Lifetime JPH074610Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1987085093U JPH074610Y2 (ja) 1987-05-30 1987-05-30 半導体素子発振特性測定治具

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1987085093U JPH074610Y2 (ja) 1987-05-30 1987-05-30 半導体素子発振特性測定治具

Publications (2)

Publication Number Publication Date
JPS63193372U JPS63193372U (enrdf_load_stackoverflow) 1988-12-13
JPH074610Y2 true JPH074610Y2 (ja) 1995-02-01

Family

ID=30940184

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1987085093U Expired - Lifetime JPH074610Y2 (ja) 1987-05-30 1987-05-30 半導体素子発振特性測定治具

Country Status (1)

Country Link
JP (1) JPH074610Y2 (enrdf_load_stackoverflow)

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6142481U (ja) * 1984-08-21 1986-03-19 三菱電機株式会社 半導体装置の試験装置

Also Published As

Publication number Publication date
JPS63193372U (enrdf_load_stackoverflow) 1988-12-13

Similar Documents

Publication Publication Date Title
JPH074610Y2 (ja) 半導体素子発振特性測定治具
JPH075419Y2 (ja) 表面抵抗測定装置
JP2576335Y2 (ja) リーフスイッチ
JPS59632Y2 (ja) 回路素子挾持装置
JPS6225877U (enrdf_load_stackoverflow)
JPS6123867Y2 (enrdf_load_stackoverflow)
JPH0249575Y2 (enrdf_load_stackoverflow)
JPH0621025Y2 (ja) 隣接する２つのチップを同時に測定するプローブカード
JP2517819Y2 (ja) コンデンサーの静電容量測定装置
JPH079341Y2 (ja) 電子機器の端子接続構造
JPS5833742Y2 (ja) 回路基板におけるリ−ド接触導通構造
JPH0446221Y2 (enrdf_load_stackoverflow)
JPH0668323U (ja) 接触端子
KR0125425Y1 (ko) 전자부품 소자의 클램핑장치
JPS5849272U (ja) チツプ状試料装着ヘツド
JPS6123866Y2 (enrdf_load_stackoverflow)
JPS61205053U (enrdf_load_stackoverflow)
JPH0469767U (enrdf_load_stackoverflow)
JPS63172080U (enrdf_load_stackoverflow)
JPS6163174U (enrdf_load_stackoverflow)
JPS58138058A (ja) 半導体装置
JPS59161057A (ja) 半導体集積回路
JPS63109658U (enrdf_load_stackoverflow)
JPS6215138B2 (enrdf_load_stackoverflow)
JPS60174059U (ja) 電源端子接続装置