JPS63193372U - - Google Patents

Info

Publication number
JPS63193372U
JPS63193372U JP8509387U JP8509387U JPS63193372U JP S63193372 U JPS63193372 U JP S63193372U JP 8509387 U JP8509387 U JP 8509387U JP 8509387 U JP8509387 U JP 8509387U JP S63193372 U JPS63193372 U JP S63193372U
Authority
JP
Japan
Prior art keywords
clamp
circuit pattern
semiconductor device
electrode
main body
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8509387U
Other languages
English (en)
Japanese (ja)
Other versions
JPH074610Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1987085093U priority Critical patent/JPH074610Y2/ja
Publication of JPS63193372U publication Critical patent/JPS63193372U/ja
Application granted granted Critical
Publication of JPH074610Y2 publication Critical patent/JPH074610Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP1987085093U 1987-05-30 1987-05-30 半導体素子発振特性測定治具 Expired - Lifetime JPH074610Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1987085093U JPH074610Y2 (ja) 1987-05-30 1987-05-30 半導体素子発振特性測定治具

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1987085093U JPH074610Y2 (ja) 1987-05-30 1987-05-30 半導体素子発振特性測定治具

Publications (2)

Publication Number Publication Date
JPS63193372U true JPS63193372U (enrdf_load_stackoverflow) 1988-12-13
JPH074610Y2 JPH074610Y2 (ja) 1995-02-01

Family

ID=30940184

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1987085093U Expired - Lifetime JPH074610Y2 (ja) 1987-05-30 1987-05-30 半導体素子発振特性測定治具

Country Status (1)

Country Link
JP (1) JPH074610Y2 (enrdf_load_stackoverflow)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6142481U (ja) * 1984-08-21 1986-03-19 三菱電機株式会社 半導体装置の試験装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6142481U (ja) * 1984-08-21 1986-03-19 三菱電機株式会社 半導体装置の試験装置

Also Published As

Publication number Publication date
JPH074610Y2 (ja) 1995-02-01

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