JPH0736299Y2 - Ｉｃハンドラー - Google Patents

Ｉｃハンドラー

Info

Publication number
JPH0736299Y2
JPH0736299Y2 JP1988109765U JP10976588U JPH0736299Y2 JP H0736299 Y2 JPH0736299 Y2 JP H0736299Y2 JP 1988109765 U JP1988109765 U JP 1988109765U JP 10976588 U JP10976588 U JP 10976588U JP H0736299 Y2 JPH0736299 Y2 JP H0736299Y2
Authority
JP
Japan
Prior art keywords
socket
chip
holder
handler
measured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1988109765U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0232075U (enExample
Inventor
和久 鵜川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Priority to JP1988109765U priority Critical patent/JPH0736299Y2/ja
Publication of JPH0232075U publication Critical patent/JPH0232075U/ja
Application granted granted Critical
Publication of JPH0736299Y2 publication Critical patent/JPH0736299Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP1988109765U 1988-08-22 1988-08-22 Ｉｃハンドラー Expired - Lifetime JPH0736299Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1988109765U JPH0736299Y2 (ja) 1988-08-22 1988-08-22 Ｉｃハンドラー

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1988109765U JPH0736299Y2 (ja) 1988-08-22 1988-08-22 Ｉｃハンドラー

Publications (2)

Publication Number Publication Date
JPH0232075U JPH0232075U (enExample) 1990-02-28
JPH0736299Y2 true JPH0736299Y2 (ja) 1995-08-16

Family

ID=31346309

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1988109765U Expired - Lifetime JPH0736299Y2 (ja) 1988-08-22 1988-08-22 Ｉｃハンドラー

Country Status (1)

Country Link
JP (1) JPH0736299Y2 (enExample)

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6486533A (en) * 1987-09-29 1989-03-31 Nippon Lsi Kk Ic package inspection device

Also Published As

Publication number Publication date
JPH0232075U (enExample) 1990-02-28

Similar Documents

Publication Publication Date Title
JP2821046B2 (ja) 半導体素子用特性検査装置
CN1103452C (zh) 集成电路处理器的测试部
CA1303237C (en) Apparatus for testing circuit boards
CN115780318B (zh) 一种多功能石英晶体振荡器测试设备
CN212160008U (zh) 一种基于fpga的集成电路芯片测试机
CN211680440U (zh) 一种焊接电路板用的定位夹具
JPH0736299Y2 (ja) Ｉｃハンドラー
JPH10256799A (ja) テープフィーダの検査装置
CN115041422A (zh) 一种电子元器件半自动检测分选设备
JP3095807B2 (ja) 半導体デバイスの検査装置
JPH0712945Y2 (ja) Ｉｃハンドラーのソケットホルダー
TWI745136B (zh) 承置器調位機構及其應用之作業設備
CN218370361U (zh) 电阻元件电性测试设备
JPH08334546A (ja) 半導体装置のテスト装置
JPS5896258A (ja) 電子部品テスタ用オ−トハンドラにおける部品ケ−スドツキング機構
JP3071156B2 (ja) Ｂ・ｇ・ａのｉｃパッケージ用基板の導通検査方法
JP3071155B2 (ja) Ｂ・ｇ・ａ、ｐ・ｇ・ａ等のｉｃパッケージ用の基板の導通検査方法及びその装置
CN220019342U (zh) 一种led焊线检验固定夹
CN114509581B (zh) 承置器调位机构及其应用的作业设备
JP2575073B2 (ja) ウエハプローバ
KR20050026055A (ko) 전자부품 시험장치
CN219625268U (zh) 一种集成电路封装测试装置
KR102052180B1 (ko) 발광 다이오드 패키지 테스트 장치
CN219695359U (zh) 自动打点标记测试机
CN220533312U (zh) 用于焊接pcb的治具和用于焊接和测试pcb的工作台