JPH07335132A - Picture tube assembly inspection - Google Patents

Abstract

PURPOSE:To inspect accurately the silicon applied to a stem portion of a picture tube by irradiating the stem portion with a spot light and thus taking this transmission picture into a camera. CONSTITUTION:A stem portion 5 of a picture tube is fixed at a specific position. And the stem portion 5 is then irradiated with a spot light froma a pair of spot light sources 1. On the other hand, scattered light from an inverter light source 3b of a white color background portion 3, and so a background picture of the stem portion 5 as viewed from the side of a camera 2 is made white in color. A transmission picture of the stem portion 5 irradiated with a spot light from a light source 1 is taken into a camera. A picture signal is thus outputted to a picture processing portion 4. The output pretreated as a picture is then turned into binary signals, and the original black and while pictures are inverted each other. Stem pins 7 of the stem portion 5 and silicon 9 applied in between the pins 7 are thus extracted. An area of projection of the silicon 9 is obtained. A quantity of the silicon 9 is calculated from this projection area. Thus, it is determined whether the quantity of silicon applied is appropriate or not.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a picture tube assembly inspection apparatus used for inspecting the coating state of silicon applied between stem pins of a stem portion of a picture tube.

[0002]

2. Description of the Related Art In general, pressure-resistant silicon is applied between a plurality of stem pins provided on a stem portion of a color picture tube in order to prevent occurrence of leak current, discharge and the like. Since the silicon coating state on the stem affects the subsequent pressure resistance function, the silicon coating amount and coating position are inspected during the picture tube assembly process to prevent outflow of pressure resistance defects to the subsequent processes. ing.

Conventionally, a color type image processing apparatus has been used as this type of inspection apparatus. In this inspection apparatus, the stem portion of the picture tube is irradiated with light and the reflected image is captured by the camera. Then, the silicon image is extracted by utilizing the chromaticity difference and the luminance difference of the captured image, and the silicon coating state is inspected based on this.

[0004]

However, in the above-mentioned conventional inspection apparatus, since the color tone of each portion changes variously depending on the light irradiation condition, the glass portion of the stem portion in the reflection image captured by the camera, It was difficult to separate the stem pin and the silicon, and the inspection result was unreliable. In addition, as described above, the subtle irradiation of light on the stem affects the inspection result,
It was always difficult to maintain and manage appropriate irradiation conditions. Furthermore, when the type of silicon used, especially the color of the silicon, changes, it is necessary to establish the irradiation conditions and the image processing conditions accordingly, and therefore a fine adjustment work has been forced. In addition, since white silicon hardly causes a chromaticity difference or a luminance difference from other portions (especially the glass portion), there is a problem that an accurate inspection result cannot be obtained by color type image processing.

The present invention has been made to solve the above problems, and an object of the present invention is to provide a picture tube assembly capable of accurately inspecting a coating state of silicon coated on a stem portion of a picture tube. To provide an inspection device.

[0006]

SUMMARY OF THE INVENTION The present invention has been made to achieve the above object, and is a picture tube for inspecting the coating state of silicon coated between stem pins of a stem portion of a picture tube by image processing. In an assembly inspection device, a pair of spot light sources that irradiate spot light obliquely from below onto the stem portion of a picture tube that is positioned and fixed at a predetermined position, and a transmission image of the stem portion that is irradiated with spot light from the spot light source are captured. An image processing unit that extracts a camera, a white background portion that is placed in the image capturing area of the camera to whiten the background image of the stem portion, a stem pin and silicon as a transmission image, and removes the transmission image of the stem pin. And a configuration for inspecting the coating state of silicon based on the processing output of the image processing unit.

[0007]

In the picture tube assembly inspection apparatus of the present invention, when the stem portion to be inspected is irradiated with spot light and the transmitted image is captured by the camera, only the opaque stem pin and silicon are projected as the transmitted image. , And everything else is white. Therefore, the image processing unit can easily separate the stem pin and the silicon, and can accurately cut out only the silicon from the transmission image.

[0008]

Embodiments of the present invention will now be described in detail with reference to the drawings. FIG. 1 is a schematic configuration diagram showing an embodiment of a picture tube assembly inspection apparatus according to the present invention, in which (a) is a schematic side view thereof and (b) is a schematic plan view thereof. The illustrated picture tube assembling inspection apparatus roughly includes a pair of spot light sources 1, an image capturing camera 2, a white background portion 3, and an image processing portion 4.

Here, the structure of the stem portion of the picture tube to be inspected will be described before the detailed description of the apparatus configuration. The stem portion 5 of the picture tube is, as shown in FIG.
A glass neck portion 6 having an integral structure with a funnel portion (not shown), a plurality of stem pins 7 arranged circumferentially on the end face of the glass neck portion 6, and provided inside the circumference of these stem pins 7. And the glass sealing portion 8. Further, among the plurality of stem pins 7 provided in the stem portion 5, a higher voltage is applied to the stem pin 7a particularly corresponding to G ₄ (main focus) than the other stem pins 7, so that these stem pins 7a and Silicon 9 for pressure resistance is applied between the other stem pins 7. The picture tube assembly inspection device of the present invention is for inspecting the coating state of the silicon 9 on the stem portion 5,
The functions and arrangements of the above-mentioned components will be described below.

First, the pair of spot light sources 1 are installed in a state of being positioned diagonally below the stem portion 5 which is positioned and fixed at a predetermined position. These spot light sources 1 irradiate the stem portion 5 with strong spot light from their respective installation positions, as indicated by broken line arrows in the figure.
For example, it is configured by a lamp house, an optical fiber light source, or the like.

The image capturing camera 2 is installed so as to be located on the opposite side of the spot light source 1 via a stem portion 5 which is positioned and fixed during inspection. Further, the head portion (tip portion) of the camera 2 is arranged toward the side of the stem portion 5 to be inspected, which allows the stem 5 to be inspected.
Is set in the image capturing area of the camera 2. Here, during inspection, spot light is emitted from the pair of spot light sources 1 and is emitted to the stem portion 5 from diagonally below. Therefore, the camera 3 transmits a transmitted image of the stem portion 5 by the spot light. Will be captured.

The white background portion 3 is for whitening the background image of the stem portion 5 when the transmission image of the stem portion 5 is captured by the camera 2. The white background portion 3 is composed of, for example, a white thin plate reflector 3a and an inverter light source (high-frequency lighting fluorescent lamp, circle fluorescent lamp, etc.) 3b, and the background image of the stem portion 5 is whitened. It is arranged in the image capturing area of the camera 2 so as to allow it. More specifically, the white reflection plate 3a is obliquely installed at a position facing the head part of the camera 2 via the stem part 5, and the inverter light source 3b is arranged above it. Then, when the inverter light source 3b is turned on, the scattered light is reflected by the white surface of the reflection plate 3a and is incident on the camera 2 side, whereby the background (background) of the stem portion 5 in the image capturing area becomes white. It is supposed to do.

The image processing unit 4 is for subjecting an image captured by the camera 2 to predetermined processing, for example, binarization processing and image calculation processing, which is performed by a cable or the like via a camera control unit (not shown). Is connected to the output terminal of the camera 2.

It should be noted that in the above-described device configuration, the stem portion 5
The spot light source 1 is installed so that the spot light is emitted obliquely from below. The reason is that when the spot light is emitted from obliquely above the stem portion 5, the edge corner portion of the glass neck portion 6 is exposed. This is because the spot light is reflected and enters the camera 2 to saturate the CCD element. In order to avoid such an adverse effect, in the present embodiment, there is no positional interference with the white background portion 3,
The spot light source 1 is installed so that the stem portion 5 is irradiated with the spot light obliquely from below.

Next, the operation of the picture tube assembly inspection apparatus in this embodiment will be described. First, the picture tube that has been carried by a carrying device (not shown) is supplied to the device inspection unit. In the apparatus inspection section, the stem section 5 is positioned and fixed at a predetermined position by chucking the neck section together with the positioning of the picture tube. When the stem portion 5 is fixed in this manner, spot light is emitted from each of the pair of spot light sources 1, and the spot light is emitted to the stem portion 5 obliquely from below.

On the other hand, in the white background portion 3, when the inverter light source 3b is turned on, scattered light is applied to the reflection plate 3a. As a result, the background image of the stem portion 5 viewed from the camera 2 side becomes white. In this state, the camera 2 captures the transmission image of the stem portion 5 irradiated with the spot light from the spot light source 1 and outputs it as an image signal to the image processing portion 4.

FIG. 2 shows an original image of the stem portion 5 captured by the camera 2. In the figure, the hatched portion is black and the other portions are white. here,
Among the constituent parts of the stem part 5, the transparent glass neck part 6 and the glass sealing part 8 transmit the light emitted from the spot light source 1. Therefore, in the original image shown in FIG. 2, since the glass neck portion 6 and the glass sealing portion 8 have the same color as the white background portion 3, they do not appear in the transmission image of the stem portion 5 captured by the camera 2. . On the other hand, stem pin 7
Since the silicon 9 is opaque, it does not transmit the spot light, and the entire image is reflected in the transmitted image as a blackened shadow.

In the image processing section 4, the transmission image of the stem section 5 captured by the camera 2 is subjected to image preprocessing such as a Laplacian filter and then binarized. FIG. 3 shows an image binarized by the image processing unit 4. In this binarized image, the white portion and the black portion of the original image shown in FIG. Only the silicon 9 applied between the pins is extracted.

Further, in the image processing section 4, the binarized image is subjected to an image calculation process to remove the stem pin 7 from the binarized image shown in FIG. FIG. 4 shows an output image obtained by the image calculation processing. In this output image, only the silicon 9 applied to the stem portion 5 is cut out as a white portion, and other portions (hatched portion in the figure) are all black. Has become.

When only the image of the silicon 9 is extracted by the image processing unit 4 in this way, the coating state of the silicon 9 is inspected based on the processing output of the image processing unit 4. That is, the projected area of the silicon 9 shown in the output image of FIG. 4 is obtained by image processing calculation, and it is determined whether or not the coating amount of the silicon 9 converted from the projected area is appropriate. In addition, the silicon 9
The center of gravity position is determined and it is determined whether or not the application position of the silicon 9 based on the position of the stem pin 7 is appropriate.

As described above, in the picture tube assembly inspection apparatus of the present embodiment, the stem portion 5 to be inspected is irradiated with the spot light from the spot light source 1 and the transmitted image is taken by the camera 2.
Since it is a method of taking in, the opaque stem pin 7 and the silicon 9 are projected as a black shadow,
It becomes easy to separate the other white area by the white background portion 3 from the stem pin 7 and the silicon 9. Therefore, in the image processing unit 4, the stem pin 7 and the silicon 9 can be accurately extracted as a transmission image, and by removing the transmission image of the stem pin 7, only the image of the silicon 9 can be cut out. By inspecting the coating state of No. 9, the reliability of the inspection result is remarkably increased.

By the way, as shown in FIG.
On the inner surface of the glass sealing portion 8 in, the suction portions 8a having various shapes are formed by the glass suction at the time of sealing. Depending on the shape of the suction portion 8a, even the object 10 existing in the image capturing area of the camera 2 may be displayed in the transmission image together with the step pin 7 and the silicon 9, which may affect the inspection result.

Therefore, in the apparatus configuration of this embodiment, as shown in FIGS. 1 and 5, a part of the reflection plate 3a is extended to the vicinity of the stem portion 5 as a shielding portion 3c. As a result, the shielding portion 3c comes to be interposed between the suction portion 8a of the glass sealing portion 8 and the object 10 outside the image capturing area, so that the transmission image of the stem portion 5 includes the object 10 outside the camera field of view. It can be surely prevented from being projected.

The picture tube assembly inspection apparatus according to the present invention not only inspects the coating state of the silicon 9 on the stem portion 5, but also the bending state of the stem pin 7, the coating state of the neck carbon, and the opaque base. It can also be applied to inspect the wearing condition of the cap.

[0025]

As described above, according to the present invention,
Since the system of irradiating the stem portion of the picture tube with spot light and capturing the transmitted image with the camera is employed, the following effects can be obtained. First, in the image processing section, it is easier to separate the stem pin and the silicon in the stem section, so that it is possible to more accurately inspect the coating state of silicon than in the past. Further, even if the irradiation condition of the light to the stem portion is slightly changed, the inspection result is hardly affected, and therefore, it becomes easy to maintain and manage the irradiation condition under appropriate conditions. Furthermore, even if the color of the silicon used changes, it can be inspected without changing the irradiation conditions or image processing conditions, so fine adjustment work according to the color of the silicon is unnecessary, and even if it is white silicon, it is accurate. It is possible to obtain various inspection results.

[Brief description of drawings]

FIG. 1 is a schematic configuration diagram showing an embodiment of a picture tube assembling apparatus according to the present invention.

FIG. 2 is a diagram showing an original image of a stem portion.

FIG. 3 is a diagram showing a binarized image in an image processing unit.

FIG. 4 is a diagram showing a processed output image in an image processing unit.

FIG. 5 is a diagram illustrating additional functions.

[Explanation of symbols]

1 Spot Light Source 2 Camera 3 White Background 4 Image Processing 5 Stem 7 Stem Pin 9 Silicon

Claims (1)

[Claims] 1. A picture tube assembling inspection apparatus for inspecting a coating state of silicon applied between stem pins of a picture tube stem section by image processing, wherein the picture tube assembly is obliquely attached to a picture tube stem section fixed at a predetermined position. A pair of spot light sources that illuminate spot light from below, a camera that captures a transmission image of the stem portion that is illuminated by spot light from the spot light source, and a background of the stem portion that is arranged in an image capture area of the camera. A white background portion that whitens an image, and an image processing unit that extracts the stem pin and the silicon as a transmission image and removes the transmission image of the stem pin, and based on a processing output of the image processing unit, A picture tube assembly inspection apparatus, which inspects the coating state of silicon.