JP2001141662A - Method and apparatus for detecting flaw of transparent plate-shaped object - Google Patents

Method and apparatus for detecting flaw of transparent plate-shaped object

Info

Publication number
JP2001141662A
JP2001141662A JP32824099A JP32824099A JP2001141662A JP 2001141662 A JP2001141662 A JP 2001141662A JP 32824099 A JP32824099 A JP 32824099A JP 32824099 A JP32824099 A JP 32824099A JP 2001141662 A JP2001141662 A JP 2001141662A
Authority
JP
Japan
Prior art keywords
light
transparent plate
ccd camera
defect
camera
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP32824099A
Other languages
Japanese (ja)
Inventor
Shinya Okugawa
真也 奥川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Central Glass Co Ltd
Original Assignee
Central Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Central Glass Co Ltd filed Critical Central Glass Co Ltd
Priority to JP32824099A priority Critical patent/JP2001141662A/en
Publication of JP2001141662A publication Critical patent/JP2001141662A/en
Pending legal-status Critical Current

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)

Abstract

PROBLEM TO BE SOLVED: To solve such a problem that it is difficult to detect a very fine flaw called a hairline as an image, because the intensity of the light scattered from a flaw depends on the size and shape of the flaw and the intensity of light scattered from the vary fine flaw is weak. SOLUTION: In a method for detecting the flaw of a transparent plate-shaped object by irradiating the transparent plate-shaped object with light to use transmitted light, scattered light is allowed to be incident on the transparent plate- shaped object to photograph the transparent plate-shaped object by a CCD camera, and the shading plate movable on the straight line connecting a light source and the CCD camera is provided between the CCD camera and the transparent plate-shaped object to prevent the direct incidence of the light from the light source on the CCD camera.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、板ガラスや透明プ
ラスチック板などの透明板状体の製造や2次加工におけ
る欠点検査に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to the production of a transparent plate such as a glass plate or a transparent plastic plate and the inspection of defects in secondary processing.

【0002】[0002]

【従来の技術】板ガラスに光を照射し、板ガラスを透過
する光あるいは板ガラスの表面で反射する光を用いて板
ガラスの欠点を検査する方法は、欠点で光が散乱するこ
とを利用するものである。欠点のところで光が散乱する
ため、その部分が光の2次光源となり、カメラでその部
分を画像としてとらえることが可能であり、欠点がない
ところは光が散乱しないので結像することが無く、画像
には欠点のみが像として形成される。
2. Description of the Related Art A method of inspecting a sheet glass for defects by irradiating the sheet glass with light and transmitting light through the sheet glass or light reflected on the surface of the sheet glass utilizes the fact that light is scattered by the defects. . Since the light is scattered at the defect, the part becomes a secondary light source of light, and it is possible to capture the part as an image with a camera, and where there is no defect, the light is not scattered, so that no image is formed. Only defects are formed in the image as images.

【0003】[0003]

【発明が解決しようとする課題】欠点で散乱される光の
強さは、欠点の大きさと形状に依存し、ヘアラインと呼
ばれるような非常に微細なキズにおいては、散乱される
光が弱く、像として検出することが困難であった。
The intensity of light scattered by a defect depends on the size and shape of the defect. In a very minute flaw such as a hairline, the scattered light is weak, and Was difficult to detect.

【0004】このような微細な欠点を検出するために、
高輝度のランプとシリンドリカルレンズを用いて、透明
板を帯状に照明し、欠点による散乱光と迷光との差異を
大きくして、欠点を検出する方法が考えられるが、欠点
からの散乱光の輝度を大きくするために光源の輝度を大
きくしなければならず、光源部が高熱となるため、レン
ズの耐熱性などの考慮から、大がかりな装置になってし
まうという欠点があった。
In order to detect such minute defects,
Using a high-intensity lamp and a cylindrical lens, the transparent plate is illuminated in a strip shape, and the difference between scattered light and stray light due to the defect is increased to detect the defect. In order to increase the brightness, the brightness of the light source must be increased, and the light source section becomes high in heat. Therefore, there is a disadvantage that the apparatus becomes large-scale in consideration of the heat resistance of the lens.

【0005】[0005]

【課題を解決するための手段】本発明の検査方法は、透
明板状体に光を当て、透過する光を用いる透明板状体の
欠点検出方法において、散乱光を透明板状体に入射し、
該透明板状体をCCDカメラで撮影し、CCDカメラと
透明板状体との間に、光源とCCDカメラを結ぶ直線上
で移動可能な遮光板を設けて、光源の光が直接カメラに
入射しないようにしたことを特徴とする欠点検出方法で
ある。
The inspection method according to the present invention is directed to a method for detecting a defect in a transparent plate using light transmitted through the transparent plate, wherein scattered light is incident on the transparent plate. ,
The transparent plate is photographed with a CCD camera, and a light-shielding plate is provided between the CCD camera and the transparent plate that is movable on a straight line connecting the light source and the CCD camera, so that light from the light source is directly incident on the camera. This is a defect detection method characterized in that it is not performed.

【0006】また、前述の欠点検出方法が、CCDカメ
ラで撮影した画像において、照度分布補正処理、2値化
処理、形状処理を行って、透明板状体の欠点を検知する
ことを特徴とする。
Further, the above-mentioned defect detecting method is characterized in that an illuminance distribution correction process, a binarization process, and a shape process are performed on an image photographed by a CCD camera to detect a defect of a transparent plate-like body. .

【0007】また、透明板状体に帯状に照明する照明器
と、該照明器と透明板状体を結ぶ垂線上に配設したCC
Dカメラと、該CCDカメラと該透明板状体の間におい
て該CCDカメラと該照明器を結ぶ線上に配置した遮光
板とからなることを特徴とする前述の欠点検出方法に用
いる検出装置である。
Further, an illuminator for illuminating the transparent plate in a strip shape and a CC disposed on a perpendicular line connecting the illuminator and the transparent plate.
A detection device for use in the above-described defect detection method, comprising: a D camera; and a light shielding plate disposed on a line connecting the CCD camera and the illuminator between the CCD camera and the transparent plate. .

【0008】[0008]

【作用】欠点の散乱光により欠点を検出する方法におい
て、微細な線状の欠点をもれなく検出するために、散乱
光を用いて欠点をあらゆる方向から照明する。散乱光で
照明された欠点において、欠点による散乱光も照明光の
進む方向とほぼ同じ方向に進む光が強い。このため、C
CDカメラで光源を直接見るような光学系にすれば、欠
点からの散乱光を多量に検知できる。しかし、この光学
系では、光源の光りも直接CCDカメラに入射するた
め、CCDカメラで撮影する画像は背景が明るすぎて欠
点の検知がほとんどできない。
In the method of detecting a defect by the scattered light of the defect, the defect is illuminated from all directions by using the scattered light in order to detect all fine linear defects. Among the defects illuminated by the scattered light, the scattered light due to the defect has a strong light traveling in almost the same direction as the direction of the illumination light. Therefore, C
If the optical system is configured to directly view the light source with a CD camera, a large amount of scattered light from a defect can be detected. However, in this optical system, since the light from the light source also directly enters the CCD camera, the background of the image photographed by the CCD camera is too bright and the detection of a defect is hardly possible.

【0009】そのため、光源の光が直接CCDカメラに
入射しないように、スリットで光源の光の一部を板状体
に入射する方法があるが、スリットの開いたところと光
源を結ぶ線上に近いところでないと、キズなどの微細な
欠点からの散乱光を結像させることはかなり難しく、光
源の位置とCCDカメラの位置を試行錯誤を繰り返して
調整しなければならず、また、欠点からの散乱光が欠点
の中を光ガイドのように伝播する傾向があり、欠点の一
部のみを照明すると、前述の効果が小さくなり、欠点の
散乱光の量が減少して、検知にかからない欠点もある。
To prevent the light from the light source from being directly incident on the CCD camera, there is a method in which a part of the light from the light source is incident on the plate-like body by using a slit. However, it is close to a line connecting the opening of the slit and the light source. However, it is very difficult to image scattered light from minute defects such as scratches, so the position of the light source and the position of the CCD camera must be adjusted by trial and error, and the scattering from the defects is also difficult. Light tends to propagate through the defect like a light guide, and illuminating only a part of the defect reduces the aforementioned effects, reduces the amount of scattered light of the defect and has some disadvantages that do not affect detection .

【0010】本発明の透明板状体とCCDカメラの間に
遮光板を設ける方法は、前述の不具合を無くし、欠点か
らの散乱光を多量に検知でき、しかも光源の光を遮るこ
とができ、微細な欠点をもれなく検出できる有効な方法
である。
The method of the present invention in which a light-shielding plate is provided between a transparent plate and a CCD camera eliminates the above-mentioned problems, can detect a large amount of scattered light from the defects, and can block light from a light source. This is an effective method that can detect fine defects without fail.

【0011】[0011]

【発明の実施の形態】透明板状体の下あるいは上から照
明器を用いて、帯状に透明板状体を照明する。
BEST MODE FOR CARRYING OUT THE INVENTION A transparent plate-like body is illuminated from below or above a transparent plate-like body using an illuminator.

【0012】照明器にはハロゲンランプ、キセノンラン
プ、高圧水銀灯、ナトリウムランプなどの光源を用い、
光源の光を遮光したり、板状あるいはロッド状の光ガイ
ドを用いて、透明板状体を帯状に照明する。透明板状体
に入射する光は磨りガラスなどのディフューザーを用い
るか、光ガイドの射出側に凹凸処理をして散乱光にす
る。また光源に棒状の蛍光灯を用いても良い。
Light sources such as a halogen lamp, a xenon lamp, a high-pressure mercury lamp, and a sodium lamp are used for the illuminator.
The light from the light source is shielded, or the plate-shaped or rod-shaped light guide is used to illuminate the transparent plate-like body in a band-like manner. The light incident on the transparent plate is made to be a scattered light by using a diffuser such as frosted glass or by subjecting the exit side of the light guide to an uneven treatment. Further, a rod-shaped fluorescent lamp may be used as the light source.

【0013】透明板状体の照明された部分を、透明板状
体の照明器とは反対側に設置されたCCDカメラで撮影
する。CCDカメラと透明板状体と光源は直線上に配置
する。透明板状体とCCDカメラの間に、遮光板を設
け、該遮光板は光源とCCDカメラを結ぶ直線上で移動
して、CCDカメラに光源の光が直接入射しないように
するとともに、CCDカメラに入射する光量を調整す
る。欠点の輝度を大きくするために、遮光板は透明板状
体に近い位置にすることが望ましく、また遮光板の位置
を調整しやすくするため、光源とCCDカメラは、光源
とCCDカメラとを結ぶ線が透明板状体に直角になるよ
うに配置することが望ましい。透明板状体を水平に置
き、CCDカメラ、遮光板および照明器を垂直に配置す
るか、または透明板状体を垂直に立て、CCDカメラ、
遮光板および照明器を水平に配置する。
The illuminated portion of the transparent plate is photographed by a CCD camera installed on the side opposite to the illuminator of the transparent plate. The CCD camera, the transparent plate and the light source are arranged on a straight line. A light-shielding plate is provided between the transparent plate and the CCD camera, and the light-shielding plate moves on a straight line connecting the light source and the CCD camera so that light from the light source does not directly enter the CCD camera. Adjust the amount of light incident on. In order to increase the luminance of the defect, it is desirable that the light-shielding plate is located at a position close to the transparent plate-like body, and in order to easily adjust the position of the light-shielding plate, the light source and the CCD camera connect the light source and the CCD camera. It is desirable that the lines are arranged at right angles to the transparent plate. Place the transparent plate horizontally, and arrange the CCD camera, light shield plate and illuminator vertically, or stand the transparent plate vertically, CCD camera,
The light shield and the illuminator are arranged horizontally.

【0014】透明板状体の全体を検査するために、透明
板状体を固定して、光源、遮光板およびCCDカメラを
移動するか、あるいは光源、遮光板およびCCDカメラ
を固定して、透明板状体を移動する。
In order to inspect the entire transparent plate, the transparent plate is fixed and the light source, the light shielding plate and the CCD camera are moved, or the light source, the light shielding plate and the CCD camera are fixed and the transparent plate is fixed. Move the plate.

【0015】遮光板は、欠点の像との明るさの差異を大
きくするため、黒色であることが好ましい。また、遮光
板の端部で光が散乱しないように、遮光板の端部をナイ
フエッジの形状にしておくことが望ましい。
The light shielding plate is preferably black in order to increase the difference in brightness from the defect image. Further, it is desirable that the end of the light-shielding plate has a knife-edge shape so that light is not scattered at the end of the light-shielding plate.

【0016】CCDカメラは通常のカメラでも良いが、
遮光板の近傍のみの画像において、欠点の散乱光が強
く、従って遮光板の近傍のみの画像をデータ処理した方
が好ましく、1本の走査線のみを撮影するようにしたラ
インカメラを用いることが望ましい。
The CCD camera may be an ordinary camera,
In an image only in the vicinity of the light-shielding plate, the scattered light of the defect is strong. Therefore, it is preferable to perform data processing on the image only in the vicinity of the light-shielding plate, and use a line camera that captures only one scanning line. desirable.

【0017】また光源発光部分以外のカメラ視野の背景
となる部分は無反射の黒色塗装等を行い、余分な反射光
がカメラに入光しないことが望ましい。
It is desirable that a non-reflective black paint or the like be applied to a portion of the camera field of view other than the light source light emitting portion so that extra reflected light does not enter the camera.

【0018】ラインカメラを用いる場合、光源とカメラ
の光軸および視野の位置関係は面状もしくは棒状の光源
発光部のエッジ周辺またはエッジから僅かに離れた部分
を観察するよう合わせる。この際、光源からの直接光は
カメラ受光部にはほとんど入射しないはずであるが、実
際には若干の光が入射する。
When a line camera is used, the positional relationship between the light source, the optical axis of the camera, and the field of view is adjusted so as to observe the periphery or slightly away from the edge of the planar or rod-shaped light emitting portion. At this time, the direct light from the light source should hardly enter the camera light receiving unit, but a small amount of light actually enters.

【0019】この光を減少させるためには光軸をさらに
光源発光部分からずらす方法も考えられるが、これでは
欠陥自身の散乱光が減ってしまうため望ましくなく、本
発明では遮光板を透明体とカメラの間に挿入して光源か
らの余分な光をカットする。
In order to reduce this light, a method of further shifting the optical axis from the light emitting portion of the light source is conceivable. However, this is not desirable because the scattered light of the defect itself is reduced. Insert between the cameras to cut off extra light from the light source.

【0020】CCDカメラで撮影された透明板状体の像
は、照度調整処理を行った後に、像の明るさをCCDカ
メラの分解能に対応させて、明と暗との2値化処理す
る。さらに、2値化処理されたデータの明の部分を幅と
長さに形状処理して、欠点の認識処理を行う。
The image of the transparent plate-like object photographed by the CCD camera is subjected to illuminance adjustment processing, and then subjected to binarization processing of light and dark in accordance with the brightness of the image according to the resolution of the CCD camera. Further, the bright portion of the binarized data is shaped into a width and a length, and a defect recognition process is performed.

【0021】CCDカメラで撮影された画像は、CCD
カメラからのデータをそのまま画像データとして小型の
パーソナルコンピュータあるいは中型のワークステーシ
ョンなどのコンピュータに取り込み、コンピュータに予
め組み込まれたプログラムで画像処理をしても良く、あ
るいはCCDカメラとコンピュータの間に画像処理機を
設け、照度調整から2値化までを画像処理機で行い、形
状による欠点としての認識処理をコンピュータに組み込
まれた手順で行っても良い。
An image captured by a CCD camera is a CCD camera.
The data from the camera can be directly taken as image data into a computer such as a small personal computer or a medium-sized workstation, and image processing can be performed using a program pre-installed in the computer, or image processing can be performed between the CCD camera and the computer. An image processor may be used to perform illumination adjustment to binarization, and recognition processing as a defect due to shape may be performed by a procedure incorporated in a computer.

【0022】[0022]

【実施例】以下、図面を参照しながら本発明を詳細に説
明する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, the present invention will be described in detail with reference to the drawings.

【0023】実施例1 図1および図2は、実施例1の光学系の概略側面図と概
略平面図である。
First Embodiment FIGS. 1 and 2 are a schematic side view and a schematic plan view of an optical system according to a first embodiment.

【0024】厚み5mmのフロート板ガラスの透明板状
体3を下方から照明器6で照明し、ラインカメラ1で透
明板状体3を撮影した。照明器6には、ハロゲンランプ
の光をロッド状の光ガイドで広げ、透明板状体3を帯状
に照明する照明器を用いた。照明範囲5に対して、遮光
板4を該遮光板4のエッジがラインカメラ1の撮影像の
中心になるように配置した。さらに、照明器6の光が直
接ラインカメラに入射しないように、照明器6の位置を
ラインカメラ1の真下からずらした。
The transparent plate 3 made of float glass having a thickness of 5 mm was illuminated from below by an illuminator 6, and the transparent plate 3 was photographed by the line camera 1. As the illuminator 6, an illuminator that spreads the light of a halogen lamp with a rod-shaped light guide and illuminates the transparent plate 3 in a band shape was used. With respect to the illumination range 5, the light-shielding plate 4 was arranged such that the edge of the light-shielding plate 4 became the center of the image captured by the line camera 1. Further, the position of the illuminator 6 was shifted from immediately below the line camera 1 so that the light from the illuminator 6 did not directly enter the line camera.

【0025】照明器6の透明板状体3の照明範囲5は、
欠点からの散乱光が減少しないように、照明器6を透明
板状体3の下300mmに設置し、幅200mmの幅で
帯状に透明板状体3を照明した。
The illumination range 5 of the transparent plate 3 of the illuminator 6 is
The illuminator 6 was installed 300 mm below the transparent plate 3 so that the scattered light from the defect did not decrease, and the transparent plate 3 was illuminated in a band shape with a width of 200 mm.

【0026】ラインカメラ1による撮影を透明板状体3
を移動させながら行い、遮光板4のエッジ近傍に見える
透明板状体3をライン状に撮影した。
The photographing by the line camera 1 is performed by the transparent plate 3
Was performed while moving, and the transparent plate-like body 3 seen near the edge of the light-shielding plate 4 was photographed in a line shape.

【0027】ラインカメラ1で撮影したライン状の画像
を、画像処理機10により、照度調整処理および2値化
処理を行った。画像処理機10で画像処理されたライン
状の画像をパーソナルコンピュータ11に取り込み、透
明板状体全体につなぎ合わせ、図4に示すような透明板
状体全体の合成画像12を作成した。合成画像12には
透明板状体の像9の中にキズ欠点7が明るい像として現
れる。さらにパーソナルコンピュータ11を用いて、明
の部分のキズ欠点7の幅と長さについて形状解析を行
い、欠点としての認識を行った。
The linear image taken by the line camera 1 was subjected to illuminance adjustment processing and binarization processing by the image processor 10. The linear image processed by the image processor 10 was taken into a personal computer 11 and connected to the entire transparent plate to form a composite image 12 of the entire transparent plate as shown in FIG. In the composite image 12, the flaw 7 appears as a bright image in the image 9 of the transparent plate. Further, using the personal computer 11, shape analysis was performed on the width and length of the flaw 7 in the bright part, and the defect was recognized as a flaw.

【0028】本実施例において、図4に示す合成画像1
2のキズ欠点7は、幅が50μm程度のものまで検出可
能であった。
In this embodiment, the composite image 1 shown in FIG.
The scratch defect 7 of No. 2 was detectable up to a width of about 50 μm.

【0029】実施例2 図5および図6は、実施例2の光学系の概略側面図と概
略平面図である。CCDカメラにエリアカメラ1’を用
い、CCDカメラ1’の中心、遮光板4の中心および照
明器6の中心を、透明板状体3に対して垂直にほぼ1直
線上に配置した他は、実施例1と同様である。
Second Embodiment FIGS. 5 and 6 are a schematic side view and a schematic plan view of an optical system according to a second embodiment. An area camera 1 ′ is used as the CCD camera, and the center of the CCD camera 1 ′, the center of the light shielding plate 4, and the center of the illuminator 6 are arranged on a substantially straight line perpendicular to the transparent plate 3. This is similar to the first embodiment.

【0030】エリアカメラ1’では、図7に示すように
な画像12’が撮影され、画像12’に遮光板4の陰8
が現れる。欠点は遮光板4のエッジ周辺で検出されるた
め、この場合は、透明板状体3を移動させて、透明板状
体3の全体を検査できる必要枚数を撮影し、それぞれの
撮影した画像12’について、画像処理装置10で照度
補正と2値化を行い、パーソナルコンピュータ11でキ
ズ欠点7の幅と長さの形状処理を行い、欠点としての認
識を行った。
The area camera 1 'captures an image 12' as shown in FIG.
Appears. Since the defect is detected around the edge of the light-shielding plate 4, in this case, the transparent plate 3 is moved to photograph the required number of sheets capable of inspecting the entire transparent plate 3, and each photographed image 12 For ', the image processing apparatus 10 performed illuminance correction and binarization, and the personal computer 11 performed shape processing of the width and length of the flaw defect 7 to recognize the defect.

【0031】本実施例においても、図7に示すキズ欠点
7は幅50μm程度のものまで検出できた。
Also in this embodiment, the flaw 7 shown in FIG. 7 can be detected up to a width of about 50 μm.

【0032】[0032]

【発明の効果】本発明の欠点検出方法および検出装置
は、従来困難とされてきた透明板状体のヘアラインのよ
うな微細な欠点の検出を可能にするものである。
The method and apparatus for detecting a defect according to the present invention make it possible to detect a minute defect such as a hairline of a transparent plate which has been conventionally difficult.

【図面の簡単な説明】[Brief description of the drawings]

【図1】実施例1の光学系の概略側面図。FIG. 1 is a schematic side view of an optical system according to a first embodiment.

【図2】実施例1の光学系の概略平面図。FIG. 2 is a schematic plan view of the optical system according to the first embodiment.

【図3】CCDカメラで撮影した画像を解析する装置の
構成図。
FIG. 3 is a configuration diagram of an apparatus that analyzes an image captured by a CCD camera.

【図4】実施例1で撮影されるキズ欠点を概念的に示し
た図
FIG. 4 is a diagram conceptually showing a defect of a flaw photographed in the first embodiment.

【図5】実施例2の光学系の概略側面図。FIG. 5 is a schematic side view of an optical system according to a second embodiment.

【図6】実施例2の光学系の概略平面図。FIG. 6 is a schematic plan view of an optical system according to a second embodiment.

【図7】実施例2で撮影されるキズ欠点を概念的に示し
た図。
FIG. 7 is a diagram conceptually showing a flaw of a flaw photographed in the second embodiment.

【符号の説明】[Explanation of symbols]

1 CCDカメラ 1’ CCDラインカメラ 2、2’撮影範囲 3 透明板状体 4 遮光板 5 照明範囲 6 照明器 7 キズ欠点 8 遮光板の陰 9 透明板状体の画像 10 画像処理装置 11 パーソナルコンピュータ 12 合成画像像 12’ エリアカメラで撮影される画像 REFERENCE SIGNS LIST 1 CCD camera 1 ′ CCD line camera 2, 2 ′ shooting range 3 transparent plate 4 light shielding plate 5 illumination range 6 illuminator 7 scratch defect 8 shadow of light shielding plate 9 image of transparent plate 10 image processing device 11 personal computer 12 Composite image 12 'Image taken with area camera

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】透明板状体に光を当て、透過する光を用い
る透明板状体の欠点検出方法において、多点を光源にす
る散乱光を透明板状体に入射し、該透明板状体をCCD
カメラで撮影し、CCDカメラと透明板状体との間に、
光源とCCDカメラを結ぶ直線上で移動可能な遮光板を
設けて、光源の光が直接カメラに入射しないようにした
ことを特徴とする欠点検出方法。
In a method for detecting a defect of a transparent plate using light transmitted through the transparent plate, a scattered light having a plurality of points as a light source is incident on the transparent plate, and the light is transmitted to the transparent plate. CCD body
Take a picture with a camera, between the CCD camera and the transparent plate
A defect detection method, comprising: providing a light-shielding plate movable on a straight line connecting a light source and a CCD camera so that light from the light source does not directly enter the camera.
【請求項2】CCDカメラで撮影した画像において、照
度分布補正処理、2値化処理、形状処理を行って、透明
板状体の欠点を検知することを特徴とする請求項1に記
載の欠点検出方法。
2. The defect according to claim 1, wherein an illuminance distribution correction process, a binarization process, and a shape process are performed on the image photographed by the CCD camera to detect a defect of the transparent plate. Detection method.
【請求項3】透明板状体に帯状に照明する照明器と、該
照明器と透明板状体を結ぶ垂線上に配設したCCDカメ
ラと、該CCDカメラと該透明板状体の間において該C
CDカメラと該照明器を結ぶ線上に配置した遮光板とか
らなることを特徴とする請求項1または2に記載の欠点
検出方法に用いる検出装置。
3. An illuminator for illuminating the transparent plate in a strip shape, a CCD camera arranged on a perpendicular line connecting the illuminator and the transparent plate, and a light source between the CCD camera and the transparent plate. The C
3. The detecting apparatus according to claim 1, comprising a CD camera and a light shielding plate arranged on a line connecting the illuminator.
JP32824099A 1999-11-18 1999-11-18 Method and apparatus for detecting flaw of transparent plate-shaped object Pending JP2001141662A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP32824099A JP2001141662A (en) 1999-11-18 1999-11-18 Method and apparatus for detecting flaw of transparent plate-shaped object

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP32824099A JP2001141662A (en) 1999-11-18 1999-11-18 Method and apparatus for detecting flaw of transparent plate-shaped object

Publications (1)

Publication Number Publication Date
JP2001141662A true JP2001141662A (en) 2001-05-25

Family

ID=18208016

Family Applications (1)

Application Number Title Priority Date Filing Date
JP32824099A Pending JP2001141662A (en) 1999-11-18 1999-11-18 Method and apparatus for detecting flaw of transparent plate-shaped object

Country Status (1)

Country Link
JP (1) JP2001141662A (en)

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100490455B1 (en) * 2001-09-26 2005-05-19 가부시키가이샤 도쿄 웰드 Appearance examining apparatus
JP2005300439A (en) * 2004-04-15 2005-10-27 Central Glass Co Ltd Method for detecting defect in transparent-plate-like body and its apparatus
JP2010048745A (en) * 2008-08-25 2010-03-04 Asahi Glass Co Ltd Defect inspection system and defect inspection method
CN102788798A (en) * 2011-05-16 2012-11-21 芝浦机械电子装置股份有限公司 Bonding plate-shaped body checking device and method
CN103185727A (en) * 2011-12-31 2013-07-03 芝浦机械电子装置股份有限公司 Inspection system and inspection method
CN103185726A (en) * 2011-12-31 2013-07-03 芝浦机械电子装置股份有限公司 Illumination system, illumination method, and inspection system
WO2013146023A1 (en) * 2012-03-30 2013-10-03 東京特殊電線株式会社 Laminate inspection method, laminate inspection device and laminate manufacturing apparatus
CN106950485A (en) * 2017-03-24 2017-07-14 京东方科技集团股份有限公司 A kind of tester substrate microscope carrier and substrate test equipment
WO2018045280A1 (en) * 2016-09-01 2018-03-08 3M Innovative Properties Company Machine direction line film inspection
CN109781743A (en) * 2017-11-14 2019-05-21 鹤立精工股份有限公司 Optical detecting method

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0882602A (en) * 1994-09-13 1996-03-26 Nippon Electric Glass Co Ltd Method and apparatus for inspecting fault of plate glass
JPH0894532A (en) * 1994-09-22 1996-04-12 Fuji Photo Film Co Ltd Surface inspection device
JPH08201313A (en) * 1995-01-31 1996-08-09 Asahi Glass Co Ltd Defect inspection method for transparent plate-like body and device thereof
JPH09189665A (en) * 1996-01-10 1997-07-22 Nippon Sheet Glass Co Ltd Dark field illumination device used for defect inspecting device

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0882602A (en) * 1994-09-13 1996-03-26 Nippon Electric Glass Co Ltd Method and apparatus for inspecting fault of plate glass
JPH0894532A (en) * 1994-09-22 1996-04-12 Fuji Photo Film Co Ltd Surface inspection device
JPH08201313A (en) * 1995-01-31 1996-08-09 Asahi Glass Co Ltd Defect inspection method for transparent plate-like body and device thereof
JPH09189665A (en) * 1996-01-10 1997-07-22 Nippon Sheet Glass Co Ltd Dark field illumination device used for defect inspecting device

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100490455B1 (en) * 2001-09-26 2005-05-19 가부시키가이샤 도쿄 웰드 Appearance examining apparatus
JP2005300439A (en) * 2004-04-15 2005-10-27 Central Glass Co Ltd Method for detecting defect in transparent-plate-like body and its apparatus
JP2010048745A (en) * 2008-08-25 2010-03-04 Asahi Glass Co Ltd Defect inspection system and defect inspection method
WO2010024082A1 (en) * 2008-08-25 2010-03-04 旭硝子株式会社 Defect inspecting system, and defect inspecting method
CN102788798A (en) * 2011-05-16 2012-11-21 芝浦机械电子装置股份有限公司 Bonding plate-shaped body checking device and method
CN103185726A (en) * 2011-12-31 2013-07-03 芝浦机械电子装置股份有限公司 Illumination system, illumination method, and inspection system
CN103185727A (en) * 2011-12-31 2013-07-03 芝浦机械电子装置股份有限公司 Inspection system and inspection method
WO2013146023A1 (en) * 2012-03-30 2013-10-03 東京特殊電線株式会社 Laminate inspection method, laminate inspection device and laminate manufacturing apparatus
CN103363896A (en) * 2012-03-30 2013-10-23 东京特殊电线株式会社 Laminate inspection method, laminate inspection device and laminate manufacturing apparatus
JPWO2013146023A1 (en) * 2012-03-30 2015-12-10 東京特殊電線株式会社 Laminate inspection method, laminate inspection apparatus, and laminate manufacturing apparatus
WO2018045280A1 (en) * 2016-09-01 2018-03-08 3M Innovative Properties Company Machine direction line film inspection
CN106950485A (en) * 2017-03-24 2017-07-14 京东方科技集团股份有限公司 A kind of tester substrate microscope carrier and substrate test equipment
CN109781743A (en) * 2017-11-14 2019-05-21 鹤立精工股份有限公司 Optical detecting method

Similar Documents

Publication Publication Date Title
JP4511978B2 (en) Surface flaw inspection device
TW201616123A (en) System and method for defect detection
JP2004037248A (en) Inspection device and inspection method for through hole
JPH11337504A (en) Inspection method and apparatus for discriminating defects in glass sheet
US20100245560A1 (en) Method and device for imaging a fragmentation pattern formed in a ply of toughened glass
JP5542367B2 (en) Visual inspection device and optical device for visual inspection
JP2001141662A (en) Method and apparatus for detecting flaw of transparent plate-shaped object
JP2002214158A (en) Defect detecting method and detecting device for transparent plate-like body
KR102162693B1 (en) System and method for defect detection
JP2002039952A (en) Apparatus and method for inspecting defect
JPH07234187A (en) Method and device for detecting surface detect of glass substrate
JPH11316195A (en) Surface defect detecting device of transparent plate
JP2013246059A (en) Defect inspection apparatus and defect inspection method
KR20110125906A (en) Reticle inspection method and the apparatus
JPH07104290B2 (en) Bottle inspection equipment
JP2001272354A (en) Defect inspecting apparatus
JP2507421B2 (en) Observation device for the subject
JPH11248643A (en) Detection device for foreign matter in transparent film
JP2002148206A (en) Method and apparatus for detecting defect of transparent sheet-shaped body
JP3339416B2 (en) Quality inspection equipment using epi-illumination
JP2003083904A (en) Method and device for detecting defect of transparent plate-shaped body
JP4212711B2 (en) Metal surface inspection method and apparatus
JP2002014058A (en) Method and apparatus for checking
KR20160032576A (en) System and Method for Analyzing Image Using High-Speed Camera and Infrared Optical System
JPH09189665A (en) Dark field illumination device used for defect inspecting device

Legal Events

Date Code Title Description
A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20040421

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20040427

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20040525

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20040706

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20040831

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20041119