JPH07325043A - Inspection apparatus - Google Patents

Abstract

PURPOSE:To carry out positioning work of an inspection point precisely and efficiently by computing a next image taking position based on the shift distance of the previous image taking position. CONSTITUTION:A programmer and an inspector give various kinds of commands to a control part through keys of an operation part 22. Based on the various kinds of the commands from the operation part 22, a control part 20 controls operation of each part and at the same time carries out computation for repeat operation and equally dividing operation. A memory part 24 stores the inspection point (the image taking position) instructed by the programmer as an inspection program and at the same time stores the image taking position given from the control part 20. A driving part 23 controls the image taking position and the image taking direction of an image taking part 25 based on an instruction from the control part 20. The image taking part 25 takes images of an object to be inspected and gives obtained image data to a monitor apparatus 21. Since the next image taking position is calculated based on the shifted distance of the previous image taking position, the positioning of the next image taking position can be carried out automatically.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an inspection device for picking up an image of an inspection object and inspecting it on a screen.

[0002]

2. Description of the Related Art When an electronic device is constructed by using various electronic parts, after the electronic parts are arranged on a printed circuit board on which pattern wiring is formed, the lead wires of the electronic parts are patterned on the printed circuit board. Solder to. After mounting the electronic components, it is necessary to inspect the soldering state of the lead wires of each electronic component and the pattern wiring of the printed circuit board, the bending degree of the lead wires, and the like. Therefore, it is often difficult to perform a sufficient examination with the naked eye.

In such a case, an inspection device has been developed which is capable of taking an image of a printed circuit board on which electronic components are mounted and performing an inspection based on an enlarged image on the screen.
In this inspection apparatus, the imaging device is arranged in the left-right direction (hereinafter, referred to as X direction) and the front-back direction (hereinafter, Y direction) with respect to the inspection object.
It is possible to magnify and observe an arbitrary portion of the inspection object on the screen while moving it relative to the direction).

[0004]

Recently, an inspection apparatus has been developed which can program an inspection procedure by storing a plurality of inspection points of an inspection object in advance. The creator of the inspection program moves the imaging device in the X direction or the Y direction while observing the inspection object on the screen, and sequentially stores the inspection points in the inspection device as the inspection program. At the time of inspection, the inspection program is executed, the imaging device automatically moves to a predetermined inspection point of the inspection object, and images of the inspection point are sequentially displayed on the screen. As a result, the work of positioning the inspection points by the inspector is automated.

For example, an inspection object 10 as shown in FIG.
Consider the case of creating an inspection program. The inspection object 10 in FIG. 9 is a 30-pin IC. Here, it is assumed that a single imaging range of the imaging device is three and a half pins.

In this case, first, as shown in FIG. 9A, the image pickup device is moved to the image pickup position A, and the image pickup position A is set to 1.
Write in the inspection program as the second inspection point. next,
As shown in FIG. 9B, the imaging device is moved to the imaging position B, and the imaging position B is written in the inspection program as the second inspection point. Furthermore, as shown in (c) of FIG.
The imaging device is moved to the imaging position C, and the imaging position C is written in the inspection program as the third inspection point. Since the inspection object of FIG. 9 has 15 pins on one side, it is necessary to perform 10 positioning operations to inspect the pins on both sides and write 10 inspection points in the inspection program. Therefore, there is a problem that it takes time to create the inspection program.

Further, since all pins of the IC have the same shape and almost the same image is displayed on the screen, it is often difficult to know which pin is being viewed while the image pickup apparatus is moving. Therefore, there is a problem that a part of the inspection object is skipped and an inspection point is set.

Therefore, it is an object of the present invention to provide an inspection apparatus which can accurately and efficiently perform an inspection point positioning operation.

[0009]

[Means for Solving the Problems]

(1) 1st invention The inspection apparatus which concerns on 1st invention WHEREIN: The imaging means which images an inspection target object, the moving means which moves the imaging position of the inspection object by an imaging means, and the last imaging position by a moving means. And a calculation unit that calculates the next imaging position based on the moving distance of the.

(2) Second Invention In the inspection apparatus according to the second invention, in the configuration of the inspection apparatus according to the first invention, the calculating means moves from the current imaging position by the same distance as the previous moving distance. The calculated position is calculated as the next imaging position.

(3) Third Aspect of the Invention An inspection apparatus according to a third aspect of the present invention comprises image pickup means for picking up an image of an inspection object, moving means for moving an image pickup position of the inspection object by the image pickup means, and image pickup means. And an arithmetic means for calculating an intermediate image pickup position based on the first image pickup position and the second image pickup position.

(4) Fourth Invention In the inspection apparatus according to the fourth invention, in the configuration of the inspection apparatus according to the third invention, the calculating means includes the first imaging position and the second imaging position.
It is characterized in that a position obtained by equally dividing the distance from the image pickup position of 1 to a given number is calculated as an intermediate image pickup position.

[0013]

In the inspection apparatus according to the first and second aspects of the present invention, since the next image pickup position is calculated based on the previous moving distance, the positioning work of the next image pickup position is automatically performed.

In particular, in the inspection apparatus according to the second aspect of the present invention, since the position moved by the same distance as the previous moving distance from the current position becomes the next image pickup position, the image pickup position is first moved by the predetermined distance. After that, the image pickup positions can be automatically moved sequentially by the same distance. Therefore, the work of positioning the inspection point of the inspection object can be performed accurately and efficiently.

In the inspection apparatus according to the third and fourth aspects of the invention, since the intermediate image pickup position is calculated based on the first image pickup position and the second image pickup position, the positioning work of the plurality of image pickup positions is automatically performed. Is done in a regular manner.

In particular, in the inspection apparatus according to the fourth aspect of the invention, the equidistant points of the first and second image pickup positions are set to intermediate image pickup positions only by defining the first image pickup position and the second image pickup position. The positioning work can be performed accurately and efficiently.

[0017]

Embodiments of the present invention will now be described in detail with reference to the drawings. FIG. 1 is a block diagram showing the configuration of an inspection apparatus according to an embodiment of the present invention.

The inspection apparatus of FIG. 1 includes a control unit 20, a monitor device 21, an operation unit 22, a drive unit 23, a storage unit 24 and an image pickup unit 25. The program creator and the inspector can give various commands to the control unit 20 by using various keys of the operation unit 22. The control unit 20 uses the monitor unit 21, the drive unit 23, and the storage unit 2 based on various commands from the operation unit 22.
4 and the operation of the image pickup unit 25, as well as calculation and control for a repeat operation and an even division operation described later.

The storage unit 24 stores the inspection point (imaging position) designated by the program creator as an inspection program, and also stores the imaging position given by the control unit 20. The drive unit 23 controls the image pickup position and the image pickup direction of the image pickup unit 25 according to an instruction from the control unit 20. The image capturing unit 25 captures an image of the inspection target in response to the control signal from the control unit 20, and provides the monitor device 21 with the image data obtained by the image capturing. The monitor device 21 includes an imaging unit 25.
The image data given by is displayed on the screen as an image.

FIG. 2 is a schematic perspective view mainly showing the structure of the image pickup section of the inspection apparatus of FIG. In FIG. 2, the X table 1 is movable in the X direction, and the inspection device main body (not shown).
Is attached to. A drive mechanism 2 for rotating and vertically moving the drive shaft 2a is attached to a lower portion of the X table 1. A support member 3 is attached to the lower end of the drive shaft 2 a, and an arcuate arm member 4 is slidably attached to the support member 3 at the lower end of the support member 3. A fixing member 5 is attached to one side surface of the arm member 4, and a cylindrical imaging head 6 is attached to the fixing member 5. The imaging head 6 has a lens and a CCD camera built therein. Further, a vibration absorbing damper 7 is attached to a side portion of the support member 3.

Below the support member 3, a Y table 8 is attached to an inspection apparatus body (not shown) so as to be movable in the Y direction. A support table 9 having a tilt adjusting mechanism is attached to the upper portion of the Y table 8. An inspection object 10 such as a printed circuit board on which electronic components are mounted is placed on the support table 9.

Two illuminators 11 made of, for example, white fluorescent lamps are arranged on both sides of the support table 9 and below the upper surface of the support table 9. Then, the measurement case 12 is installed so as to surround the support member 3 and the two illuminators 11. In the figure, the measurement case 12 is shown by a broken line for convenience. The front part 121 of the measurement case 12 is slidable up and down.
By sliding 1 upward, the inspection object 10 can be replaced from the front surface of the measurement case 12. In addition, a groove 123 is formed in the center of the upper surface 122 of the measurement case 12.
Is formed, and the drive shaft 2a is movable in the X direction in the groove 123.

A white paint is applied to the inner surface of the measuring case 12 as a diffusion paint. Thereby, the light emitted from the illuminator 11 is diffused on the inner surface of the measurement case 12, and the surface of the inspection object 10 is irradiated with the diffused light.

A drive motor (not shown) for moving the X table 1, a drive motor (not shown) for moving the Y table 8, a drive mechanism 2, an imaging head 6
The CCD camera and the two illuminators 11 built in the
It is connected to the controller 13 via a cable 15.

The controller 13 contains the control unit 20, the drive unit 23, the storage unit 24 and the power supply circuit shown in FIG. Various commands are given to the controller 13 by the operation unit 22. By operating the keys of the operation unit 22 by the program creator or the inspector, the illuminator 11 is turned on / off, the X table 1 is moved, the Y table 8 is moved,
It is possible to instruct the imaging by the imaging head 6 and the rotation and vertical movement of the drive shaft 2a. Controller 13
1 is connected to the monitor device 21, and the image obtained by the imaging head 6 is displayed on the monitor device 21.

FIG. 3 is a diagram showing the main keys of the operation unit 22. As shown in FIG. 3, the operation unit 22 displays on the screen the left rotation key RL for rotating the imaging direction to the left, the right rotation key RR for rotating the imaging direction to the right, and the imaging position of the imaging head 6 on the screen. It has a left shift key L for moving to the left, a right shift key R for moving to the right, an upper shift key U for moving up, and a lower shift key D for moving down. Further, the operation unit 2
Reference numeral 2 denotes a teaching mode key TC for setting the control unit 20 in a teaching mode, a repeat key RP for instructing a repeat operation, an equal division key DV for instructing an equal division operation, and a key input for clearing a key input. It has a clear key CL, a scroll key SC for instructing a scroll operation, and a return key RT for confirming a key input.

Next, the repeat operation of the inspection apparatus of FIG. 1 will be described with reference to the flowchart of FIG. First, when the program creator presses the teaching mode key TC of the operation unit 22, the inspection apparatus is set to the inspection program creation state (step S1). When the teaching mode key TC is pressed again after creating the inspection program, the teaching mode is released and the inspection device is set to the inspection mode.

In the teaching mode, the program creator uses the shift keys L, R, U, D of the operation unit 22 to move the image pickup head 6 to the first image pickup position P ₁ (step S2), and then presses the return key RT. When pressed (step S3), the control unit 20 sets the first imaging position P ₁ to the storage unit 2
4 (step S4).

Next, the program creator moves the image pickup head 6 to the second image pickup position P ₂ by using the shift keys L, R, U, D of the operation section 22 (step S5), and then presses the return key RT. Then (step S6), the control unit 20 stores the second imaging position P ₂ in the storage unit 24 (step S6).
7).

After that, when the program creator presses the repeat key RP of the operation unit 22 (step S8), the control unit 2
0 reads out the previous image pickup position P _n−1, that is, the second image pickup position P ₂ and the second image pickup position P _n−2, that is, the first image pickup position P ₁ from the storage unit 24 (step S9). .
Then, the control unit 20 uses the following equation to calculate the image pickup position P two before.
A moving distance ΔP from _n−2 to the immediately preceding imaging position P _n−1 is calculated (step S10).

ΔP = P _n−1 −P _n−2 Further, the control unit 20 uses the following equation to obtain the current imaging position P _n.
Is calculated (step S11), and the calculated current imaging position P _n is stored in the storage unit 24 (step S12).

P _n = P _n-1 + ΔP Next, the control unit 20 instructs the drive unit 23 to move the imaging head 6 to the current imaging position P _n (step S
13), the drive unit 23 moves the imaging head 6 of the imaging unit 25 to the current imaging position P _n .

When the program creator further presses the repeat key RP of the operation unit 22 (step S8), step S8
The processing from 9 to step S13 is repeated. As a result, as shown in FIG. 5, the moving distance ΔP from the _first image pickup position P ₁ to the second image pickup position P _{2 is} increased from the image pickup position P ₂ to the image pickup position P ₃ , and from the image pickup position P ₃ to the image pickup position P. Every time the repeat key RP is pressed to ₄ , the imaging head 6 moves, and the imaging positions P ₁ , P ₂ , P ₃ , P ₄ are written in the inspection program as inspection points.

In this repeat operation, as shown in FIG. 5, even if the moving direction is diagonal, the image pickup position automatically moves by the initial moving distance ΔP. According to the above-mentioned repeat operation, the movement distance ΔP between the first image pickup position P ₁ and the second image pickup position P ₂ is set to be smaller than one screen, so that the pin pitch of the inspection object is changed to the screen. Even if the size does not match the size of, the entire object can be imaged without skipping a part of the inspection object.

Next, the equal division operation of the inspection apparatus of FIG. 1 will be described with reference to the flowchart of FIG. When the program creator presses the teaching mode key TC of the operation unit 22, the inspection device is set to the teaching mode (step S11). After the program creator moves the imaging head 6 to the first imaging position P ₁ by using the shift keys L, R, U, D of the operation unit 22 (step S12), and presses the return key RT (step 13), The control unit 20 stores the first imaging position P ₁ in the storage unit 24 (step S
14).

Next, the program creator moves the image pickup head 6 to the second image pickup position P ₂ with the shift keys L, R, U, D of the operation section 22 (step S15), and then presses the return key RT. (Step S16), the control unit 20
Stores the second imaging position P ₂ in the storage unit 24 (step S17).

Next, when the program creator presses the equal division key DV of the operation unit 22 (step S18), the control unit 20
Indicates to the program creator the number of divisions Q by the monitor device 21.
Is prompted (step S19). When the program creator inputs the number of divisions Q with the numeric keys (not shown) of the operation unit 22 (step S20), the control unit 20 calculates the moving distance d by the following equation (step S21).

D = (P ₂ -P ₁ ) / Q Next, the control section 20 calculates the intermediate image pickup position P (i) by the following equation (step S22).

P (i) = P ₁ + id Here, when Q = n, i = 1, 2, ..., N-1. For example, when the division number Q is 3, as shown in FIG. 7, an intermediate imaging position P (1), which is obtained by equally dividing the first imaging position P ₁ and the second imaging position P ₂ into three, P (2) is calculated, and the imaging positions P ₁ , P (1), P (2), and P ₂ are written in the inspection program as inspection points.

Also in this equal division operation, as shown in FIG. 7, even if the first image pickup position P ₁ and the second image pickup position P ₂ are in the oblique direction, the intermediate image pickup position is automatically calculated. To be done. According to the above-described equal division operation, by increasing the distance between the first imaging position P ₁ and the second imaging position P ₂ , the error of the movement amount is reduced and the number of repetitive operations is reduced. Be done.

As shown in FIG. 8, the inspection apparatus of FIG. 1 can also perform a scroll operation of scrolling the image pickup position left and right and front and back by one screen. When the program creator presses the scroll key SC and the left shift key L of the operation unit 22, the imaging head 6 moves to the position PL shifted left by one screen from the current imaging position P ₀ and presses the return key RT. The imaging position PL is written in the inspection program as an inspection point. Similarly, when the scroll key SC and the right shift key R are pressed, the imaging head 6 is moved to the current imaging position P _0.
From the current imaging position P ₀ to the position PU shifted up by one screen when the scroll key SC and the up shift key U are pressed, the image pickup head 6 moves to a position PU shifted up by one screen and scrolls. When the key SC and the down shift key D are pressed, the imaging head 6 moves to the position PD which is shifted down one screen from the current imaging position P ₀ .

According to the scroll operation described above, the entire inspection object can be sequentially imaged without overlapping.

[0043]

According to the first and second aspects of the present invention, since the next image pickup position is automatically calculated based on the previous moving distance, the positioning work of a plurality of inspection points can be performed accurately and efficiently. It becomes possible.

According to the third and fourth inventions, since the intermediate image pickup position is calculated based on the first image pickup position and the second image pickup position, the work of positioning a plurality of inspection points can be performed accurately and efficiently. It becomes possible to do well.

[Brief description of drawings]

FIG. 1 is a block diagram showing a configuration of an inspection apparatus according to an embodiment of the present invention.

FIG. 2 is a schematic perspective view mainly showing a configuration of an image pickup section of the inspection device of FIG.

FIG. 3 is a diagram showing main keys of an operation unit of the inspection device in FIG.

4 is a flowchart for explaining a repeat operation of the inspection device of FIG.

FIG. 5 is a diagram showing an example of a repeat operation.

FIG. 6 is a flowchart for explaining an equal division operation of the inspection device of FIG.

FIG. 7 is a diagram showing an example of an equal division operation.

8 is a diagram showing a scroll operation of the inspection device of FIG.

FIG. 9 is a diagram for explaining an inspection point positioning operation in the inspection apparatus.

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 1 X table 6 Imaging head 8 Y table 9 Support table 10 Inspection object 20 Control part 21 Monitoring device 22 Operation part 23 Driving part 24 Storage part 25 Imaging part In addition, the same code | symbol shows each same or corresponding part.

Claims (4)

[Claims] 1. An image pickup means for picking up an image of an inspection object, a moving means for moving an image pickup position of the inspection object by the image pickup means, and a next image pickup position based on a moving distance of a previous image pickup position by the moving means. An inspection apparatus comprising: a calculation means for calculating 2. The inspection apparatus according to claim 1, wherein the calculation unit calculates a position moved from the current image pickup position by the same distance as the previous movement distance as the next image pickup position. 3. An image pickup means for picking up an image of an inspection object, and a calculation means for calculating an intermediate image pickup position based on a first image pickup position and a second image pickup position of the inspection object by the image pickup means. Inspection device. 4. The calculation means calculates a position, which is equally divided into a given number, between the first image pickup position and the second image pickup position as an intermediate image pickup position. Item 3. The inspection device according to item 3.