JPH0731106A - Focal point adjusting method of position detecting light receiving function in cut position detecting method for undercut machine positioning method - Google Patents

Abstract

PURPOSE:To provide a focal point adjusting method of light receiving function in cut part position detecting method for an undercut machine, and a cutting part positioning method, in which the mica of a commutator can be cut highly accurately through a simple structure. CONSTITUTION:Predetermined number of photoelectric conversion functional elements 1 are arranged perpendicularly to a commutator 1 thus forming a light receiving function 6 for detecting the mica 1b of the commutator 1. The focal point is determined based on the variation in the quantity of light received by each photoelectric conversion functional element during focal point adjusting operation. The opposite parts of the mica 1b are determined based on the light receiving state of each functional element and the central part of the mica 1b is determined based on the position of an intermediate functional element.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention detects the mica part to be cut by an undercut machine for cutting the mica part of a commutator of a DC motor or the central part of this mica part by means of a light irradiation function and a light receiving function. The method of detecting the position of the cutting part of the undercut machine, in particular, enables the cutting of the mica part of the commutator with high accuracy by automatically detecting the mica part or the central part of the mica part that should be cut accurately. The present invention relates to a focus adjustment method for a position detecting light receiving function and a positioning method for a cutting part in a cutting part position detecting method for an undercut machine.

[0002]

2. Description of the Related Art A method for detecting a mica part of a commutator for detecting a cutting position in an undercut machine is, for example, as follows.
Means as shown in FIGS. 12 and 13 are implemented. FIG. 12 schematically shows a means for electrically determining the conductor portion 1a of the commutator 1 and the mica portion 1b to be cut, and FIG. 12A shows the commutator 1 viewed from the surface. Figure, Figure 12
FIG. 12B is a diagram in which two probes 21 and 22 are added to the diagram of FIG. 12A viewed from the side. Probe 21 and probe 2
The distance from each of the two and the respective positions are set to predetermined conditions and moved according to the outer dimensions of the commutator 1 and the widths of the conductor portion 1a and the mica portion 1b. Each of the probe 21 and the probe 22 is brought into contact with the surface of the commutator 1, and the commutator 1
The determination circuit 23 determines the conduction state between the surface of the probe and each of the probe 21 and the probe 22. By the above determination, the position of the mica part 1b of the commutator 1 to be cut by the undercut machine is detected, and the mica part 1 which is the cutting center is detected.
Determine the center of b. Although the above embodiment has described the case of using two probes, a method of determining the mutual conduction state using three probes and detecting the central part of the mica part 1b is also executed.

FIG. 13 schematically shows a means for optically determining the conductor portion 1a and the mica portion 1b of the commutator 1, and corresponds to FIG. 12 (B) described above. Two
FIG. 1 is a view showing an optical detection mechanism in place of the probe 22. In FIG. 13, reference numeral 31 denotes a light source, and a light beam emitted from the light source 31 is interrupted by a slitted plate 33 vibrated by the mechanism portion 32. The light beam emitted from the light source 31 and intermittently is reflected on the surface of the commutator 1, and the reflected light 34 is received by the photoelectric conversion functional element 35. The intermittent light received by the photoelectric conversion function element 35 is converted into an electric signal and input to the detection circuit 36. In the detection circuit 36, the reflection signal from the commutator 1 is separated and detected from the light reception signal of the photoelectric conversion functional element 35 in synchronization with the drive signal of the slit plate 33 output from the mechanism unit 32. Regarding the reflected signal from the commutator 1, the reflected light from the conductor portion 1a is strong and the reflected light from the mica portion 1b is weak. Therefore, in the detection circuit 36, the mica part 1b of the commutator 1 to be cut by the undercut machine
Is detected and the central portion of the mica portion 1b, which is the cutting center, is determined.

[0004]

By the way, the above-described commutator mica part detecting means has the following problems. First, in the means using the probe shown in FIG. 12, there is a problem that an adjusting drive mechanism, a retracting mechanism, etc. of the probe, which are not shown, are complicated due to the following reasons. If the DC motors to be cut by the undercut machine are motors of different dimensions, the position of the probe should be changed according to the size configuration of the commutator of the DC motor to be cut. ， Need to readjust. Therefore, adjustment time is required, and machining error may occur depending on the adjustment accuracy. The circuit is complicated because it is detected by multiple probes, and bending of the cutting part cannot be handled. Each probe must always be in contact with the commutator surface,
If the contact is cut when the probe moves, the detection work cannot be executed effectively. According to the detection means by the probe, it is necessary to shift the position of the probe with respect to the cutter position of the undercut machine or to retract the probe after the detection is completed for cutting work by the undercut machine. Moreover, the optical means shown in FIG. 13 has the following problems. Since the vibration of the slit is mechanically performed, the structure becomes complicated. If the vibration amplitude of the slit fluctuates for some reason and becomes narrower than the width of the mica, it may not be possible to detect the conductor and mica separately. It is necessary to increase the rigidity of the vibrating mechanism so that resonance vibration due to the vibration of the slit does not occur. It is necessary to adjust the vibration amplitude of the slit according to the commutator structural dimensions such as the thickness and width of the mica and the diameter of the commutator. It is necessary to adjust the constants of the judgment electric circuit used for detection desired depending on the commutator structural dimensions, such as the thickness and width of the mica and the diameter of the commutator. SUMMARY OF THE INVENTION It is an object of the present invention to provide a focus adjusting method for a position detecting light receiving function and a cutting portion positioning method in a cutting portion position detecting method for an undercut machine, which solves the above-mentioned conventional problems (problems). .

[0005]

In order to solve the above-mentioned problems, in a focus adjusting method of a position detecting light receiving function in a cutting portion position detecting method of an undercut machine according to the present invention, a predetermined number of photoelectric cells are provided in at least one row. The mica part of the commutator is detected by the light receiving function with the focus adjustment function, which is formed by aligning the conversion function elements so as to be orthogonal to the commutator. The focal point of the light receiving function is the position where the difference in the amount of received light between the photoelectric conversion function element with a small value and the photoelectric conversion function element that is adjacent to this photoelectric conversion function element and that receives a greater amount of received light than this photoelectric conversion function element is maximum. It was decided to be the position. In addition, the position where the number of photoelectric conversion functional elements that detects the amount of received light smaller than the average value of the amount of received light of all the photoelectric conversion functional elements forming the light receiving function is detected is determined to be the focus position. I chose Further, in the cutting part positioning method in the cutting part position detection method of the undercut machine, among the plurality of photoelectric conversion function elements forming the above-described light receiving function, a predetermined value is more than the average value of the light reception amount of all photoelectric conversion function elements. The photoelectric conversion function element that receives a smaller amount of light than the value is judged to be both ends of the mica part where both sides are continuous for a predetermined number or more, and the intermediate photoelectric conversion function element position is the center part of the mica part. I decided to judge. In addition, among the plurality of photoelectric conversion function elements that form the above-described light receiving function, photoelectric conversion function elements that receive a smaller amount of received light than the average value of the amount of received light of all photoelectric conversion function elements are located on both side ends where a predetermined number or more are continuous. The position of the photoelectric conversion function element that shows the maximum amount of received light close to the photoelectric conversion function element is determined to be both ends of the mica part, and the intermediate photoelectric conversion function element position is determined to be the center part of the mica part. I did it.

[0006]

Since the present invention employs the method described above, the focus position of the light receiving function can be automatically and surely determined, and the focus adjustment can be easily and surely executed. In addition, the mica part, which is the cutting part, and the central part can be easily and surely determined.

[0007]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS The details of an embodiment of a positioning device to which a method for positioning a cutting portion of an undercut machine according to the present invention is applied will be described in detail with reference to FIGS. FIG. 1 shows a schematic configuration example of a positioning device to which a cutting portion positioning method of an undercut machine is applied. In Figure 1,
Reference numeral 1 is a commutator formed on the armature of the motor for cutting the surface of the mica part. The commutator 1 is held on the bed 2a of the undercut machine 2 and mounted on the mechanism part 2b. Shows. Further, 3 is a light source using, for example, a halogen lamp, and the light emitted from the light source 3 is guided to a light projecting section 5 composed of lenses by a light guiding function of an optical fiber-4 or the like. Light source 3 described above, optical fiber
4, the light projecting unit 5 and the like constitute a light irradiation function.
The light beam 5a emitted by the light projecting portion 5 is reflected by the conductor portion 1a or the mica portion 1b formed on the surface of the commutator 1, and the reflected light 5b is incident on the light receiving function 6 and corresponds to the change in the amount of incident light. It is converted into a changing electrical signal. The light receiving function 6 has at least one photoelectric conversion function element.
A row, an optical sensor aligned in a direct direction with respect to the commutator 1 to be measured, such as 6A shown in FIG.
CCD camera with the function of arranging 128 photoelectric conversion functional elements from 1 to 127.
It is described as a sensor). 6A indicates a light receiving function in which photoelectric conversion functional elements are arranged in one row. CCD sensor 6
The received light signal output of is transmitted to the image processing device 7. The processing result by the image processing device 7 is a higher-level control device that transmits an operation signal to the image processing device 7, for example,
It is transmitted to a sequencer (hereinafter referred to as a sequencer) 8.
The sequencer 8 also transmits control signals to the control device 9 of the undercut machine 2. Further, 10 indicates a cutter of this undercut machine 2.

(Embodiment 1) Next, an embodiment 1 which is an example of a method for adjusting the focus of the CCD sensor constructed as described above will be described with reference to FIGS. 3 and 4, the reference numerals are the same as those shown in FIG. Figure 3 is CC
FIG. 6 is a diagram showing the amount of reflected light 5b received from the surface of the commutator 1 which is the D sensor 6 to be measured, and the horizontal axis shows 128 photoelectric conversion functions from 0 to 127 which constitute the CCD sensor. The elements are shown, and the vertical axis shows the amount of light received by each photoelectric conversion element. In FIG. 3, the curve a is CC
When the focus position of the D sensor 6 does not match the surface of the commutator 1 that is the measurement target, the curve b shows the case where the focus position of the CCD sensor 6 matches the surface of the commutator that is the measurement target. Next, by the flow shown in FIG.
An operation for automatically matching the focal position of the CD sensor 6 will be described. When the commutator 1 to be cut is mounted on the undercut machine 2 and the sequencer 8 is started, CC is executed by the sequence program preset in the sequencer 8.
The automatic focus adjustment of the D sensor 6 is started. That is, the CCD sensor 6 is made to receive light as shown by the curve a shown in FIG. 3 at a position separated from the surface of the commutator 1 by a predetermined distance, and then the measurement is started. The light receiving signal of each photoelectric conversion function element which constitutes the CCD sensor 6 is taken into the image processing device 7 (step-2), and each signal level value is recorded (step-1). After the above-mentioned operation, focus adjustment is started in step 1. That is, for example, when the CCD sensor 6 is set at a position where the surface of the commutator 1 is farther from the focal position of the CCD sensor 6, a predetermined position is set so that the focal position of the CCD sensor 6 approaches the surface of the commutator 1. Activate the focus adjustment function. Alternatively, the CCD sensor 6 is brought close to the surface of the commutator 1. The light reception signal of each photoelectric conversion functional element is continuously taken in (step 2). The received light levels of the adjacent elements of the photoelectric conversion function elements that have been captured are compared (step 3), and the compared light reception level difference between the adjacent photoelectric conversion function elements is greater than the level difference when recorded in step -1. Then, the deviation value is recorded (step 4) and the focus adjusting operation is continued in the same direction (step 5). As a result of continuing the above work and comparing the light reception levels of the adjacent photoelectric conversion function elements of each photoelectric conversion function element (step 3), if the light reception level difference between the adjacent elements is larger than the level difference previously checked and recorded. If it becomes smaller, the deviation value is recorded (step 4 ') and the focus adjustment operation is performed in the opposite direction to the conventional one (step 5'). As a result of continuing the above work and comparing the light receiving levels of the adjacent elements of each photoelectric conversion function element (step 3), if the light receiving level difference between the adjacent photoelectric conversion function elements is larger than the level difference previously checked and recorded. If there is no change within the preset range, it is determined that the focus adjustment is completed. That is, at this stage, each photoelectric conversion function element receives light at the light receiving level as shown by the curve b in FIG.

(Embodiment 2) Next, an example of the focus adjustment method of the CCD sensor 6 of Embodiment 2 will be described with reference to FIGS. The reference numerals used in the description are the same as those shown in FIG. In FIG. 5, as in the first embodiment, the commutator 1 is mounted on the undercut machine 2 to start automatic focus adjustment. The light reception signal of each photoelectric conversion function element is taken into the image processing device 7 (step-4), and each light reception level value is recorded (step-3). The focus adjustment operation is performed for the first time (step-2), and then the received light receiving level value of the photoelectric conversion functional element is compared with each received signal level value recorded and the deviation value is recorded (step-1). After that, the focus adjustment operation is advanced (step 1), the received light level of each photoelectric conversion function element is taken and recorded (step 2), and the calculated deviation value is compared with the previously received light reception level (step 3). (Step 4) and compares with the previous deviation value (step 5). If the deviation value is changing in the increasing direction, the deviation value is recorded (step 6), and the focus adjustment is continued in the same direction (step 7). If the change value does not increase and decreases as the above work is continued, the deviation value is recorded (step 6 ') and the focus adjustment operation is performed in the opposite direction to the conventional one (step 7'). When the above operation is continued and the change value of the light receiving level does not increase in step 3 and there is no change within the preset range, it is determined that the focus adjustment is completed.

(Third Embodiment) Next, an example of a focus adjusting method for the CCD sensor 6 of the third embodiment will be described with reference to FIGS. The reference numerals used in the description are the same as those shown in FIG. In FIG. 6, the commutator 1 is mounted on the undercut machine 2 as in the first embodiment, and automatic focus adjustment is started. The light reception signal of each photoelectric conversion function element is taken into the image processing device 7 (step-2), and the deviation value between each light reception level value and the light reception level value of each adjacent photoelectric conversion function element is recorded (step-1). After the above operation, the focus adjustment operation is started (step 1), and the light receiving level of each photoelectric conversion functional element is captured and recorded (step 2). The light receiving level of each photoelectric conversion function element is compared with the light receiving level of the adjacent photoelectric conversion function element (step 3), the calculated deviation value is recorded (step 4), and the calculated deviation value and the previously calculated deviation value recorded are compared. Compare (step 5). When the deviation value of the comparison result becomes large, the deviation value is recorded (step 6) and the focus adjustment is continued in the same direction (step 7). When the deviation value does not increase and decreases when the above work is continued, the deviation value is recorded (step 6 ') and the focus adjustment operation is performed in the opposite direction to the conventional one (step 7'). When the above operation is continued and the received light level deviation value between adjacent photoelectric conversion functional elements in step 5 does not increase and there is no change within a preset range, it is determined that the focus adjustment is completed.

(Embodiment 4) Next, as in the above-mentioned embodiment, C
A fourth embodiment, which is an embodiment of the detection operation of the mica portion that is a target for cutting the surface of the commutator 1 that can be performed after the focus adjustment of the CD sensor 6 is completed, will be described with reference to FIG. 7. The reference numerals used in the description are the same as those shown in FIG. FIG. 7 is a diagram showing the amount of reflected light 5b reflected from the surface of the commutator 1 which is the object of measurement by the CCD sensor 6, and the horizontal axis shows a total of 128 from 0th to 127th constituting the CCD sensor 6. Each photoelectric conversion function element is shown, and the vertical axis shows the amount of light received by each photoelectric conversion element. As described above, after mounting the commutator 1 to be cut on the undercut machine 2 and adjusting the focus of the CCD sensor 6,
When the operation of the sequencer 8 is advanced, the measurement based on this embodiment is started. As in the previous embodiment, the light receiving signals of the photoelectric conversion functional elements are taken into the image processing device 7 and the respective signal level values are recorded. The light receiving level of each photoelectric conversion element is checked, the average value of all is calculated, and a value lower than the preset ratio value than this average value is set as the threshold level, and the light receiving level below the threshold level Of the photoelectric conversion element array formed by the number of lines (depending on the setting conditions of the threshold level, the photoelectric conversion elements of the light receiving level higher than the threshold level independently existing in the array are ignored and included in the row). Each photoelectric conversion function element number c,
Record d as both ends of the mica part 1b. Also,
One of the two photoelectric conversion elements e, which is preset between the intermediate portions c and d or the intermediate portion, is recorded as the central portion of the mica portion 1b to be cut.

(Example 5) Next, the mica part 1 of Example 5
The detection operation of b will be described with reference to the flow charts shown in FIGS. 7 and 8 described above. The reference numerals used in the description are the same as those shown in FIG. First, the light reception signal of each photoelectric conversion functional element is taken into the image processing device 7 (step-2),
The average value of the light receiving level values from the photoelectric conversion function element No. 0 to a predetermined number of photoelectric conversion function elements shown in FIG. 7 is calculated and recorded (step -1). One photoelectric conversion functional element that performs average value processing is shifted. That is, the average value of the light-receiving level values from the photoelectric conversion function element No. 1 to various photoelectric conversion function elements is calculated and recorded (step 1) and compared with the previously recorded average value (step 2). If the average value has changed in the increasing direction, the process returns to step 1 and the above-described operation is repeated. If the average value changes in the direction of decreasing by a predetermined amount or more, the process similarly returns to step 1 and the above operation is repeated. If the amount of change in the average value slightly changes to a value less than or equal to a predetermined amount, or if it does not change, the number of the photoelectric conversion function element that is the highest order of the average value processing, that is, the photoelectric conversion function element newly added to the average value processing is shown in FIG. It is recorded as c (step 3).
Further, the same average value processing (step 4) and the comparison operation as described above are continued (step 5). If the average value changes in the direction of increasing by a predetermined amount or more, the highest number after the average value processing, that is, a number a predetermined number before the photoelectric conversion function element newly added to the average value processing is set as d shown in FIG. An intermediate value between the above-mentioned c and this d or a preset one of the two intermediate parts is recorded as e (step 6).

(Sixth Embodiment) Next, the mica part 1 of the sixth embodiment
The detection operation of b will be described with reference to FIG. The reference numerals used in the description are the same as those shown in FIG. Figure 9
Is a diagram showing the amount of reflected light 5b reflected from the surface of the commutator 1 which is the measurement target of the CCD sensor 6, and the horizontal axis shows a total of 128 from 0th to 127th constituting the CCD sensor 6. Of each photoelectric conversion function element, and the vertical axis indicates the amount of light received by each photoelectric conversion function element. As described above, the commutator 1 to be cut is attached to the undercut machine 2, and the focus of the CCD sensor 6 is adjusted.
When the operation of the lens 8 is advanced, the measurement based on this embodiment is started. Similar to the previous embodiment, the light receiving signals of the photoelectric conversion functional elements are taken into the image processing device 7 and the respective signal level values are recorded. Check the light receiving level of each photoelectric conversion function element,
It is determined that the positions f and g of the photoelectric conversion function element having the maximum light receiving level, which is separated from the predetermined number of photoelectric conversion function elements in the middle, are photoelectric conversion function elements indicating both end positions of the mica part 1b. Then, it is determined that the photoelectric conversion functional element position h intermediate between f and g, that is, the photoelectric conversion functional element position h obtained by the same determination means as that of e determined in the fourth embodiment is the central portion of the mica portion 1b.

(Embodiment 7) Next, an embodiment of the detection operation of the mica part when the target mica part does not exist within the observation range of the CCD sensor as in the above-mentioned embodiment is included in FIG. It will be described with reference to the flow shown in FIG. The reference numerals used in the description are the same as those shown in FIG. Similar to the previous embodiment, the light receiving signal of each photoelectric conversion function element is taken into the image processing device 7 (step-2), and each light receiving level value is recorded (step-1). The CCD sensor 6 is moved in the center direction of the undercut machine 2 (the direction of the photoelectric conversion function element array). Alternatively, the commutator 1 mounted on the undercut machine 2 is rotated (step 1).
The received light signal of each photoelectric conversion element is fetched and recorded (step 2) and compared with the previous recording level value (step 3). As a result of comparison, for example, an average value process is performed on the previous recording level value according to a preset condition so as to eliminate the influence of the reflection characteristic due to the variation of the flatness of the commutator surface, or the value outside the specific condition is satisfied. The light receiving data is ignored, and when almost all the recording level values increase, the operation shown in step 1 is continued (step 4). As a result of the comparison, the above operation is continued even if the attenuation level of the received light level is obtained after the maximum value of the received light level is obtained (step 4). As a result of the comparison, when two maximum values are obtained by separating a predetermined number of photoelectric conversion function elements, the first maximum value is f, the maximum value that appears later is g, and two photoelectric conversion function elements f are used. And the central position of g is determined to be h (step 5). If necessary, the number of the photoelectric conversion functional element that records the h point is
The CCD sensor 6 is moved while shifting the numbers of the photoelectric conversion function elements corresponding to the points f, g, and h so that they are located at the center of the photoelectric conversion function elements that make up the CCD sensor 6.
To move.

(Embodiment 8) Next, refer to the flow charts shown in FIGS. 7 and 11 for Embodiment 8 of the detection operation of the mica part when the target mica part does not exist within the observation range of the CCD sensor 6. And explain. CCD sensor 6 and commutator 1
Since the positional relationship with and can be set in advance in accordance with the conditions of the undercut machine, this embodiment describes a case where the mica part is in the 0th direction of the photoelectric conversion function element forming the CCD sensor 6. First, the received light signal of each photoelectric conversion function element is taken into the image processing device 7 (step-2), and the average of the received light level values from the photoelectric conversion function element No. 0 to a predetermined number of photoelectric conversion function elements shown in FIG. 7 are averaged. Calculate and record the value (step-1). The CCD sensor 6 is shifted by one photoelectric conversion function element in the direction of the 0th photoelectric conversion function element that performs average value processing. That is, again, the average value of the received light level values from the photoelectric conversion function element No. 0 to a predetermined number of photoelectric conversion function elements is output and recorded (step 1) and compared with the previously recorded average value (step 2). . If the average value has changed in the increasing direction, the process returns to step 1 and the above-described operation is repeated. If the average value changes in the direction of decreasing by a predetermined amount or more, the process similarly returns to step 1 and the above operation is repeated. If the change amount of the average value is changed to a predetermined amount or less, or does not change, the number of the photoelectric conversion function element at the moving direction side end of the CCD sensor subjected to the average value is shown in FIG. Is recorded (step 3).
Further, the average value processing (step 4) and the comparison are continued while moving the CCD sensor 6 as described above (step 5). In that case, the number of the photoelectric conversion function element for recording the above-mentioned point c is shifted by one step corresponding to the movement of the CCD sensor 6. If the average value changes in the direction of increasing by a predetermined amount or more, the number of the photoelectric conversion functional element at the end portion in the moving direction of the CCD sensor, which has been subjected to the average value processing, is recorded as d shown in FIG. Then, the number which is set in the middle between this and d, or one of the two set intermediate parts which is set in advance is recorded as e (step 6). If necessary, the number of the photoelectric conversion function element for recording the point e is set so that the number of the photoelectric conversion function element is at the center of the photoelectric conversion function element constituting the CCD sensor 6,
The CCD sensor 6 is moved while shifting the numbers of the photoelectric conversion functional elements corresponding to the points d and e respectively.

The cutting part positioning device of the undercut machine can be realized by configuring so as to realize a desired measurement according to the flow as in the above-described embodiment. The above description shows the basic configuration for realizing the technical idea of the present invention, and can be variously applied and modified. That is, for example, in order to determine the points c and d shown in FIG. 7 or the points f and g shown in FIG. it can. Further, if the method shown in each of the above-described embodiments can be realized, a configuration other than that shown in FIG. 1 can be adopted. For example, the photoelectric conversion function may use any light receiving function other than the CCD sensor, and each functional element used for comparison and determination may be configured by hardware or software of a computer. .

[0017]

EFFECTS OF THE INVENTION Since the present invention has the above-mentioned method, it has the following excellent effects. Focusing of optical sensors such as CCD sensors can be performed automatically. Furthermore, the central line of the mica part, which is the cutting part, can be detected reliably. Therefore, it is possible to efficiently perform the cutting work by the accurate undercut machine.

[Brief description of drawings]

FIG. 1 is a schematic block diagram showing a schematic configuration example of a positioning device to which a cutting portion positioning method using an undercut machine according to the present invention is applied.

FIG. 2 is an explanatory diagram showing a configuration of a photoelectric conversion element that constitutes a CCD sensor in a CCD sensor that is an example of an optical sensor applied to the positioning device shown in FIG.

FIG. 3 is a schematic view showing a C in an optical sensor in the positioning device shown in FIG.
FIG. 6 is a schematic characteristic diagram illustrating a situation in which a light receiving level when a CD sensor is used changes due to focus adjustment.

FIG. 4 is a schematic diagram showing a photo sensor in the positioning device shown in FIG.
It is a schematic flow chart explaining Example 1 which is an automatic focusing method when a CD sensor is used.

FIG. 5 is a schematic flowchart illustrating an example of an automatic focusing method according to a second embodiment when a CCD sensor is used as an optical sensor.

FIG. 6 is a schematic flowchart illustrating an example of an automatic focus adjustment method according to a third embodiment when a CCD sensor is used as an optical sensor.

FIG. 7 is a schematic diagram showing an example of the positioning device shown in FIG.
It is a schematic light-receiving characteristic figure by a CCD sensor explaining Example 4 which is a method of detecting a mica part (cutting part) to be cut by an undercut machine when a CD sensor is used.

FIG. 8 is a schematic view showing a photo sensor having C in the positioning device shown in FIG.
It is a schematic flow chart explaining an example of an automatic detection method of Example 5 which detects a mica part (cutting part) to be cut by an undercut machine when a CD sensor is used.

FIG. 9 is a schematic diagram showing an example of the positioning device shown in FIG.
It is a general | schematic light receiving characteristic figure by a CCD sensor explaining the example of the method of Example 6 which detects the mica part (cutting part) which should be cut by an undercut machine when a CD sensor is used.

10 is a schematic flow chart for explaining an example of an automatic detection method of the seventh embodiment for detecting a mica part (cutting part) to be cut by an undercut machine when a CCD sensor is used as an optical sensor in the positioning apparatus shown in FIG. -Figure.

11 is a schematic flow chart for explaining an example of an automatic detection method of an eighth embodiment for detecting a mica portion (cutting portion) to be cut by an undercut machine when a CCD sensor is used as an optical sensor in the positioning device shown in FIG. -Figure.

FIG. 12 is an explanatory view showing an example of an electrical method for detecting a cutting portion in a conventional undercut machine, and FIG.
Is a plan view of the main part of the commutator, and FIG. 6B is a side view showing the relationship between the commutator and the probe.

FIG. 13 is an explanatory diagram showing an example of an optical method for detecting a cutting portion in a conventional undercut machine.

[Explanation of symbols]

 1: Commutator 1a: Conductor part of commutator 1b: Mica part of commutator 2: Undercut machine 3: Light source (halogen lamp) 4: Light guiding function (optical fiber) 5: Light emitting part 6: Optical sensor ( CCD sensor) (CCD camera) 7: Image processing device 8: Control device (sequencer) 9: Control device of undercut machine 10: Cutter of undercut machine

Claims (5)

[Claims] 1. A method for detecting a cutting portion position of an undercut machine for cutting a mica portion of a commutator of a DC motor, comprising:
A commutator having a light irradiation function configured to be movable in the undercut machine and a light receiving function having a focus adjusting function formed by arranging a predetermined number of photoelectric conversion function elements in at least one row so as to be orthogonal to the commutator. Of the photoelectric conversion function element that forms the light receiving function during the focus adjustment operation of the light receiving function and is adjacent to the photoelectric conversion function element that receives a smaller amount of light. An under-position characterized in that the position where the difference in the amount of received light with the photoelectric conversion function element that receives a larger amount of received light than the photoelectric conversion function element is maximized is determined to be the focus position of the light reception function. A focus adjustment method of a light receiving function for position detection in a cutting part position detection method of a cutting machine. 2. A method of detecting a cutting portion position of an undercut machine for cutting a mica portion of a commutator of a DC motor, comprising:
Detects the mica part of the commutator by the movable light irradiation function and the light receiving function with the focus adjustment function which is formed by arranging a certain number of photoelectric conversion function elements in at least one row so as to be orthogonal to the commutator. During the focus adjustment operation of the light receiving function, the maximum number of photoelectric conversion function elements that detect a light receiving quantity that is smaller than the average value of the light receiving quantity of all photoelectric conversion function elements forming the light receiving function by a predetermined value or more. The focus adjustment method of the position detecting light receiving function in the cutting part position detection method of the undercut machine, wherein the position of is determined to be the focus position. 3. A method of detecting a cutting portion position of an undercut machine for cutting a mica portion of a commutator of a DC motor,
Detects the mica part of the commutator by the movable light irradiation function and the light receiving function with the focus adjustment function which is formed by arranging a certain number of photoelectric conversion function elements in at least one row so as to be orthogonal to the commutator. Of the plurality of photoelectric conversion functional elements forming the light receiving function, the photoelectric conversion receiving a light receiving amount smaller than the average value of the light receiving amounts of all the photoelectric conversion functional elements forming the light receiving function by a predetermined value or more. Positioning of the cutting part in the cutting part position detection method of the undercut machine, characterized in that the photoelectric conversion function element positions at both ends where the functional elements are continuous for a predetermined number or more are determined to be both ends of the mica part Method. 4. A method of detecting a cutting portion position of an undercut machine for cutting a mica portion of a commutator of a DC motor, comprising:
Detects the mica part of the commutator by the movable light irradiation function and the light receiving function with the focus adjustment function which is formed by arranging a certain number of photoelectric conversion function elements in at least one row so as to be orthogonal to the commutator. Therefore, among the plurality of photoelectric conversion function elements forming the light receiving function, the photoelectric conversion function element receiving a light receiving amount smaller than the average value of the light receiving amount of all the photoelectric conversion function elements forming the light receiving function is Cutting of an undercut machine characterized by determining that the photoelectric conversion function element position showing the maximum light receiving amount close to the photoelectric conversion function elements on both ends continuous for a predetermined number or more is determined to be both ends of the mica part Positioning method of cutting part in part position detection method. 5. The photoelectric conversion function element position in the central portion of a photoelectric conversion function element row having both ends of the mica portion, the photoelectric conversion function element position being the central portion of the cutting portion according to claim 3 or 4. A method for positioning a cutting portion in a method for detecting the position of a cutting portion of an undercut machine, which is determined as follows.