JPS6359159A - Method and device for adjusting position of solid-state scanning element - Google Patents

Abstract

PURPOSE:To attain highly accurate position adjustment in a very short time by using a solid-state scanning element to read an adjusting pattern, detecting out of focus immediately via a signal processing unit and a controller and moving the solid-state scanning element support provided with the Z axis moving function. CONSTITUTION:The adjusting pattern 1 is read by the solid-state scanning element 3, a signal processing unit 4 counts number Np of picture elements existing between central picture elements of plural picture elements being the read result of white lines 102 and 103 to obtain a deviation Z of the solid-state scanning element 3 from the focus. Then the controller 5 commands the moving quantity corresponding to the deviation Z to the Z axis moving device 6 supporting the solid-state scanning element 3. Through the operation above, the position adjustment in the Z axis of the solid-state scanning element 3 is finished in very short time. The accuracy of adjustment is given by the inter- center distance between the white lines 102 and 103 of the pattern 1 and in increasing the width W of the white lines 102, 103 further, it is possible to increase the distance A between the pattern 1 and the lens 2.

Description

DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention provides a method for adjusting the position of a fixed scanning element suitable for image information processing in a facsimile transmitter or a copying machine equipped with a solid-state electronic scanning document reading section, and This invention relates to a position adjustment device.

[Conventional technology]

Among the solid-state scanning elements, lenses, mirrors, etc. conventionally used in solid-state electronic scanning document reading sections, the position of the solid-state scanning element in the optical axis (hereinafter referred to as the Z-axis) direction of the lens is aligned with the focal point of the lens. In order to make adjustments, an operator places an adjustment pattern at the appropriate position on the document surface, reads the pattern with a solid-state scanning device, observes the output video signal using an oscilloscope, etc., and determines whether the observed waveform is optimal. It is common to do this so that the shape is the same. On the other hand, Japanese Patent Laid-Open No. 60-2913 states that it is possible to read the adjustment pattern using a solid-state scanning element and detect the deviation in the Z-axis direction from the obtained video signal. This conventional technique will be explained using FIGS. 6(α) to (d). The detection system includes a projection unit 701° and a projection lens 70 as shown in FIG.
2 and a solid-state scanning element 703. Projection section 70
1 is a light source 704 and a sixth light source illuminated by this light source 704.
The projection index plate 705 has an adjustment pattern as shown in FIG. 7(b). The pattern of the index plate 7o5 includes wedge patterns 706 and 707 whose arrangement directions are opposite to each other, and two parallel straight line patterns 70.
8, 709, and one straight line pattern 70
A glass plate 710 is attached to 9 to change the focusing position. When the observation optical system section is out of focus, projection patterns 708' and 70 are projected as shown in FIG. 6(d).
Since the width of 9' changes to SR' e S4', defocus can be detected from this amount of change. According to this method, when the solid-state scanning element is located at the outer dividing point between the lens center and the focal point, a shift can be detected. However, when the solid-state scanning element is located at the internal dividing point between the lens center and the focal point, the glass plate 710 provided to change the focusing position
Since this plays no role, it is problematic to achieve the goal of detecting deviations with practical accuracy.

Next, as an example of a Z-axis direction position adjustment device for a solid-state scanning element, Japanese Patent Application Laid-Open No. 58-3371 will be described. This device is
This system adjusts the position of a fixed scanning element used in a solid-state electronic scanning type document reading section, and includes an adjustment pattern set at a position where the document is to be mounted and a pattern obtained by the solid-state scanning device. a positional deviation determination section that detects a positional deviation of the solid-state scanning element by comparing the received light of the adjustment pattern with pre-stored light reception pattern information; The solid-state scanning device is composed of a correction section that issues a correction command to perform the correction, and a drive section that moves the solid-state scanning element according to the correction command.

In this position adjustment device, since the light reception by the solid-state scanning element is first stored in advance and compared with light reception pattern information for all pixels, the position shift determination section takes a considerable amount of time. Furthermore, although it is possible to detect a position shift, it is only possible to obtain information regarding the direction of the shift, and it is impossible to specifically obtain information about the amount of shift. Therefore, when it is considered to perform position adjustment by setting a predetermined time, a problem arises in that there is no guarantee that the position adjustment can be completed completely within the time.

[Problem that the invention seeks to solve]

When detecting the displacement of the solid-state scanning element in the Z-axis direction, the above-mentioned conventional technology either requires the precondition that the position of the solid-state scanning element is at the outer dividing point of the lens and the focal point, or the above-mentioned precondition is not necessary. However, there was a problem that the amount of deviation was not clear.

An object of the present invention is to correct the Z-axis deviation of a solid-state scanning element in terms of direction and amount so that the position of the solid-state scanning element used in a solid-state electronic scanning document reading section can be easily adjusted in the Z-axis direction. By obtaining the resulting detection method and configuring a Z-axis position adjustment device for a solid-state scanning element based on the detection method, the time for position adjustment at a production site can be shortened, the burden on workers can be reduced,
The purpose is to contribute to stable product quality.

[Means for Solving the Problems] In order to achieve the above object, the present invention arranges two white lines parallel to each other in brightness on a black substrate as an adjustment pattern, and uses the adjustment pattern as a solid. The number of pixels that exist between the center pixel of the plurality of pixels reading one white line and the center pixel of the plurality of pixels reading the other white line among the video signals obtained by reading with the scanning element. The position of the solid-state scanning element in the Z-axis direction is determined by a signal processing device that counts the number of pixels, and a control device that calculates the amount of deviation based on the number of pixels and sends a movement command to the Z-axis movement device that supports the solid-state scanning device. Configure the adjustment device.

[Effect]

According to the present invention, the solid-state scanning element used in the solid-state electronic scanning original reading unit is
When adjusting the position in the axial direction, the adjustment pattern is read by the solid-state scanning element, and by passing through the signal processing device and the control device, the focus shift can be immediately detected. By moving the element support device, highly accurate position adjustment can be completed in an extremely short time.

〔Example〕

Embodiments of the present invention will be described below based on the drawings. 1st
The figure is a configuration diagram of a biaxial position adjustment device for a solid-state scanning element according to the present invention. The adjustment pattern 1 is reduced by a lens 2 and moved in the Z-axis direction.

- imaged onto the solid-state scanning element 3 supported at the position 6;

FIG. 2 shows the adjustment pattern 1. Adjustment pattern 1
is the black base 101 and the two widths W with a large difference in brightness.
The white lines 102 and 103 of the substrate 10 are separated by 2L in parallel.
1.

Figure 3 shows adjustment pattern 1, lens 2, and solid state scanning element 3.
FIG. 2 is a diagram of an optical system made up of the following, viewed from above in the Y direction. Here, the reduction ratio of the lens 2 is m1, the pixel pitch of the solid-state scanning element 3 is P, and the adjustment pattern l is placed at a distance A from the lens 2.

When the solid-state scanning element 3 is at the focal point of the lens 2 on the Z axis, its output video signal is as shown in FIG. 4 (α).

Here, let the pixel number of the center of the plurality of pixels reading one white line 102 be Machi, and the pixel number of the center of the plurality of pixels reading the other white line 103 be G. When the solid-state scanning element 3 is at the focal point, the number #P(0) of pixels existing between the ηth pixel and the second pixel is #P(0) = ζ-machi.

-Also, the solid-state scanning element 3 is installed at a position moved from the focal point by a distance A - mA in two axes directions, and the adjustment pattern 1
, the center pixel number of the plurality of pixels reading one white line 102 and the other white line 103 is 1!, as described above. ,-! shall be. At this time the town'
Number of pixels existing between the th and nth and 7th pixels Np
(A-n+A) is Np (A-mA) =: n
@'-Town'L =-... [2]. Geometrically speaking, the existence of a linear proportional relationship between the number of pixels Np and the deviation Z from the focal point described above means that the position where the solid-state scanning element 3 approaches or moves away from the lens 2 from the focal point ( In general, it is applicable to both front pin and rear pin).

Therefore, the deviation Z from the focus of the solid-state scanning element 3 and before.

The relationship with the number of pixels Np described above is given by the following equation.

Z=pregnancy CNp-people) ...[3] That is, as shown in FIG. 1, the adjustment pattern l is read by the solid-state scanning element 3, and among them, the white line 102 and the white line 10 shown in FIG.
The signal processing device 4 counts the number NP of pixels existing between the central pixels of the plurality of pixels that are reading 3, and calculates the shift Z. Thereafter, the control device 5 instructs the Z-axis direction moving device 6 supporting the solid-state scanning element 3 to move an amount corresponding to the deviation Z. - From the above operations, it can be seen that the position adjustment of the solid-state scanning element 3 in the Z-axis direction is completed in an extremely short time. Further, the accuracy of adjustment is given by the distance between the centers of the white line 102 and the white line 303 in the adjustment pattern 1 shown in FIG.
From the slope of the third equation, it becomes [4] L. Furthermore, by increasing the width W of the white line 102 and the white line 103, it is possible to increase the distance A between the adjustment pattern 1 and the lens 2 in FIG. 3.

FIG. 5 shows another embodiment of the present invention.
In the embodiment shown in the figure, the solid-state scanning element 3 is installed in the Z-axis moving device 6 so that its position can be moved, but in this embodiment, the lens 2
is installed on the Z-axis direction moving device 6. The adjustment pattern l is reduced by the lens 2, and the solid-state scanning element 3
Read by.

A Z-axis movement device that sends the output video signal of the solid-state scanning element 3 to the signal processing device 4, detects the Z-axis deviation by the method described above, and supports the lens 2 from the control device 5 in order to correct the corresponding deviation. 6 to move the position of lens 2. From the above, it is possible to configure and implement an autofocus correction system.

〔Effect of the invention〕

As explained above, the position adjustment pattern and position adjustment method of the solid-state scanning element of the present invention read the adjustment pattern,
It is possible to quantitatively detect and adjust the shift in the Z-axis direction. Therefore, the position adjustment of the solid-state scanning element used in the solid-state electronic scanning type document reading unit, which conventionally took an enormous amount of time due to trial and error, can now be completed in an extremely short time. . Furthermore, since the burden on the person performing the position adjustment can be reduced, it greatly contributes to improving the precision of the position adjustment and, ultimately, to improving the quality of the solid-state electronic scanning document reading section.

[Brief explanation of drawings]

FIG. 1 is an explanatory diagram showing the configuration of a first embodiment of the position adjustment method according to the present invention, FIG. 2 is an explanatory diagram showing the adjustment pattern of the present invention, and FIG. A configuration diagram for explaining the principle of detection in the example, FIG. 4 is the first embodiment of the present invention.
FIG. 5 is an explanatory diagram showing the configuration of the second embodiment of the present invention,
FIG. 6 is an explanatory diagram for explaining the detection principle of the prior art. l... Adjustment pattern 2... Lens 3... Solid state scanning element 4... Signal processing device 5... Control device 6... Z-axis direction moving device 101... Base material 102... White line 103... White line Figure 1 Figure 2 Figure 3 Figure 4 +j1 Kenjoro Figure 5

Claims (1)

[Claims] 1. In order to adjust the position of the solid-state scanning element electrically in the direction of its focal point with respect to the optical axis of the lens used in the solid-state electronic scanning original reading unit so as to show the highest sensitivity, A position where a line pattern is arranged in which two parallel lines with a large difference in brightness from the substrate are arranged in a direction perpendicular to the sub-scanning direction of the fixed scanning element on a black substrate, placed at a position corresponding to the document. The adjustment pattern is read using a solid-state scanning element, and the center pixel number of the plurality of pixels reading the line pattern with a large brightness difference from the base of the position adjustment pattern is detected for each of the two line patterns. A method for adjusting the position of a solid-state scanning element, comprising detecting the direction and amount of deviation of the solid-state scanning element from the focal point of an optical axis based on the number of pixels present. 2. In order to adjust the position of the solid-state scanning element electrically in the direction of its focal point with respect to the optical axis of the lens used in the solid-state electronic scanning type original reading unit, it is necessary to position the solid-state scanning element at the position corresponding to the original. A position adjustment pattern was read on the installed black base surface, in which two parallel lines with a large difference in brightness from the base were arranged in a direction perpendicular to the sub-scanning direction of the fixed scanning element. a signal processing device that detects the direction and amount of deviation of the solid-state scanning device from the focal point of the optical axis from an output video signal of the solid-state scanning device; a solid-state scanning device moving device that moves the solid-state scanning device in the optical axis direction of the lens; A position adjustment device for a solid-state scanning element, comprising a control device that receives information regarding the displacement of the solid-state scanning device in the optical axis direction from the signal processing device and sends commands for the direction and amount of movement to the moving device.