JPH0726716Y2 - Ｉｃテスト用接続具 - Google Patents
Ｉｃテスト用接続具Info
- Publication number
- JPH0726716Y2 JPH0726716Y2 JP8896589U JP8896589U JPH0726716Y2 JP H0726716 Y2 JPH0726716 Y2 JP H0726716Y2 JP 8896589 U JP8896589 U JP 8896589U JP 8896589 U JP8896589 U JP 8896589U JP H0726716 Y2 JPH0726716 Y2 JP H0726716Y2
- Authority
- JP
- Japan
- Prior art keywords
- card
- frog
- contact
- pogo
- circuit board
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000012360 testing method Methods 0.000 title claims description 17
- 230000008054 signal transmission Effects 0.000 claims description 13
- 239000004020 conductor Substances 0.000 claims description 8
- 239000000523 sample Substances 0.000 description 15
- 239000000463 material Substances 0.000 description 5
- 239000002184 metal Substances 0.000 description 5
- 239000011347 resin Substances 0.000 description 5
- 229920005989 resin Polymers 0.000 description 5
- 230000002950 deficient Effects 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 3
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 238000003825 pressing Methods 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 210000000078 claw Anatomy 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000013011 mating Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8896589U JPH0726716Y2 (ja) | 1989-07-28 | 1989-07-28 | Ｉｃテスト用接続具 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8896589U JPH0726716Y2 (ja) | 1989-07-28 | 1989-07-28 | Ｉｃテスト用接続具 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0328478U JPH0328478U (OSRAM) | 1991-03-20 |
| JPH0726716Y2 true JPH0726716Y2 (ja) | 1995-06-14 |
Family
ID=31638560
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8896589U Expired - Fee Related JPH0726716Y2 (ja) | 1989-07-28 | 1989-07-28 | Ｉｃテスト用接続具 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0726716Y2 (OSRAM) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE69901220T2 (de) * | 1999-08-23 | 2003-02-06 | Agilent Technologies, Inc. (N.D.Ges.D.Staates Delaware) | Modulare Schnittstelle zwischen Testeinrichtung und Anwendungseinrichtung |
| JP4534868B2 (ja) * | 2005-05-23 | 2010-09-01 | 横河電機株式会社 | Ｉｃテスタ |
| JP4488438B2 (ja) * | 2006-01-13 | 2010-06-23 | 株式会社アドバンテスト | コネクタハウジングブロック、インターフェイス部材および電子部品試験装置 |
| JP6046200B2 (ja) * | 2015-04-30 | 2016-12-14 | 東京特殊電線株式会社 | 伝送線路及び検査治具 |
-
1989
- 1989-07-28 JP JP8896589U patent/JPH0726716Y2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0328478U (OSRAM) | 1991-03-20 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |