JPH07211762A - Wafer transfer treater - Google Patents

Wafer transfer treater

Info

Publication number
JPH07211762A
JPH07211762A JP194094A JP194094A JPH07211762A JP H07211762 A JPH07211762 A JP H07211762A JP 194094 A JP194094 A JP 194094A JP 194094 A JP194094 A JP 194094A JP H07211762 A JPH07211762 A JP H07211762A
Authority
JP
Japan
Prior art keywords
transfer
wafer
vacuum
chamber
processing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP194094A
Other languages
Japanese (ja)
Inventor
Seiichiro Sugano
誠一郎 菅野
Hiroyuki Kitsunai
浩之 橘内
Nobuo Tsumaki
伸夫 妻木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP194094A priority Critical patent/JPH07211762A/en
Publication of JPH07211762A publication Critical patent/JPH07211762A/en
Pending legal-status Critical Current

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  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

PURPOSE:To provide a wafer vacuum-transferring treater, which can easily construct a process, has a high maintainability, and can add the vacuum treater. CONSTITUTION:A plurality of pieces of transfer tubes 6, which are formed into the same form, are coupled with a plurality of pieces of vacuum-transferring chambers 3 a to l having a wafer transfer function via gate valves 5 and the like to constitute a transfer path and a transfer chamber connected with wafer treating chambers 2 a to j or a plurality of pieces of treating chambers is coupled with the vacuum-transferring chambers to constitute a wafer vacuum- transferring treater.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、半導体装置の製造工程
に用いられる半導体ウエハの製造工程におけるウエハ搬
送処理装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a wafer transfer processing apparatus in a semiconductor wafer manufacturing process used in a semiconductor device manufacturing process.

【0002】[0002]

【従来の技術】半導体の微細化,高密度化に伴い、半導
体製造プロセスでは真空一貫処理化やウエハの大口径
化,枚様式化が進んでいる。半導体製造プロセスとして
真空一貫プロセスを採用することの利点は、製造プロセ
スのある一連の処理、全てを真空中または、その他の不
活性ガス中で行うことが可能となるので、ウエハが塵埃
や不純ガス分子により汚染される可能性を減少させるこ
とである。また、プロセスの再現性が良くなり、歩留ま
りの向上が期待できる。さらに、プロセス間の搬送にお
いて、例えば、ウエハカセットを人が搬送するようなウ
エハに汚染を与える可能性のある工程をなくすことがで
きる。
2. Description of the Related Art With the miniaturization and high density of semiconductors, in the semiconductor manufacturing process, integrated vacuum processing, large diameter wafers, and single-piece wafers are being developed. The advantage of adopting a vacuum integrated process as a semiconductor manufacturing process is that a series of processes in the manufacturing process can be performed in a vacuum or other inert gas, so that the wafer does not have dust or impurities. To reduce the possibility of contamination by molecules. In addition, the process reproducibility is improved, and the yield can be expected to be improved. Further, in the process-to-process transfer, it is possible to eliminate a step that may contaminate the wafer, for example, when a wafer cassette is transferred by a person.

【0003】従って、半導体製造装置は集合化、つま
り、クラスタ化し、さらにマルチチャンバ化などの複合
化が図られ、更にそれらを統合して真空一貫化していく
傾向にある。
Therefore, the semiconductor manufacturing apparatus has a tendency to be integrated, that is, clustered, and further compounded such as multi-chambered, and further integrated and integrated into a vacuum.

【0004】なお、この種の半導体製造装置における真
空ウエハ搬送処理装置の例は、特開平4−229633 号公報
に開示されている。
An example of a vacuum wafer transfer processing apparatus in this type of semiconductor manufacturing apparatus is disclosed in Japanese Patent Application Laid-Open No. 4-229633.

【0005】[0005]

【発明が解決しようとする課題】特開平4−229633 号公
報に挙げられる開示例では、各クラスタ装置や単一処理
チャンバは、中央に設置されたウエハ保持手段を備えた
中央真空チャンバと放射状にチャンバ間搬送アームによ
り接続して一つの半導体プロセスラインを構築してい
る。従って、中央真空チャンバ内でウエハの破壊などの
トラブルが発生した際には、他のクラスタ装置や処理チ
ャンバにウエハを搬送することができず、製造を停止し
なければならない。また、新たにプロセスを追加したい
場合が生じても処理チャンバを増設できず、別の装置を
用意しラインを構築し直さなければならない。更に、各
処理室は中央真空チャンバに対して放射状に接続してい
るので、装置の据え付け面積が大きくなりスペース効率
が悪い等の問題がある。
In the disclosed example disclosed in Japanese Patent Laid-Open No. 4-229633, each cluster device or single processing chamber is radially arranged with a central vacuum chamber having a wafer holding means installed at the center. One semiconductor process line is constructed by connecting with chamber-to-chamber transfer arms. Therefore, when a trouble such as a wafer breakage occurs in the central vacuum chamber, the wafer cannot be transferred to another cluster device or the processing chamber, and the manufacturing must be stopped. Further, even if there is a case where it is desired to add a new process, the processing chamber cannot be added, and another device must be prepared and the line must be rebuilt. Further, since each processing chamber is radially connected to the central vacuum chamber, there is a problem that the installation area of the apparatus is large and the space efficiency is poor.

【0006】本発明の目的は、製造ラインの構築が容易
で保守性がよく、かつ、真空処理装置の増設が可能であ
る真空ウエハ搬送処理装置及び、搬送路の連結方法を提
供することにある。
An object of the present invention is to provide a vacuum wafer transfer processing apparatus and a transfer path connecting method in which a manufacturing line can be easily constructed and maintainability is improved, and a vacuum processing apparatus can be added. .

【0007】[0007]

【課題を解決するための手段】上記目的を達成するた
め、本発明は、ウエハ搬送用ロボットを備え、かつ側面
にウエハ搬送口を持った複数個の真空搬送チャンバと、
複数個の同一形状をした搬送管を連結して装置間搬送装
置を構築し、それにウエハ処理室、または前記と同一形
状の搬送管を用いて複数個の処理室を備えた真空搬送チ
ャンバとを連結してウエハのプロセス工程を構成する。
To achieve the above object, the present invention comprises a wafer transfer robot, and a plurality of vacuum transfer chambers having a wafer transfer port on a side surface thereof.
A plurality of transfer pipes having the same shape are connected to each other to construct an inter-device transfer device, and a wafer processing chamber, or a vacuum transfer chamber provided with a plurality of processing chambers using the transfer pipe having the same shape as described above. They are connected to form a wafer process step.

【0008】また、真空搬送チャンバと搬送管の連結部
分に、開あるいは閉の状態で搬送管と真空搬送チャンバ
の任意の一方または、両方へ固定可能な連結部分を有す
るゲートバルブを介して連結する。
The vacuum transfer chamber and the transfer tube are connected to each other via a gate valve having a connection part that can be fixed to either or both of the transfer tube and the vacuum transfer chamber in an open or closed state. .

【0009】[0009]

【作用】各一連の処理工程と処理工程間のウエハの搬送
装置は、ウエハ搬送ロボットを備えた真空搬送チャンバ
と複数個の同一形状を有した搬送管をゲートバルブを介
して連結して構成される。したがって、ある一連の処理
工程と処理工程間で故障やウエハ破損などの事故が発生
しても装置全体を停止する必要はなく、事故の影響が無
い処理室では処理を続行することができる。あるいは、
使用していない搬送口を用いてバイパス路を作り、全体
の処理を続行することができる。更に、ウエハ処理室の
増設の必要性が発生した際にも、真空搬送チャンバに搬
送管を用いて、処理室、または別の真空搬送チャンバを
連結することにより容易に増設が可能となる。
A wafer transfer device between each processing step is constituted by connecting a vacuum transfer chamber equipped with a wafer transfer robot and a plurality of transfer tubes having the same shape through a gate valve. It Therefore, even if an accident such as a failure or a wafer damage occurs between a series of processing steps, it is not necessary to stop the entire apparatus, and the processing can be continued in a processing room that is not affected by the accident. Alternatively,
It is possible to create a bypass path using an unused transport port and continue the entire process. Further, even when the necessity of adding the wafer processing chamber arises, it is possible to easily add the wafer processing chamber by connecting the processing chamber or another vacuum transfer chamber using the transfer tube to the vacuum transfer chamber.

【0010】[0010]

【実施例】以下、本発明の実施例を図に従って説明す
る。
Embodiments of the present invention will be described below with reference to the drawings.

【0011】図1は、本発明の一実施例であり、シリコ
ン集積回路プロセスへの実施例を示すものである。図1
において、例えば、1はロードロック室であり、ここで
ウエハ7をロード,アンロードする事ができる。また、
図中2aから2kはウエハ7にさまざまな処理を施す処
理装置であり、例えば、ウエハクリーニング,MBE,
CVD,リソグラフィ,エッチング,アニール,イオン
注入,多層配線,酸化,パッシベーション,評価などを
行う装置である。
FIG. 1 shows an embodiment of the present invention, which is an embodiment of a silicon integrated circuit process. Figure 1
In FIG. 1, for example, 1 is a load lock chamber in which the wafer 7 can be loaded and unloaded. Also,
In the figure, 2a to 2k are processing apparatuses for performing various processings on the wafer 7, for example, wafer cleaning, MBE,
It is a device for performing CVD, lithography, etching, annealing, ion implantation, multi-layer wiring, oxidation, passivation, evaluation and the like.

【0012】次にウエハの動きを説明する。まず、ウエ
ハ7をロードロック室1に入れた後、ロードロック室1
を真空排気する。ロードロック室とゲートバルブを介し
て連結している真空搬送チャンバ3a内には、例えば、
ウエハを保持した状態で回転,伸縮,昇降運動可能なウ
エハ搬送用ロボット4aが設置されている。従って、ロ
ードロック室1に導入されたウエハ7を、真空搬送チャ
ンバ3aに取り込むことができる。真空搬送チャンバ3
aに取り込まれたウエハ7は、ウエハ搬送用ロボット4
aにより、ゲートバルブを介して真空搬送チャンバ3a
と連結した別の処理室に移送され、必要な処理が行われ
る。処理が済んだウエハは、ウエハ搬送ロボット4aの
回転運動により、真空搬送チャンバ3aと3bを連結し
ている搬送管6の端部直前に移動させられる。この時、
ウエハ7を受け渡すべきウエハ搬送用ロボット4bは搬
送管6の真空搬送チャンバ3bと連結した端部直前で待
機している。そして、これらのウエハ搬送用ロボット4
a,4bの伸縮,昇降運動によりウエハの受け渡しが行
われる。このウエハを受け取ったウエハ搬送用ロボット
4bが設置されている真空搬送チャンバ3bは図に示す
ように、同じ複数個の真空搬送チャンバ3c,d,f,
g,i,j,lと、複数個の同一形状の搬送管6を連結
して構築された環状の搬送路の一部になっている。そし
てウエハは、この搬送路を構成している真空搬送チャン
バ内のウエハ搬送ロボットにより、搬送路の中を自在に
移動することができる。従って、ウエハを各処理室に搬
送することができる。ところで、真空搬送チャンバと搬
送管の間にはゲートバルブ9が設置されている。図2
に、真空搬送チャンバと搬送管の連結分の断面図、図3
には斜視図を示す。図2に示す様に真空搬送チャンバと
搬送管の接続面には、搬送口を囲んでいるOリング1
4,15と、このOリング14,15を囲んでいるOリ
ング13,16の二種類のOリングが入っている。これ
らのOリングには真空グリースが塗布されている。そし
て、ゲートバルブ9は真空搬送チャンバ3と搬送管6に
搬送管側ねじ10,11、真空搬送チャンバ側ねじ1
7,18で固定されている。また、このゲートバルブ内
には、バルブ機構が備えてある。このバルブ機構は、図
2に示すようにウエハを通すための搬送口とOリング1
4または15と、Oリング13または16の間の空間
を、バルブ22により開閉することができる。このバル
ブは、Oリング14または15とOリング13または1
6の間に残された大気を排気するために設置されてい
る。すなわち、搬送路を真空排気する際にはバルブ22
は開放されている。この時、バルブ22にはOリング2
0が設置されているので、真空漏れを起こすことはな
い。そして、真空搬送チャンバと搬送管内の圧力が一定
に達したならば、バルブ22は閉じられる。ところで、
このゲートバルブ9は、通常、ウエハの処理が行われて
いる状態では、真空搬送チャンバと搬送管をウエハが通
過できるように連結している。しかし、もしも故障や事
故により搬送路を分解したい場合には、真空搬送チャン
バまたは搬送管の真空状態を保ったまま分解することを
可能にする。つまり、搬送管側ねじ10,11、真空搬
送チャンバ側ねじ17,18をはずし、ゲートバルブ9
をこの図では上にずらして搬送口を覆えばよい。この
時、真空搬送チャンバと搬送管は真空状態にある。従っ
て、ゲートバルブ9は大気圧との差圧により真空搬送チ
ャンバ3と搬送管6に押しつけられているので、真空漏
れをおこすことはない。しかし、図に示すようにゲート
バルブ押さえ23によりゲートバルブ9を真空搬送チャ
ンバ3と搬送管6に押しつけておいてもよい。その後、
真空状態を保ちたい側のねじ12とねじ穴19を利用し
て、ゲートバルブを固定することができる。また、分解
や修理作業が終了したならば、逆の動作によりもとの搬
送路へ戻すことができる。このように、ウエハ搬送用ロ
ボットを持った複数個の真空搬送チャンバと複数個の同
一形状の搬送管を、ゲートバルブを介して連結して搬送
路を構成すれば、処理室間または複数の処理室の連結し
た真空搬送チャンバ間のウエハの搬送を真空中で行え
る。また、搬送装置の故障やウエハ破損などの事故によ
り分解,修理の必要性が発生した場合でも、搬送管と真
空搬送チャンバはゲートバルブにより真空状態を保った
まま任意の場所で分解可能であるので、それぞれの処理
室または処理室の連結した真空搬送チャンバは独立して
稼動できる。従って、装置全体を停止する必要はなく、
被害を最小限に抑えることができる。また、真空搬送チ
ャンバと搬送管は、容易に分割可能であるため必要最低
限の部分のみの修理または交換で済む、非常にメンテナ
ンス性がよい装置が得られる。更に、搬送路の構築が真
空搬送チャンバと搬送管の連結により行われるので、搬
送路の形状に自由度がある。よって、装置を据え付ける
空間に合わせることができ、スペース効率がよくなる。
つまり、本実施例ではウエハの搬送路を環状構造とした
が、搬送路の形状はその装置を設置する場所の形状や面
積によって自由に変更することができる。なお、本実施
例の搬送用ロボットはアームに伸縮,昇降機構を有して
いるが、代わりに搬送用ロボットのアームは伸縮機構の
みとし、搬送管内にウエハを保持した状態で昇降運動が
可能な突き上げ用ロボットを設置してウエハの受け渡し
を行ってもよい。また、真空搬送チャンバと搬送管の連
結部分に介しているゲートバルブは、真空を封じるもの
であれば、どのような形状のものでもよい。
Next, the movement of the wafer will be described. First, after placing the wafer 7 in the load lock chamber 1,
Is evacuated. In the vacuum transfer chamber 3a connected to the load lock chamber via a gate valve, for example,
A wafer transfer robot 4a capable of rotating, expanding and contracting, and moving up and down while holding a wafer is installed. Therefore, the wafer 7 introduced into the load lock chamber 1 can be taken into the vacuum transfer chamber 3a. Vacuum transfer chamber 3
The wafer 7 taken in a is transferred to the wafer transfer robot 4
a by means of the gate valve through the vacuum transfer chamber 3a
It is transferred to another processing chamber connected to and subjected to necessary processing. The processed wafer is moved immediately before the end of the transfer pipe 6 connecting the vacuum transfer chambers 3a and 3b by the rotational movement of the wafer transfer robot 4a. This time,
The wafer transfer robot 4b to which the wafer 7 is to be transferred is on standby immediately before the end of the transfer tube 6 connected to the vacuum transfer chamber 3b. Then, these wafer transfer robots 4
Wafers are delivered by the expansion and contraction of a and 4b and the vertical movement. As shown in the figure, the vacuum transfer chamber 3b in which the wafer transfer robot 4b that receives the wafer is installed has the same plurality of vacuum transfer chambers 3c, d, f, and
g, i, j, l and a plurality of transport pipes 6 having the same shape are connected to each other to form a part of an annular transport path. The wafer can be freely moved in the transfer path by the wafer transfer robot in the vacuum transfer chamber forming this transfer path. Therefore, the wafer can be transferred to each processing chamber. By the way, a gate valve 9 is installed between the vacuum transfer chamber and the transfer tube. Figure 2
FIG. 3 is a cross-sectional view of the connection between the vacuum transfer chamber and the transfer tube.
Shows a perspective view. As shown in FIG. 2, the O-ring 1 surrounding the transfer port is provided on the connection surface between the vacuum transfer chamber and the transfer tube.
There are two types of O-rings 4, 15 and O-rings 13, 16 surrounding the O-rings 14, 15. Vacuum grease is applied to these O-rings. The gate valve 9 is connected to the vacuum transfer chamber 3 and the transfer pipe 6 by the transfer pipe side screws 10 and 11, and the vacuum transfer chamber side screw 1.
It is fixed at 7,18. In addition, a valve mechanism is provided in the gate valve. As shown in FIG. 2, this valve mechanism has a transfer port for passing a wafer and an O-ring 1.
The space between 4 or 15 and the O-ring 13 or 16 can be opened and closed by the valve 22. This valve has an O-ring 14 or 15 and an O-ring 13 or 1
It is installed to exhaust the atmosphere left over between 6. That is, when the transport path is evacuated, the valve 22
Is open. At this time, the valve 22 has an O-ring 2
Since 0 is installed, vacuum leakage does not occur. Then, when the pressure in the vacuum transfer chamber and the transfer tube reaches a constant value, the valve 22 is closed. by the way,
The gate valve 9 is normally connected to the vacuum transfer chamber and the transfer tube so that the wafer can pass therethrough while the wafer is being processed. However, if it is desired to disassemble the transfer path due to a failure or accident, it is possible to disassemble the vacuum transfer chamber or transfer tube while maintaining the vacuum state. That is, the transfer pipe side screws 10 and 11 and the vacuum transfer chamber side screws 17 and 18 are removed, and the gate valve 9
In this figure, the transfer port may be covered by shifting it upward. At this time, the vacuum transfer chamber and the transfer tube are in a vacuum state. Therefore, since the gate valve 9 is pressed against the vacuum transfer chamber 3 and the transfer tube 6 by the pressure difference from the atmospheric pressure, there is no vacuum leakage. However, as shown in the figure, the gate valve 9 may be pressed against the vacuum transfer chamber 3 and the transfer tube 6 by the gate valve retainer 23. afterwards,
The gate valve can be fixed by using the screw 12 and the screw hole 19 on the side where the vacuum state is desired to be maintained. Further, when the disassembling or repair work is completed, it is possible to return to the original transport path by the reverse operation. In this way, if a plurality of vacuum transfer chambers having a wafer transfer robot and a plurality of transfer tubes of the same shape are connected via a gate valve to form a transfer path, it is possible to perform processing between processing chambers or a plurality of processing chambers. Wafers can be transferred between vacuum transfer chambers connected to each other in a vacuum. In addition, even if disassembly or repair is required due to an accident such as a transfer device failure or wafer damage, the transfer valve and vacuum transfer chamber can be disassembled at any place while maintaining the vacuum state by the gate valve. The respective processing chambers or the vacuum transfer chambers connected to the processing chambers can operate independently. Therefore, it is not necessary to stop the entire device,
The damage can be minimized. Further, since the vacuum transfer chamber and the transfer tube can be easily divided, only a minimum necessary portion needs to be repaired or replaced, and a device having very good maintainability can be obtained. Further, since the transfer path is constructed by connecting the vacuum transfer chamber and the transfer tube, there is a degree of freedom in the shape of the transfer path. Therefore, the space for installing the device can be adjusted, and the space efficiency is improved.
That is, although the wafer transfer path has an annular structure in the present embodiment, the shape of the transfer path can be freely changed depending on the shape and area of the place where the apparatus is installed. Although the transfer robot of this embodiment has an extension / contraction mechanism and an elevating / lowering mechanism in the arm, instead, the arm of the transfer robot has only the extension / contraction mechanism, and the elevating / lowering motion can be performed while holding the wafer in the transfer tube. A push-up robot may be installed to transfer the wafer. Further, the gate valve interposed between the connecting portion between the vacuum transfer chamber and the transfer tube may have any shape as long as it can seal the vacuum.

【0013】図4は、本発明の第二の実施例である。こ
の図は、図1に示す装置の真空搬送チャンバ3i内に設
置されたウエハ搬送ロボット4iに故障が発生したた
め、新たに搬送管とウエハ搬送用ロボット4mを備えた
真空搬送チャンバ3mを用いてバイパス用の搬送路を構
成した図である。この時、真空搬送チャンバ3g,3j
と、真空搬送チャンバ3iに連結した搬送管の連結部分
は、ゲートバルブ9で封じてある。このように搬送路を
構成すれば、故障箇所を分解,修理してる時にも、真空
を汚染すること無く全処理を続行できるので装置の可動
率がよい装置が得られる。
FIG. 4 shows a second embodiment of the present invention. In this figure, since a failure occurs in the wafer transfer robot 4i installed in the vacuum transfer chamber 3i of the apparatus shown in FIG. 1, the vacuum transfer chamber 3m newly provided with the transfer tube and the wafer transfer robot 4m is used to bypass the wafer transfer robot 4i. It is the figure which comprised the conveyance path for. At this time, the vacuum transfer chambers 3g and 3j
And the connecting portion of the transfer pipe connected to the vacuum transfer chamber 3i is closed by a gate valve 9. By constructing the transport path in this manner, even when the faulty part is disassembled and repaired, the entire process can be continued without contaminating the vacuum, so that a device having a high mobility can be obtained.

【0014】図5は、本発明の第三の実施例である。本
実施例は、ウエハ処理装置増設の必要性が発生したため
に、搬送路を形成している真空搬送チャンバ3gにゲー
トバルブ5を介して増設用処理室8を増設した例であ
る。このように搬送路を構成する真空搬送チャンバを利
用することにより、簡単に処理室を増設することができ
る。図では、処理室を搬送路中の真空搬送チャンバに直
接連結したが、搬送管を用いて別な真空搬送チャンバを
接続し、この真空搬送チャンバに処理室を増設してもよ
い。
FIG. 5 shows a third embodiment of the present invention. This embodiment is an example in which an additional processing chamber 8 is added via a gate valve 5 to the vacuum transfer chamber 3g forming the transfer path because of the necessity of adding a wafer processing device. By using the vacuum transfer chamber forming the transfer path in this way, it is possible to easily add a processing chamber. Although the processing chamber is directly connected to the vacuum transfer chamber in the transfer path in the figure, another vacuum transfer chamber may be connected using a transfer pipe to add a processing chamber to this vacuum transfer chamber.

【0015】[0015]

【発明の効果】本発明によれば、搬送装置の故障やウエ
ハ破損などの事故が発生しても装置全体を停止する必要
はなく、事故の影響が無い処理室では処理を続行するこ
とができる。また、事故により装置の分解や部品交換の
必要性が発生しても、分割可能な場所が多いため、作業
のしやすくメンテナンス性のよい装置が得られる。
According to the present invention, even if an accident such as a transfer device failure or wafer damage occurs, it is not necessary to stop the entire device, and the process can be continued in a processing room which is not affected by the accident. . Further, even if it is necessary to disassemble the device or replace the parts due to an accident, since there are many places where the device can be divided, a device that is easy to work and has good maintainability can be obtained.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の第一の実施例のシリコン集積回路の説
明図。
FIG. 1 is an explanatory diagram of a silicon integrated circuit according to a first embodiment of the present invention.

【図2】真空搬送チャンバと搬送管の連結部分の断面
図。
FIG. 2 is a sectional view of a connecting portion between a vacuum transfer chamber and a transfer tube.

【図3】真空搬送チャンバと搬送管の連結部分の斜視
図。
FIG. 3 is a perspective view of a connecting portion between a vacuum transfer chamber and a transfer tube.

【図4】本発明の第二実施例の説明図。FIG. 4 is an explanatory diagram of a second embodiment of the present invention.

【図5】本発明の第三実施例の説明図。FIG. 5 is an explanatory diagram of a third embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1…ロードロック室、2a〜k…処理室、3a〜m…真
空搬送チャンバ、4a〜m…ウエハ搬送用ロボット、5
…ゲートバルブ、6…搬送管、7…ウエハ。
1 ... Load lock chamber, 2a-k ... Processing chamber, 3a-m ... Vacuum transfer chamber, 4a-m ... Wafer transfer robot, 5
... gate valve, 6 ... transport tube, 7 ... wafer.

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】ウエハ搬送用ロボットを内部に持ち、ウエ
ハを導入,排出するための搬送口を備えた複数個の真空
搬送チャンバと、前記ウエハが内部を通過可能であり、
両端部は連結すべき相手との気密を保てるように接続可
能である複数個の搬送管を連結して搬送路を構成し、前
記搬送路を構成している一個以上の前記真空搬送チャン
バに、ウエハ処理室または、複数個の処理室と接続した
搬送チャンバを連結することを特徴とするウエハ搬送処
理装置。
1. A plurality of vacuum transfer chambers having a wafer transfer robot therein and having transfer ports for introducing and ejecting wafers, and the wafers capable of passing through the inside,
Both ends form a transfer path by connecting a plurality of transfer pipes that can be connected so as to maintain airtightness with a partner to be connected, and one or more vacuum transfer chambers that form the transfer path, A wafer transfer processing apparatus comprising a wafer processing chamber or a transfer chamber connected to a plurality of processing chambers.
【請求項2】請求項1において、前記真空搬送チャンバ
と前記搬送管の任意の連結部分にゲートバルブを設けた
ウエハ搬送処理装置。
2. The wafer transfer processing apparatus according to claim 1, wherein a gate valve is provided at an arbitrary connecting portion between the vacuum transfer chamber and the transfer tube.
【請求項3】請求項2において、前記真空搬送チャンバ
と前記搬送管の間には前記ウエハが通行可能な孔と、前
記真空搬送チャンバと前記搬送管の搬送口を封じる面積
を有し、前記搬送路を開あるいは閉の状態で前記搬送管
と前記真空搬送チャンバの任意の一方及び両方へ固定可
能な締結部を有した板状のゲートバルブを有するウエハ
搬送処理装置。
3. The wafer according to claim 2, wherein a hole through which the wafer can pass is provided between the vacuum transfer chamber and the transfer tube, and an area for sealing the transfer port of the vacuum transfer chamber and the transfer tube. A wafer transfer processing apparatus having a plate-shaped gate valve having a fastening portion that can be fixed to any one or both of the transfer tube and the vacuum transfer chamber with the transfer path opened or closed.
【請求項4】請求項1において、前記ウエハ搬送ロボッ
トは平面内での運動機能を有し、前記搬送管内には前記
ウエハを保持した状態で昇降運動可能なロボットを設置
し、前記ウエハ搬送ロボットおよび前記ロボットの運動
により前記ウエハの受け渡しを行うウエハ搬送処理装
置。
4. The wafer transfer robot according to claim 1, wherein the wafer transfer robot has a movement function in a plane, and a robot capable of moving up and down while holding the wafer is installed in the transfer tube. And a wafer transfer processing device that transfers the wafer by the movement of the robot.
JP194094A 1994-01-13 1994-01-13 Wafer transfer treater Pending JPH07211762A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP194094A JPH07211762A (en) 1994-01-13 1994-01-13 Wafer transfer treater

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP194094A JPH07211762A (en) 1994-01-13 1994-01-13 Wafer transfer treater

Publications (1)

Publication Number Publication Date
JPH07211762A true JPH07211762A (en) 1995-08-11

Family

ID=11515616

Family Applications (1)

Application Number Title Priority Date Filing Date
JP194094A Pending JPH07211762A (en) 1994-01-13 1994-01-13 Wafer transfer treater

Country Status (1)

Country Link
JP (1) JPH07211762A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007511104A (en) * 2003-11-10 2007-04-26 ブルーシフト テクノロジーズ インコーポレイテッド Method and system for processing a product being processed in a semiconductor processing system under vacuum
KR100756152B1 (en) * 1999-06-18 2007-09-05 동경 엘렉트론 주식회사 Transfer module and cluster system for semiconductor manufacturing process
JP2017220410A (en) * 2016-06-10 2017-12-14 株式会社ジャパンディスプレイ Device for producing laminated film and method of producing laminated film
US9884726B2 (en) 2003-11-10 2018-02-06 Brooks Automation, Inc. Semiconductor wafer handling transport
JP2018022619A (en) * 2016-08-04 2018-02-08 株式会社ジャパンディスプレイ Device and method for producing laminated film
US10086511B2 (en) 2003-11-10 2018-10-02 Brooks Automation, Inc. Semiconductor manufacturing systems

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100756152B1 (en) * 1999-06-18 2007-09-05 동경 엘렉트론 주식회사 Transfer module and cluster system for semiconductor manufacturing process
JP2007511104A (en) * 2003-11-10 2007-04-26 ブルーシフト テクノロジーズ インコーポレイテッド Method and system for processing a product being processed in a semiconductor processing system under vacuum
US9884726B2 (en) 2003-11-10 2018-02-06 Brooks Automation, Inc. Semiconductor wafer handling transport
US10086511B2 (en) 2003-11-10 2018-10-02 Brooks Automation, Inc. Semiconductor manufacturing systems
JP2017220410A (en) * 2016-06-10 2017-12-14 株式会社ジャパンディスプレイ Device for producing laminated film and method of producing laminated film
JP2018022619A (en) * 2016-08-04 2018-02-08 株式会社ジャパンディスプレイ Device and method for producing laminated film
CN111463365A (en) * 2016-08-04 2020-07-28 株式会社日本显示器 Manufacturing device and manufacturing method of light emitting element
CN111463365B (en) * 2016-08-04 2023-05-26 株式会社日本显示器 Apparatus and method for manufacturing light-emitting element

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