JPH07181468A - Inspection method of transparent substrate and device therefor - Google Patents

Inspection method of transparent substrate and device therefor

Info

Publication number
JPH07181468A
JPH07181468A JP32539893A JP32539893A JPH07181468A JP H07181468 A JPH07181468 A JP H07181468A JP 32539893 A JP32539893 A JP 32539893A JP 32539893 A JP32539893 A JP 32539893A JP H07181468 A JPH07181468 A JP H07181468A
Authority
JP
Japan
Prior art keywords
steam
glass substrate
transparent substrate
liquid crystal
generated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP32539893A
Other languages
Japanese (ja)
Inventor
Teruo Nakano
輝夫 中野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP32539893A priority Critical patent/JPH07181468A/en
Publication of JPH07181468A publication Critical patent/JPH07181468A/en
Pending legal-status Critical Current

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  • Liquid Crystal (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Abstract

PURPOSE:To provide an inspection device of a transparent substrate capable of easily inspecting the strain of the transparent substrate. CONSTITUTION:Water is housed in a receiving tray 6 of a steam generator 5 and steam is generated by heating a heater 7 to generate heat. The amt. of the steam to be generated is controlled by a humidity sensor 16 so that the specified humidity in a casing 1 is attained. The steam generated in the steam generator 5 makes the flow of the steam uniform by a mesh 11 and the steam is blown out upward instantaneously by blowing out of blow-off holes 9 of a blower 8. The glass substrate 19 for liquid crystals to be inspected is placed above an opening 2 for inspection. A lamp 12 of an illuminating device 13 is lighted to illuminate the rear surface of the glass substrate 19 for liquid crystal via a transparent plate 15 of an opening 14 for irradiation. Clouding of the glass substrate 19 for liquid crystals by the steam is photographed by a camera 17 and the presence or absence of the strain on the glass substrate 19 for liquid crystal is inspected. The kinds of the stain and the cause of its generation are searched by the degrees of the clouding, such as dark, thin and stripe patterns generated on the glass substrate 19 for liquid crystal.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、透明基板の汚れを検査
する透明基板検査方法およびその装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a transparent substrate inspection method and apparatus for inspecting stains on a transparent substrate.

【0002】[0002]

【従来の技術】従来、透明基板である液晶用ガラス基板
の汚れを検査する場合には、液晶用ガラス基板を手に持
ち、工場ラインのボイラで蒸気を作り、あるいは、ポッ
トややかんからの蒸気により、これら蒸気を液晶用ガラ
ス基板に当て、ガラス基板に付着した蒸気によるくもり
具合によって汚れている個所や、油、ごみなど汚れの種
類を検査している。
2. Description of the Related Art Conventionally, when inspecting a glass substrate for liquid crystal, which is a transparent substrate, for dirt, hold the glass substrate for liquid crystal and make steam in a boiler on the factory line, or steam from a pot or kettle. By applying these vapors to the glass substrate for liquid crystal, the location where the vapor is attached to the glass substrate due to the cloudiness of the vapor and the type of contamination such as oil and dust are inspected.

【0003】[0003]

【発明が解決しようとする課題】しかしながら、上述の
ように、液晶用ガラス基板を手に持ち、この液晶用ガラ
ス基板に蒸気を当てる際には、人手で液晶用ガラス基板
を移動させながら蒸気を当てているため、熟練が必要で
あるとともに、液晶用ガラス基板の全面に均一に蒸気を
当てることができず、特に液晶用ガラス基板の端部の汚
れが発見できない。
However, as described above, when the liquid crystal glass substrate is held by hand and vapor is applied to the liquid crystal glass substrate, the vapor is generated by manually moving the liquid crystal glass substrate. Since it is applied, skill is required, and the vapor cannot be evenly applied to the entire surface of the glass substrate for liquid crystal, and in particular, dirt on the end portion of the glass substrate for liquid crystal cannot be found.

【0004】また、ポットまたはやかんからの蒸気を使
用すると、液晶用ガラス基板の全面に蒸気を当てるのに
時間がかかり、最初に蒸気がガラス基板に当たった部分
のくもりが消え、汚れている個所が見つけられないこと
がある。一方、工場ラインのボイラの蒸気を使用する
と、蒸気の量が多いため液晶用ガラス基板に水滴が付着
し、汚れを見つけることができないことがある。
Further, when steam from a pot or a kettle is used, it takes time to apply steam to the entire surface of the glass substrate for liquid crystal, and the cloudiness at the portion where the steam first hits the glass substrate disappears and the spot is dirty. May not be found. On the other hand, when steam from a boiler in a factory line is used, water drops adhere to the liquid crystal glass substrate due to the large amount of steam, and it may not be possible to find dirt.

【0005】さらに、液晶用ガラス基板の汚れを見つけ
ても短時間で蒸気によるくもりが消えるため、汚れが発
生している製造工程や装置などの場所や、汚れの原因を
探すことができない問題を有している。
Further, even if dirt on the glass substrate for liquid crystal is found, the cloudiness due to the vapor disappears in a short time, so that there is a problem that it is not possible to find the location of the manufacturing process or device where the dirt is generated, or the cause of the dirt. Have

【0006】本発明は、上記問題点に鑑みなされたもの
で、透明基板の汚れを簡単に検査できる透明基板の検査
方法および装置を提供することを目的とする。
The present invention has been made in view of the above problems, and an object of the present invention is to provide a transparent substrate inspection method and apparatus capable of easily inspecting the contamination of the transparent substrate.

【0007】[0007]

【課題を解決するための手段】請求項1記載の透明基板
の検査方法は、透明基板に蒸気を均一に瞬時に吹き付け
てくもらせ、このくもらせられた透明基板を撮影し、前
記透明基板の汚れを検査するものである。
A method for inspecting a transparent substrate according to claim 1, wherein vapor is uniformly and instantly blown on the transparent substrate so that the transparent substrate is photographed, and the transparent substrate is photographed. It is to inspect for dirt.

【0008】請求項2記載の透明基板の検査装置は、蒸
気を発生させる蒸気発生装置と、この蒸気発生装置によ
り発生された蒸気を吹き付ける吹付装置と、この吹付装
置および透明基板間に設けられこの吹付装置から吹き付
けられた蒸気を均一にする均一板と、蒸気が吹き付けら
れた透明基板を撮影する撮影手段とを具備したものであ
る。
According to a second aspect of the present invention, there is provided a transparent substrate inspecting apparatus, which is provided between a steam generating device for generating steam, a spraying device for spraying the steam generated by the steam generating device, and the spraying device and the transparent substrate. It is provided with a uniform plate for making the steam sprayed from the spraying device uniform and a photographing means for photographing the transparent substrate sprayed with the steam.

【0009】[0009]

【作用】請求項1記載の透明基板の検査方法は、透明基
板に蒸気を均一に瞬時に吹き付けてくもらせ、このくも
らせられた透明基板を撮影するため、瞬時に透明基板の
全体に蒸気が付着してくもり、このくもりを撮影するこ
とにより、水滴などが生じないため、熟練を必要とする
ことなく、簡単に汚れを検出できる。
In the method for inspecting a transparent substrate according to the first aspect, vapor is sprayed uniformly and instantly on the transparent substrate and the clouded transparent substrate is photographed. Therefore, the entire transparent substrate is instantly exposed to the vapor. Clouds that have adhered to the surface and images of the cloud can prevent water droplets and the like, and therefore stains can be easily detected without requiring skill.

【0010】請求項2記載の透明基板の検査装置は、蒸
気発生装置で蒸気を発生し、吹付装置で蒸気を吹き付
け、均一板により蒸気を均一にし、透明基板に蒸気を吹
き付けてくもらせ、撮影手段により蒸気が吹き付けられ
た透明基板を撮影するため、瞬時に透明基板の全体に蒸
気が付着してくもり、このくもりを撮影することによ
り、水滴などが生じないため、熟練を必要とすることな
く、簡単に汚れを検出できる。
According to a second aspect of the present invention, there is provided a transparent substrate inspection apparatus in which a steam generating device generates steam, a spraying device sprays the steam, a uniform plate makes the steam uniform, and the transparent substrate is sprayed with the steam to make it cloudy. Since the image of the transparent substrate sprayed with the vapor by means is taken, the vapor is instantly attached to the entire transparent substrate and becomes cloudy.By capturing this cloud, water droplets etc. do not occur, so there is no need for skill. , Dirt can be detected easily.

【0011】[0011]

【実施例】以下、本発明の透明基板の検査装置の一実施
例の液晶ガラス基板の検査装置を図面を参照して説明す
る。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A liquid crystal glass substrate inspection apparatus according to an embodiment of the present invention will be described below with reference to the drawings.

【0012】図1において、1は筐体で、この筐体1の
上部には蒸気吹出用の検査用開口2が形成され、また、
筐体1の下方ほぼ1/3の高さ位置には、矩形状の連通
孔3が形成された仕切板4にて上下方向に仕切られ、こ
の筐体1の内部は光の乱反射防止のため艶消しの黒色塗
装が施されている。
In FIG. 1, reference numeral 1 denotes a housing, and an inspection opening 2 for blowing out steam is formed in an upper portion of the housing 1, and
A partition plate 4 having a rectangular communication hole 3 is formed at a height position approximately one-third below the casing 1 so as to be vertically partitioned. The inside of the casing 1 is for preventing diffuse reflection of light. Matte black paint is applied.

【0013】そして、筐体1の仕切板4より下部側に
は、蒸気発生装置5が設けられている。この蒸気発生装
置5は、湯水を収容する受皿6の上方にライン状のヒー
タ7を配設したもので、ヒータ7により受皿6内の湯水
を加熱させることにより、蒸気を発生させる。
A steam generator 5 is provided below the partition plate 4 of the housing 1. The steam generator 5 has a line-shaped heater 7 disposed above a saucer 6 for storing hot water, and the heater 7 heats the hot water in the saucer 6 to generate steam.

【0014】また、蒸気発生装置5の上方には、図示し
ないファンを有する吹付装置としてのブロア8が設けら
れ、このブロア8の吹出孔9は連通孔3内にほぼ仕切板
4とほぼ同一の高さで設けられ、ブロア8を駆動するこ
とにより蒸気発生装置5で発生した蒸気を上方に吹き付
ける。
A blower 8 as a spraying device having a fan (not shown) is provided above the steam generator 5, and a blowout hole 9 of the blower 8 is substantially the same as the partition plate 4 in the communication hole 3. It is provided at a height and drives the blower 8 to blow the steam generated by the steam generator 5 upward.

【0015】さらに、筐体1の仕切板4の上方には、均
一板としてのメッシュ11が仕切板4とほぼ平行に設けら
れ、ブロア8により吹き付けられた蒸気を均一にして上
方に吹き出す。
Further, a mesh 11 as a uniform plate is provided above the partition plate 4 of the housing 1 substantially in parallel with the partition plate 4, and the steam blown by the blower 8 is made uniform and blows out upward.

【0016】また、筐体1の仕切板4の上方の側面に
は、直線状のランプ12を有する照明装置13が取り付けら
れ、この照明装置13の照射方向には照射開口14が形成さ
れ、この照射開口14には透明板15が装着されて閉塞され
ている。一方、この照明装置13と反対側の側面には筐体
1内の湿度を検出する湿度センサ16が装着され、この湿
度センサ16により蒸気発生装置5を制御して筐体1内の
湿度を一定にしている。
An illumination device 13 having a linear lamp 12 is attached to the upper side surface of the partition plate 4 of the housing 1, and an illumination opening 14 is formed in the illumination direction of the illumination device 13. A transparent plate 15 is attached to the irradiation opening 14 to close it. On the other hand, a humidity sensor 16 for detecting the humidity inside the housing 1 is mounted on the side surface opposite to the lighting device 13, and the humidity sensor 16 controls the steam generator 5 to keep the humidity inside the housing 1 constant. I have to.

【0017】さらに、検査用開口2の上方には、撮影手
段としてのカメラ17が支柱18にて取り付けられている。
Further, a camera 17 as a photographing means is attached above the inspection opening 2 by a column 18.

【0018】そして、検査用開口2の上部に、透明基板
としての液晶用ガラス基板19が載置されるようになって
いる。
A glass substrate 19 for liquid crystal, which is a transparent substrate, is placed on the inspection opening 2.

【0019】次に、上記実施例の動作について説明す
る。
Next, the operation of the above embodiment will be described.

【0020】まず、蒸気発生装置5の受皿6内に湯ある
いは水を収容し、ヒータ7を発熱させて受皿6より蒸気
を発生させる。この蒸気発生装置5により蒸気を発生さ
せるに際しては、湿度センサ16により筐体1内の湿度が
ほぼ一定になるように蒸気の発生量を制御する。また、
蒸気発生装置5で発生した蒸気は、メッシュ11にて蒸気
の流れを均一化するとともに、ブロア8の吹出孔9から
の吹き出しにより瞬時に上方に蒸気を吹き出す。
First, hot water or water is stored in the pan 6 of the steam generator 5, and the heater 7 is caused to generate heat to generate steam from the pan 6. When the steam is generated by the steam generator 5, the humidity sensor 16 controls the amount of steam generated so that the humidity in the housing 1 becomes substantially constant. Also,
The steam generated by the steam generator 5 makes the flow of the steam uniform in the mesh 11 and instantaneously blows the steam upward by the blowout from the blowout hole 9 of the blower 8.

【0021】次に、筐体1の検査用開口2の上方に被検
査用の液晶用ガラス基板19を載置し、照明装置13のラン
プ12を点灯させ、照射開口14の透明板15を介して液晶用
ガラス基板19の下面を照明する。
Next, the liquid crystal glass substrate 19 to be inspected is placed above the inspection opening 2 of the housing 1, the lamp 12 of the illumination device 13 is turned on, and the transparent plate 15 of the irradiation opening 14 is inserted. And illuminates the lower surface of the liquid crystal glass substrate 19.

【0022】そして、この状態で液晶用ガラス基板19の
蒸気によるくもりをカメラ17で撮影し、液晶用ガラス基
板19の汚れの有無を検査する。液晶用ガラス基板19に生
じた濃い、薄い、縞模様などくもり具合などにより、ど
んな汚れが発生しているかを判断し、汚れの発生原因を
探求する。
Then, in this state, the cloudiness of the liquid crystal glass substrate 19 due to the vapor is photographed by the camera 17, and the presence or absence of contamination of the liquid crystal glass substrate 19 is inspected. It is determined what kind of stains are caused by the degree of cloudiness such as dark, thin, and striped patterns generated on the liquid crystal glass substrate 19, and the cause of the stains is searched for.

【0023】上記実施例によれば、液晶用ガラス基板19
を検査用開口2の上方に載置することにより、液晶用ガ
ラス基板19の全体に蒸気が当たるため、人手で液晶用ガ
ラス基板19を移動させる必要がないので、熟練などが不
要で簡単に汚れなどを検査できるとともに、端部にも蒸
気が当たるため液晶用ガラス基板19の全体の汚れを検査
できる。
According to the above embodiment, the glass substrate for liquid crystal 19
Since the liquid crystal glass substrate 19 does not need to be manually moved because the entire liquid crystal glass substrate 19 is exposed to the vapor by placing the above the inspection opening 2, the liquid crystal glass substrate 19 does not require any skill and is easily soiled. In addition to being able to inspect, etc., the entire edge of the glass substrate for liquid crystal 19 can be inspected because steam hits the edges.

【0024】また、瞬時に液晶用ガラス基板19の全面に
蒸気が当たるため、蒸気が最初に液晶用ガラス基板19に
当たった部分のくもりが消えたりすることを防止できる
とともに、メッシュ11により全体に均一に蒸気を吹き出
すため、液晶用ガラス基板19に蒸気が付着しなかったり
水滴が付着して、汚れが発見できないことを防止でき
る。
Further, since the steam is instantly applied to the entire surface of the liquid crystal glass substrate 19, it is possible to prevent the fog from disappearing at the part where the steam first hits the liquid crystal glass substrate 19, and the mesh 11 covers the entire surface. Since the vapor is blown out uniformly, it is possible to prevent the vapor from not adhering to the glass substrate 19 for liquid crystal or the water droplets to prevent the stain from being found.

【0025】さらに、カメラ17により液晶用ガラス基板
19を撮影するため、短時間で蒸気によるくもりが消えて
も、汚れが発生している製造工程や装置などの場所や、
汚れの原因を探すことができる。
Further, a glass substrate for liquid crystal is used by the camera 17.
Since 19 is photographed, even if the cloudiness due to steam disappears in a short time, there are stains on the manufacturing process
You can find the cause of dirt.

【0026】[0026]

【発明の効果】請求項1記載の透明基板の検査方法によ
れば、透明基板に蒸気を均一に瞬時に吹き付けてくもら
せ、このくもらせられた透明基板を撮影するため、瞬時
に透明基板の全体に蒸気が付着してくもり、このくもり
を撮影することにより、水滴などが生じないため、熟練
を必要とすることなく、簡単に汚れを検出できる。
According to the transparent substrate inspection method of the first aspect, vapor is uniformly and instantly blown onto the transparent substrate, and the clouded transparent substrate is photographed. Since vapor adheres to the entire surface and causes cloudiness, and by imaging this cloudiness, water droplets and the like do not occur, and therefore dirt can be easily detected without requiring skill.

【0027】請求項2記載の透明基板の検査装置によれ
ば、蒸気発生装置で蒸気を発生し、吹付装置で蒸気を吹
き付け、均一板により蒸気を均一にし、透明基板に蒸気
を吹き付けてくもらせ、撮影手段により蒸気が吹き付け
られた透明基板を撮影するため、瞬時に透明基板の全体
に蒸気が付着してくもり、このくもりを撮影することに
より、水滴などが生じないため、熟練を必要とすること
なく、簡単に汚れを検出できる。
According to the transparent substrate inspection apparatus of the second aspect, the steam is generated by the steam generator, the steam is sprayed by the spraying device, the steam is made uniform by the uniform plate, and the steam is sprayed on the transparent substrate to make the cloudy haze. , Since the image of the transparent substrate sprayed with the vapor by the image capturing means is immediately attached to the entire transparent substrate, the vapor becomes cloudy and fog does not occur. Without this, dirt can be easily detected.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例の液晶ガラス基板の検査装置
を示す斜視図である。
FIG. 1 is a perspective view showing a liquid crystal glass substrate inspection apparatus according to an embodiment of the present invention.

【符号の説明】[Explanation of symbols]

5 蒸気発生装置 8 吹付装置としてのブロア 11 均一板としてのメッシュ 17 撮影手段としてのカメラ 19 透明基板としての液晶用ガラス基板 5 Steam generator 8 Blower as spraying device 11 Mesh as uniform plate 17 Camera as photographing means 19 Glass substrate for liquid crystal as transparent substrate

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 透明基板に蒸気を均一に瞬時に吹き付け
てくもらせ、 このくもらせられた透明基板を撮影し、 前記透明基板の汚れを検査することを特徴とする透明基
板の検査方法。
1. A method for inspecting a transparent substrate, which comprises spraying vapor uniformly and instantly on the transparent substrate to cause the transparent substrate to be photographed, and to inspect the transparent substrate for contamination.
【請求項2】 蒸気を発生させる蒸気発生装置と、 この蒸気発生装置により発生された蒸気を吹き付ける吹
付装置と、 この吹付装置および透明基板間に設けられこの吹付装置
から吹き付けられた蒸気を均一にする均一板と、 蒸気が吹き付けられた透明基板を撮影する撮影手段とを
具備したことを特徴とする透明基板の検査装置。
2. A steam generating device for generating steam, a spraying device for spraying the steam generated by the steam generating device, and a steam provided between the spraying device and the transparent substrate to spray the steam uniformly from the spraying device. An inspecting device for a transparent substrate, characterized by comprising: a uniform plate for performing an operation and an image capturing means for capturing an image of the transparent substrate sprayed with steam.
JP32539893A 1993-12-22 1993-12-22 Inspection method of transparent substrate and device therefor Pending JPH07181468A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP32539893A JPH07181468A (en) 1993-12-22 1993-12-22 Inspection method of transparent substrate and device therefor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP32539893A JPH07181468A (en) 1993-12-22 1993-12-22 Inspection method of transparent substrate and device therefor

Publications (1)

Publication Number Publication Date
JPH07181468A true JPH07181468A (en) 1995-07-21

Family

ID=18176403

Family Applications (1)

Application Number Title Priority Date Filing Date
JP32539893A Pending JPH07181468A (en) 1993-12-22 1993-12-22 Inspection method of transparent substrate and device therefor

Country Status (1)

Country Link
JP (1) JPH07181468A (en)

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KR101008338B1 (en) * 2008-03-20 2011-01-14 (주)리드 Apparatus for inspecting substrate surface using steam
KR101067972B1 (en) * 2002-12-31 2011-09-26 엘지디스플레이 주식회사 Apparatus for inspecting alignment film of liquid crystal display device
JP2018054575A (en) * 2016-09-30 2018-04-05 東海光学株式会社 Lens appearance inspection device
JP2018054576A (en) * 2016-09-30 2018-04-05 東海光学株式会社 Visual inspection device for lens

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
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KR101067972B1 (en) * 2002-12-31 2011-09-26 엘지디스플레이 주식회사 Apparatus for inspecting alignment film of liquid crystal display device
KR101008338B1 (en) * 2008-03-20 2011-01-14 (주)리드 Apparatus for inspecting substrate surface using steam
JP2018054575A (en) * 2016-09-30 2018-04-05 東海光学株式会社 Lens appearance inspection device
JP2018054576A (en) * 2016-09-30 2018-04-05 東海光学株式会社 Visual inspection device for lens

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