JPH07176555A - Resin flash removing device - Google Patents

Resin flash removing device

Info

Publication number
JPH07176555A
JPH07176555A JP31886693A JP31886693A JPH07176555A JP H07176555 A JPH07176555 A JP H07176555A JP 31886693 A JP31886693 A JP 31886693A JP 31886693 A JP31886693 A JP 31886693A JP H07176555 A JPH07176555 A JP H07176555A
Authority
JP
Japan
Prior art keywords
lead frame
resin
laser
resin burr
sides
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP31886693A
Other languages
Japanese (ja)
Other versions
JP2818536B2 (en
Inventor
Masami Shiroyama
正海 白山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP5318866A priority Critical patent/JP2818536B2/en
Publication of JPH07176555A publication Critical patent/JPH07176555A/en
Application granted granted Critical
Publication of JP2818536B2 publication Critical patent/JP2818536B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Abstract

PURPOSE:To provide an automatic machine having a YAG laser for removing resin flashes on the lead frame of a molded semiconductor devices. CONSTITUTION:With a lead frame 7 in a vertical position, a laser device is transported by a roller, 5 and from both sides of the lead frame 7, a galvano mirror is used to emit YAG laser 2. Resin soot and flashes generated are removed by a dust collection port 4 and a revolving brush 6.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、樹脂バリ除去装置に関
し、特に半導体素子(IC)の製造装置、特に封止済み
リードフレームのゲート部及びエアベント部の樹脂バリ
をレーザ光線で除去する半導体製造装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a resin burr removing apparatus, and more particularly to a semiconductor element (IC) manufacturing apparatus, and more particularly, a semiconductor manufacturing method for removing resin burr in a gate portion and an air vent portion of a sealed lead frame with a laser beam. Regarding the device.

【0002】[0002]

【従来の技術】従来、半導体製品封止済リードフレーム
7のゲート部17及びエアベント部16の樹脂を除去す
る為には、図8のように作業者がマイナスドライバー等
の平らなヘラ状のもの19で削り落すか、又は図9のよ
うにレーザ21によりリードフレーム7を水平状態で片
側から照射する事によりバリ除去を行っていた。このゲ
ート部17及びエアベント部16は封止樹脂が半導体素
子18の中へ未充填なく注入する為に必要であるが、エ
アベント16の樹脂バリは図11のように10〜30μ
m程度の薄い樹脂バリのため、大きなパッケージやボイ
ドの多い樹脂を用いる場合などにはリードフレーム7の
両側にエアベント16が必要で、除去が不十分の場合に
は、図10のように樹脂バリ16,17が後工程の切断
工程において、切断金型のパンチやダイの隙間に入りこ
んで樹脂バリを潰してしまい、金型製品を破損したり、
半導体素子18のリード22に樹脂バリ打痕等の不良を
発生させるという欠点があった。
2. Description of the Related Art Conventionally, in order to remove the resin of the gate part 17 and the air vent part 16 of a semiconductor product-sealed lead frame 7, as shown in FIG. The burrs were removed by scraping off with 19 or by irradiating the lead frame 7 from one side in a horizontal state with a laser 21 as shown in FIG. The gate portion 17 and the air vent portion 16 are necessary for injecting the sealing resin into the semiconductor element 18 without unfilling, but the resin burr of the air vent 16 is 10 to 30 μm as shown in FIG.
Since the resin burr is thin about m, air vents 16 are required on both sides of the lead frame 7 when a large package or a resin with many voids is used. In the subsequent cutting step, 16 and 17 enter the gap between the punch and die of the cutting die to crush the resin burr and damage the die product,
There has been a drawback that defects such as resin burr dents are generated on the leads 22 of the semiconductor element 18.

【0003】[0003]

【発明が解決しようとする課題】上述した従来の半導体
素子封止済みリードフレーム7のゲート部17及びエア
ベント部16の樹脂を除去する作業は、人手が非常に多
く必要であると共に、除去が不十分であったりしてばら
つきが大きかった。又、上方のみの樹脂バリ(表)16
除去では下側に発生している樹脂バリ(裏)16を除去
できないという不具合があった。更に、下側から照射す
るとレンズ15に樹脂バリのカスやススが付着しレーザ
21に正常に照射出来なくなるという問題があった。
The work of removing the resin of the gate portion 17 and the air vent portion 16 of the above-described conventional semiconductor element-sealed lead frame 7 requires a great deal of manpower and is not removable. It was enough, and there was a large variation. Also, the resin burr on the top only (front) 16
There is a problem that the resin burr (back) 16 generated on the lower side cannot be removed by the removal. Furthermore, there is a problem that when the laser beam is irradiated from the lower side, resin burr residue or soot adheres to the lens 15 and the laser beam 21 cannot be normally irradiated.

【0004】本発明の目的は樹脂バリ除去能力を向上さ
せることのできる樹脂バリ除去装置を提供することにあ
る。
An object of the present invention is to provide a resin deburring device which can improve the resin deburring ability.

【0005】[0005]

【課題を解決するための手段】本発明による樹脂バリ除
去装置は、リードフレームの樹脂注入ゲート部及びエア
ベント部の樹脂バリに対し、上記リードフレームの両側
からレーザ光を照射して樹脂バリの除去を行うことを特
徴とする。
SUMMARY OF THE INVENTION A resin burr removing device according to the present invention removes resin burr by irradiating the resin burr on the resin injection gate portion and the air vent portion of the lead frame with laser light from both sides of the lead frame. It is characterized by performing.

【0006】[0006]

【実施例】次に、本発明の実施例を図面を参照しながら
説明する。
Embodiments of the present invention will now be described with reference to the drawings.

【0007】図1は本発明の実施例1を示す構成図であ
る。図2は、図1のBB断面でローダー側からみた側面
図である。
FIG. 1 is a block diagram showing a first embodiment of the present invention. FIG. 2 is a side view seen from the loader side in the BB cross section of FIG. 1.

【0008】リードフレーム7は、リードフレームの両
側から挟んで回転により搬送する回転ローラ5により垂
直の状態でレーザ照射位置まで搬送される。そこで、高
出力YAGレーザ発振器3から発せられたYAGレーザ
21が角度可動式のガルバノミラー9と反射ミラー8に
よりリードフレーム7の両側に分離され、予め素子毎に
プログラムされたゲート部とエアベント部の位置に角度
可動式のガルバノミラー9が動いてYAGレーザ21が
照射され樹脂バリが除去される。照射時に落下した樹脂
バリは、照射位置の両側及び下方に位置した集塵口4か
ら吸引される、と同時にリードフレーム7は、回転ブラ
シ6によりフレーム7に付着している樹脂カスをブラシ
の回転により取り除くことが出来、ブラシの両側及び下
方より吸引を行い樹脂バリを完全に取り除く。このよう
に順次、半導体素子の樹脂バリを除去し、1枚のフレー
ムが完了した後、リードフレーム7は回転ローラ5によ
りアンローダー2に収納される。
The lead frame 7 is vertically conveyed to a laser irradiation position by a rotating roller 5 which is sandwiched from both sides of the lead frame and is conveyed by rotation. Therefore, the YAG laser 21 emitted from the high-output YAG laser oscillator 3 is separated on both sides of the lead frame 7 by the angle-movable galvano mirror 9 and the reflection mirror 8, and the gate portion and the air vent portion pre-programmed for each element are provided. The angle movable galvanometer mirror 9 moves to the position and the YAG laser 21 is irradiated to remove the resin burr. The resin burr that has fallen during irradiation is sucked from the dust collecting ports 4 located on both sides and below the irradiation position, and at the same time, the lead frame 7 causes the rotating brush 6 to rotate the resin debris attached to the frame 7 to rotate the brush. The resin burr can be completely removed by suctioning from both sides and below the brush. In this way, the resin burrs of the semiconductor element are sequentially removed, and after one frame is completed, the lead frame 7 is housed in the unloader 2 by the rotating roller 5.

【0009】図6及び図7は本発明の実施例2を示す構
成図である。
6 and 7 are configuration diagrams showing a second embodiment of the present invention.

【0010】基本的な構成及び動作状態は実施例1と同
じである。この実施例ではリードフレーム7を搬送する
搬送機構が搬送爪を使用する点が特徴である。ローダー
1からプッシャー14により1枚分離されたリードフレ
ーム7は搬送爪11により一定ピッチ毎搬送され、上記
実施例1と同様にレーザ21により樹脂バリが除去さ
れ、1枚のリードフレームが完了した後、搬送爪11で
アンローダー2に収納される。
The basic configuration and operating state are the same as in the first embodiment. This embodiment is characterized in that the carrying mechanism for carrying the lead frame 7 uses a carrying claw. After the lead frame 7 separated from the loader 1 by the pusher 14 is conveyed at a constant pitch by the conveying claws 11, the resin burr is removed by the laser 21 as in the first embodiment, and after one lead frame is completed. The transfer claws 11 are stored in the unloader 2.

【0011】[0011]

【発明の効果】以上説明したように本発明は、リードフ
レームが縦状に搬送されて両側からレーザが照射される
構造となっているので、リードフレームの両側の樹脂バ
リが同時に除去出来る利点がある。又、光学系が下方に
ないため、樹脂スス付着が低減され、レンズ交換のコス
ト低減や光学系のメンテ工数の削減が可能となる。
As described above, the present invention has a structure in which the lead frame is conveyed vertically and the laser is irradiated from both sides, so that the resin burr on both sides of the lead frame can be removed at the same time. is there. Further, since the optical system is not located at the lower side, adhesion of resin soot is reduced, which makes it possible to reduce the cost of lens replacement and the number of maintenance steps of the optical system.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施例1を示す上面図である。FIG. 1 is a top view showing a first embodiment of the present invention.

【図2】図1のBB断面でローダー1側からみた断面図
である。
FIG. 2 is a sectional view taken along the line BB of FIG. 1 viewed from the loader 1 side.

【図3】リードフレーム7のレーザ照射位置とブラシク
リーニング位置を示す図である。
FIG. 3 is a diagram showing a laser irradiation position and a brush cleaning position of the lead frame 7.

【図4】図1のCC断面でローダー側から見た図及び図
1のAA断面でローダー側から見た図である。
4 is a view seen from the loader side in the CC cross section of FIG. 1 and a view seen from the loader side in the AA cross section of FIG.

【図5】回転ブラシ6と集塵口4の相対位置を示す図で
ある。
FIG. 5 is a view showing a relative position between a rotating brush 6 and a dust collecting port 4.

【図6】本発明の実施例2を示す図である。FIG. 6 is a diagram showing a second embodiment of the present invention.

【図7】本発明の実施例2の上面図である。FIG. 7 is a top view of a second embodiment of the present invention.

【図8】従来の手作業の一例を示す概念図である。FIG. 8 is a conceptual diagram showing an example of conventional manual work.

【図9】従来のレーザによるゲート部バリ除去装置の一
例を示す概念図である。
FIG. 9 is a conceptual diagram showing an example of a conventional gate deburring device using a laser.

【図10】切断金型の側面図である。FIG. 10 is a side view of a cutting die.

【図11】半導体素子18とリードフレーム7の平面図
である。
11 is a plan view of the semiconductor element 18 and the lead frame 7. FIG.

【符号の説明】[Explanation of symbols]

1 ローダー 2 アンローダー 3 レーザ発振器 4 集塵口 5 回転ローラー 6 回転ブラシ 7 リードフレーム 8 反射ミラー 9 ガルバノミラー 10 集塵器 11 搬送爪 12 フレームガイド 13 駆動モーター 14 フッシャー 15 レンズ 16 エアベント樹脂バリ 17 ゲート樹脂バリ 18 半導体素子 19 マイナスドライバー等の平なヘラ 20 切断金型 21 YAGレーザ 22 リード 1 Loader 2 Unloader 3 Laser Oscillator 4 Dust Collector 5 Rotating Roller 6 Rotating Brush 7 Lead Frame 8 Reflecting Mirror 9 Galvano Mirror 10 Dust Collector 11 Conveying Claw 12 Frame Guide 13 Drive Motor 14 Footer 15 Lens 16 Air Vent Resin Burr 17 Gate Resin burr 18 Semiconductor element 19 Flat spatula such as flat head screwdriver 20 Cutting die 21 YAG laser 22 Lead

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 リードフレームの樹脂注入ゲート部及び
エアベント部の樹脂バリに対し、リードフレームの両側
からレーザ光を照射して樹脂バリの除去を行うことを特
徴とする樹脂バリ除去装置。
1. A resin deburring device, which removes resin burrs by irradiating the resin burrs of a resin injection gate portion and an air vent portion of a lead frame with laser light from both sides of the lead frame.
【請求項2】 前記リードフレームを垂直な状態で保持
して樹脂バリ除去を行うことを特徴とする樹脂バリ除去
装置。
2. A resin deburring apparatus, which holds the lead frame in a vertical state to remove the resin deburring.
JP5318866A 1993-12-20 1993-12-20 Resin deburring device Expired - Fee Related JP2818536B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5318866A JP2818536B2 (en) 1993-12-20 1993-12-20 Resin deburring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5318866A JP2818536B2 (en) 1993-12-20 1993-12-20 Resin deburring device

Publications (2)

Publication Number Publication Date
JPH07176555A true JPH07176555A (en) 1995-07-14
JP2818536B2 JP2818536B2 (en) 1998-10-30

Family

ID=18103842

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5318866A Expired - Fee Related JP2818536B2 (en) 1993-12-20 1993-12-20 Resin deburring device

Country Status (1)

Country Link
JP (1) JP2818536B2 (en)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100406509B1 (en) * 2001-04-10 2003-11-19 (주)오토엠아이티 Deflash system of semiconductor package
KR100413032B1 (en) * 2001-04-19 2003-12-31 주식회사 이오테크닉스 Apparatus for removing flash from integrated circuit package using laser
JP2004343038A (en) * 2003-05-12 2004-12-02 Jettech Ltd Semiconductor package having cutting groove on side flash, method of forming this cutting groove, deflashing method in semiconductor package having cutting groove
KR100478859B1 (en) * 2002-09-18 2005-03-24 주식회사 이오테크닉스 Cleaning method of adhesive residue material from a lead frame in semiconductor packaging process using laser
JP2007214237A (en) * 2006-02-08 2007-08-23 Seiko Instruments Inc Manufacturing method for semiconductor device
JP2011091194A (en) * 2009-10-22 2011-05-06 Renesas Electronics Corp Method of manufacturing semiconductor device, and method of manufacturing electronic device
KR101103690B1 (en) * 2010-07-20 2012-01-11 삼일테크(주) Collector for deflash
JP2013214775A (en) * 2013-07-17 2013-10-17 Renesas Electronics Corp Method for manufacturing semiconductor device
CN116899985A (en) * 2023-09-14 2023-10-20 浙江森尼克半导体有限公司 Lead frame flash removing method and device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54107673A (en) * 1978-02-13 1979-08-23 Toshiba Corp Manufacture for semiconductor device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54107673A (en) * 1978-02-13 1979-08-23 Toshiba Corp Manufacture for semiconductor device

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100406509B1 (en) * 2001-04-10 2003-11-19 (주)오토엠아이티 Deflash system of semiconductor package
KR100413032B1 (en) * 2001-04-19 2003-12-31 주식회사 이오테크닉스 Apparatus for removing flash from integrated circuit package using laser
KR100478859B1 (en) * 2002-09-18 2005-03-24 주식회사 이오테크닉스 Cleaning method of adhesive residue material from a lead frame in semiconductor packaging process using laser
JP2004343038A (en) * 2003-05-12 2004-12-02 Jettech Ltd Semiconductor package having cutting groove on side flash, method of forming this cutting groove, deflashing method in semiconductor package having cutting groove
JP2007214237A (en) * 2006-02-08 2007-08-23 Seiko Instruments Inc Manufacturing method for semiconductor device
JP4674813B2 (en) * 2006-02-08 2011-04-20 セイコーインスツル株式会社 Manufacturing method of semiconductor device
JP2011091194A (en) * 2009-10-22 2011-05-06 Renesas Electronics Corp Method of manufacturing semiconductor device, and method of manufacturing electronic device
KR101103690B1 (en) * 2010-07-20 2012-01-11 삼일테크(주) Collector for deflash
JP2013214775A (en) * 2013-07-17 2013-10-17 Renesas Electronics Corp Method for manufacturing semiconductor device
CN116899985A (en) * 2023-09-14 2023-10-20 浙江森尼克半导体有限公司 Lead frame flash removing method and device
CN116899985B (en) * 2023-09-14 2023-12-15 浙江森尼克半导体有限公司 Lead frame flash removing method and device

Also Published As

Publication number Publication date
JP2818536B2 (en) 1998-10-30

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