JPH0712940Y2 - Ｉｃ試験装置 - Google Patents

Ｉｃ試験装置

Info

Publication number
JPH0712940Y2
JPH0712940Y2 JP12940689U JP12940689U JPH0712940Y2 JP H0712940 Y2 JPH0712940 Y2 JP H0712940Y2 JP 12940689 U JP12940689 U JP 12940689U JP 12940689 U JP12940689 U JP 12940689U JP H0712940 Y2 JPH0712940 Y2 JP H0712940Y2
Authority
JP
Japan
Prior art keywords
test
terminal
during
line
logic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP12940689U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0368080U (enrdf_load_stackoverflow
Inventor
浩文 坪下
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP12940689U priority Critical patent/JPH0712940Y2/ja
Publication of JPH0368080U publication Critical patent/JPH0368080U/ja
Application granted granted Critical
Publication of JPH0712940Y2 publication Critical patent/JPH0712940Y2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP12940689U 1989-11-06 1989-11-06 Ｉｃ試験装置 Expired - Fee Related JPH0712940Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12940689U JPH0712940Y2 (ja) 1989-11-06 1989-11-06 Ｉｃ試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12940689U JPH0712940Y2 (ja) 1989-11-06 1989-11-06 Ｉｃ試験装置

Publications (2)

Publication Number Publication Date
JPH0368080U JPH0368080U (enrdf_load_stackoverflow) 1991-07-03
JPH0712940Y2 true JPH0712940Y2 (ja) 1995-03-29

Family

ID=31677035

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12940689U Expired - Fee Related JPH0712940Y2 (ja) 1989-11-06 1989-11-06 Ｉｃ試験装置

Country Status (1)

Country Link
JP (1) JPH0712940Y2 (enrdf_load_stackoverflow)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6331783B1 (en) * 1999-10-19 2001-12-18 Teradyne, Inc. Circuit and method for improved test and calibration in automated test equipment
JP2002040098A (ja) * 2000-07-24 2002-02-06 Advantest Corp 試験装置
JP5314412B2 (ja) * 2008-12-19 2013-10-16 株式会社アドバンテスト 電源装置および試験装置

Also Published As

Publication number Publication date
JPH0368080U (enrdf_load_stackoverflow) 1991-07-03

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