JPH0368080U - - Google Patents

Info

Publication number
JPH0368080U
JPH0368080U JP12940689U JP12940689U JPH0368080U JP H0368080 U JPH0368080 U JP H0368080U JP 12940689 U JP12940689 U JP 12940689U JP 12940689 U JP12940689 U JP 12940689U JP H0368080 U JPH0368080 U JP H0368080U
Authority
JP
Japan
Prior art keywords
test
terminal
during
logic
turned
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12940689U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0712940Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP12940689U priority Critical patent/JPH0712940Y2/ja
Publication of JPH0368080U publication Critical patent/JPH0368080U/ja
Application granted granted Critical
Publication of JPH0712940Y2 publication Critical patent/JPH0712940Y2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP12940689U 1989-11-06 1989-11-06 Ｉｃ試験装置 Expired - Fee Related JPH0712940Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12940689U JPH0712940Y2 (ja) 1989-11-06 1989-11-06 Ｉｃ試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12940689U JPH0712940Y2 (ja) 1989-11-06 1989-11-06 Ｉｃ試験装置

Publications (2)

Publication Number Publication Date
JPH0368080U true JPH0368080U (enrdf_load_stackoverflow) 1991-07-03
JPH0712940Y2 JPH0712940Y2 (ja) 1995-03-29

Family

ID=31677035

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12940689U Expired - Fee Related JPH0712940Y2 (ja) 1989-11-06 1989-11-06 Ｉｃ試験装置

Country Status (1)

Country Link
JP (1) JPH0712940Y2 (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002008775A1 (fr) * 2000-07-24 2002-01-31 Advantest Corporation Instrument d'essai
JP2003512630A (ja) * 1999-10-19 2003-04-02 テラダイン・インコーポレーテッド 自動試験装置における改良試験及び較正回路及び方法
JP2010148290A (ja) * 2008-12-19 2010-07-01 Advantest Corp 電源装置および試験装置

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003512630A (ja) * 1999-10-19 2003-04-02 テラダイン・インコーポレーテッド 自動試験装置における改良試験及び較正回路及び方法
WO2002008775A1 (fr) * 2000-07-24 2002-01-31 Advantest Corporation Instrument d'essai
JP2002040098A (ja) * 2000-07-24 2002-02-06 Advantest Corp 試験装置
KR100733256B1 (ko) * 2000-07-24 2007-06-27 주식회사 아도반테스토 시험장치
JP2010148290A (ja) * 2008-12-19 2010-07-01 Advantest Corp 電源装置および試験装置

Also Published As

Publication number Publication date
JPH0712940Y2 (ja) 1995-03-29

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