JPH07117383B2 - Electronic component mounting inspection method - Google Patents

Electronic component mounting inspection method

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Publication number
JPH07117383B2
JPH07117383B2 JP61161964A JP16196486A JPH07117383B2 JP H07117383 B2 JPH07117383 B2 JP H07117383B2 JP 61161964 A JP61161964 A JP 61161964A JP 16196486 A JP16196486 A JP 16196486A JP H07117383 B2 JPH07117383 B2 JP H07117383B2
Authority
JP
Japan
Prior art keywords
image
electronic component
photoelectric conversion
conversion means
light source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP61161964A
Other languages
Japanese (ja)
Other versions
JPS6318206A (en
Inventor
明 小野
賢司 佐々木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP61161964A priority Critical patent/JPH07117383B2/en
Publication of JPS6318206A publication Critical patent/JPS6318206A/en
Publication of JPH07117383B2 publication Critical patent/JPH07117383B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

【発明の詳細な説明】 〔発明の目的〕 (産業上の利用分野) 本発明は電子部品実装検査方法に関する。DETAILED DESCRIPTION OF THE INVENTION [Object of the Invention] (Field of Industrial Application) The present invention relates to an electronic component mounting inspection method.

(従来の技術) 印刷回路基板に例えば抵抗体、コンデンサなどの電子部
品の取り付け(電子部品の実装)後、その実装状態を検
査するため次のような手段が提案されている。即ち、コ
ンデンサなどの電子部品を装着した印刷回路基板に対
し、二方向から交互に斜光線を照射して得られた画像を
光電変換手段、例えばテレビカメラで撮り電気信号に変
えて電算機で画像処理することによって、実装した電子
部品の位置や形状など検出する手段が開発されている
(特開昭55−155205号公報)。
(Prior Art) After mounting electronic components such as resistors and capacitors (mounting electronic components) on a printed circuit board, the following means have been proposed for inspecting the mounting state. That is, an image obtained by alternately irradiating oblique rays from two directions on a printed circuit board on which electronic components such as a capacitor are mounted is captured by a photoelectric conversion unit, for example, a television camera, and converted into an electric signal to be converted into an image by a computer. A means for detecting the position and shape of the mounted electronic component by processing has been developed (JP-A-55-155205).

上記実装検出手段によれば電子部品の実装状態を容易に
検査、検出しうるが精度乃至信頼性の点で十分満足しう
るものとは云い難い。即ち電子部品を多数実装した印刷
回路基板について実装検査を行なった場合上記交互に斜
光線を照射して得られた画像に稍々不鮮明なものが認め
られたりするため検査に長い時間を要したり、また信頼
性の点において問題があった。
According to the mounting detection means, the mounting state of the electronic component can be easily inspected and detected, but it is difficult to say that the mounting state is sufficiently satisfactory in terms of accuracy and reliability. That is, when a mounting inspection is performed on a printed circuit board on which a large number of electronic components are mounted, it takes a long time to inspect because the image obtained by alternately irradiating the oblique rays may be unclear. Also, there was a problem in terms of reliability.

(発明が解決しようとする問題点) 従って本発明は簡単な画像処理で、実装されている電子
部品の装着位置の誤差や部品形状の異常などの検出乃至
検査を信頼性高く行ないうる電子部品の実装検査方法を
提供することを目的とする。
(Problems to be Solved by the Invention) Therefore, the present invention provides an electronic component capable of highly reliable detection or inspection of an error in the mounting position of an electronic component mounted or an abnormality in the component shape by simple image processing. The purpose is to provide a mounting inspection method.

〔発明の構成〕[Structure of Invention]

(問題点を解決するための手段) 本発明は、実装された電子部品の稜線もしくは母線が一
定方向に配設されている印刷回路基板を支持台に載置す
る工程と、光源からの光を前記稜線もしくは母線の方向
に対して傾斜しかつ前記電子部品の影像をその上方より
撮像する光電変換手段を介して互いに対向する方向から
前記電子部品に照射する工程と、前記光源からの光照射
による前記電子部品の影像をその上方より撮像し前記光
電変換手段により電気信号に変換する工程と、前記光電
変換手段で出力した出力信号を画像処理装置により画像
処理する工程とを備えたことを特徴とする電子部品実装
検査方法である。
(Means for Solving Problems) The present invention provides a step of mounting a printed circuit board on which a ridgeline or a busbar of a mounted electronic component is arranged in a certain direction on a support base, and By irradiating the electronic component from directions opposite to each other through photoelectric conversion means for capturing an image of the electronic component from above, which is inclined with respect to the direction of the ridgeline or the generatrix, and by irradiating light from the light source. A step of capturing an image of the electronic component from above and converting it into an electric signal by the photoelectric conversion means; and a step of image-processing an output signal output by the photoelectric conversion means by an image processing device. This is an electronic component mounting inspection method.

(作用) 上記構成により、少なくとも二方向から照射した光によ
って、印刷回路基板に表われる画像乃至影像は一定の出
力信号を出す。即ち実装されている電子部品はその稜線
もしくは母線に対し斜め方向から常に光が照射されるこ
とになるため、全ての電子部品について所定の画像乃至
影像を呈する。従って光電変換手段による出力も実装さ
れている電子部品全てについて一様となるため実装部品
の検査の信頼性が向上する。また、予め記憶させておい
た電子部品の基準像などを移動させながら上記出力を電
気信号(画像処理)と対比することによって電子部品が
異常形状であるか否かも検出できる。
(Operation) With the above configuration, the image or image displayed on the printed circuit board outputs a constant output signal by the light emitted from at least two directions. That is, since the mounted electronic components are always irradiated with light from the oblique direction with respect to the ridgeline or the generatrix thereof, all the electronic components show a predetermined image or image. Therefore, the output from the photoelectric conversion means is also uniform for all the mounted electronic components, so that the reliability of the inspection of the mounted components is improved. It is also possible to detect whether or not the electronic component has an abnormal shape by comparing the output with an electric signal (image processing) while moving a reference image of the electronic component stored in advance.

(実施例) 以下本発明の実施例を示す第1図および第2図を参照し
て本発明を説明する。第1図において(1)は支持台、
(2)は被検査体である電子部品(2a)を実装された印
刷回路基板であって前記支持台(1)上に載置される。
しかして上記印刷回路基板(2)は、例えば抵抗体,コ
ンデンサ,半導体素子などの電子部品(2a)を、例えば
それら各電子部品(2a)の稜線もしくは母線と基板(2
b)の辺とが平行もしくは直交するように配設、実装し
たものである。また(3),(4)は前記印刷回路基板
(2)に対して、それぞれ異なる方向から交互に光を照
射する光源例えばランプであり、これら光源(3),
(4)は、印刷回路基板(2)の被照射面における照射
強度がほぼ等しいものが選ばれる。(5)は上記印刷回
路基板(2)を光源(3),(4)で交互に照射したと
きの画像をその鉛直上方より撮像し電気信号に変換する
光電変換手段、例えばテレビカメラである。さらに
(6)は前記光電変換手段(5)で出力された出力信号
を画像処理する手段であって次のように構成されてい
る。即ち光電変換手段(5)で出力された信号、例えば
光源(3)を照射したときの出力信号を記憶する第一の
信号記憶装置(7a)および光源(4)を照射したときの
出力信号を記憶する第二の信号記憶装置(7b)と、これ
ら両信号記憶装置(7a),(7b)に記憶された信号を同
期した再生し、レベル差の把握乃至出力信号の相殺を行
なう引算装置(8)と、前記引算装置(8)にて得られ
た出力信号の差もしくは出力信号差の絶対値から形状信
号を演算する演算装置(9)と、前記演算装置(9)で
演算された形状信号を予め設定されている基準信号と比
較して判定信号を出力表示する判定装置(10)とから構
成されている。しかして本発明においては、上記互に異
なる方向から被検査体を交互に照射する光源(3),
(4)および照射面の画像をその鉛直上方より撮像し電
気信号に変換する光電変換手段(5)の配設について特
に考慮を払っている。即ち第2図に平面的に示すよう
に、光源(3)と光電変換手段(5)とを結ぶ線(照明
線)の延長線(11a)および光源(4)と光電変換手段
(5)とを結ぶ線(照明線)の延長線(11b)がそれぞ
れ被検査体である印刷回路基板(2)の辺に対し傾斜し
て交叉する状態を採るように前記光源(3),(4)お
よび光電変換手段(5)を特に配設している。
(Example) The present invention will be described below with reference to FIGS. 1 and 2 showing an example of the present invention. In FIG. 1, (1) is a support base,
(2) is a printed circuit board on which an electronic component (2a), which is an object to be inspected, is mounted, and is placed on the support base (1).
Therefore, the printed circuit board (2) includes electronic components (2a) such as resistors, capacitors, and semiconductor elements, for example, ridge lines or bus bars of the respective electronic components (2a) and the substrate (2).
It is arranged and mounted so that the side of b) is parallel or orthogonal to the side. Further, (3) and (4) are light sources, for example, lamps that alternately irradiate the printed circuit board (2) with light from different directions.
For (4), the one having substantially the same irradiation intensity on the surface to be irradiated of the printed circuit board (2) is selected. (5) is a photoelectric conversion means, for example, a television camera, which picks up an image when the printed circuit board (2) is alternately irradiated with the light sources (3) and (4) from the vertically upper side thereof and converts it into an electric signal. Further, (6) is a means for image-processing the output signal output from the photoelectric conversion means (5), and is configured as follows. That is, a signal output from the photoelectric conversion means (5), for example, a first signal storage device (7a) for storing an output signal when the light source (3) is irradiated and an output signal when the light source (4) is irradiated are A second signal storage device (7b) for storing and a subtraction device for reproducing the signals stored in the both signal storage devices (7a), (7b) in synchronization with each other to grasp the level difference or cancel the output signal. (8), a calculation device (9) for calculating a shape signal from the difference between the output signals or the absolute value of the output signal difference obtained by the subtraction device (8), and the calculation device (9). The shape signal is compared with a preset reference signal, and the judgment signal is output and displayed. In the present invention, however, the light sources (3) for alternately irradiating the object to be inspected from different directions,
Particular consideration is given to (4) and the arrangement of the photoelectric conversion means (5) for picking up the image of the irradiation surface from above vertically and converting it into an electric signal. That is, as shown in plan view in FIG. 2, an extension line (11a) of the line (illumination line) connecting the light source (3) and the photoelectric conversion means (5), the light source (4), and the photoelectric conversion means (5). The light sources (3), (4), and (4) so that the extension lines (11b) of the lines (illumination lines) connecting the lines intersect with the sides of the printed circuit board (2) that is the object to be inspected. The photoelectric conversion means (5) is especially arranged.

次に上記構成による本発明の電子部品実装検査方法の詳
細について説明する。先ず支持台(1)に被検査体とし
ての印刷回路基板(2)を載置し、一方の光源(3)を
点灯し印刷回路基板(2)面を照射する。次いでこの光
照射面の光電変換手段(5)例えばテレビカメラで影像
の鉛直上方より撮像し、電気信号に変換して第一の信号
記憶装置(7a)に記憶させる。しかる後光源(3)を消
灯する一方、他の光源(4)を点灯し、光照射面の画像
を同じく撮像し光電変換手段(5)にて電気信号に変換
して第二の信号記憶装置(7b)に記憶させる。ところで
本実施例においては印刷回路基板(2)の電子部品(2
a)はそれら電子部品(2a)の稜線もしくは母線が基板
(2b)の辺に対して平行もしくは直交するように実装さ
れており、且つ光源(3),(4)からの各光照射は、
前記実装された電子部品(2a)の稜線や母線に対し傾斜
した方向からなされることになる。従って、例えば光源
(3)で照射したとき影像(画像)であった部分は光源
(4)で照射したときには上記映像を呈しなかったり、
呈しても薄かったりするのに対し、光源(3)の光照射
時に影像を呈しなかった部分などが逆に影像を呈するこ
とになる。こうして得られた光源(3)からの光照射に
よる画像を変換した電気信号の値と、光源(4)からの
光照射により得られた画像を変換した電気信号の値との
差を求めることにより、出力信号が共に同じレベルを持
つ電子部品(2a)等の箇所に対応する電気信号値は打ち
消されて、それぞれの照射により別個に形成された影の
部分に対応する電気信号値だけが残る。この電気信号の
有無の境界の座標値をもとにさらに演算処理を施すこと
により、その電子部品(2a)の形状が分かる。例えば上
記光源(3),(4)と光電変換手段(5)とをそれぞ
れ結ぶ延長線(11a),(11b)が基板(2b)の辺に対し
てそれぞれ45度傾斜している場合、電子部品(2a′)の
影像(画像)は第3図に模写的に示す如く、光源(3)
で光照射したときの影像(12a)と光源(4)で照射し
たときの影像(12b)とから作られることになる。なお
回路パターンなど基板(2b)の面よりほとんど突出して
いない部分については影像はほとんど出ず、また出ても
後述するレベル差の把握段階で相殺される。上記印刷回
路基板(2)の電子部品(2a)についての影像(画像)
はその鉛直上方に光電変換手段(5)によってそれぞれ
電気信号に変えられ、第一の信号記憶装置(7a)、第二
の信号記憶装置(7b)にそれぞれ記憶され次の引算装置
(8)にて同期再生され両出力信号の差(レベル差)を
求める。即ち前記第一および第二の両信号記憶装置(7
a),(7b)にてそれぞれ記憶した各出力信号、例えば
第3図示の影像について光源(3)で光照射したときの
出力信号fA(x,y)と光源(4)で光照射したときの出
力信号fB(x,y)との差または差の絶対値|fA(x,y)−f
B(x,y)|を引算装置(8)で求める。かくして求めた
レベル差は次の演算装置(9)にて形状乃至位置信号に
演算される。例えば第3図においてx軸に平行な線(1
3)に沿った上記|fA(x,y)−fB(x,y)|は第4図に示
すような信号強度分布を呈するので、前記信号強度分布
における内ベリの位置x1,x2、即ち電子部品の位置が分
る。一方上記平行な線(13)を順次平行移動させその都
度x1,x2を求めそれらx1,x2の平均値1,を得、これ
がその電子部品(2a′)のx軸位置座標となる。同様に
yについても行ないy1,y2から位置が分り、さらに1,
を得(y軸位置座標)ることによって実装されてい
る電子部品(2a)の形状が分る。かくして演算装置
(9)で演算された形状信号乃至位置信号は予め基準値
(設定値)を記憶格納してある判定装置(10)において
比較判定され、その判定結果が表示される。なおこの判
定装置(10)に予め記憶格納する基準像(設定値)、即
ち実装検査の対象となる電子部品(2a)の基準像は対応
する電子部品の輪郭像や影像或いは影像を2値化した像
またはそれらの一部例えば第5図に示す如く輪郭像(1
4)の一部でもよい。また上記判定装置(10)での比較
判定において上記の如く信号強度分布の内べりx1,x2
よびy1,y2を求めて対比せず、信号強度分布(影像)を
予め記憶させてある基準像と直接対比して合致状況から
電子部品(2a)の位置を検出することもできる(この場
合は演算装置(9)による演算は不要となる)。
Next, details of the electronic component mounting inspection method of the present invention having the above configuration will be described. First, the printed circuit board (2) as an object to be inspected is placed on the support base (1), one light source (3) is turned on, and the printed circuit board (2) surface is irradiated. Next, the photoelectric conversion means (5) of this light irradiation surface, for example, a television camera, captures an image from vertically above, converts it into an electric signal, and stores it in the first signal storage device (7a). After that, the light source (3) is turned off while the other light source (4) is turned on, the same image of the light irradiation surface is picked up, and the photoelectric conversion means (5) converts the electric signal into an electric signal, which is the second signal storage device. Store it in (7b). By the way, in the present embodiment, the electronic components (2
a) is mounted so that the ridgelines or generatrix of these electronic components (2a) are parallel or orthogonal to the sides of the substrate (2b), and the light irradiation from the light sources (3) and (4) is
This is done from the direction inclined with respect to the ridgeline and the generatrix of the mounted electronic component (2a). Therefore, for example, a portion that was a shadow image (image) when illuminated by the light source (3) does not show the above image when illuminated by the light source (4),
Although it is thin even if it is presented, the portion which did not present an image when the light source (3) irradiates the light presents an image on the contrary. By calculating the difference between the value of the electric signal obtained by converting the image obtained by the light irradiation from the light source (3) and the value of the electric signal obtained by converting the image obtained by the light irradiation from the light source (4). , The electric signal values corresponding to the parts of the electronic component (2a) or the like whose output signals have the same level are canceled out, and only the electric signal values corresponding to the shadow portions formed separately by the respective irradiations remain. The shape of the electronic component (2a) can be known by further performing arithmetic processing based on the coordinate value of the boundary of the presence or absence of the electric signal. For example, when the extension lines (11a) and (11b) connecting the light sources (3) and (4) and the photoelectric conversion means (5) are inclined at 45 degrees with respect to the sides of the substrate (2b), respectively, The image (image) of the part (2a ') is a light source (3) as shown in FIG.
It is made from the image (12a) when illuminated by the light and the image (12b) when illuminated by the light source (4). It should be noted that almost no image appears in a portion such as a circuit pattern that does not protrude from the surface of the substrate (2b), and even if it appears, it is offset in the level difference grasping step described later. Image (image) of the electronic component (2a) of the printed circuit board (2)
Are converted vertically into electric signals by photoelectric conversion means (5) and stored in the first signal storage device (7a) and the second signal storage device (7b) respectively, and the next subtraction device (8). Are reproduced synchronously at and the difference (level difference) between both output signals is obtained. That is, the first and second signal storage devices (7
Each output signal stored in a) and (7b), for example, output signal f A (x, y) when light is emitted from the light source (3) for the image shown in FIG. 3 and light is emitted from the light source (4) Output signal f B (x, y) or the absolute value of the difference | f A (x, y) −f
B (x, y) | is calculated by the subtraction device (8). The level difference thus obtained is calculated as a shape or position signal by the following calculation device (9). For example, in FIG. 3, a line (1
Since the above | f A (x, y) −f B (x, y) | along 3) exhibits the signal intensity distribution as shown in FIG. 4, the position of the inner veri in the signal intensity distribution x 1 , x 2, ie it is found position of the electronic component. Meanwhile the average value 1 of the parallel lines (13) by sequentially translating each time seek x 1, x 2 which x 1, x 2, 2 to give, this x-axis coordinates of the electronic component (2a ') Becomes Similarly, for y, the position is known from y 1 , y 2 , and further 1 ,
By obtaining 2 (y-axis position coordinate), the shape of the mounted electronic component (2a) can be known. Thus, the shape signal or the position signal calculated by the calculation device (9) is compared and judged by the judgment device (10) in which the reference value (setting value) is stored beforehand and the judgment result is displayed. The reference image (setting value) stored in advance in the determination device (10), that is, the reference image of the electronic component (2a) that is the object of the mounting inspection, binarizes a contour image, a shadow image, or a shadow image of the corresponding electronic component. Images or parts of them, such as the contour image (1
It may be part of 4). In addition, in the comparison determination by the determination device (10), the inner velocities x 1 and x 2 and y 1 and y 2 of the signal intensity distribution are obtained and compared as described above, and the signal intensity distribution (image) is stored in advance. The position of the electronic component (2a) can be detected from the matching state by directly comparing with a certain reference image (in this case, the calculation by the calculation device (9) is unnecessary).

さらに上記判定装置(10)における比較判定において第
6図に示す如く、予め記憶格納してある基準像(設定
値)即ち基準となる電子部品の輪郭像(14)、影像、影
像を2値化した像もしくはそれらの一部を移動させなが
ら前記演算装置(9)で演算した形状信号乃至位置信号
の内ベリx1,x2およびy1,y2との合致度を演算することに
より電子部品の形状異常も容易に検出できる。即ち基準
像における内ベリと実装電子部品についての演算による
内ベリとが一致している程、合致度の最大値は高いが例
えば実装電子部品が破損などし形状が異常の場合には上
記合致度の最大値が異常に低くなるため形状異常を容易
に検出しうることになる。しかしてこの形状異常の検出
は上記形状信号乃至位置信号の内ベリx1,x2やy1,y2との
合致度を演算することなく、信号強度分布を基準像(基
準となる電子部品の輪郭像など)と対比し、その合致度
合から形状の異常を判定しうる。例えば基準輪郭像に比
べ実装電子部品についての信号強度分布の強度幅が広い
かまたは狭いかと云うことは実装電子部品が高さ方向に
おいて高いかまたは低いかに相当し、形状異常と判定し
うる。
Further, in the comparison judgment in the judgment device (10), as shown in FIG. 6, the reference image (set value) stored in advance, that is, the outline image (14), the image, and the image of the reference electronic component are binarized. electronic components by calculating the image or coincidence degree between the inner Beri x 1, x 2 and y 1, y 2 of the operational shape signal to the position signal by the arithmetic unit while moving a portion thereof (9) The abnormal shape can be easily detected. That is, the greater the match between the inner verities in the reference image and the inner verities calculated by the mounted electronic parts, the higher the maximum matching value. Since the maximum value of is abnormally low, the shape abnormality can be easily detected. However, the shape abnormality is detected by calculating the signal intensity distribution using a reference image (reference electronic component without calculating the degree of coincidence of the shape signal or the position signal with the verities x 1 , x 2 and y 1 , y 2). The contour abnormality can be determined from the degree of matching. For example, whether the intensity width of the signal intensity distribution of the mounted electronic component is wider or narrower than that of the reference contour image corresponds to whether the mounted electronic component is high or low in the height direction, and it can be determined that the shape is abnormal.

上記実施例では被検査体である印刷回路基板(2)にお
いては電子部品を、その電子部品の稜線もしくは母線が
基板(2b)の辺に対し直交または平行になるよう実装,
配設したが要はそれら実装された電子部品の稜線もしく
は母線が一定の方向に揃っていればよいことになる。ま
た印刷回路基板(2)への照射光線を2個を用いたが光
源を1個とし例えば回転ミラーで切換え二方向から光を
照射するようにしてもよいし、また光の照射は二方向に
限らず三方向もしくは四方向など多方向から行なっても
よい。この場合、例えば三方向から光照射した場合には
信号出力差は2fA(x,y)−fB(x,y)−fC(x,y)の形で
算出される。しかして上記光照射するに当ってはスイッ
チによる光源の点灯,消灯に限らず光シャッタ或いは偏
光利用の電気シャッタなどによる選択的なしゃ光方式や
照射光の強度差を付けることによってもよい。また印刷
回路基板(2)の光照射面の影像(画像)を撮像し光電
変換する手段(5)はテレビカメラに限らず半導体光電
変換素子などでもよい。しかして上記少なくとも二方向
から照射する光源は光電変換手段(5)に対して対称的
な配設とする。また光電変換手段(5)と光源(3),
(4)との配設も、それらが互に結ぶ延長線(11a),
(11b)が基板(2b)の辺即ち一定方向に配設された電
子部品(2a)に対し好しくは45度程度の傾斜であるが必
ずしも、これに限定されない。さらに被検査体である印
刷回路基板(2)を載置する支持台(1)はXY軸方向に
可動なテーブルとし、検査に当って印刷回路基板(2)
の位置を適宜変えて所要の実装検査を行ないうる。
In the above-mentioned embodiment, the electronic component is mounted on the printed circuit board (2) which is the object to be inspected so that the ridge line or the generatrix of the electronic component is orthogonal or parallel to the side of the substrate (2b),
Although they are arranged, the point is that the ridgelines or busbars of the mounted electronic components are aligned in a certain direction. Further, although two light rays are applied to the printed circuit board (2), one light source may be used and the light may be emitted from two directions by switching with a rotating mirror, for example. The present invention is not limited to this, and may be performed from multiple directions such as three directions or four directions. In this case, for example, the signal output difference when light illuminated from three directions is 2f A (x, y) -f B (x, y) -f C (x, y) is calculated in the form of. However, the light irradiation is not limited to turning on and off the light source by a switch, and may be performed by a selective light-shielding method using an optical shutter or an electric shutter using polarized light, or by providing a difference in intensity of irradiation light. The means (5) for picking up and photoelectrically converting the image (image) of the light irradiation surface of the printed circuit board (2) is not limited to the television camera but may be a semiconductor photoelectric conversion element or the like. Therefore, the light sources for radiating from at least two directions are symmetrically arranged with respect to the photoelectric conversion means (5). In addition, the photoelectric conversion means (5) and the light source (3),
The arrangement with (4) is also an extension line (11a) connecting them,
The angle (11b) is preferably about 45 degrees with respect to the side of the substrate (2b), that is, the electronic component (2a) arranged in a certain direction, but is not necessarily limited to this. Further, the support base (1) on which the printed circuit board (2) to be inspected is placed is a table movable in the XY axis directions, and the printed circuit board (2) is used for inspection.
The required mounting inspection can be performed by appropriately changing the position of.

〔発明の効果〕〔The invention's effect〕

上記の如く本発明によれば、電子部品の稜線もしくは母
線が一定の方向に方向付けられて電子部品を実装した印
刷回路基板について照明線(光源と光電変換手段とを結
ぶ線)を前記電子部品の配設方向に対して傾斜させて光
源を配設する構成となっている。このため実装検査する
電子部品個々について照明線を変えることなく各電子部
品について確実に、明認しうる影像(画像)が容易に得
られる。従って光電変換手段による出力信号に対する事
後の画像処理で演算した各電子部品についての影像の内
ベリ位置1,2,1,などを求めるだけで容易にそ
れら電子部品の位置を検出しうる。また予め記憶,格納
してある各電子部品の輪郭像などの基準像(設定値)を
移動させながら検出した電子部品の影像(画像)につい
ての演算による内ベリ値x1,x2,y1,y2との合致度合など
から実装されている電子部品の異常形状(例えば破損欠
陥のあるもの、品種の誤り)をも検出できる。かくして
本発明に係る電子部品実装検査方法によれば電子部品の
実装状態を確実且つ高精度に検査しうることになる。
As described above, according to the present invention, the illumination line (the line connecting the light source and the photoelectric conversion means) is provided on the printed circuit board on which the electronic component is mounted with the ridgeline or the generatrix of the electronic component oriented in a certain direction. The light source is arranged so as to be inclined with respect to the arrangement direction. Therefore, a recognizable image (image) can be easily obtained with certainty for each electronic component without changing the illumination line for each electronic component to be mounted and inspected. Therefore, the positions of the electronic components can be easily detected only by obtaining the in-verify positions 1 , 2 , 1 , 2, etc. of the images of the electronic components calculated in the subsequent image processing on the output signal by the photoelectric conversion means. In addition, the internal verification values x 1 , x 2 , y 1 are calculated by calculating the image (image) of the electronic component detected while moving the reference image (set value) such as the outline image of each electronic component stored and stored in advance. , y 2 and the like, it is possible to detect an abnormal shape of the mounted electronic component (for example, one having a damage defect, an error in the product type). Thus, according to the electronic component mounting inspection method of the present invention, the mounting state of electronic components can be inspected reliably and highly accurately.

【図面の簡単な説明】[Brief description of drawings]

第1図は本発明の電子部品実装検査方法の実施例を示す
概略構成図、第2図は第1図における印刷回路基板に対
する光源および光電変換手段の配置関係を示す平面図、
第3図は第1図の装置において得られた電子部品の影像
を示す模写図、第4図は第3図の影像においてx軸方向
における信号強度を示す特性図、第5図は第1図の装置
において予め記憶格納させた基準値(像)の一例を示す
模写図、第6図は第1図の装置における動作の一例を示
す説明図である。 (1):支持台、(2):印刷回路基板、(2a):電子
部品、(2b):基板、(3),(4):光源、(5):
光電変換手段、(6):画像処理装置、 (11a),(11b):光源と光電変換手段とを結ぶ延長
線。
FIG. 1 is a schematic configuration diagram showing an embodiment of an electronic component mounting inspection method of the present invention, and FIG. 2 is a plan view showing an arrangement relationship of a light source and photoelectric conversion means with respect to a printed circuit board in FIG.
FIG. 3 is a copy diagram showing an image of an electronic component obtained in the apparatus of FIG. 1, FIG. 4 is a characteristic diagram showing signal intensity in the x-axis direction in the image of FIG. 3, and FIG. 5 is FIG. 6 is an imitation diagram showing an example of reference values (images) stored and stored in advance in the apparatus of FIG. 6, and FIG. 6 is an explanatory diagram showing an example of operation in the apparatus of FIG. (1): support, (2): printed circuit board, (2a): electronic component, (2b): substrate, (3), (4): light source, (5):
Photoelectric conversion means, (6): image processing device, (11a), (11b): extended line connecting the light source and the photoelectric conversion means.

───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 昭60−140107(JP,A) 特開 昭52−63753(JP,A) 特開 昭55−155205(JP,A) 特開 昭59−107202(JP,A) ─────────────────────────────────────────────────── ─── Continuation of front page (56) References JP-A-60-140107 (JP, A) JP-A-52-63753 (JP, A) JP-A-55-155205 (JP, A) JP-A-59- 107202 (JP, A)

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】実装された電子部品の稜線もしくは母線が
一定方向に配設されている印刷回路基板を支持台に載置
する工程と、 光源からの光を前記稜線もしくは母線の方向に対して傾
斜しかつ前記電子部品の影像をその上方より撮像する光
電変換手段を介して互いに対向する方向から前記電子部
品に照射する工程と、 前記光源からの光照射による前記電子部品の影像をその
上方より撮像し前記光電変換手段により電気信号に変換
する工程と、 前記光電変換手段で出力した出力信号を画像処理装置に
より画像処理する工程とを備えたことを特徴とする電子
部品実装検査方法。
1. A step of placing a printed circuit board on which a ridgeline or a generatrix of a mounted electronic component is arranged in a fixed direction on a support base, and light from a light source with respect to the direction of the ridgeline or the generatrix. A step of irradiating the electronic component from a direction opposite to each other through a photoelectric conversion means for inclining and imaging the image of the electronic component from above, and a shadow image of the electronic component due to light irradiation from the light source from above An electronic component mounting inspection method comprising: a step of capturing an image and converting it into an electric signal by the photoelectric conversion means; and a step of image-processing an output signal output by the photoelectric conversion means by an image processing device.
JP61161964A 1986-07-11 1986-07-11 Electronic component mounting inspection method Expired - Lifetime JPH07117383B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61161964A JPH07117383B2 (en) 1986-07-11 1986-07-11 Electronic component mounting inspection method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61161964A JPH07117383B2 (en) 1986-07-11 1986-07-11 Electronic component mounting inspection method

Publications (2)

Publication Number Publication Date
JPS6318206A JPS6318206A (en) 1988-01-26
JPH07117383B2 true JPH07117383B2 (en) 1995-12-18

Family

ID=15745417

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61161964A Expired - Lifetime JPH07117383B2 (en) 1986-07-11 1986-07-11 Electronic component mounting inspection method

Country Status (1)

Country Link
JP (1) JPH07117383B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102010030859B4 (en) * 2009-07-03 2019-01-24 Koh Young Technology Inc. A method of inspecting a target mounted on a substrate

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4041286A (en) * 1975-11-20 1977-08-09 The Bendix Corporation Method and apparatus for detecting characteristic features of surfaces
JPS55155205A (en) * 1979-05-23 1980-12-03 Toshiba Corp Form detector
JPS59107202A (en) * 1982-12-10 1984-06-21 Matsushita Electric Ind Co Ltd Checking device of fitting position of minute parts
JPS60140107A (en) * 1983-12-28 1985-07-25 Hitachi Ltd Shape detecting method and apparatus thereof

Also Published As

Publication number Publication date
JPS6318206A (en) 1988-01-26

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