JPH10227745A - Method and device for inspecting side of top of rivet-shaped part - Google Patents

Method and device for inspecting side of top of rivet-shaped part

Info

Publication number
JPH10227745A
JPH10227745A JP4841997A JP4841997A JPH10227745A JP H10227745 A JPH10227745 A JP H10227745A JP 4841997 A JP4841997 A JP 4841997A JP 4841997 A JP4841997 A JP 4841997A JP H10227745 A JPH10227745 A JP H10227745A
Authority
JP
Japan
Prior art keywords
pallet
rivet
head
light
shaped
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4841997A
Other languages
Japanese (ja)
Inventor
Itsuchiyou Uchiumi
一肇 内海
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Metal Mining Co Ltd
Original Assignee
Sumitomo Metal Mining Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Metal Mining Co Ltd filed Critical Sumitomo Metal Mining Co Ltd
Priority to JP4841997A priority Critical patent/JPH10227745A/en
Publication of JPH10227745A publication Critical patent/JPH10227745A/en
Pending legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To inspect surface defects on the sides of tops of plural rivet-shaped parts at once, by irradiating the sides of tops of the barts which are inserted into through holes in translucent pallet using light from down side of the pallet, and by photographing the reflected light. SOLUTION: A light-shielding cylinder 6 is attached to a lens 2 fixed to a camera 3 to eliminate effect from disturbance light, and a pallet 1 made of translucent material is shined by a surface lighting halogen lamp 5 on its down side. The light radiates the side of top parts of the rivet-shaped parts which are inserted into through holes in the pallet 1, and a camera 3 photograph its reflected light. An image processing device 4 processes the photographed image, and judges whether surface detects are on the side of top parts. By arranging the through holes with same intervals, orderly inserting the components, and radiating light them from downside, light which scatters in a pallet 1 irradiates the side of top of each part circumferencially and uniformly and causes surface defects to generate their shadows. Thus, surface defects on the sides of tops of plural rivet-shaped barts are inspected at once.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、例えば電気接点等
のようなリベット状部品の頭部側面の表面欠陥を、照明
光によって強調させて選別するための検査方法および装
置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an inspection method and apparatus for selecting a surface defect on a side surface of a head of a rivet-shaped component such as an electrical contact by highlighting the defect with illumination light.

【0002】[0002]

【従来の技術】リベット状部品、例えば電気接点の頭部
側面の表面欠陥を検査して不良品を選別するに際し、前
記リベット状部品に頭上方向から紙等で反射させた柔ら
かい散乱光を当てつつ、台上で該リベット状部品をピン
セッ卜などで転がして表面欠陥を検査しているのが実状
である。
2. Description of the Related Art In selecting a defective product by inspecting a surface defect on a side surface of a head of a rivet-shaped component, for example, an electric contact, the rivet-shaped component is irradiated with soft scattered light reflected by paper or the like from above. In reality, the rivet-shaped part is rolled on a table with tweezers or the like to inspect for surface defects.

【0003】このような表面欠陥の検査は、専ら作業者
の目視検査により行われているので、目視検査では作業
能率が上がらず、また個人誤差や錯誤などにより、検査
精度にばらつきが発生してしまう。この問題を解決する
ために、近年、光学手段による自動検査装置の導入が試
みられている。
[0003] Inspection of such surface defects is carried out exclusively by visual inspection of an operator. Therefore, the visual inspection does not increase the work efficiency, and the inspection accuracy varies due to individual errors and errors. I will. In order to solve this problem, in recent years, introduction of an automatic inspection device using optical means has been attempted.

【0004】[0004]

【発明が解決しようとする課題】前記リベット状部品の
頭部側面の表面欠陥検査を行う場合、前記部品の頭部を
平らな姿勢から垂直な姿勢に変換して側面に沿って回転
させてやる必要があり、薬品錠剤などに見られる円形偏
平物品の表面欠陥検査などにおいては、実際にこの方法
が用いられている。しかしながら、リベット状部品のよ
うに、足のある形状の物品においては側面に沿って回転
させることは難しく、頭部側面検査装置全体が大変に複
雑になってしまうという欠点がある。さらに、前記部品
を回転させるとなると、高速で高解像度の画像を得るた
めの画像処理システムが必要となり、カメラ数台を用い
て、多方向から頭部側面を検査する方法も考えられる
が、やはり装置が複雑になり、自動検査装置には適さな
い。
When performing a surface defect inspection on the side surface of the head of the rivet-shaped part, the head of the part is changed from a flat posture to a vertical posture and rotated along the side surface. This method is actually used in surface defect inspection of a circular flat article such as a medicine tablet. However, it is difficult to rotate the article having a foot shape such as a rivet-like part along the side face, and there is a disadvantage that the whole head side inspection apparatus becomes very complicated. Furthermore, when the parts are rotated, an image processing system for obtaining a high-speed and high-resolution image is required, and a method of inspecting the side of the head from multiple directions using several cameras is also conceivable. The equipment is complicated and not suitable for automatic inspection equipment.

【0005】このように従来の技術にかかる検査方法で
は、前記リベット状部品の頭部側面の表面欠陥が強調さ
れ難くて見逃し率が高く、また、回転して前記部品の頭
部側面周囲をすべて検査するために、検査時間が掛かる
という欠点もある。
As described above, in the inspection method according to the prior art, the surface defect on the side surface of the head of the rivet-shaped part is hardly emphasized and the oversight rate is high. There is also a disadvantage that the inspection takes a long time to perform the inspection.

【0006】本発明は、上記従来技術の課題を効果的に
解決したものであって、リベット状部品を半透明パレッ
トに設けた貫通穴または溝穴に収めて整列させ、該パレ
ットの下方に照明器具を設置し、かつ前記パレットの上
方で前記部品の頭部側面から反射された光を検出するこ
とによって、回転するなどの手間が無く、所望に応じ−
度に複数個のリベット状部品の頭部側面の表面欠陥を検
査が可能となり検査時間を大幅に縮めることができる検
査方法を提供することを目的とするものである。また本
発明は前記の方法を用いることにより、簡単に構築する
ことができ、自動化可能なリベット状部品の頭部側面の
表面欠陥検査装置を提供することを目的とするものであ
る。
The present invention effectively solves the above-mentioned problems of the prior art. In the present invention, rivet-shaped parts are placed and aligned in through holes or slots provided in a translucent pallet, and illumination is provided below the pallet. By installing the apparatus and detecting the light reflected from the side of the head of the part above the pallet, there is no need for rotation or the like, and if necessary,
It is an object of the present invention to provide an inspection method capable of inspecting a surface defect on a side surface of a head of a plurality of rivet-shaped components at a time, thereby greatly reducing an inspection time. Another object of the present invention is to provide an apparatus for inspecting a surface of a rivet-shaped part on a side surface of a head which can be easily constructed and can be automated by using the above method.

【0007】[0007]

【課題を解決するための手段】本発明者は前記リベット
状部品の頭部側面で反射された光を検出することによっ
て、頭部側面の表面欠陥をあたかも陰のように浮き出さ
せて強調することができることを見出した。
The inventor of the present invention detects a light reflected on a side surface of the head of the rivet-shaped component, thereby emphasizing a surface defect on the side surface of the head as if it were raised as if it were a shadow. I found that I can do it.

【0008】すなわち、前記リベット状部品の頭部側面
の表面欠陥を強調するために、前記部品の真横から照明
を当てて頭部側面の表面欠陥に陰を作ることを考えた
が、実際には真横の四方八方から光を当てることは困難
であるために、斜め下方向から光を当てることを狙っ
て、透過光を用いた。ここで、均一な柔らかい光を供給
するために、前記リベット状部品が収まるような貫通穴
または溝穴を等間隔に設け、かつ所定の厚みの半透明材
質からなるパレットを形成し、前記貫通穴または溝穴に
リベット状部品を整列させて、その下方から光を当てる
ことによって、半透明材質のパレット内で散乱された柔
らかい光が、前記部品の頭部側面を周囲から均一に照ら
して、表面欠陥を陰として強調することができるのであ
る。
That is, in order to emphasize the surface defect on the side surface of the head of the rivet-shaped part, it has been considered that the surface defect on the side surface of the head is shaded by illuminating the part directly beside the part. Since it is difficult to shine light from all sides, the transmitted light was used with the aim of shining light obliquely from below. Here, in order to supply uniform soft light, through holes or slots are provided at regular intervals to accommodate the rivet-shaped parts, and a pallet made of a translucent material having a predetermined thickness is formed. Or, by aligning the rivet-shaped parts in the slots and shining light from below, the soft light scattered in the translucent pallet uniformly illuminates the side of the head of the part from the surroundings, Defects can be emphasized as shadows.

【0009】したがって、上記目的を達成するために本
発明の第1の実施態様は、リベット状部品の頭部側面の
表面欠陥を検査する方法であって、前記部品を収める少
なくとも1つの貫通穴または溝穴を設けた半透明のパレ
ットに前記部品を入れ、該パレットの下方から光を当て
てこの光が前記パレット中を通って前記部品の頭部側面
を照らし、かつ前記部品の頭部側面で反射した光をパレ
ットの上方に備えたカメラで撮像するリベット状部品の
頭部側面検査方法を特徴とするものであり、さらに前記
パレットに設けた複数個の貫通穴または溝穴は前記リベ
ット状部品を等間隔をおいて整列させた状態で収めるこ
とが可能であることが好ましく、また前記カメラで撮像
した像をさらに画像処理装置によって画像処理すること
を特徴とする。
Therefore, in order to achieve the above object, a first embodiment of the present invention is a method for inspecting a surface defect on a side surface of a head portion of a rivet-like component, the method comprising at least one through hole or a hole for accommodating the component. Put the parts in a translucent pallet provided with a slot, apply light from below the pallet, this light passes through the pallet and illuminates the head side of the part, and A method for inspecting a head side surface of a rivet-shaped component in which reflected light is imaged by a camera provided above a pallet, wherein a plurality of through holes or slots provided in the pallet is provided with the rivet-shaped component. It is preferable that the images captured by the camera are further processed by an image processing device.

【0010】また、上記目的を達成するために本発明の
第2の実施態様は、リベット状部品を収める少なくとも
1つの貫通穴または溝穴を有する半透明パレットと、該
パレットの下方より光を当てる照明手段と、前記パレッ
トの上方に設けたカメラとを備えたリベット状部品の頭
部側面検査装置を特徴とするものであり、さらに前記パ
レットに設けた複数個の貫通穴または溝穴は前記リベッ
ト状部品を等間隔をおいて整列させた状態で収めること
が可能であることが好ましく、また前記貫通穴または溝
穴の間隔は、該穴に収められた各リベット状部品の頭部
側面からの反射光による影響を相互に受けない距離とし
たり、あるいは前記カメラの撮像を画像処理するための
画像処理装置をさらに備えてなることを特徴とする。
In order to achieve the above object, a second embodiment of the present invention provides a translucent pallet having at least one through hole or slot for accommodating a rivet-like component, and irradiates light from below the pallet. An apparatus for inspecting a head side surface of a rivet-shaped part comprising an illuminating means and a camera provided above the pallet, further comprising a plurality of through holes or slots provided in the pallet. It is preferable that the parts can be housed in an aligned state at equal intervals, and the distance between the through-holes or slots is set such that the distance from the side of the head of each rivet-like part housed in the hole is increased. It is characterized by further comprising an image processing device for setting the distance so as not to be influenced by the reflected light mutually, or for performing image processing of the image picked up by the camera.

【0011】[0011]

【発明の実施の形態】図1は、本発明の頭部側面検査装
置の一実施例を示すブロック図、図2は電気接点におけ
る頭部側面の表面欠陥を示す斜視図、図3は本発明の対
象であるリベット状物品としての電気接点を示す図で、
(a)は銀層が厚く頭部側面傾斜が緩やかな電気接点の
断面図、(b)は銀層が薄く頭部側面傾斜が急峻な電気
接点の断面図、図4は本発明で用いたパレットを示す図
で、(a)は図3(a)に示す電気接点用のパレットの
部分平面図、(b)は(a)のA−A線上の断面図、
(c)は図3(b)に示す電気接点用パレットの部分平
面図、(d)は(c)のB−B線上の断面図、図5はパ
レット下方から面照明ハロゲンランプで照らした時の光
の方向を矢印で模擬的に示した図で、(a)は図3
(a)に示す電気接点を収めた状態を示す図、(b)は
図3(b)に示す電気接点を収めた状態を示す図、図6
は電気接点を図1に示す装置で実際に撮像した時の状態
を示す図であって、1はパレット、2はレンズ、3はカ
メラ、4は画像処理装置、5は面照明ハロゲンランプ、
6は遮光筒である。
FIG. 1 is a block diagram showing an embodiment of a head side inspection apparatus according to the present invention, FIG. 2 is a perspective view showing surface defects on the side of the head in electrical contacts, and FIG. FIG. 2 is a diagram showing an electric contact as a rivet-shaped article that is the subject of
(A) is a cross-sectional view of an electrical contact having a thick silver layer and a gentle head side inclination, (b) is a cross-sectional view of an electrical contact having a thin silver layer and a steep head inclination, and FIG. 4 is used in the present invention. 3A is a partial plan view of the electrical contact pallet shown in FIG. 3A, FIG. 3B is a cross-sectional view taken along line AA of FIG.
(C) is a partial plan view of the electrical contact pallet shown in FIG. 3 (b), (d) is a cross-sectional view taken along the line BB of (c), and FIG. 5 is when illuminated by a surface illumination halogen lamp from below the pallet. FIG. 3A is a diagram schematically showing the direction of light by arrows, and FIG.
FIG. 6A is a diagram showing a state in which the electrical contacts are housed, FIG. 6B is a diagram showing a state in which the electrical contacts are housed shown in FIG.
1 is a diagram showing a state when an electrical contact is actually imaged by the device shown in FIG. 1, 1 is a pallet, 2 is a lens, 3 is a camera, 4 is an image processing device, 5 is a surface illumination halogen lamp,
Reference numeral 6 denotes a light shielding tube.

【0012】半透明材質からなるパレット1は、面照明
ハロゲンランプ5によって下方から照明されまた、外乱
光による影響を無くすために、カメラ3に併設されたレ
ンズ2は遮光筒6が取り付けられている。一方、パレッ
ト1の下方から当てられた面照明ハロゲンランプ5の光
はパレット1に設けられた貫通穴または溝穴に収められ
たリベット状部品の一例としての電気接点の頭部側面を
照らして、該頭部側面で反射した光をカメラ3により撮
像し、該カメラで撮像された像は画像処理装置4によっ
て画像処理され頭部側面の表面欠陥の有無を判別する。
The pallet 1 made of a translucent material is illuminated from below by a surface illumination halogen lamp 5, and a lens 2 attached to the camera 3 is provided with a light-shielding tube 6 in order to eliminate the influence of disturbance light. . On the other hand, the light of the surface illumination halogen lamp 5 applied from below the pallet 1 illuminates the side surface of the head of the electrical contact as an example of a rivet-shaped part contained in a through hole or a slot provided in the pallet 1, The light reflected by the side of the head is captured by the camera 3, and the image captured by the camera is subjected to image processing by the image processing device 4 to determine the presence or absence of a surface defect on the side of the head.

【0013】ここで、自動検査装置の対象としたリベッ
ト状部品の一例としての電気接点は、図2、図3に示す
ように頭部上部7が銀、一体の頭部下部と足部8が銅で
作られ、判別する不良品(頭部側面の表面欠陥9)は、
図2に示すように銀部分における割れや傷の形で発生す
る。
As shown in FIGS. 2 and 3, the electrical contact as an example of a rivet-shaped part targeted by the automatic inspection apparatus is as follows. Defective products (surface defects 9 on the side of the head) made of copper and identified
As shown in FIG. 2, it occurs in the form of cracks or scratches in the silver portion.

【0014】本発明の対象であるリベット状部品の例で
ある電気接点は大きく分けて、図3(a)に示すように
頭部上部7の銀層の厚く側面傾斜が緩やかな電気接点と
図3(b)に示すように頭部上部7の銀層が薄く側面傾
斜が急峻な電気接点がある。なお、図3に示す電気接点
の寸法は単なる一例であり、この寸法に限るものではな
いが、電気接点の頭部側面の鏡面欠陥は目視による検査
が困難である程に小さく、また頭部側面に傾斜を持つこ
とがこの図で示されている。
The electric contact which is an example of the rivet-shaped part which is the object of the present invention can be roughly divided into an electric contact having a thick silver layer of the upper part 7 of the head and a gentle side inclination as shown in FIG. As shown in FIG. 3 (b), there is an electrical contact where the silver layer on the upper part 7 of the head is thin and the side surface slope is steep. The dimensions of the electrical contacts shown in FIG. 3 are merely examples, and are not limited to these dimensions. However, the specular defect on the side of the head of the electrical contacts is so small that it is difficult to visually inspect it. This is shown in this figure.

【0015】次に図4は、図1におけるパレット1の詳
細を示すものである。この検査のために使用するパレッ
ト1の材質は、例えば乳白色アクリル製の半透明のもの
であり、電気接点はこのパレット1に設けられた等間隔
の貫通穴1−1または溝穴1−2に足部8が入り込むよ
うにして収められセットされる。ここで貫通穴1−1ま
たは溝穴1−2の間隔は、隣の電気接点からの反射光の
影響を受けない最短距離である7mmとした。パレット
1の貫通穴1−1と溝穴1−2の形状が相違するのは、
貫通穴1−1は銀層の厚い電気接点用とし、また溝穴1
−2は銀層の薄い電気接点用としたためである。銀層の
薄い電気接点用のパレット1に座グリ部1−3を設けた
のは、傾斜の急峻な頭部側面にパレット1を通った光を
充分に当てて、割れや傷による陰を強調して作るためで
ある。
FIG. 4 shows the details of the pallet 1 in FIG. The material of the pallet 1 used for this inspection is, for example, a translucent material made of milk-white acrylic, and the electric contacts are provided in the through holes 1-1 or the slots 1-2 provided at equal intervals in the pallet 1. It is set and set so that the foot 8 enters. Here, the interval between the through holes 1-1 or the slots 1-2 was 7 mm, which is the shortest distance not affected by the reflected light from the adjacent electrical contact. The difference between the shape of the through hole 1-1 and the shape of the slot 1-2 of the pallet 1 is that
The through hole 1-1 is used for an electrical contact having a thick silver layer.
No. -2 is for an electrical contact with a thin silver layer. The counterbore portion 1-3 is provided on the pallet 1 for the electrical contact with a thin silver layer, because the light passing through the pallet 1 is sufficiently applied to the steeply inclined side of the head to emphasize shadows due to cracks and scratches. To make it.

【0016】さらに図5には、パレット1を通る光の方
向を、銀層の厚い電気接点と銀層の薄い電気接点に分け
て、それぞれ模擬的に矢印で示したものである。パレッ
ト1の下方より面照明ハロゲンランプ5を照らすことに
よって、半透明のパレット1の内部において光が拡散さ
れる。拡散された光は、図5(a)に示すように電気接
点の斜め下から、あるいは図5(b)に示すように座グ
リ部1−3により側面から均一に照らされる。ここで、
座グリ部1−3を設けた理由は、銀層の薄い電気接点用
の検査パレットの座グリ部1−3から電気接点の急峻な
傾斜側面に光を充分に当てられるためである。このよう
に電気接点の頭部側面の傾斜部分を照らした光は上方に
設置されたカメラ3の方向へと反射される。この時、頭
部側面に割れや傷があると、光はカメラ3の方向へ反射
されずに、他の方向へ散乱してしまうために、表面欠陥
による陰ができる。
Further, in FIG. 5, the directions of light passing through the pallet 1 are schematically shown by arrows, each of which is divided into electrical contacts having a thick silver layer and electrical contacts having a thin silver layer. By illuminating the surface illumination halogen lamp 5 from below the pallet 1, light is diffused inside the translucent pallet 1. The diffused light is uniformly illuminated from obliquely below the electrical contact as shown in FIG. 5A, or from the side by the spot facing portion 1-3 as shown in FIG. 5B. here,
The reason for providing the spot facing portion 1-3 is that light can be sufficiently applied from the spot facing portion 1-3 of the inspection pallet for the electrical contact having a thin silver layer to the steeply inclined side surface of the electrical contact. The light illuminating the inclined portion on the side of the head of the electric contact is reflected toward the camera 3 installed above. At this time, if there is a crack or a scratch on the side of the head, the light is not reflected in the direction of the camera 3 but is scattered in another direction, so that a shadow due to a surface defect is generated.

【0017】次に図6に、表面欠陥の無い電気接点と表
面欠陥のある電気接点の撮像画像の一例を示す。表面欠
陥の無い電気接点による陰10は丸く見える。しかし、
電気接点の頭部側面の割れや傷においては、光が上方の
カメラの方には反射されずに散乱するため、陰となって
強調される。すなわち頭部側面における割れや傷などの
表面欠陥が上部まで這い上がっている場合には電気接点
による丸い陰の周囲に突起を有する陰11になって見え
る。また、表面欠陥が上部まで這い上がっていない場合
には電気接点による丸い陰の周囲に離れた陰12となっ
て見える。この方法で強調された電気接点の頭部側面の
表面欠陥による陰11、12は、カメラ3によって撮影
され、その画像信号を画像処理装置4によって処理し、
不良品を判別する。
Next, FIG. 6 shows an example of a picked-up image of an electric contact having no surface defect and an electric contact having a surface defect. The shade 10 due to electrical contacts without surface defects looks round. But,
In the case of cracks or scratches on the side of the head of the electrical contact, the light is scattered instead of being reflected toward the upper camera, and is emphasized as a shadow. That is, when a surface defect such as a crack or a scratch on the side surface of the head crawls up to the upper part, it appears as a shadow 11 having a projection around a round shadow formed by electrical contacts. When the surface defect does not crawl to the upper part, it appears as a shadow 12 separated from a round shadow by the electric contact. The shadows 11 and 12 due to the surface defects on the side of the head of the electrical contacts highlighted by this method are photographed by the camera 3 and the image signals are processed by the image processing device 4.
Determine defective products.

【0018】[0018]

【発明の効果】この発明により、電気接点のようなリベ
ット状部品の頭部側面の表面欠陥を検査するに際して、
電気接点の頭部側面の割れや傷などを有する欠陥品を見
逃すことなく、明確な判定基準の下で、判別できるよう
になりまた、電気接点を回転させるなどの手間も無く、
上方からの撮像によって容易に欠陥を判別できるため、
検査に掛かる時間も大幅に短縮し得る。
According to the present invention, when inspecting surface defects on the side surface of the head of a rivet-shaped component such as an electric contact,
Without missing a defective product with cracks or scratches on the side of the head of the electrical contact, it can be distinguished under clear criteria, and there is no trouble such as rotating the electrical contact,
Defects can be easily identified by imaging from above,
The time required for the inspection can be significantly reduced.

【0019】さらに、パレットへの接点移載機構とパレ
ットのピッチ移動機構を備え付けることにより、リベッ
ト状部品の頭部側面の表面欠陥を自動的に検査する装置
が可能となり、無人運転による検査が行えるようにな
る。
Further, by providing a mechanism for transferring the contact points to the pallet and a mechanism for moving the pitch of the pallet, a device for automatically inspecting the surface defects on the side surface of the head of the rivet-shaped component can be provided, and the inspection by unmanned operation can be performed. Become like

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の頭部側面検査装置の一実施例を示すブ
ロック図である。
FIG. 1 is a block diagram showing one embodiment of a head side inspection apparatus according to the present invention.

【図2】電気接点における頭部側面の表面欠陥を示す斜
視図である。
FIG. 2 is a perspective view showing a surface defect on a side surface of a head in an electric contact.

【図3】本発明の対象であるリベット状物品としての電
気接点を示す図で、(a)は銀層が厚く頭部側面傾斜が
緩やかな電気接点の断面図、(b)は銀層が薄く頭部側
面傾斜が急峻な電気接点の断面図である。
3A and 3B are diagrams showing an electric contact as a rivet-shaped article which is an object of the present invention, wherein FIG. 3A is a cross-sectional view of an electric contact having a thick silver layer and a gentle inclination to the side of the head, and FIG. It is sectional drawing of the electrical contact which is thin and the head side inclination is steep.

【図4】本発明で用いたパレットを示す図で、(a)は
図3(a)に示す電気接点用のパレットの部分平面図、
(b)は(a)のA−A線上の断面図、(c)は図3
(b)に示す電気接点用パレットの部分平面図、(d)
は(c)のB−B線上の断面図である。
4A and 4B are diagrams showing a pallet used in the present invention, wherein FIG. 4A is a partial plan view of the pallet for electrical contacts shown in FIG.
FIG. 3B is a cross-sectional view taken along line AA of FIG. 3A, and FIG.
Partial plan view of the electrical contact pallet shown in (b), (d)
FIG. 7C is a cross-sectional view taken along line BB of FIG.

【図5】パレット下方から面照明ハロゲンランプで照ら
した時の光の方向を矢印で模擬的に示した図で、(a)
は図3(a)に示す電気接点を収めた状態を示す図、
(b)は図3(b)に示す電気接点を収めた状態を示す
図である。
5A and 5B are diagrams schematically showing directions of light when illuminated by a surface illumination halogen lamp from below the pallet with arrows, and FIG.
FIG. 3A is a diagram showing a state where the electrical contacts shown in FIG.
FIG. 3B is a diagram showing a state where the electrical contacts shown in FIG.

【図6】電気接点を図1に示す装置で実際に撮像した時
の状態を示す図である。
FIG. 6 is a diagram showing a state when an electric contact is actually imaged by the device shown in FIG. 1;

【符号の説明】[Explanation of symbols]

1 パレット 1−1 貫通穴 1−2 溝穴 1−3 座グリ部 2 レンズ 3 カメラ 4 画像処理装置 5 面照明ハロゲンランプ 6 遮光筒 7 頭部上部 8 足部 9 表面欠陥 10、11、12 陰 DESCRIPTION OF SYMBOLS 1 Pallet 1-1 Through hole 1-2 Slot hole 1-3 Counterbore part 2 Lens 3 Camera 4 Image processing device 5 Surface illumination halogen lamp 6 Shielding cylinder 7 Upper head part 8 Foot part 9 Surface defect 10, 11, 12 Shadow

Claims (7)

【特許請求の範囲】[Claims] 【請求項1】 リベット状部品の頭部側面の表面欠陥を
検査する方法であって、前記部品を収める少なくとも1
つの貫通穴または溝穴を設けた半透明のパレットに前記
部品を入れ、該パレットの下方から光を当ててこの光が
前記パレット中を通って前記部品の頭部側面を照らし、
かつ前記部品の頭部側面で反射した光をパレットの上方
に備えたカメラで撮像することを特徴をするリベット状
部品の頭部側面検査方法。
1. A method for inspecting a surface defect on a side surface of a head of a rivet-shaped part, comprising:
Placing the part in a translucent pallet provided with two through holes or slots, irradiating light from below the pallet, this light passes through the pallet and illuminates the side of the head of the part,
A method for inspecting a head side surface of a rivet-shaped component, wherein the light reflected on the head side surface of the component is imaged by a camera provided above a pallet.
【請求項2】 前記パレットに設けた複数個の貫通穴ま
たは溝穴は前記リベット状部品を等間隔をおいて整列さ
せた状態で収めることが可能であることを特徴とする請
求項1記載のリベット状部品の頭部側面検査方法。
2. The pallet according to claim 1, wherein the plurality of through holes or slots provided in the pallet are capable of receiving the rivet-shaped parts in an aligned state at equal intervals. Inspection method for the side of the head of rivet-shaped parts.
【請求項3】 前記カメラで撮像した像をさらに画像処
理装置によって画像処理することを特徴とする請求項1
記載のリベット状部品の頭部側面検査方法。
3. The image processing apparatus according to claim 1, wherein the image captured by the camera is further processed by an image processing device.
A method for inspecting a side surface of a head of a rivet-shaped component as described.
【請求項4】 リベット状部品を収める少なくとも1つ
の貫通穴または溝穴を有する半透明パレットと、該パレ
ットの下方より光を当てる照明手段と、前記パレットの
上方に設けたカメラとを備えたことを特徴とするリベッ
ト状部品の頭部側面検査装置。
4. A semi-transparent pallet having at least one through hole or slot for accommodating a rivet-like component, illuminating means for applying light from below the pallet, and a camera provided above the pallet. A head side inspection device for rivet-shaped parts.
【請求項5】 前記パレットに設けた複数個の貫通穴ま
たは溝穴は前記リベット状部品を等間隔をおいて整列さ
せた状態で収めることが可能であることを特徴とする請
求項4記載のリベット状部品の頭部側面検査装置。
5. The pallet according to claim 4, wherein the plurality of through holes or slots provided in the pallet can accommodate the rivet-shaped parts in an aligned state at equal intervals. Head side inspection device for rivet-shaped parts.
【請求項6】 前記貫通穴または溝穴の間隔は、該穴に
収められた各リベット状部品の頭部側面からの反射光に
よる影響を相互に受けない距離であることを特徴とする
請求項5記載のリベット状部品の頭部側面検査装置。
6. The distance between the through holes or the slots is a distance that does not affect each other by the reflected light from the side face of the head of each rivet-shaped part housed in the holes. 5. A head side inspection device for a rivet-shaped part according to 5.
【請求項7】 前記カメラの撮像を画像処理するための
画像処理装置をさらに備えてなることを特徴とする請求
項4〜6のいずれか1項記載のリベット状部品の頭部側
面検査装置。
7. The apparatus for inspecting a head side surface of a rivet-shaped component according to claim 4, further comprising an image processing device for performing image processing of an image captured by the camera.
JP4841997A 1997-02-17 1997-02-17 Method and device for inspecting side of top of rivet-shaped part Pending JPH10227745A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4841997A JPH10227745A (en) 1997-02-17 1997-02-17 Method and device for inspecting side of top of rivet-shaped part

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4841997A JPH10227745A (en) 1997-02-17 1997-02-17 Method and device for inspecting side of top of rivet-shaped part

Publications (1)

Publication Number Publication Date
JPH10227745A true JPH10227745A (en) 1998-08-25

Family

ID=12802809

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4841997A Pending JPH10227745A (en) 1997-02-17 1997-02-17 Method and device for inspecting side of top of rivet-shaped part

Country Status (1)

Country Link
JP (1) JPH10227745A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100944425B1 (en) 2008-04-29 2010-02-25 주식회사 포스코 Apparatus for the detecting defect mark on steel plate
WO2013069736A1 (en) * 2011-11-09 2013-05-16 株式会社クボタ Granule inspection device
JP2013101082A (en) * 2011-11-09 2013-05-23 Kubota Corp Granular material inspection device
WO2020251127A1 (en) * 2019-06-11 2020-12-17 주식회사 엘지화학 Inspection equipment and inspection method of secondary battery

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100944425B1 (en) 2008-04-29 2010-02-25 주식회사 포스코 Apparatus for the detecting defect mark on steel plate
WO2013069736A1 (en) * 2011-11-09 2013-05-16 株式会社クボタ Granule inspection device
JP2013101082A (en) * 2011-11-09 2013-05-23 Kubota Corp Granular material inspection device
CN103907013A (en) * 2011-11-09 2014-07-02 株式会社久保田 Granule inspection device
KR20140083057A (en) * 2011-11-09 2014-07-03 가부시끼 가이샤 구보다 Granule inspection device
CN103907013B (en) * 2011-11-09 2016-12-28 株式会社久保田 Coccoid checks device
WO2020251127A1 (en) * 2019-06-11 2020-12-17 주식회사 엘지화학 Inspection equipment and inspection method of secondary battery
CN112470324A (en) * 2019-06-11 2021-03-09 株式会社Lg化学 Apparatus and method for inspecting secondary battery
EP3799189A4 (en) * 2019-06-11 2021-12-29 Lg Chem, Ltd. Inspection equipment and inspection method of secondary battery
US11955611B2 (en) 2019-06-11 2024-04-09 Lg Energy Solution, Ltd. Equipment and method for inspecting secondary battery

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