JPS6318206A - Apparatus for inspecting mounting of electronic part - Google Patents

Apparatus for inspecting mounting of electronic part

Info

Publication number
JPS6318206A
JPS6318206A JP16196486A JP16196486A JPS6318206A JP S6318206 A JPS6318206 A JP S6318206A JP 16196486 A JP16196486 A JP 16196486A JP 16196486 A JP16196486 A JP 16196486A JP S6318206 A JPS6318206 A JP S6318206A
Authority
JP
Japan
Prior art keywords
electronic component
image
light source
photoelectric conversion
printed circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16196486A
Other languages
Japanese (ja)
Other versions
JPH07117383B2 (en
Inventor
Akira Ono
明 小野
Kenji Sasaki
賢司 佐々木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP61161964A priority Critical patent/JPH07117383B2/en
Publication of JPS6318206A publication Critical patent/JPS6318206A/en
Publication of JPH07117383B2 publication Critical patent/JPH07117383B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Abstract

PURPOSE:To detect the mount position error of a mounting part with high reliability, by arranging a light source so that an illumination line is inclined in a part arranging direction with respect to a substrate having the ridgeline or bus bar of each electronic part arranged thereto in a definite direction. CONSTITUTION:The electronic parts 2a of a printed circuit board 2 are mounted so that the ridgeline or bus bar or each of said parts is parallel to the side 2b of the board 2 or crosses said side 2b at a right angle and the extending lines respectively connecting light sources 3, 4 and a photoelectric converter means 5 are respectively arranged so as to be inclined, for example, at an angle of 45 deg. with respect to the side 2b. When each part 2a is alternately irradiated with lights from the light sources 3, 4, the picked-up image on the irradiated surface is converted to an electric signal by the photoelectric converter means 5 to be respectively stored in first and second signal memory devices 7a, 7b and synchronously regenerated by the next subtraction apparatus 8 to calculate the difference between both output signals. This level difference is operated by an operation apparatus 9 to obtain shape and position signals. These signals are compared and judged by a judge apparatus 10 having a reference value preliminarily stored therein and the positional error of each part 2a or the abnormality of the shape thereof is detected. By this method, the mounting state of the electronic parts 2a can be certainly examined with high accuracy by a simple image processing.

Description

【発明の詳細な説明】 〔発明の目的〕 (産業上の利用分野) 本発明は電子部品実装検査装置に関する。[Detailed description of the invention] [Purpose of the invention] (Industrial application field) The present invention relates to an electronic component mounting inspection apparatus.

(従来の技術) 印刷回路基板に例えば抵抗体、コンデンサなどの電子部
品の取り付け(電子部品の実装)後。
(Prior art) After mounting electronic components, such as resistors and capacitors, on a printed circuit board (electronic component mounting).

その実装状態を検査するため次のような手段が提案され
ている。即ち、コンデンサなどの電子部品を装着した印
刷回路基板に対し、二方向から交互に斜光線を照射して
得られた画像を光電変換手段。
The following methods have been proposed to inspect the implementation status. That is, a printed circuit board on which electronic components such as capacitors are mounted is irradiated with oblique light alternately from two directions, and an image obtained is converted to photoelectric conversion means.

例えばテレビカメラで撮り電気信号に変えXX機で画像
処理することによって、実装した電子部品の位置や形状
など検出する手段が開発されている(特開昭55−15
5205号公報)。
For example, a means has been developed to detect the position and shape of mounted electronic components by capturing images with a television camera and converting them into electrical signals and processing the images with a XX machine (Japanese Patent Laid-Open No. 55-15
5205 Publication).

上記実装検出手段によれば電子部品の実装状態を容易に
検査、検出しうるが精度乃至信頼性の点で十分満足しつ
るものとは云い難い。即ち電子部品を多数実装した印刷
回路基板について実装検査を行なった場合上記交互に斜
光線を照射して得られた画像に稍々不鮮明なものが認め
られたりするため検査に長い時間を要したり、また信頼
性の点において問題があった。
Although the above-mentioned mounting detection means can easily inspect and detect the mounting state of electronic components, it is difficult to say that it is fully satisfactory in terms of accuracy and reliability. In other words, when performing a mounting inspection on a printed circuit board on which a large number of electronic components are mounted, the image obtained by alternately irradiating the oblique light beams may be slightly unclear, and the inspection may take a long time. There were also problems with reliability.

(発明が解決しようとする問題点) 従って本発明は簡単な画像処理で、実装されている電子
部品の装着位置の誤差や部品形状の異常などの検出乃至
検査を信頼性高く行ないつる電子部品の実装検査装置を
提供することを目的とする。
(Problems to be Solved by the Invention) Therefore, the present invention uses simple image processing to reliably detect and inspect errors in the mounting position of mounted electronic components and abnormalities in the shape of the components. The purpose is to provide a mounting inspection device.

〔発明の構成〕[Structure of the invention]

(問題点を解決するための手段) 本発明によれば電子部品の陵線もしくは母線が一定方向
に1例えば基板の辺に対して平行もしくは直交するよう
に電子部品が配設されている印刷回路基板に対して少な
くとも二方向から光を照射する光源と、この光源からの
光照射によって得られる画像(影像)を撮像し電気信号
に変換する光電変換手段とをそれぞれ結ぶm(照明線)
の延長線が前記電子部品の配役方向に対して傾斜するよ
う前記光αおよび光電変換手段を配設することを骨子と
している。
(Means for Solving the Problems) According to the present invention, a printed circuit in which electronic components are arranged such that the ridge lines or generatrix lines of the electronic components are arranged in a certain direction, for example, parallel to or perpendicular to the sides of the board. m (illumination line) connecting a light source that irradiates light to the substrate from at least two directions and a photoelectric conversion means that captures an image (image) obtained by irradiating light from this light source and converts it into an electrical signal.
The main point is to arrange the light α and the photoelectric conversion means so that the extension line thereof is inclined with respect to the arrangement direction of the electronic component.

(作用) 上記構成により、少なくとも二方向から照射した光によ
って、印刷回路基板に表われる画像乃至影像は一定の出
力信号を出す。即ち実装されている電子部品はそのゝ陵
線もしくは母線に対し斜め方向から常に光が照射される
ことになるため、全ての電子部品について所定の画像乃
至影像を呈する。従って光電変換手段による出力も実装
されている電子部凸金てについて一様となるため実装部
品の検査の信頼性が向上する。また、予め記憶させてお
いた電子部品の基準像などを移動させながら上記出力を
電気信号(画像処理)と対比することによって電子部品
が異常形状であるか否かも検出できる。
(Function) With the above configuration, the image or image appearing on the printed circuit board outputs a constant output signal by light irradiated from at least two directions. That is, since the mounted electronic components are always irradiated with light from an oblique direction with respect to their ridges or generatrix lines, all electronic components exhibit a predetermined image or image. Therefore, the output from the photoelectric conversion means is uniform for the mounted electronic part convex metal, thereby improving the reliability of inspection of the mounted parts. Further, by comparing the output with an electrical signal (image processing) while moving a pre-stored reference image of the electronic component, it is also possible to detect whether the electronic component has an abnormal shape.

(実施例) 以下本発明の実施例を示す第1図および第2図を参照し
て本発明を説明する。第1図において(1)は支持台、
(2)は被検査体である電子部品(2a)を実装された
印刷回路基板であって前記支持台(1)上に載置される
。しかして上記印刷回路基板(2)は。
(Example) The present invention will be described below with reference to FIGS. 1 and 2 showing examples of the present invention. In Fig. 1, (1) is a support stand;
(2) is a printed circuit board on which an electronic component (2a), which is an object to be inspected, is mounted, and is placed on the support table (1). However, the printed circuit board (2) is...

例えば抵抗体、コンデンサ、半導体素子などの電子部品
(2a)を1例えばそれら各電子部品(2a)の陵線も
しくは母線と基板(2b)の辺とが平行もしくは直交す
るように配設、実装したものである。また(3) 、 
(4)は前記印刷回路基板(2)に対して、それぞれ異
なる方向から交互に光を照射する光源例えばランプであ
り、これら光源(3)、(4)は、印刷回路基板(2)
の被照射面における照射強度がほぼ等しいものが選ばれ
る。(5)は上記印刷回路基板(2)を光源(3)、(
4)で交互に照射したときの画像を撮像し電気信号に変
換する光電変換手段1例えばテレビカメラである。さら
に(6)は前記光電変換手段(5)で出力された出力信
号を画像処理する手段であって次のように構成されてい
る。即ち光電変換手段(5)で出力された信号1例えば
光源(3)を照射したときの出力信号を記憶する第一の
信号記憶装置(7a)および光源(4)を照射したとき
の出力信号を記憶する第二の信号記憶装置(7b)と、
これら両信号記憶装置(71)、 (7b)に記憶され
た信号を同期して再生し、レベル差の把握乃至出力信号
の相殺を行なう引算装R(8)と。
For example, electronic components (2a) such as resistors, capacitors, semiconductor elements, etc. are arranged and mounted such that the crests or busbars of each electronic component (2a) and the sides of the substrate (2b) are parallel or perpendicular to each other. It is something. Also (3),
(4) is a light source, such as a lamp, that alternately irradiates light from different directions to the printed circuit board (2), and these light sources (3) and (4) are
The irradiation intensity on the irradiated surface is approximately the same. (5) connects the printed circuit board (2) to the light source (3), (
4) The photoelectric conversion means 1 is, for example, a television camera, which captures images obtained by alternately irradiating the light and converts them into electrical signals. Furthermore, (6) is a means for image processing the output signal outputted from the photoelectric conversion means (5), and is constructed as follows. That is, the signal 1 outputted by the photoelectric conversion means (5), for example, the first signal storage device (7a) that stores the output signal when the light source (3) is irradiated, and the output signal when the light source (4) is irradiated. a second signal storage device (7b) for storing;
and a subtraction device R (8) which synchronizes and reproduces the signals stored in both signal storage devices (71) and (7b) to grasp the level difference or cancel out the output signals.

と、前記演算装置1(9)で演算された形状信号を予め
設定されている基準信号と比較して判定信号を出力表示
する判定装置(1Gとから構成されている。しかして本
発明においては、上記互に異なる方向から被検査体を交
互に照射する光源(33,(4)および照射面の画像を
撮像し電気信号に変換する光電変換手段(5)の配設に
ついて特に考慮を払っている。即ち第2図に平面的に示
すように、光源(3)と光電変換手段(5)とを結ぶ線
(照明線)の延長線(11りおよび光源(4)と光電変
換手段(5)とを結ぶ線(照明線)の延長線(llb)
がそれぞれ被検査体である印刷回路基板(2)の辺に対
し傾斜して交叉する状態を採るように前記光源(3)、
(4)および光電変換手段(5)を特に配設している。
and a determination device (1G) that compares the shape signal calculated by the calculation device 1 (9) with a preset reference signal and outputs and displays a determination signal. Particular consideration has been given to the arrangement of the light source (33, (4)) that alternately irradiates the object to be inspected from different directions and the photoelectric conversion means (5) that captures an image of the irradiated surface and converts it into an electrical signal. That is, as shown in plan in FIG. ) Extension line (llb) of the line (illumination line) connecting
the light sources (3), so that the light sources (3) cross each other at an angle with respect to the side of the printed circuit board (2) which is the object to be inspected;
(4) and photoelectric conversion means (5) are particularly provided.

次に上記構成の電子部品実装検査装置の動作シてついて
説明する。先ず支持台(1)に被検査体としての印刷回
路基板(2)を載置し、一方の光源(3)を点灯し印刷
回路基板(2)面を照射する。次いでこの光照射面の画
像を光電変換手段(5)例えばテレビカメラで撮像し、
電気信号に変換して第一の信号記憶装置(7a)に記憶
させる。しかる後光源(3)を消灯する一方、他の光源
(4)を点灯し、光照射面の画像を同じく撮像し光電変
換手段(5)にて電気信号に変換して第二の信号記憶装
置(7b)に記憶させる。ところで本実施例においては
印刷回路基板(2)の電子部品(2a)はそれら電子部
品(2a)の陵線もしくは母線が基板(2b)の辺に対
して平行もしくは直交するように実装されており、且つ
光源+3)、(4)からの各光照射は、前記実装された
電子部品(2りの陵線や母線に対し傾斜した方向からな
されることになる。従って1例えば光源(3)で照射し
たとき影像(画像)であった部分は光源(4)で照射し
たときには上記影像を呈しなかったり、呈しても薄かっ
たりするのに対し、光源(3)の光照射時に影像を呈し
なかった部分などが逆に影像を呈することになる。例え
ば上記光源(3) 、 (4)と光電変換手段(5)と
をそれぞれ結ぶ延長線(11a)、 (ob)が基板(
2b)の辺に対してそれぞれ45度傾斜している場合、
電子部品(2a)の影像(画像)は第3図に模写的に示
す如く、光源(3)で光照射したときの影像(12りと
光源(4)で照射したときの影像(12b)とから作ら
れることになる。
Next, the operation of the electronic component mounting inspection apparatus having the above configuration will be explained. First, a printed circuit board (2) as an object to be inspected is placed on a support stand (1), and one light source (3) is turned on to illuminate the surface of the printed circuit board (2). Next, an image of this light irradiated surface is captured by a photoelectric conversion means (5), for example, a television camera,
It is converted into an electrical signal and stored in the first signal storage device (7a). After that, the light source (3) is turned off, while the other light source (4) is turned on, and an image of the light irradiation surface is similarly captured and converted into an electrical signal by the photoelectric conversion means (5), which is then stored in the second signal storage device. (7b). By the way, in this embodiment, the electronic components (2a) of the printed circuit board (2) are mounted such that the crests or busbars of the electronic components (2a) are parallel or perpendicular to the sides of the board (2b). , and the respective light irradiation from light sources (+3) and (4) will be performed from a direction inclined to the ridge lines and generatrix lines of the mounted electronic components (2).Therefore, for example, light source (3) The part that was a shadow (image) when irradiated with light source (4) did not exhibit the above-mentioned image, or even if it did, it was faint, whereas it did not exhibit a shadow image when irradiated with light from light source (3). For example, if the extension lines (11a) and (ob) connecting the light sources (3) and (4) and the photoelectric conversion means (5), respectively, are connected to the substrate (
If each side is inclined at 45 degrees with respect to the sides of 2b),
As shown schematically in Figure 3, the image (image) of the electronic component (2a) is an image (12b) when irradiated with light source (3) and an image (12b) when irradiated with light source (4). It will be made from.

なお回路パターンなど基板(2b)の面よりほとんど突
出していない部分については影像はほとんど出す1才だ
出ても後述するレベル差の把握段階で相殺される。上記
印刷回路基板(2)の電子部品(2a)についての影像
(画像)はそれぞれ光電変換手段(5)にて電気信号に
変えられ、第一の信号記憶装置t (7a)。
Note that for parts such as circuit patterns that hardly protrude from the surface of the board (2b), almost no image is produced, but even if it appears, it will be canceled out at the stage of understanding the level difference, which will be described later. The images of the electronic components (2a) of the printed circuit board (2) are each converted into electrical signals by a photoelectric conversion means (5), and are transferred to a first signal storage device t (7a).

第二の信号記憶装置(7b)にそれぞれ記憶され次の引
算装置(8)にて同期再生され両出力信号の差(レベル
晟)を求める。即ち前記第一および第二の両信号記憶装
e (7a)、 (7b)にてそれぞれ記憶した各出力
信号、例えば請3図示の影像について光源(3)で光照
射したときの出力信号fA(x、 y)と光源(4)で
光照射したときの出力信号fn(x、 y)との差また
は差の絶対値l f人(x、 y) −fn(x、 y
) lを引算装置(8)で求める。かくして求めたレベ
ル差は次の演算装置(9)にて形状乃至位置信号に演算
される。例えば第3図においてX軸に平行な線αJに沿
りた上記1f人(x、 y) −fn(x、 y) I
は第4図に示すような信号強度分布を呈するので、前記
信号強度分布に窓ける内ベリの位fjl xs l )
c! を即ち電子部品の位置が分る。−方上記平行な線
03を順次平行移動させその都度x1+X、を求めそれ
らxl t xtの平均値阿、罵を得、これがその電子
部品(2a)のX軸位置座標となる。同様にyについて
も行ない)’l r ytから位置が分り、さらにY1
+Yzを得、(y軸位置座標)ることによって実装され
ている電子部品(2a)の形状が分る。かくして演算装
置(9)で演算された形状信号乃至位置信号は予め基準
値(設定値)を記憶格納しである判定装置Qlにおいて
比較判定され、その判定結果が表示される。なおこの判
定装置o(llに予め記憶格納する基準像(設定値)、
即ち実装検査の対象となる電子部品(2a)の基準像は
対応する電子部品の輪郭像や影像或いは影像を2値化し
た像またはそれらの一部例えば第5図に示す如き輪郭像
αaの一部でもよい。また上記判定装置0Cでの比較判
定において上記の如く信号強度分布の内べりxI + 
Xtおよび)’1 + Ytを求めて対比せず、信号強
度分布(影像)を予め記憶させてある基準像と直接対比
して合致状況から電子部品(2a)の位置を検出するこ
ともできる(この場合は演算装置(9)による演算は不
要となる)。
The signals are respectively stored in the second signal storage device (7b) and synchronously reproduced in the next subtraction device (8) to determine the difference (level) between the two output signals. That is, each output signal stored in the first and second signal storage devices e (7a) and (7b), for example, the output signal fA ( x, y) and the output signal fn(x, y) when irradiated with light by the light source (4) or the absolute value of the difference l f person(x, y) - fn(x, y
) Find l using the subtraction device (8). The level difference thus obtained is calculated into a shape or position signal by the next calculation device (9). For example, in Figure 3, the above 1f people (x, y) - fn (x, y) I along the line αJ parallel to the X axis
exhibits a signal strength distribution as shown in FIG.
c! In other words, the position of the electronic component can be found. - direction The parallel lines 03 are sequentially translated and x1+X is obtained each time, and the average value of xl t xt is obtained, which becomes the X-axis position coordinate of the electronic component (2a). Do the same for y)'l r yt to find the position, and then Y1
By obtaining +Yz (y-axis position coordinate), the shape of the mounted electronic component (2a) can be found. The shape signal or position signal thus calculated by the calculation device (9) is compared and determined by the determination device Ql which stores reference values (setting values) in advance, and the determination results are displayed. Note that the reference image (set value) stored in advance in this judgment device o(ll),
That is, the reference image of the electronic component (2a) to be inspected for mounting is a contour image, an image, a binarized image of the corresponding electronic component, or a part thereof, for example, one of the contour images αa as shown in FIG. It can also be a department. In addition, in the comparison judgment by the judgment device 0C, the inner deviation of the signal strength distribution xI +
It is also possible to detect the position of the electronic component (2a) from the matching situation by directly comparing the signal intensity distribution (image) with a reference image stored in advance, without determining and comparing Xt and )'1 + Yt ( In this case, the calculation by the calculation device (9) becomes unnecessary).

さらに上記判定装置OQにおける比較判定において第6
図に示す如く、予め記憶格納しである基準像(設定値)
即ち基準となる電子部品の輪郭像(14゜影像、影像を
2値化した像もしくはそれらの一部を移動させながら前
記演−J P FIN (91で演算した形状信号乃至
位置信号の内ペリ”l + X2および’h 、 Yx
との合致度を演算することにより電子部品の形状異常も
容易に検出できる。即ち基準像における内ペリと実装電
子部品についての演算による内ペリとが一致している程
1合致度の最大値は高いが例えば実装電子部品が破損な
どし形状が異常の場合には上記合致度の最大値が異常に
低くなるため形状異常を容易に検出しうることになる。
Furthermore, in the comparison judgment in the judgment device OQ, the sixth
As shown in the figure, the reference image (setting value) is stored in advance.
In other words, while moving the outline image (14° image, binarized image, or a part thereof) of the electronic component that serves as a reference, l + X2 and 'h, Yx
Abnormalities in the shape of electronic components can also be easily detected by calculating the degree of matching. In other words, the more the inner periphery in the reference image matches the inner periphery calculated for the mounted electronic component, the higher the maximum value of the 1 degree of coincidence will be. However, if the mounted electronic component is damaged or has an abnormal shape, the above coincidence degree will increase. Since the maximum value of is abnormally low, shape abnormalities can be easily detected.

しかしてこの形状異常の検出は上記形状信号乃至位置信
号の内ぺ!J xl+ Xtや)’l 、 Yxとの合
致度を演算することなく、信号強度分布を基準像(基準
となる電子部品の輪郭像など)と対比し、その合致度合
から形状の異常を判足しつる。例えば基準輪郭像に比べ
実装電子部品についての信号強度分布の強度幅が広いか
または狭いかと云うことは実装電子部品が高さ方向にお
いて高いかまたは低いかに和尚し。
However, detection of abnormalities in the shape of the lever is possible only within the above shape signal or position signal! J xl + Vine. For example, whether the intensity width of the signal intensity distribution of a mounted electronic component is wider or narrower than the reference contour image depends on whether the mounted electronic component is taller or lower in the height direction.

形状異常と判定しつる。It is determined that the shape is abnormal.

上記実施例では被検査体である印刷回路基板(2)−二
    ’  −+ −、J−’   L贋≠光1目計
いヰかにおいては電子部品を、その電子部品の陵ねもし
くは母線が基板(2b)の辺に対し直交または平行にな
るよう実装、配設したが賛はそれら実装された個を用い
たが光源を1個とし例えば回転ミラーで切換え二方向か
ら光を照射するようにしてもよいし、また光の照射は二
方向に限らず三方向もしくは四方向など多方向から行な
ってもよい。この場合1例えば三方向から光照射した場
合((は信号出力差は2f人(x、y) −fn(x、
 y) −fo(x、 y)の形で算出される。しかし
て上記光照射するに当ってはスイッチによる光源の点灯
、消灯に限らず光シャッタ或いは偏光利用の電気シャッ
タなどによる選択的なし中光方式や照射光の強度差を付
けることによってもよい。また印刷回路基板(2)の光
照射面の影像(画像)を撮像し光電変換する手段(5)
はテレビカメラに限らず半導体光電変換素子などでもよ
い。
In the above embodiment, the printed circuit board (2) which is the object to be inspected is They were mounted and arranged so that they were perpendicular or parallel to the sides of the board (2b), but the light source was one, and for example, a rotating mirror was used to switch and emit light from two directions. Alternatively, light irradiation may be performed not only from two directions but from many directions such as three or four directions. In this case 1. For example, when light is irradiated from three directions ((, the signal output difference is 2f people (x, y) - fn (x,
y) −fo(x, y). The above-mentioned light irradiation is not limited to turning on and off the light source using a switch, but may also be performed selectively using an optical shutter or an electric shutter using polarized light, or by varying the intensity of the irradiated light. Also, a means (5) for capturing an image of the light-irradiated surface of the printed circuit board (2) and photoelectrically converting it.
is not limited to a television camera, but may also be a semiconductor photoelectric conversion element or the like.

しかして上記少なくとも二方向から照射する光源は光電
変換手段(5)に対して対称的な配設が好しいが、これ
に限定されずまた。光電変換手段(5)と光源(3)、
(4)との配設も、それらが互に結ぶ延長線(llり、
 (llb)が基板(2b) ノ辺即ち一定方向ニ配設
された電子部品(2a)に対し好しくは45度程度の傾
斜であるが必ずしも、これに限定されない。さらに被検
査体である印刷回路基板(2)を載置する支持台(1)
はXY軸方向に可動なテーブルとし、検査に当って印刷
回路基板(2)の位置を適宜変えて所要の実装検査を行
ないつる。
Although it is preferable that the light source emitting light from at least two directions is arranged symmetrically with respect to the photoelectric conversion means (5), the present invention is not limited thereto. photoelectric conversion means (5) and light source (3),
The arrangement with (4) is also an extension line that connects them to each other.
(llb) is preferably inclined at about 45 degrees with respect to the electronic component (2a) disposed on the side of the substrate (2b), that is, in a certain direction, but is not necessarily limited to this. Furthermore, a support stand (1) on which a printed circuit board (2), which is the object to be inspected, is placed.
is a table movable in the XY-axis directions, and the position of the printed circuit board (2) is appropriately changed during inspection to perform the required mounting inspection.

〔発明の効果〕〔Effect of the invention〕

上記の如く本発明によれば、を子部品の陵線もしくは母
線が一定の方向に方向付けられて電子部品を実装した印
刷回路基板について照明a(光源と光電変換手段とを結
ぶ線)を前記電子部品の配役方向に対して傾斜させて光
源を配設する構成となっている。このため実装検査する
電子部凸側々について照明線を変えることなく各電子部
品について確実に、明認しつる影像(画像)が容易に得
られる。従って光電変換手段による出力信号にた予め記
憶、格納しである各電子部品の輪郭像などの基準像(設
定値)を移動させながら検出した電子部品の影像(画像
)についての演算による内ヘリ値xl * ”! r 
Yl + Ytとの合致度合などから実装されている電
子部品の異常形状(例えば破損欠陥のあるもの1品種の
誤り)をも検出できる。かくして本発明に係る電子部品
実装検査装置によれば電子部品の実装状態を確実且つ高
精度に検査しうることになる。
As described above, according to the present invention, the illumination a (the line connecting the light source and the photoelectric conversion means) is connected to the printed circuit board on which the ridge line or bus line of the child component is oriented in a certain direction and the electronic component is mounted. The light source is arranged at an angle with respect to the direction in which the electronic components are arranged. Therefore, it is possible to easily obtain clearly visible images of each electronic component without changing the illumination line for each convex side of the electronic component to be inspected for mounting. Therefore, the inner edge value is calculated by calculating the image (image) of the electronic component detected while moving the reference image (setting value) such as the outline image of each electronic component, which is stored in advance in the output signal from the photoelectric conversion means. xl *”! r
It is also possible to detect an abnormal shape of a mounted electronic component (for example, an incorrect type of one with a breakage defect) based on the degree of coincidence with Yl + Yt. Thus, according to the electronic component mounting inspection apparatus according to the present invention, the mounting state of electronic components can be inspected reliably and with high precision.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の電子部品実装検査装置の実施例を示す
概略構成図、第2図は第1図における印刷回路基板に対
する光源および光電変換手段の配置関係を示す平面図、
第3図は第1図の装置において得られた電子部品の影像
を示す模写図、第4図は第3図の影像においてX@方向
における信号強度を示す特性図、第5図は第1図の装置
において予め記憶格納させた基準値(像)の−例を示す
模写図、第6図は第1図の装置における動作の一例を示
す説明図である。 (1)二支持台、(2):印刷回路基板、(2a):電
子部品。 (2b) :基板、  (3)、(4):光源、(5)
:光電変換手段。 (6)二面像処理装置。 (llり、 (llb) :光源と光電変換手段とを結
ぶ延長線。 代理人 弁理士  則 近 憲 佑 同     竹 花 喜久男 第 1fi ′@ 4 図 2d       第5図 第6図
FIG. 1 is a schematic configuration diagram showing an embodiment of the electronic component mounting inspection apparatus of the present invention, FIG. 2 is a plan view showing the arrangement relationship of the light source and photoelectric conversion means with respect to the printed circuit board in FIG. 1,
Fig. 3 is a reproduction diagram showing the image of the electronic component obtained with the apparatus shown in Fig. 1, Fig. 4 is a characteristic diagram showing the signal strength in the X@ direction in the image of Fig. 3, and Fig. 5 is the diagram shown in Fig. FIG. 6 is an explanatory diagram showing an example of the operation of the apparatus shown in FIG. 1. FIG. (1) Two support stands, (2): Printed circuit board, (2a): Electronic components. (2b): Substrate, (3), (4): Light source, (5)
: Photoelectric conversion means. (6) Dual image processing device. (lli, (llb): An extension line connecting the light source and the photoelectric conversion means. Agent Patent attorney Nori Chika Ken Yudo Kikuo Takehana 1fi'@4 Figure 2d Figure 5 Figure 6

Claims (2)

【特許請求の範囲】[Claims] (1)実装された電子部品の陵線もしくは母線が一定方
向に配設されている印刷回路基板を載置する支持台と、
前記印刷回路基板に対して少なくとも二方向から光を照
射する光源と、前記光源からの光照射による電子部品の
影像を撮像し電気信号に変換する光電変換手段と、前記
光電変換手段で出力した出力信号を画像処理する画像処
理装置とを具備し、且つ前記光源および光電変換手段は
それら光源を光電変換手段とを結ぶ延長線が前記電子部
品の配設方向に対して傾斜するように配設されて成るこ
とを特徴とする電子部品実装検査装置。
(1) A support stand on which a printed circuit board is placed, on which the ridge lines or bus bars of the mounted electronic components are arranged in a certain direction;
a light source that irradiates the printed circuit board with light from at least two directions; a photoelectric conversion unit that captures an image of the electronic component caused by the light irradiation from the light source and converts it into an electrical signal; and an output output by the photoelectric conversion unit. an image processing device that performs image processing on a signal, and the light source and the photoelectric conversion means are arranged such that an extension line connecting the light source and the photoelectric conversion means is inclined with respect to a direction in which the electronic component is arranged. An electronic component mounting inspection device characterized by comprising:
(2)前記画像処理装置は光電変換手段で交互に出力し
た出力信号を画像処理するとともに予め記憶させてある
実装電子部品の基準像もしくはその一部を移動させなが
ら前記出力画像と合致度を対比する手段を含むことを特
徴とする特許請求の範囲第一項記載の電子部品実装検査
装置。
(2) The image processing device performs image processing on the output signals alternately outputted by the photoelectric conversion means, and compares the degree of matching with the output image while moving a pre-stored reference image of the mounted electronic component or a part thereof. An electronic component mounting inspection apparatus according to claim 1, characterized in that the electronic component mounting inspection apparatus includes means for performing.
JP61161964A 1986-07-11 1986-07-11 Electronic component mounting inspection method Expired - Lifetime JPH07117383B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61161964A JPH07117383B2 (en) 1986-07-11 1986-07-11 Electronic component mounting inspection method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61161964A JPH07117383B2 (en) 1986-07-11 1986-07-11 Electronic component mounting inspection method

Publications (2)

Publication Number Publication Date
JPS6318206A true JPS6318206A (en) 1988-01-26
JPH07117383B2 JPH07117383B2 (en) 1995-12-18

Family

ID=15745417

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61161964A Expired - Lifetime JPH07117383B2 (en) 1986-07-11 1986-07-11 Electronic component mounting inspection method

Country Status (1)

Country Link
JP (1) JPH07117383B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011013220A (en) * 2009-07-03 2011-01-20 Koh Young Technology Inc Inspection method of object to be measured

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5263753A (en) * 1975-11-20 1977-05-26 Bendix Corp Apparatus for discriminating surface characteristic of object
JPS55155205A (en) * 1979-05-23 1980-12-03 Toshiba Corp Form detector
JPS59107202A (en) * 1982-12-10 1984-06-21 Matsushita Electric Ind Co Ltd Checking device of fitting position of minute parts
JPS60140107A (en) * 1983-12-28 1985-07-25 Hitachi Ltd Shape detecting method and apparatus thereof

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5263753A (en) * 1975-11-20 1977-05-26 Bendix Corp Apparatus for discriminating surface characteristic of object
JPS55155205A (en) * 1979-05-23 1980-12-03 Toshiba Corp Form detector
JPS59107202A (en) * 1982-12-10 1984-06-21 Matsushita Electric Ind Co Ltd Checking device of fitting position of minute parts
JPS60140107A (en) * 1983-12-28 1985-07-25 Hitachi Ltd Shape detecting method and apparatus thereof

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011013220A (en) * 2009-07-03 2011-01-20 Koh Young Technology Inc Inspection method of object to be measured
US8548224B2 (en) 2009-07-03 2013-10-01 Koh Young Technology Inc. Method for inspecting measurement object
US20130294679A1 (en) * 2009-07-03 2013-11-07 Koh Young Technology Inc. Method for inspecting measurement object
US8724883B2 (en) * 2009-07-03 2014-05-13 Koh Young Technology Inc. Method for inspecting measurement object

Also Published As

Publication number Publication date
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