JPH07115034A - Discrimination method of direction of lamination ceramic capacitor - Google Patents
Discrimination method of direction of lamination ceramic capacitorInfo
- Publication number
- JPH07115034A JPH07115034A JP26004493A JP26004493A JPH07115034A JP H07115034 A JPH07115034 A JP H07115034A JP 26004493 A JP26004493 A JP 26004493A JP 26004493 A JP26004493 A JP 26004493A JP H07115034 A JPH07115034 A JP H07115034A
- Authority
- JP
- Japan
- Prior art keywords
- ceramic capacitor
- internal electrode
- magnetic field
- monolithic ceramic
- electrode layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Ceramic Capacitors (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
- Measuring Magnetic Variables (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、強磁性体を内部電極と
した積層セラミックコンデンサの方向識別方法に関す
る。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for identifying the direction of a monolithic ceramic capacitor having a ferromagnetic material as an internal electrode.
【0002】[0002]
【従来の技術】積層セラミックコンデンサは、複数の誘
電体セラミック層と、その誘電体セラミック層を介して
互いに積層された状態で配置された複数の内部電極層
と、その内部電極層の所定のものに接続された外部電極
とからなり、直方体の形状をしている。また、その内部
電極層としてはPd,Pt,Ag等の貴金属系や、内部
電極材料のコストダウンを目的としたNi,Cu等の卑
金属系の金属が用いられている。2. Description of the Related Art A multilayer ceramic capacitor includes a plurality of dielectric ceramic layers, a plurality of internal electrode layers arranged in a laminated state with the dielectric ceramic layers interposed therebetween, and predetermined internal electrode layers. It has an external electrode connected to and has a rectangular parallelepiped shape. As the internal electrode layer, a noble metal based metal such as Pd, Pt, Ag or a base metal based metal such as Ni or Cu for the purpose of cost reduction of the internal electrode material is used.
【0003】この積層セラミックコンデンサにおいて、
その実装信頼性や品質を高めるために、その方向、つま
り内部電極層の方向の識別を要求される場合がある。即
ち、一般に、積層セラミックコンデンサは、キャビティ
内に収容された状態にテーピング包装された後、実装機
により回路基板に装着されるが、この実装の信頼性を上
げるために、キャビティ内のチップの高さ寸法のばらつ
きを押さえる必要がある。このため、内部電極層の方向
を識別し、チップを同一方向でキャビティ内に収容し、
テーピングする必要がある。また、誘電体セラミック層
と内部電極層との間に生じるデラミネーション等の内部
構造欠陥を検出する方法として、超音波探傷試験機によ
り、積層セラミックコンデンサに超音波を照射し、その
反射波を解析することにより欠陥の有無を検査する方法
が採用されている。この場合も、デラミネーションの検
出感度を上げるためには内部電極層に垂直に超音波を当
てる必要があり、そのために超音波探傷試験の前に内部
電極層の方向の識別を要求される場合がある。In this laminated ceramic capacitor,
In order to improve its mounting reliability and quality, it may be required to identify the direction, that is, the direction of the internal electrode layer. That is, in general, a laminated ceramic capacitor is mounted on a circuit board by a mounting machine after being taped and packaged in a state of being housed in the cavity. In order to improve the reliability of mounting, the height of a chip in the cavity is increased. It is necessary to suppress variations in size. Therefore, the direction of the internal electrode layer is identified, the chip is housed in the cavity in the same direction,
Need to taping. In addition, as a method of detecting internal structural defects such as delamination that occurs between the dielectric ceramic layer and the internal electrode layer, an ultrasonic flaw tester irradiates the laminated ceramic capacitor with ultrasonic waves and analyzes the reflected waves. A method of inspecting for the presence or absence of a defect by doing so is adopted. Also in this case, in order to increase the detection sensitivity of delamination, it is necessary to apply ultrasonic waves perpendicularly to the internal electrode layer, and therefore it may be required to identify the direction of the internal electrode layer before the ultrasonic flaw detection test. is there.
【0004】従来、この直方体形状をした積層セラミッ
クコンデンサの内部電極層の方向、特に内部電極層を積
み重ねた厚み方向と内部電極層の幅方向の識別は次のよ
うにしていた。即ち、積層セラミックコンデンサの内部
電極層を積み重ねた厚み方向と内部電極層の幅方向との
間に設計上明らかな違いがある時は、その寸法の違いに
より識別していた。一方、内部電極層を積み重ねた厚み
方向と内部電極層の幅方向との間に設計上殆ど差がな
い、即ち略正四角柱の形状の場合には、内部電極層がセ
ラミック表面に透けて見えるときはその色合いを、ある
いは一般に内部電極層を積み重ねた厚み方向の面が僅か
ながら凸形状を示す特徴を有する場合はその特徴を、目
視により観察したりて識別していた。Conventionally, the direction of the internal electrode layers of this rectangular parallelepiped monolithic ceramic capacitor, in particular, the thickness direction in which the internal electrode layers are stacked and the width direction of the internal electrode layers have been identified as follows. That is, when there is a clear design difference between the thickness direction in which the internal electrode layers of the monolithic ceramic capacitor are stacked and the width direction of the internal electrode layers, they are identified by the size difference. On the other hand, when there is almost no difference in design between the thickness direction in which the internal electrode layers are stacked and the width direction of the internal electrode layers, that is, in the case of a substantially square prism shape, when the internal electrode layers can be seen through the ceramic surface. Has identified the color, or in general, when the surface in the thickness direction in which the internal electrode layers are stacked has a slight convex shape, the characteristic is visually observed and identified.
【0005】[0005]
【発明が解決しようとする課題】従来の、角柱形状の積
層セラミックコンデンサのセラミック表面の色合いや凸
形状を目視により観察したりして、内部電極層の方向を
識別する方法は、視覚に頼る方法でありその識別精度は
悪く、テーピングした積層セラミックコンデンサの実装
信頼性や超音波探傷試験の精度を悪くする原因となって
いた。The conventional method of identifying the direction of the internal electrode layers by visually observing the shade or convex shape of the ceramic surface of the prismatic monolithic ceramic capacitor depends on the visual method. Therefore, the identification accuracy is poor, which causes the mounting reliability of the taped laminated ceramic capacitor and the accuracy of the ultrasonic flaw detection test to be deteriorated.
【0006】そこで、本発明の目的は、Ni等の強磁性
体の内部電極層が外部磁界で磁化されることに着目し
て、強磁性体からなる内部電極層を有する角柱形状の積
層セラミックコンデンサの方向、つまり内部電極層の方
向を非破壊で正確に識別する方法を提供することにあ
る。Therefore, an object of the present invention is to pay attention to the fact that an internal electrode layer made of a ferromagnetic material such as Ni is magnetized by an external magnetic field, and a prismatic laminated ceramic capacitor having an internal electrode layer made of a ferromagnetic material. The object of the present invention is to provide a method of accurately identifying the direction of the internal electrode layer, that is, the direction of the internal electrode layer in a nondestructive manner.
【0007】[0007]
【課題を解決するための手段】上記目的を達成するた
め、本発明は、誘電体セラミック層を介して配置された
静電容量を形成するための強磁性体からなる複数の内部
電極層を有する積層セラミックコンデンサに対し、該積
層セラミックコンデンサに、内部電極層の導出面との平
行を保ちながら該積層セラミックコンデンサの周囲を少
なくとも90度以上回転する一定の磁場を加えて、該積
層セラミックコンデンサに加える磁場の方向を変化させ
て、該積層セラミックコンデンサの磁化状態を測定する
ことを特徴とする。In order to achieve the above object, the present invention has a plurality of internal electrode layers made of a ferromagnetic material for forming a capacitance arranged through a dielectric ceramic layer. To the monolithic ceramic capacitor, a constant magnetic field that rotates at least 90 degrees around the monolithic ceramic capacitor while maintaining parallel to the lead-out surface of the internal electrode layer is applied to the monolithic ceramic capacitor. The magnetization state of the monolithic ceramic capacitor is measured by changing the direction of the magnetic field.
【0008】また、積層セラミックコンデンサに加える
磁場の方向を変化させるに当り、磁場を固定して、該積
層セラミックコンデンサを、対向する内部電極層の導出
面を軸として回転させてもよい。When changing the direction of the magnetic field applied to the monolithic ceramic capacitor, the magnetic field may be fixed and the monolithic ceramic capacitor may be rotated about the lead-out surface of the facing internal electrode layer.
【0009】[0009]
【作用】本発明の対象とする積層セラミックコンデンサ
の内部電極層は、Ni等の強磁性体よりなる。従って、
積層セラミックコンデンサに加える磁場の方向を変化さ
せると、内部電極層を通過する磁束が変化し、積層セラ
ミックコンデンサの磁化の程度が変化する。従って、磁
化の、積層セラミックコンデンサへの磁場の入射角度依
存性の違いにより、積層セラミックコンデンサの方向を
識別することができる。The internal electrode layers of the monolithic ceramic capacitor targeted by the present invention are made of a ferromagnetic material such as Ni. Therefore,
When the direction of the magnetic field applied to the monolithic ceramic capacitor is changed, the magnetic flux passing through the internal electrode layers is changed, and the degree of magnetization of the monolithic ceramic capacitor is changed. Therefore, the direction of the monolithic ceramic capacitor can be identified by the difference in the dependence of the magnetization on the incident angle of the magnetic field on the monolithic ceramic capacitor.
【0010】[0010]
【実施例】以下、本発明の積層セラミックコンデンサの
方向識別方法を実施例に基づき説明する。図1は振動試
料型磁力計を用いた積層セラミックコンデンサの磁化測
定の斜視図である。同図において、1は内部電極層が強
磁性体のNiからなる長さ寸法2.0mm,幅寸法1.
25mm,厚み寸法1.25mmの正角柱形状の積層セ
ラミックコンデンサ、2は積層セラミックコンデンサ1
の内部電極層、3は同じく積層セラミックコンデンサ1
の外部電極である。そして、4は積層セラミックコンデ
ンサ1に、内部電極層導出面との平行を保ちながらその
積層セラミックコンデンサ1の周囲を回転する一定の磁
場を加える電磁石(ポールピース)である。さらに、H
は磁場の印加方向であり、Rは磁場の回転方向であり、
Mは積層セラミックコンデンサ1の磁化の測定方向であ
る。The method for identifying the direction of a monolithic ceramic capacitor according to the present invention will be described below with reference to embodiments. FIG. 1 is a perspective view of a magnetization measurement of a multilayer ceramic capacitor using a vibrating sample magnetometer. In the figure, reference numeral 1 denotes a length dimension of 2.0 mm and a width dimension of 1.
25 mm, thickness 1.25 mm prismatic prism-shaped monolithic ceramic capacitor, 2 monolithic ceramic capacitor 1
The internal electrode layers of 3 are the same as the multilayer ceramic capacitor 1
External electrodes. Reference numeral 4 denotes an electromagnet (pole piece) that applies a constant magnetic field to the monolithic ceramic capacitor 1 so as to rotate around the monolithic ceramic capacitor 1 while keeping parallel to the internal electrode layer leading surface. Furthermore, H
Is the magnetic field application direction, R is the magnetic field rotation direction,
M is the measurement direction of the magnetization of the monolithic ceramic capacitor 1.
【0011】まず、積層セラミックコンデンサ1に加え
る磁場の方向Hを変化させて、積層セラミックコンデン
サ1の磁化の磁場入射角度依存性を求めた。即ち、あら
かじめ外部電極3の一部を除去して確認しておいた内部
電極層2が磁場の方向Hに対して垂直になるように、か
つ外部電極3の面が上下に位置するように積層セラミッ
クコンデンサ1を電磁石4の間に配置した。そして、磁
場の強さを10kOeに固定して、内部電極層導出面と
の平行を保ちながら積層セラミックコンデンサ1の回り
に磁場を回転させ、内部電極層2への磁場の入射角度を
90度から360度変化させて、そのときの磁場の回転
面と垂直な方向Mの磁化を測定した。その結果を図2に
示す。First, the direction H of the magnetic field applied to the monolithic ceramic capacitor 1 was changed to determine the magnetic field incident angle dependence of the magnetization of the monolithic ceramic capacitor 1. That is, the internal electrode layers 2 which have been confirmed by removing a part of the external electrodes 3 in advance are stacked so that the internal electrode layers 2 are perpendicular to the direction H of the magnetic field and the surfaces of the external electrodes 3 are positioned vertically. The ceramic capacitor 1 was arranged between the electromagnets 4. Then, the strength of the magnetic field is fixed at 10 kOe, and the magnetic field is rotated around the laminated ceramic capacitor 1 while keeping the parallel to the lead-out surface of the internal electrode layer, and the incident angle of the magnetic field to the internal electrode layer 2 is changed from 90 degrees. The magnetization was changed in 360 degrees and the magnetization in the direction M perpendicular to the plane of rotation of the magnetic field at that time was measured. The result is shown in FIG.
【0012】図2に示す通り、積層セラミックコンデン
サの磁化は、その内部電極層への磁場の入射角度が変わ
ることにより変化する。即ち、磁場の内部電極層への入
射角度が垂直あるいは平行なときに、積層セラミックコ
ンデンサの磁化は極大を示し、しかも磁場の内部電極層
への入射角度が垂直なときのほうが平行なときと比較し
て磁化は大きくなる。As shown in FIG. 2, the magnetization of the monolithic ceramic capacitor changes as the angle of incidence of the magnetic field on its internal electrode layer changes. That is, when the angle of incidence of the magnetic field on the internal electrode layer is vertical or parallel, the magnetization of the monolithic ceramic capacitor exhibits a maximum, and moreover, when the angle of incidence of the magnetic field on the internal electrode layer is vertical, it is compared to when it is parallel. Then the magnetization increases.
【0013】従って、たとえば、内部電極層が導出され
ていない任意の一面にほぼ垂直な角度より少なくとも9
0度以上、内部電極層導出面との平行を保ちながら、積
層セラミックコンデンサの回りに磁場を回転させて磁化
を測定して、検出した磁化の複数のピーク値の相対的大
きさとその時系列を調べることで、セラミックコンデン
サの内部電極層の方向を識別することができる。Therefore, for example, at least 9 from an angle substantially perpendicular to any one surface where the internal electrode layers are not led out.
The magnetization is measured by rotating the magnetic field around the monolithic ceramic capacitor while maintaining parallel to the internal electrode layer lead-out surface at 0 degrees or more, and the relative magnitudes of a plurality of detected magnetization peak values and their time series are investigated. Thus, the direction of the internal electrode layer of the ceramic capacitor can be identified.
【0014】なお、積層セラミックコンデンサに加える
磁場の強さは、上記実施例の場合には磁化が飽和する1
0kOeの磁場を加えているが、これに限定されること
なく、それ以下の磁化が不飽和の領域の磁場でもよい。Incidentally, the strength of the magnetic field applied to the monolithic ceramic capacitor is such that the magnetization is saturated in the above embodiment.
Although a magnetic field of 0 kOe is applied, the magnetic field is not limited to this and may be a magnetic field in a region where the magnetization is lower than that is unsaturated.
【0015】また、上記実施例においては、磁場を回転
させて積層セラミックコンデンサに加える磁場の方向を
変化させているが、これに限定されることなく、逆に磁
場を固定しておいて、積層セラミックコンデンサを対向
する内部電極層導出面を軸として回転させてもよい。さ
らに本発明は、識別する積層セラミックコンデンサが必
ずしも略正角柱のものに限ることはなく、他の直方体の
ものでもよい。In the above embodiment, the magnetic field is rotated to change the direction of the magnetic field applied to the monolithic ceramic capacitor. However, the present invention is not limited to this, and the magnetic field is fixed in the opposite direction, and the monolithic ceramic capacitor is laminated. The ceramic capacitor may be rotated around the opposing internal electrode layer lead-out surface as an axis. Further, in the present invention, the laminated ceramic capacitor to be identified is not necessarily limited to the one having a substantially regular prism shape, and may be another rectangular parallelepiped one.
【0016】[0016]
【発明の効果】以上の説明で明らかなように、本発明の
強磁性体を内部電極層とする積層セラミックコンデンサ
の方向識別方法によれば、内部電極層に加える磁場の方
向を変化させると、内部電極層を通過する磁束が変化す
るため内部電極層の磁化の状態が変化する。この磁化の
磁場入射角度依存性を測定することにより、強磁性体を
内部電極層とする積層セラミックコンデンサの方向を非
破壊で正確に識別することができる。As is apparent from the above description, according to the method for identifying the direction of a laminated ceramic capacitor having a ferromagnetic material as an internal electrode layer of the present invention, when the direction of a magnetic field applied to the internal electrode layer is changed, Since the magnetic flux passing through the internal electrode layers changes, the state of magnetization of the internal electrode layers changes. By measuring the dependence of the magnetization on the incident angle of the magnetic field, the direction of the multilayer ceramic capacitor having the ferromagnetic material as the internal electrode layer can be accurately identified in a nondestructive manner.
【0017】従って、テープ部材のキャビティ内へのチ
ップ収納方向を一定させることができ、キャビティ内の
チップ高さばらつきを押えて実装機での実装信頼性を高
めることができる。Therefore, the direction in which the tape member accommodates the chip in the cavity can be made constant, and the variation in the chip height in the cavity can be suppressed to enhance the mounting reliability in the mounting machine.
【0018】また、同様の構成を転用し、内部電極層に
垂直に超音波が照射されるように超音波探傷機へチップ
を配置し、デラミネーション等の内部構造欠陥を精度良
く検査することができる。この場合、超音波照射機が先
の実施例の電磁石となることはいうまでもない。Further, by using the same structure, the chip is arranged on the ultrasonic flaw detector so that the internal electrode layer is irradiated with ultrasonic waves vertically, and internal structural defects such as delamination can be accurately inspected. it can. In this case, it goes without saying that the ultrasonic wave irradiation device serves as the electromagnet of the previous embodiment.
【図1】振動試料型磁力計を用いた積層セラミックコン
デンサの磁化測定の斜視図である。FIG. 1 is a perspective view of a magnetization measurement of a multilayer ceramic capacitor using a vibrating sample magnetometer.
【図2】積層セラミックコンデンサの磁化の磁場入射角
度依存性を示すグラフである。FIG. 2 is a graph showing the magnetic field incident angle dependence of the magnetization of a monolithic ceramic capacitor.
1 積層セラミックコンデンサ 2 内部電極層 3 外部電極 4 振動試料型磁力計の電磁石 H 磁場の印加方向 R 磁場の回転方向 M 磁化の測定方向 1 Multilayer Ceramic Capacitor 2 Internal Electrode Layer 3 External Electrode 4 Electromagnet of Vibration Sample Magnetometer H Magnetic Field Application Direction R Magnetic Field Rotation Direction M Magnetization Measurement Direction
Claims (2)
静電容量を形成するための強磁性体からなる複数の内部
電極層を有する積層セラミックコンデンサに対し、 該積層セラミックコンデンサに、内部電極層の導出面と
の平行を保ちながら該積層セラミックコンデンサの周囲
を少なくとも90度以上回転する一定の磁場を加えて、
該積層セラミックコンデンサに加える磁場の方向を変化
させて、該積層セラミックコンデンサの磁化状態を測定
することを特徴とする積層セラミックコンデンサの方向
識別方法。1. A monolithic ceramic capacitor having a plurality of internal electrode layers made of a ferromagnetic material for forming a capacitance, which are arranged via dielectric ceramic layers, wherein the monolithic ceramic capacitor has internal electrode layers. A constant magnetic field that rotates at least 90 degrees or more around the monolithic ceramic capacitor while maintaining parallel to the derivation surface of
A method for identifying a direction of a monolithic ceramic capacitor, which comprises changing a direction of a magnetic field applied to the monolithic ceramic capacitor to measure a magnetization state of the monolithic ceramic capacitor.
の方向を変化させるに当り、磁場を固定して、該積層セ
ラミックコンデンサを、対向する内部電極層の導出面を
軸として少なくとも90度以上回転させることを特徴と
する請求項1記載の積層セラミックコンデンサの方向識
別方法。2. When changing the direction of the magnetic field applied to the monolithic ceramic capacitor, the magnetic field is fixed and the monolithic ceramic capacitor is rotated at least 90 degrees or more around the lead-out surface of the facing internal electrode layer. 2. The method for identifying the direction of a monolithic ceramic capacitor according to claim 1.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5260044A JP3055375B2 (en) | 1993-10-18 | 1993-10-18 | Direction identification method for multilayer ceramic capacitors |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5260044A JP3055375B2 (en) | 1993-10-18 | 1993-10-18 | Direction identification method for multilayer ceramic capacitors |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH07115034A true JPH07115034A (en) | 1995-05-02 |
JP3055375B2 JP3055375B2 (en) | 2000-06-26 |
Family
ID=17342529
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5260044A Expired - Lifetime JP3055375B2 (en) | 1993-10-18 | 1993-10-18 | Direction identification method for multilayer ceramic capacitors |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP3055375B2 (en) |
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JP2014130912A (en) * | 2012-12-28 | 2014-07-10 | Murata Mfg Co Ltd | Method for discriminating direction of multilayer ceramic capacitor, direction discriminating device for multilayer ceramic capacitor, and method of manufacturing multilayer ceramic capacitor |
DE102013207559A1 (en) * | 2013-04-25 | 2014-10-30 | Continental Teves Ag & Co. Ohg | Method and arrangement for testing orientation and / or quality criterion of ceramic multilayer capacitors |
KR20150083792A (en) * | 2014-01-10 | 2015-07-20 | 가부시키가이샤 무라타 세이사쿠쇼 | Apparatus for manufacturing a series of taping electronic components, method for manufacturing a series of taping electronic components, apparatus for conveying electronic component, method for conveying electronic component, and a series of taping electronic components |
KR20160000837A (en) * | 2014-06-25 | 2016-01-05 | 가부시키가이샤 무라타 세이사쿠쇼 | Method of identifying direction of multilayer ceramic capacitor, apparatus identifying direction of multilayer ceramic capacitor, and method of manufacturing multilayer ceramic capacitor |
JP2016027612A (en) * | 2014-06-25 | 2016-02-18 | 株式会社村田製作所 | Method of identifying direction of stacking in stacked ceramic capacitor, apparatus for identifying direction of stacking in stacked ceramic capacitor, and method of manufacturing stacked ceramic capacitor |
US9714921B2 (en) | 2014-06-25 | 2017-07-25 | Murata Manufacturing Co., Ltd. | Method of identifying direction of multilayer ceramic capacitor, apparatus identifying direction of multilayer ceramic capacitor, and method of manufacturing multilayer ceramic capacitor |
CN116359127A (en) * | 2023-02-16 | 2023-06-30 | 广东微容电子科技有限公司 | Magnetic detection device and magnetic detection method |
-
1993
- 1993-10-18 JP JP5260044A patent/JP3055375B2/en not_active Expired - Lifetime
Cited By (9)
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JP2014130912A (en) * | 2012-12-28 | 2014-07-10 | Murata Mfg Co Ltd | Method for discriminating direction of multilayer ceramic capacitor, direction discriminating device for multilayer ceramic capacitor, and method of manufacturing multilayer ceramic capacitor |
DE102013207559A1 (en) * | 2013-04-25 | 2014-10-30 | Continental Teves Ag & Co. Ohg | Method and arrangement for testing orientation and / or quality criterion of ceramic multilayer capacitors |
KR20150083792A (en) * | 2014-01-10 | 2015-07-20 | 가부시키가이샤 무라타 세이사쿠쇼 | Apparatus for manufacturing a series of taping electronic components, method for manufacturing a series of taping electronic components, apparatus for conveying electronic component, method for conveying electronic component, and a series of taping electronic components |
US9884347B2 (en) | 2014-01-10 | 2018-02-06 | Murata Manufacturing Co., Ltd. | Apparatus for manufacturing a series of taped electronic components, method for manufacturing a series of taped electronic components, apparatus for conveying electronic components, method for conveying electronic components, and a series of taped electronic components |
KR20160000837A (en) * | 2014-06-25 | 2016-01-05 | 가부시키가이샤 무라타 세이사쿠쇼 | Method of identifying direction of multilayer ceramic capacitor, apparatus identifying direction of multilayer ceramic capacitor, and method of manufacturing multilayer ceramic capacitor |
JP2016027612A (en) * | 2014-06-25 | 2016-02-18 | 株式会社村田製作所 | Method of identifying direction of stacking in stacked ceramic capacitor, apparatus for identifying direction of stacking in stacked ceramic capacitor, and method of manufacturing stacked ceramic capacitor |
US9714921B2 (en) | 2014-06-25 | 2017-07-25 | Murata Manufacturing Co., Ltd. | Method of identifying direction of multilayer ceramic capacitor, apparatus identifying direction of multilayer ceramic capacitor, and method of manufacturing multilayer ceramic capacitor |
CN116359127A (en) * | 2023-02-16 | 2023-06-30 | 广东微容电子科技有限公司 | Magnetic detection device and magnetic detection method |
CN116359127B (en) * | 2023-02-16 | 2024-04-16 | 广东微容电子科技有限公司 | Magnetic detection device and magnetic detection method |
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