JPH06779Y2 - 基板試験用治具 - Google Patents

基板試験用治具

Info

Publication number
JPH06779Y2
JPH06779Y2 JP1985047022U JP4702285U JPH06779Y2 JP H06779 Y2 JPH06779 Y2 JP H06779Y2 JP 1985047022 U JP1985047022 U JP 1985047022U JP 4702285 U JP4702285 U JP 4702285U JP H06779 Y2 JPH06779 Y2 JP H06779Y2
Authority
JP
Japan
Prior art keywords
test
substrate
probe
plate
test plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1985047022U
Other languages
English (en)
Japanese (ja)
Other versions
JPS61161774U (enExample
Inventor
秀俊 松沢
Original Assignee
有限会社サンエー技研
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 有限会社サンエー技研 filed Critical 有限会社サンエー技研
Priority to JP1985047022U priority Critical patent/JPH06779Y2/ja
Publication of JPS61161774U publication Critical patent/JPS61161774U/ja
Application granted granted Critical
Publication of JPH06779Y2 publication Critical patent/JPH06779Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP1985047022U 1985-03-29 1985-03-29 基板試験用治具 Expired - Lifetime JPH06779Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1985047022U JPH06779Y2 (ja) 1985-03-29 1985-03-29 基板試験用治具

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1985047022U JPH06779Y2 (ja) 1985-03-29 1985-03-29 基板試験用治具

Publications (2)

Publication Number Publication Date
JPS61161774U JPS61161774U (enExample) 1986-10-07
JPH06779Y2 true JPH06779Y2 (ja) 1994-01-05

Family

ID=30561966

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1985047022U Expired - Lifetime JPH06779Y2 (ja) 1985-03-29 1985-03-29 基板試験用治具

Country Status (1)

Country Link
JP (1) JPH06779Y2 (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4556698B2 (ja) * 2005-02-14 2010-10-06 ソニー株式会社 プローブピンユニット

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4914690U (enExample) * 1972-05-08 1974-02-07
JPS50112961U (enExample) * 1974-02-25 1975-09-13
JPS5726214Y2 (enExample) * 1976-06-07 1982-06-07
JPS6013483U (ja) * 1983-07-07 1985-01-29 富士通株式会社 試験機用固定治具

Also Published As

Publication number Publication date
JPS61161774U (enExample) 1986-10-07

Similar Documents

Publication Publication Date Title
JPS63139262A (ja) 回路ボードテスト用フィクスチャ
JPH0345541B2 (enExample)
IL108503A (en) Self leveling membrane test probe
JPS5823453A (ja) 半導体ウエハ−試験装置
KR960704236A (ko) 번인 및 번인방법용 재사용가능한 다이 캐리어(reusable die carrier for burn-in and burn-in process)
EP0194958A3 (en) Electret transducer and method of fabrication
JPS62163973A (ja) プロ−ブ装置
JPH06779Y2 (ja) 基板試験用治具
CN219842513U (zh) 芯片测试治具及装置
CN110346672A (zh) 检测机构
CA2324135A1 (en) Apparatus for testing bare-chip lsi mounting board
US4963821A (en) Probe and method for testing a populated circuit board
US6369594B1 (en) Test clip for electrical testing of an electronic component
JPS5827869B2 (ja) 試験装置
JPH03173022A (ja) 操作パネルスイッチの製造方法
JPH0989997A (ja) 基板検査装置用吸引式基板固定具
JPH11126671A (ja) Ｉｃ検査用コネクタ
JPS62124572U (enExample)
US5315238A (en) Testing apparatus having an air permeable interface panel spaced from a test head
CN215297500U (zh) 一种超声波指纹模组绑定阻抗探测装置
JPS58137773A (ja) 回路基板テストシステムに用いるフイクスチア
KR200244582Y1 (ko) 인쇄회로기판 보드 시험용 픽스쳐 있어서 탑 커버 실링구조
CN209419693U (zh) 一种安装在pcb板上的手机喇叭
JPS6237172Y2 (enExample)
JPH083516B2 (ja) 半導体装置用テストヘッドおよびテスト方法