JPH0653087A - Manufacture of electrode material for capacitor - Google Patents

Manufacture of electrode material for capacitor

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Publication number
JPH0653087A
JPH0653087A JP19993092A JP19993092A JPH0653087A JP H0653087 A JPH0653087 A JP H0653087A JP 19993092 A JP19993092 A JP 19993092A JP 19993092 A JP19993092 A JP 19993092A JP H0653087 A JPH0653087 A JP H0653087A
Authority
JP
Japan
Prior art keywords
etching
intermetallic compound
surface area
electrode material
capacitor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP19993092A
Other languages
Japanese (ja)
Inventor
Toyoji Ogura
豊史 小倉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP19993092A priority Critical patent/JPH0653087A/en
Publication of JPH0653087A publication Critical patent/JPH0653087A/en
Withdrawn legal-status Critical Current

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Abstract

PURPOSE:To obtain an electrode material for capacitor which is constituted by including Al and either one of valve metals Ti, Zr, Ta, Nb, Hf, V etc., or a plurality of them, dissolving Al which is a ground of an alloy with a dendritic structure of Al and an intermetallic compound in the Al ground, and allowing the intermetallic compound part to remain for increasing a surface area. CONSTITUTION:An electrode material for capacitor is obtained by positively utilizing that there are two structure, namely a structure which can be dissolved easily and a structure which cannot be dissolved easily of an intermetallic compound part and a ground part in an alloy containing Al and either one type or a plurality of types out of valve metals Ti, Zr, Ta, Nb, Hf, and V without controlling etching as conventionally done. A material consisting of two structures which are different in terms of metal is dissolved by a liquid solution containing Al which is the same constituent as the ground with a higher concentration than that of a normal etching liquid, thus allowing only the intermetallic compound which cannot be dissolved easily to remain and then enlarging the surface area.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明はAl合金をエッチング処
理したコンデンサ用電極材料の製造方法に関するもので
ある。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method of manufacturing an electrode material for capacitors, which is obtained by etching an Al alloy.

【0002】[0002]

【従来の技術】電解コンデンサは静電容量を向上するた
め、原材料となるAl箔をエッチングすることで、利用
可能な表面積を拡大してきた。表面積拡大率の向上は、
様々なエッチングプロセスの改善とAl箔に添加した元
素による改善によってなされてきた。これまでのエッチ
ング箔において、表面積拡大をするためには細かく均一
な孔数と適切な孔径、さらには深さ方向に均一性が必要
であった。エッチングプロセスやAl箔の開発によって
より細かく均一な孔数と孔径が得られるように改善され
ているが、そのエッチングピットの発生世代や開始位置
を完全にコントロールするところまでにはいたらず、エ
ッチングの初期段階で大きな表面積を得られたとして
も、さらなる表面積拡大のためのエッチングの進行とと
もにエッチングピットが集中し、表面付近の脱落を起こ
し最終的に大きな表面積を得ることはできない。
2. Description of the Related Art In order to improve the electrostatic capacity of electrolytic capacitors, the usable surface area has been expanded by etching the Al foil as a raw material. The improvement of the surface area expansion rate is
This has been done by various etching process improvements and improvements by elements added to the Al foil. In the conventional etching foils, in order to increase the surface area, it was necessary to have a fine and uniform number of holes, an appropriate hole diameter, and evenness in the depth direction. Although the etching process and the development of Al foil have been improved to obtain a finer and more uniform number of holes and hole diameters, the generation and starting position of the etching pits cannot be completely controlled, and the etching Even if a large surface area is obtained in the initial stage, the etching pits are concentrated with the progress of etching for further expansion of the surface area, and the pits near the surface are removed, so that a large surface area cannot be finally obtained.

【0003】従来、Al箔及びAl合金箔をエッチング
すると、浅いエッチングではほぼ均一なエッチング層を
維持できるが、高い静電容量を得るため深いエッチング
を施した場合、表面積には寄与せずむしろ著しく低下さ
せるエッチングピットが表面付近に集中して発生し、こ
れが進むと金属部分の脱落を生じていた。エッチングに
おいて、交流によるものか直流によるものかによりエッ
チングピットの成長は異なるが、いずれの方法によって
も現状より大きな表面積を得ることが難しく、これを解
決するにはエッチングピットを均一に分布させることが
必要である。
Conventionally, when an Al foil and an Al alloy foil are etched, a substantially uniform etching layer can be maintained by shallow etching, but when deep etching is performed to obtain a high capacitance, it does not contribute to the surface area, but rather remarkably. The etching pits to be reduced were concentrated near the surface, and when this progressed, the metal part was removed. In etching, the growth of etching pits differs depending on whether it is AC or DC, but it is difficult to obtain a larger surface area than the current one by any method.To solve this, it is necessary to evenly distribute the etching pits. is necessary.

【0004】これまで高い誘電率を持つ元素を添加し、
高い静電特性を示すと考えられる合金開発は進められて
きたが、従来のエッチング方法ではエッチングピットの
集中が発生し、表面より脱落を起こし表面積の拡大が容
易に進まず従来の高純度Alの静電容量に及ばなかっ
た。該Al合金においても同様であり、従来のコンデン
サ電極用高純度Alに用いられるエッチング処理では合
金添加の効果も無く、得られる静電容量は低いままであ
った。また、該Al合金は樹枝状組織を表面積拡大に利
用すべく開発されたものであるが、樹枝状組織を表面積
拡大に安定に寄与させ、本来持つ静電容量を得る十分な
エッチング方法も見出せていなかった。
Until now, by adding an element having a high dielectric constant,
Although the development of alloys that are thought to exhibit high electrostatic properties has been promoted, the conventional etching method causes concentration of etching pits, which causes the pits to fall off from the surface, and the surface area cannot be expanded easily. It did not reach the capacitance. The same applies to the Al alloy, and the etching treatment used for the conventional high-purity Al for capacitor electrodes has no effect of alloy addition, and the obtained capacitance remains low. Further, although the Al alloy was developed to utilize the dendritic structure for increasing the surface area, a sufficient etching method for making the dendritic structure stably contribute to the surface area expansion and obtaining the original capacitance has been found. There wasn't.

【0005】[0005]

【発明が解決しようとする課題】該Al合金の特性を最
大限利用するためには、樹枝状組織と周囲のAl素地の
金属組織学的違いを利用したエッチング方法が無く、エ
ッチングの進行にともない表面付近よりの樹枝状組織の
脱落が激しく、より深いエッチングを施しても静電容量
は期待するほど高い値は示さなかった。
In order to make the best use of the characteristics of the Al alloy, there is no etching method utilizing the metallographic difference between the dendritic structure and the surrounding Al base, and the etching progresses. The dendritic tissue was severely detached from the vicinity of the surface, and even when deeper etching was performed, the capacitance did not show a high value as expected.

【0006】[0006]

【課題を解決するための手段】本発明者は上記の問題点
を吟味し、高い静電容量を得られる様々なAl合金につ
いて各種のエッチングを施し実験ならびに検討を加え
た。この結果、Alと他の弁金属Ti,Zr,Ta,N
b,Hf,V等のいずれか1種もしくは複数種を含み、
Al素地中にAlと金属間化合物の樹枝状組織を持つ合
金の素地であるAlを溶解し、金属間化合物部分を残存
させ、これにより表面積を拡大してなるコンデンサ用電
極材料の製造を可能にした。
Means for Solving the Problems The present inventor has examined the above problems and conducted experiments and studies on various Al alloys capable of obtaining a high capacitance by carrying out various etchings. As a result, Al and other valve metals Ti, Zr, Ta, N
b, Hf, V, etc., including one or more kinds,
Al, which is the base material of the alloy having a dendritic structure of Al and intermetallic compound, is dissolved in the Al base material to leave the intermetallic compound portion, thereby making it possible to manufacture an electrode material for capacitors by expanding the surface area. did.

【0007】これまでのように、エッチングを制御する
のではなく金属中に存在する溶解され易い組織と溶解さ
れにくい組織があることを積極的に利用し、エッチング
によって残存させる部分(樹枝状組織)と溶解させる部
分(Al素地)を金属組織的に分けることで可能にして
いる。この時のエッチング条件は素地であるAl金属の
溶解性と金属間化合物の溶解性の差が大きく出るような
溶液を用いる。
A portion (dendritic structure) to be left by etching by positively utilizing the fact that there is a structure that is easily dissolved and a structure that is not easily dissolved in a metal, rather than controlling etching as in the past. This is made possible by dividing the portion (Al base) to be melted with a metal structure. The etching conditions at this time are such that a large difference is found between the solubility of the base metal Al and the solubility of the intermetallic compound.

【0008】これを実現するためには、エッチング液中
の硫酸、燐酸、ほう酸等のエッチング時の抑制因子とな
る成分を含むことと、Al濃度を高く維持する必要があ
る。
In order to realize this, it is necessary to contain a component such as sulfuric acid, phosphoric acid, boric acid, etc., which becomes a suppressing factor during etching, and to maintain the Al concentration at a high level.

【0009】[0009]

【作用】以下に本発明を詳細に説明する。The present invention will be described in detail below.

【0010】Al素地中にAlと他の弁金属Ti,Z
r,Ta,Nb,Hf,V等との金属間化合物を細かい
組織として持つ合金を、エッチングによって金属間化合
物以外の部分であるAl素地を溶解し、表面積拡大を行
う。この時のエッチング条件は素地であるAl金属の溶
解性と金属間化合物の溶解性の差が大きく出るような溶
液を用いる。
Al and other valve metals Ti, Z in Al base
An alloy having an intermetallic compound of r, Ta, Nb, Hf, V, etc. as a fine structure is dissolved by etching to dissolve the Al base other than the intermetallic compound to increase the surface area. The etching conditions at this time are such that a large difference is found between the solubility of the base metal Al and the solubility of the intermetallic compound.

【0011】これを実現するためには、エッチング液中
の硫酸、燐酸、ほう酸等のエッチング時の抑制因子とな
る成分を含むと、Al濃度を高く維持する必要がある。
従来のエッチング液は、1.0〜2.0wt%のAlを含
むが本発明で用いるエッチング液は2.5〜18wt%の
高濃度であり、この液でのエッチングは従来と異なるエ
ッチング挙動を示す。こうしたエッチング液では、エッ
チング電流が直流、交流、パルスにおいてもその機構は
若干異なるが得られる形状は同様のものとなる。エッチ
ングの進行している近傍のAl濃度が浴槽全体のAl濃
度と余り差がないため、溶解力が弱く金属組織的に溶解
し易い部分へエッチングが進むようになるためである。
さらに抑制因子である硫酸、燐酸、ほう酸の少くとも1
種を0.05〜70wt%を加えることで金属組織的に忠
実に樹枝状組織を残し、樹枝の接合部分を保護するため
高い静電容量を得られるようになる。
In order to realize this, it is necessary to maintain the Al concentration at a high level when the etching solution contains components such as sulfuric acid, phosphoric acid, boric acid, and the like that suppress the etching.
The conventional etching solution contains 1.0 to 2.0 wt% of Al, but the etching solution used in the present invention has a high concentration of 2.5 to 18 wt%, and etching with this solution has an etching behavior different from the conventional one. Show. With such an etching solution, the shape obtained is the same even when the etching current is DC, AC, or pulse, although the mechanism is slightly different. This is because the Al concentration in the vicinity of the progress of etching is not so different from the Al concentration of the entire bath, so that the etching proceeds to a portion where the dissolving power is weak and metallographically easy to dissolve.
In addition, at least 1 of the inhibitory factors sulfuric acid, phosphoric acid, and boric acid
By adding 0.05 to 70 wt% of the seed, a dendritic structure is left faithfully in the metallographic structure, and a high capacitance can be obtained because the joint portion of the dendritic is protected.

【0012】もともと純Alに比べ金属間化合物は化学
的に安定でエッチングされ難く、この差を最大限に利用
し両組織が共存した場合に、Alだけを選択的に溶解さ
れるようにエッチングすることで可能となる。これによ
り、Alのエッチングのようにエッチングの進行ととも
に必要以外の部分の溶解を起こすことはなく脱落も発生
しない。金属組織に忠実に表面積を拡大し、制御的に有
利な材料となるため、従来の方法のものより歩留まりが
大幅に改善される。
Originally, the intermetallic compound is chemically stable and difficult to be etched as compared with pure Al. By making the most of this difference, when both structures coexist, only Al is selectively dissolved so as to be dissolved. This is possible. As a result, unlike the etching of Al, an unnecessary portion is not dissolved with the progress of etching, and the portion does not drop off. Since the surface area is faithfully expanded to the metallographic structure and the material becomes a controlly advantageous material, the yield is significantly improved as compared with the conventional method.

【0013】拡大される表面積は、エッチング後残存す
る金属間化合物の形状で決定される。金属間化合物の形
状はその金属の鋳造、塑性加工、熱処理で決定され、金
属材料としての組織が表面積のほとんどを決定する。
The expanded surface area is determined by the shape of the intermetallic compound remaining after etching. The shape of the intermetallic compound is determined by casting, plastic working, and heat treatment of the metal, and the structure of the metal material determines most of the surface area.

【0014】本発明は、金属間化合物と素地金属の異な
る2つ以上の金属組織を持つ材料からエッチングによっ
て金属間化合物を掘り起こしてなるコンデンサ用電極材
料であり、このためエッチング液中に含まれる溶解すべ
き素地金属の濃度を高くすることで、金属間化合物部分
を残存させる方法は本発明と同様の考え方によるものと
する。例えば密接に存在する球状のAlとTiの金属間
化合物と、素地Alが存在する組織で、エッチング抑制
成分を添加しAl濃度を高い液でエッチングすることで
数珠のように接合した構造をもつ材料を得ることができ
る。また、エッチングの制御のためにPb,Cu,S
i,Fe,Bi,Mn,Ni,Cr等を含んだ金属間化
合物と金属素地とで構成される材料のエッチングに関し
ても本発明の効果は十分期待できる。
The present invention is an electrode material for a capacitor obtained by excavating an intermetallic compound by etching from a material having two or more different metal textures of an intermetallic compound and a base metal. The method of leaving the intermetallic compound portion by increasing the concentration of the base metal to be made is based on the same idea as in the present invention. For example, a material having a structure in which a spherical intermetallic compound of Al and Ti and a structure in which a base Al is present are closely bonded and are bonded like a bead by etching with a liquid having a high Al concentration by adding an etching suppressing component. Can be obtained. Further, for controlling etching, Pb, Cu, S
The effects of the present invention can be expected sufficiently for etching a material composed of an intermetallic compound containing i, Fe, Bi, Mn, Ni, Cr and the like and a metal base.

【0015】[0015]

【実施例】以下に該Al合金においてエッチングしてな
るコンデンサ用電極材料の実施例を示す。エッチング前
に表1に示す各電極材料を、10wt%水酸化ナトリウム
組成液中30℃で10分間処理し、10%硝酸組成液で
10分間処理した。比較例No.1,2,3の一般的なエ
ッチングは、10wt%塩酸と0.9wt%Alの液組成で
70℃、0.02A/cm2 の電流密度で、5分間通電し
た。実施例No.4,5は本発明によるエッチングで20
wt%硫酸と10wt%塩酸、8wt%Alの組成液で行っ
た。
EXAMPLES Examples of capacitor electrode materials obtained by etching the Al alloy are shown below. Before etching, each electrode material shown in Table 1 was treated in a 10 wt% sodium hydroxide composition solution at 30 ° C. for 10 minutes and then treated with a 10% nitric acid composition solution for 10 minutes. Comparative Example No. In general etching of 1, 2, and 3, a liquid composition of 10 wt% hydrochloric acid and 0.9 wt% Al was applied at 70 ° C. and a current density of 0.02 A / cm 2 for 5 minutes. Example No. 4 and 5 are 20 by etching according to the present invention
It was performed with a composition liquid of wt% sulfuric acid, 10 wt% hydrochloric acid, and 8 wt% Al.

【0016】陽極酸化処理条件は、液としてほう酸アン
モニウム80g/lの水溶液を用い、液温60℃、電圧
は20Vで行った。陽極酸化処理で20Vに到達後30
分間保持し、次に電気炉400℃に10分間入れ、陽極
酸化20V5分間保持した。これらの処理をした各材料
の特性を測定した結果を表1に示した。表から明らかの
ように、従来のAl用のエッチングでは高純度Al以外
の該Al合金では、静電容量が小さくなり、同一組成の
該Al合金を本発明のエッチングをすることでAlと同
等以上の特性を示した。該Al合金を電極材料として用
いるためには、本発明のエッチングが最適である。
The anodizing treatment was carried out at a liquid temperature of 60 ° C. and a voltage of 20 V using an aqueous solution of ammonium borate 80 g / l as the liquid. 30 after reaching 20V by anodizing
It was held for 10 minutes, then placed in an electric furnace at 400 ° C. for 10 minutes and anodized at 20V for 5 minutes. Table 1 shows the results of measuring the characteristics of each material subjected to these treatments. As is clear from the table, in the conventional Al etching, the electrostatic capacity of the Al alloys other than high-purity Al is small, and the Al alloys of the same composition are equal to or more than Al in the etching of the present invention. The characteristics of The etching of the present invention is optimal for using the Al alloy as an electrode material.

【0017】[0017]

【表1】 [Table 1]

【0018】[0018]

【発明の効果】以上のようにAlと他の弁金属Ti,Z
r,Ta,Nb,Hf,V等のいずれか1種もしくは複
数種を含む合金に適合する本発明のコンデンサ材料は、
従来の高純度Alのエッチングに比べ大きな静電容量を
安定して得ることが可能であり、コンデンサの歩留まり
に大きく貢献し工業的ならびに実用利用価値の大なるも
のである。
As described above, Al and other valve metals Ti, Z
The capacitor material of the present invention which is compatible with alloys containing any one or more of r, Ta, Nb, Hf, V, etc.
It is possible to stably obtain a large capacitance as compared with the conventional etching of high-purity Al, which greatly contributes to the yield of the capacitor and has great industrial and practical utility value.

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 Alと他の弁金属Ti,Zr,Ta,N
b,Hf,V等のいずれか1種もしくは複数種を含み、
Al素地中にAlと金属間化合物の樹枝状組を持つ合金
において、素地であるAlを溶解し、金属間化合物部分
である樹枝状組織を残存させ、これによって表面積を拡
大することを特徴とするコンデンサ電極用材料の製造方
法。
1. Al and other valve metals Ti, Zr, Ta, N
b, Hf, V, etc., including one or more kinds,
In an alloy having a dendritic set of Al and an intermetallic compound in an Al base, the base Al is dissolved to leave a dendritic structure which is an intermetallic compound portion, thereby increasing the surface area. Method for manufacturing capacitor electrode material.
【請求項2】 請求項1記載における該Al合金のエッ
チングで、0.05〜70wt%硫酸、0.05〜30wt
%塩酸、2.5〜18wt%Alを含む液でエッチング処
理することを特徴とするコンデンサ電極用材料の製造方
法。
2. The etching of the Al alloy according to claim 1, wherein 0.05 to 70 wt% sulfuric acid and 0.05 to 30 wt% are used.
% Hydrochloric acid and a solution containing 2.5 to 18 wt% Al are used for etching, and a method for producing a capacitor electrode material.
【請求項3】 請求項1記載における該Al合金のエッ
チングで、0.05〜70wt%燐酸、0.05〜30wt
%塩酸、2.5〜18wt%Alを含む液で処理すること
を特徴とするコンデンサ電極用材料の製造方法。
3. The etching of the Al alloy according to claim 1, wherein 0.05 to 70 wt% phosphoric acid, 0.05 to 30 wt
% Hydrochloric acid and a solution containing 2.5 to 18 wt% Al are used for manufacturing a capacitor electrode material.
【請求項4】 請求項1記載における該Al合金のエッ
チングで、0.05〜70wt%ほう酸、0.05〜30
wt%塩酸、2.5〜18wt%Alを含む液で処理するこ
とを特徴とするコンデンサ電極用材料の製造方法。
4. The etching of the Al alloy according to claim 1, wherein 0.05 to 70 wt% boric acid and 0.05 to 30 are used.
A method for producing a material for a capacitor electrode, which comprises treating with a liquid containing wt% hydrochloric acid and 2.5 to 18 wt% Al.
JP19993092A 1992-07-27 1992-07-27 Manufacture of electrode material for capacitor Withdrawn JPH0653087A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19993092A JPH0653087A (en) 1992-07-27 1992-07-27 Manufacture of electrode material for capacitor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19993092A JPH0653087A (en) 1992-07-27 1992-07-27 Manufacture of electrode material for capacitor

Publications (1)

Publication Number Publication Date
JPH0653087A true JPH0653087A (en) 1994-02-25

Family

ID=16415965

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19993092A Withdrawn JPH0653087A (en) 1992-07-27 1992-07-27 Manufacture of electrode material for capacitor

Country Status (1)

Country Link
JP (1) JPH0653087A (en)

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WO2004045794A1 (en) * 2002-11-18 2004-06-03 Cbmm Asia Co.,Ltd. Nb-Al ALLOY POWDER AND METHOD FOR ELECTROLYTIC CAPACITOR AND METHOD FOR PREPARATION THEREOF, AND ELECTROLYTIC CAPACITOR
CN104903983A (en) * 2013-02-26 2015-09-09 宁夏东方钽业股份有限公司 Capacitor-level tantalum-niobium alloy wire and manufacturing method thereof

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004045794A1 (en) * 2002-11-18 2004-06-03 Cbmm Asia Co.,Ltd. Nb-Al ALLOY POWDER AND METHOD FOR ELECTROLYTIC CAPACITOR AND METHOD FOR PREPARATION THEREOF, AND ELECTROLYTIC CAPACITOR
CN104903983A (en) * 2013-02-26 2015-09-09 宁夏东方钽业股份有限公司 Capacitor-level tantalum-niobium alloy wire and manufacturing method thereof

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