JPH06507477A - 基準体と関連した、位置制御素子の位置決めのための方法および該方法実施のための装置 - Google Patents

基準体と関連した、位置制御素子の位置決めのための方法および該方法実施のための装置

Info

Publication number
JPH06507477A
JPH06507477A JP4503921A JP50392192A JPH06507477A JP H06507477 A JPH06507477 A JP H06507477A JP 4503921 A JP4503921 A JP 4503921A JP 50392192 A JP50392192 A JP 50392192A JP H06507477 A JPH06507477 A JP H06507477A
Authority
JP
Japan
Prior art keywords
projection
scale
scanner
center
scales
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4503921A
Other languages
English (en)
Japanese (ja)
Inventor
ケルナー，ヘルムート
Original Assignee
エー．エム．エス．　テヒニーク　ゲーエムベーハー
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by エー．エム．エス．　テヒニーク　ゲーエムベーハー filed Critical エー．エム．エス．　テヒニーク　ゲーエムベーハー
Publication of JPH06507477A publication Critical patent/JPH06507477A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Replacement Of Web Rolls (AREA)
  • Image Input (AREA)
JP4503921A 1991-02-12 1992-02-11 基準体と関連した、位置制御素子の位置決めのための方法および該方法実施のための装置 Pending JPH06507477A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE4104602A DE4104602C1 (enExample) 1991-02-12 1991-02-12
DE4104602.1 1991-02-12
PCT/DE1992/000101 WO1992014117A1 (de) 1991-02-12 1992-02-11 Verfahren zur lagebestimmung eines positionierkörpers relativ zu einem bezugskörper und vorrichtung zur durchführung des verfahrens

Publications (1)

Publication Number Publication Date
JPH06507477A true JPH06507477A (ja) 1994-08-25

Family

ID=6425072

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4503921A Pending JPH06507477A (ja) 1991-02-12 1992-02-11 基準体と関連した、位置制御素子の位置決めのための方法および該方法実施のための装置

Country Status (6)

Country Link
US (1) US5404226A (enExample)
EP (1) EP0571425B1 (enExample)
JP (1) JPH06507477A (enExample)
AT (1) ATE121185T1 (enExample)
DE (2) DE4104602C1 (enExample)
WO (1) WO1992014117A1 (enExample)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4225270C2 (de) * 1992-07-31 1994-06-09 Ems Technik Gmbh Verfahren zur Lagebestimmung eines Positionierkörpers relativ zu einem Bezugskörper und Vorrichtung zur Durchführung des Verfahrens
DE4304529C1 (de) * 1993-02-15 1994-06-30 Ems Technik Gmbh Meßkameraanordnung, insbesondere für photogrammetrische Messungen an technischen Objekten
JP2746511B2 (ja) * 1993-03-04 1998-05-06 信越半導体株式会社 単結晶インゴットのオリエンテーションフラット幅測定方法
DE4308456C2 (de) * 1993-03-17 1996-03-28 Ems Technik Gmbh Vorrichtung zur Lagebestimmung eines Positionierkörpers relativ zu einem Bezugskörper
DE19507613C2 (de) * 1995-03-04 1997-01-23 Heidenhain Gmbh Dr Johannes Längen- oder Winkelmeßeinrichtung
US6327791B1 (en) * 1999-06-09 2001-12-11 The Government Of The United States As Represented By The Secretary Of Commerce Chain code position detector
DE29916394U1 (de) * 1999-09-17 2001-02-15 Dr. Johannes Heidenhain Gmbh, 83301 Traunreut Optische Positionsmeßeinrichtung
US7528356B2 (en) * 1999-12-30 2009-05-05 Honeywell International Inc. Method and system for optical distance and angle measurement
US20030127588A1 (en) * 1999-12-30 2003-07-10 Martinez Steven David Method and system for optical distance and angle measurement
JP4260634B2 (ja) * 2002-02-15 2009-04-30 富士通株式会社 画像変換方法及び装置、画像認識装置、ロボット制御装置並びに画像投影装置
US7408654B1 (en) 2004-09-02 2008-08-05 Mark Randall Hardin Method for measuring position, linear velocity and velocity change of an object in two-dimensional motion
US20060044552A1 (en) * 2004-09-02 2006-03-02 Mark Hardin A device for measuring motion along surfaces of arbitrary length and of arbitrary curvature.
DE102007016056B4 (de) * 2007-04-03 2011-08-25 Sauer GmbH LASERTEC, 87437 Verfahren und Vorrichtung zur Werkstückeinmessung und Werkstückbearbeitung
ES2558022T3 (es) * 2007-09-12 2016-02-01 Pepperl + Fuchs Gmbh Procedimiento y dispositivo para la determinación de la posición de un vehículo, programa de ordenador y producto de programa de ordenador
CN109657518B (zh) * 2018-12-28 2021-12-17 三一海洋重工有限公司 集装箱激光扫描识别方法、装置、电子设备及可读介质
CN113029053B (zh) * 2021-04-06 2022-05-13 中国科学技术大学 通用的ct对轴方法
CN113636100B (zh) * 2021-07-12 2023-08-08 中国航空工业集团公司沈阳飞机设计研究所 一种飞机挂载物投射的校准方法
CN115079496B (zh) * 2022-08-23 2022-10-28 深圳市橙子数字科技有限公司 一种投影仪出风方向控制方法及装置

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3600811A (en) * 1967-08-22 1971-08-24 Zeiss Stiftung Arrangement for measuring or adjusting two-dimensional position coordinates
DE3323836A1 (de) * 1983-07-01 1985-01-03 Siemens AG, 1000 Berlin und 8000 München Verfahren zur festlegung einer koordinate auf einer oberflaeche eines festkoerpers und vorrichtung zur durchfuehrung eines solchen verfahrens
DD219566A1 (de) * 1983-08-05 1985-03-06 Harry Trumpold Hochaufloesendes optisches laengenmessverfahren mit codiertem absolutmassstab zur durchfuehrung des verfahrens
DE3418798A1 (de) * 1984-05-19 1985-11-21 Mannesmann AG, 4000 Düsseldorf Einrichtung fuer die digitale steuerung einer maschine bzw. eines geraetes, insbesondere eines matrixdruckers
NL8401649A (nl) * 1984-05-23 1985-12-16 Optische Ind De Oude Delft Nv Meetstelsel voor het, onder gebruikmaking van een op driehoeksmeting berustend principe, contactloos meten van de afstand tussen een bepaald punt van een objectvlak en een referentieniveau.
DE3624485A1 (de) * 1986-07-19 1988-01-21 Heidenhain Gmbh Dr Johannes Positionsmesseinrichtung
DE3636744C1 (de) * 1986-10-29 1988-03-24 Heidenhain Gmbh Dr Johannes Lichtelektrische Laengen- oder Winkelmesseinrichtung
JP2625917B2 (ja) * 1988-07-01 1997-07-02 キヤノン株式会社 リニアエンコーダ
DE3840726A1 (de) * 1988-12-02 1990-06-07 Karl F Zimmer Kg Messverfahren und messeinrichtung zur durchmesser-bestimmung eines dreidimensionalen objektes
AT394781B (de) * 1989-02-03 1992-06-25 Rsf Elektronik Gmbh Inkrementales messsystem
AT395071B (de) * 1989-02-09 1992-09-10 Rieder & Schwaiger Sentop Inkrementales messsystem
DE3909856A1 (de) * 1989-03-25 1990-10-31 Ems Technik Gmbh Verfahren zur bestimmung der lage eines bezugspunktes eines abtasters relativ zu einem inkrementalmassstab sowie bezugspunktgeber
US5253531A (en) * 1992-04-10 1993-10-19 Walker Dana A System and method for monitoring torsional vibrations and operating parameters of rotating shafts

Also Published As

Publication number Publication date
EP0571425A1 (de) 1993-12-01
ATE121185T1 (de) 1995-04-15
US5404226A (en) 1995-04-04
DE4104602C1 (enExample) 1992-06-04
DE59201921D1 (de) 1995-05-18
WO1992014117A1 (de) 1992-08-20
EP0571425B1 (de) 1995-04-12

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