JPH0639341Y2 - 光学式電界検出器 - Google Patents
光学式電界検出器Info
- Publication number
- JPH0639341Y2 JPH0639341Y2 JP1986022494U JP2249486U JPH0639341Y2 JP H0639341 Y2 JPH0639341 Y2 JP H0639341Y2 JP 1986022494 U JP1986022494 U JP 1986022494U JP 2249486 U JP2249486 U JP 2249486U JP H0639341 Y2 JPH0639341 Y2 JP H0639341Y2
- Authority
- JP
- Japan
- Prior art keywords
- polarized wave
- prism
- electric field
- light
- crystal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 230000005684 electric field Effects 0.000 title claims description 45
- 230000003287 optical effect Effects 0.000 title claims description 32
- 239000013078 crystal Substances 0.000 claims description 31
- 239000013307 optical fiber Substances 0.000 claims description 8
- 230000010287 polarization Effects 0.000 claims description 7
- 208000024891 symptom Diseases 0.000 claims 1
- 238000001514 detection method Methods 0.000 description 5
- 238000005259 measurement Methods 0.000 description 5
- 230000035945 sensitivity Effects 0.000 description 4
- 238000000605 extraction Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 239000000284 extract Substances 0.000 description 2
- 239000010453 quartz Substances 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 230000005697 Pockels effect Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
Landscapes
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1986022494U JPH0639341Y2 (ja) | 1986-02-18 | 1986-02-18 | 光学式電界検出器 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1986022494U JPH0639341Y2 (ja) | 1986-02-18 | 1986-02-18 | 光学式電界検出器 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62134073U JPS62134073U (enrdf_load_stackoverflow) | 1987-08-24 |
| JPH0639341Y2 true JPH0639341Y2 (ja) | 1994-10-12 |
Family
ID=30819932
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1986022494U Expired - Lifetime JPH0639341Y2 (ja) | 1986-02-18 | 1986-02-18 | 光学式電界検出器 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0639341Y2 (enrdf_load_stackoverflow) |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5970972A (ja) * | 1982-10-15 | 1984-04-21 | Meidensha Electric Mfg Co Ltd | 電界検出装置 |
-
1986
- 1986-02-18 JP JP1986022494U patent/JPH0639341Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS62134073U (enrdf_load_stackoverflow) | 1987-08-24 |
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