JPH0634678Y2 - Defective tile inspection device - Google Patents

Description

[Detailed Description of the Invention] [Industrial field of application] The present invention is a defective tile inspection device, and in particular, it has defects such as dents, cuts, and pinholes on the surface from among a large number of tiles that are successively sent. The present invention relates to an improvement of a defective tile inspection device that visually inspects tiles and removes them from a transfer line.

[Prior Art] As is well known, since tiles are manufactured through a plurality of processes, some of the manufactured tiles have various kinds of dents, cuts, pinholes, etc. on the surface during each of these manufacturing processes. Surface defects may occur.

For this reason, it is necessary to surely remove the defective tile having a defective portion on the surface from the large number of tiles conveyed. In particular, in recent years of highly automated manufacturing processes, a large number of tiles of several tens to several hundreds are transported along a transport path for one minute. It is necessary to reliably detect and remove it.

FIG. 6 shows a conventional defective tile inspection apparatus used for such a purpose.

This conventional device, above the tile transport path 100A, 100B,
A light source 200 including a plurality of linear light sources (for example, formed by using a rod-shaped fluorescent lamp or the like) 10 arranged in parallel at equal intervals is installed, and the light sources 200 are sequentially conveyed along the conveyance lines 100A and 100B. A plurality of linear light source images 1 as shown in FIG. 7 are projected on the surface of the incoming tile T.

Then, the inspector selects the transport tile T on which the linear light source image is projected.
By visually observing the surface of, the defects existing on the surface, such as dents, breaks, and pinholes, are detected based on the disturbance of the linear light source image l. Then, the detected defective tile T
Are removed from the transport path 100.

[Problems to be Solved by the Invention] However, such a conventional device has the following problems. The effective solution was desired.

(A) Normally, in this type of device, an inspector is located on the side of the tile transport path and detects a surface defect of the tile as a disturbance of the line light source image.

However, since the conventional apparatus conveys the tile T in a horizontally held state, an inspector located on the side of the conveyance path is forced to look into the tile surface from the lateral direction. Therefore, there is a problem that it is difficult for an inspector to see the tile surface, and the disorder of the linear light source image cannot be reliably viewed.

In particular, as shown in FIG. 6, a plurality of transport paths 100A, 100B
If the machines are installed in parallel, the transport line 10
Compared to the 0B tiles, the tiles of the transfer line 100A located farther away are more difficult to see the surface, and an effective solution has been desired.

(B) Further, in this conventional device, a plurality of line light sources 10 are arranged in parallel along the transport direction of the tile T. Therefore, the linear light source image 1 projected on the surface of the tile T is parallel to the tile transport direction as shown in FIG. Therefore, when the defect X is present on the tile surface and this defect is present in the projection area of the line light source image l, it can be detected satisfactorily. That is, when the linear light source image 1 exists in a region where it is not projected, there is a problem in that the detection accuracy is reduced.

The present invention has been made in view of such conventional problems, and a first object thereof is to solve the problem (a) and reliably inspect defective tiles having defects on the surface by visual inspection. It is to provide a defective tile inspection device capable of performing.

A second object of the present invention is to provide a defective tile inspection apparatus which solves the above problem (b) and can more surely perform visual inspection of defective tiles having defects on the surface. is there.

[Means for Solving Problems] In order to achieve the first object, the present invention visually inspects defective tiles having a defective surface from tiles successively sent along a conveyance path. In the defective tile inspecting apparatus, the tile transfer means formed to transfer the tile to the inspector side at a predetermined angle along the transfer path, and the tile transfer means are provided above or obliquely above the tile transfer means. Inspecting the tile surface for defects by visually observing the line light source images of the tile surface that are conveyed one after another, including a light source formed so as to project a line light source image on the tile surface and tilted at a predetermined angle. Is characterized by.

Further, in order to achieve the second object, the light source has a plurality of line light sources arranged at predetermined intervals in a direction intersecting with a tile carrying direction, and projects a plurality of line light source images on the surface of the carrying tile. It is preferable to form it.

[Operation] Next, the operation of the present invention will be described.

The device of the present invention is provided with a line light source above or diagonally above the tile transport path.

Then, the linear light source image is projected on the surface of the tiles that are successively transported along the tile transport path.

A feature of the present invention is that the tile is conveyed while being inclined to the inspector side by a predetermined angle.

This allows the inspector to visually check the line light source image projected on the tile surface from a position relatively close to the front of the tile, reliably detect the disorder of the line light source image, and detect defects on the tile surface. Can be visually inspected.

In particular, the device of the present invention can reliably perform a visual inspection on tiles carried along the transportation path located in the back when the transportation paths are provided in a plurality of rows.
The inspection accuracy of defective tiles can be significantly increased as compared with the conventional device.

Further, according to the present invention, it is preferable that the plurality of line light sources are arranged at a predetermined interval in a direction intersecting with the tile transport direction. Thereby, a plurality of linear light source images can be projected on the surface of the transport tile in a direction intersecting with the tile transport direction.

As a result, the linear light source image projected on the tile surface gradually moves to the opposite side of the transport path as the tile moves, so even if any position on the tile surface has a defect,
It becomes possible to detect this reliably.

[Embodiment] Next, a preferred embodiment of the present invention will be described with reference to the drawings.

FIG. 2 shows a preferred example of the defective tile inspection device according to the present invention, which is provided in the middle of the tile transfer device. In the apparatus of the embodiment, two tile transfer paths 100A and 100B are provided substantially in parallel.

Each of the tile transport paths 100 has a flat belt 22 that is wound around pulleys facing each other. And this flat belt 22
Round belts 26, 26 are provided on the upstream side and the downstream side of the same so as to be wound around the same pulley in parallel.

Then, the transport path 100 drives the rotary shaft 28 directly connected to the motor 30 to simultaneously rotate and drive the other rotary shaft 24 connected via the belts 22 and 26. As a result, the belts 22 and 2 are moved to move the tile T to the right in the figure.
6 The whole is driven to rotate.

Then, the tiles T that are successively transported from the upstream side of the tile transport path 100 along the arrow are sent to the defective tile inspection apparatus of the present invention.

FIG. 1 shows a schematic cross-sectional explanatory view of the defective tile inspection apparatus of this embodiment.

The apparatus of the embodiment is provided with a workbench 32 along the tile transport path 100A, and the inspector P is formed so as to face the workbench 32 while sitting on a chair.

Then, only the defective tile T having a defect on the surface is inspected by the inspector P.
The normal tiles T which are removed by the process are delivered toward the tile transport path on the downstream side.

Further, in the apparatus of the embodiment, the light source 200 is provided above or diagonally above the tile transport paths 100A and 100B.
The feature of the light source 200 is that a plurality of line light sources 10 are arranged at predetermined intervals in a direction intersecting the tile transport direction, and a plurality of line light source images 1 are projected on the surface of the transport tile T. It is in.

In this embodiment, rod-shaped fluorescent lamps are used as the line light sources 10, and the line light sources 10 are arranged at equal intervals in the direction orthogonal to the tile transport direction.

As a result, as shown in FIG. 5, a plurality of linear light source images 1 are projected on the surface of the tile T in a direction orthogonal to the tile transport direction, and the projected linear light source image 1 has tiles T indicated by arrows. As it moves in the tile transport direction shown, it moves the tile surface in the direction opposite to the transport direction. Therefore, even if the defect exists at any position on the surface of the tile T, it can be reliably detected as a disorder of the linear light source image on the tile surface.

A feature of the present invention is that the transport tile T on which such a linear light source image 1 is projected is transported along the tile transport path 100 toward the inspector P at a predetermined angle θ. This allows
The inspector P uses the linear light source image l projected on the surface of the tile T as
The line light source image 1 can be visually recognized at a position relatively close to the front of the tile, and the disturbance of the linear light source image 1 caused by the surface defect can be more reliably visually recognized.

As shown in FIG. 3, in this embodiment, the tile transfer line 100B located on the inspector P side is formed so that the tiles T are horizontally held and transferred as in the conventional case. Then, the present invention is applied to the tile transport path 100B located at the back of the inspector P, and the tile T is formed so as to be held and transported while being inclined toward the inspector P by a predetermined angle θ.

That is, the tile transport path 100B of the embodiment is the flat belt 22.
A linear ridge portion 40 is provided along the outside of the surface of the. As a result, the tile T is held on the flat belt 22 while being inclined by the predetermined angle θ. Here, the angle θ varies depending on the position of the line of sight of the inspector P, but in the embodiment, θ
It is set in the range of 15 to 20 degrees.

By doing this, even when there are multiple rows of tile transport paths such as 100A and 100B, each transport path 100
It is possible to reliably detect the surface defect of the tile T conveyed along the A and 100B.

The present embodiment has the above configuration, and its operation will be described below.

First, as shown in FIG. 4, when the tiles T sequentially conveyed along the conveyance paths 100A and 100B come under the light source 200, a plurality of linear light source images 1 are projected on the tile surface. It

At this time, as shown in FIG. 5, a plurality of linear light source images 1 are projected on the tile surface at equal intervals and in a direction orthogonal to the tile transport direction. Therefore, with the movement of the tile T, the plurality of lines of the linear light source images 1 move on the tile surface to the side opposite to the transport direction.

This allows the inspector P to reliably detect any defect on the tile surface, such as a dent, a break, or a pinhole, as a change in the linear light source image l.

In particular, according to the present embodiment, when the tile transport paths 100A and 100B are parallel to each other in a plurality of columns, the tile T of the tile transport path 100A located in the back is moved toward the inspector P by a predetermined angle θ.
Just tilted.

As a result, the inspector P displays the linear light source image 1 projected on the tile surface for both the tile T on the tile transport path 100A located in the back and the tile T on the tile transport path 100B located in the front. It is possible to visually check from a position close to the front of the tile, and it is possible to reliably detect the surface defect of the tile.

It should be noted that the present invention is not limited to the above embodiment, and various modifications can be made within the scope of the present invention.

For example, in the above-mentioned embodiment, the ridges are formed on the flat belt 22.
The description has been given by taking the case where the tile 40 is formed and the tile T is formed so as to be conveyed at an angle of θ, but the present invention is not limited to this, and the flat belt 22 itself may be installed at an angle of θ, for example. .

Further, although the flat belt 22 is used as the tile transport path 100 in the above-described embodiment, the present invention is not limited to this, and various transport means other than this may be used.

Further, in the above-described embodiment, the case where a plurality of linear light sources 10 are provided in the direction orthogonal to the tile transport path has been described as an example, but the present invention is not limited to this, and for example, each linear light source is set to the tile transport direction in a predetermined direction. Even if they are provided so as to intersect at an angle, the same operational effects as those of the above-described embodiment can be obtained.

[Effects of the Invention] As described above, according to the present invention, defective tiles having defects such as dents, cuts, and pinholes on the surface are selected from tiles successively conveyed along the conveyance path. There is an effect that it is possible to obtain a defective tile inspection device capable of surely visually inspecting.

[Brief description of drawings]

FIG. 1 is a sectional explanatory view of a preferred embodiment of a defective tile inspection apparatus according to the present invention, FIG. 2 is a plan explanatory view of the apparatus shown in FIG. 1, and FIG. 3 is a tile used in the apparatus of this embodiment. FIG. 4 is a perspective view of a main part of this embodiment, FIG. 5 is an explanatory view of a linear light source image projected on the tile surface, and FIG. 6 is a description of a conventional defective tile inspection apparatus. FIG. 7 and FIG. 7 are explanatory views of a linear light source image projected on the tile surface by using the apparatus shown in FIG. 10 …… Line light source, 22 …… flat belt, 32 …… workbench, 40 …… convex section, 100A, 100B …… tile transport path, 200 …… light source, T …… tile.

Claims (2)

[Scope of utility model registration request] 1. A defective tile inspecting apparatus for visually inspecting defective tiles having a defective surface from tiles successively sent along the conveying route, wherein tiles are inspected by the inspector side along the conveying route. A tile conveying means formed so as to be conveyed at an angle of a predetermined angle, and a light source provided above or obliquely above the tile conveying means and formed so as to project a linear light source image on the surface of the conveying tile. A defective tile inspection apparatus characterized by inspecting a defect on a tile surface by visually observing a line light source image on the tile surface that is conveyed one after another at a predetermined angle. 2. The device according to claim 1 for utility model registration, wherein the light source comprises a plurality of linear light sources arranged at predetermined intervals in a direction intersecting with a tile transport direction, and a plurality of line light sources are arranged on the transport tile surface. A defective tile inspection device, which is formed so as to project a linear light source image.