JPH0632674Y2 - Photoresist coating device - Google Patents

Photoresist coating device

Info

Publication number
JPH0632674Y2
JPH0632674Y2 JP2766389U JP2766389U JPH0632674Y2 JP H0632674 Y2 JPH0632674 Y2 JP H0632674Y2 JP 2766389 U JP2766389 U JP 2766389U JP 2766389 U JP2766389 U JP 2766389U JP H0632674 Y2 JPH0632674 Y2 JP H0632674Y2
Authority
JP
Japan
Prior art keywords
substrate
photoresist
substrate stage
base
vacuum
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP2766389U
Other languages
Japanese (ja)
Other versions
JPH02118926U (en
Inventor
英樹 鎌田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Casio Computer Co Ltd
Original Assignee
Casio Computer Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Casio Computer Co Ltd filed Critical Casio Computer Co Ltd
Priority to JP2766389U priority Critical patent/JPH0632674Y2/en
Publication of JPH02118926U publication Critical patent/JPH02118926U/ja
Application granted granted Critical
Publication of JPH0632674Y2 publication Critical patent/JPH0632674Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Description

【考案の詳細な説明】 〔産業上の利用分野〕 この考案は、例えば電極膜の形成にあたって基板の上に
フォトレジストを塗布するフォトレジスト塗布装置に関
する。
DETAILED DESCRIPTION OF THE INVENTION [Industrial field of application] The present invention relates to a photoresist coating apparatus for coating a photoresist on a substrate for forming an electrode film, for example.

〔従来の技術〕[Conventional technology]

例えば液晶表示パネル用のガラス製の基板の上にフォト
レジストを塗布する際には、一般に回転式のフォトレジ
スト塗布装置が使用される。
For example, when a photoresist is applied on a glass substrate for a liquid crystal display panel, a rotary photoresist applying device is generally used.

この種のフォトレジスト塗布装置の構成を第4図および
第5図に示し、1が処理槽で、この処理槽1の内部の中
央部にスピンモータ2で駆動されて回転するスピンテー
ブル3が水平に設けられている。このスピンテーブル3
の外周には廃液カバー4が設けられ、この廃液カバー4
の周縁下部に環状に形成された廃液受皿5が配置し、こ
の廃液受皿5の底面の一部に処理槽1の外部に連通する
ドレイン口6が形成されている。
The structure of a photoresist coating apparatus of this type is shown in FIGS. 4 and 5, and 1 is a processing tank, and a spin table 3 driven by a spin motor 2 to rotate in the center of the processing tank 1 is horizontal. It is provided in. This spin table 3
A waste liquid cover 4 is provided on the outer periphery of the
A waste liquid receiving tray 5 formed in an annular shape is arranged below the periphery of the waste liquid receiving tray 5, and a drain port 6 communicating with the outside of the processing tank 1 is formed in a part of the bottom surface of the waste liquid receiving tray 5.

スピンテーブル3は第6図ないし第8図に示すように、
スピンモータ2に連動して回転するベース11と、この
ベース11の上面に取付けられた基板ステージ12とで
構成されている。ベース11の上面にはこの上面のほぼ
全体に均等的に分布するように例えばくもの巣状に真空
路13が形成され、またベース11の下面部に真空ポン
プ(図示せず)に連通する真空室14が形成され、この
真空室14が連通孔15を介して前記真空路13に連通
している。そしてこのくもの巣状の真空路13の全体を
覆うようにベース11の上面に基板ステージ12がビス
16…を介して取付けられ、この基板ステージ12の板
面に、前記真空路13に沿って均等的に配列するように
直径が1mm程度の多数の真空吸着孔17…が形成され、
これら真空吸着孔17を通して基板ステージ12の表面
に真空吸着力が作用するようになっている。
The spin table 3 is, as shown in FIGS. 6 to 8,
It is composed of a base 11 that rotates in conjunction with the spin motor 2 and a substrate stage 12 attached to the upper surface of the base 11. A vacuum path 13 is formed in the upper surface of the base 11 so as to be evenly distributed over substantially the entire upper surface of the base 11, and a vacuum path communicating with a vacuum pump (not shown) is formed in the lower surface of the base 11. A chamber 14 is formed, and the vacuum chamber 14 communicates with the vacuum passage 13 via a communication hole 15. A substrate stage 12 is attached to the upper surface of the base 11 via screws 16 so as to cover the entire vacuum path 13 in the form of a spider web, and along the vacuum path 13 on the plate surface of the substrate stage 12. A large number of vacuum suction holes 17 having a diameter of about 1 mm are formed so as to be evenly arranged,
A vacuum suction force acts on the surface of the substrate stage 12 through these vacuum suction holes 17.

このように構成されたフォトレジスト塗布装置において
は、フォトレジストの塗布工程時にスピンテーブル3の
上に角型もしくは円型の基板aが供給されて配置し、こ
の基板aが各真空吸着孔17…に作用する真空吸着力で
基板ステージ12の表面に吸着固定される。そしてこの
基板aの上に滴下ノズル(図示せず)を通してフォトレ
ジストが滴下され、この状態でスピンテーブル3がスピ
ンモータ2に連動して回転し、この回転遠心力で基板a
の上に滴下されたフォトレジストが基板aの表面の全体
に拡がって塗布される。
In the photoresist coating apparatus configured as described above, a rectangular or circular substrate a is supplied and arranged on the spin table 3 during the photoresist coating process, and the substrate a is placed in each vacuum suction hole 17. It is adsorbed and fixed on the surface of the substrate stage 12 by the vacuum adsorption force acting on the substrate stage 12. Then, the photoresist is dropped onto the substrate a through a dropping nozzle (not shown), and in this state, the spin table 3 rotates in conjunction with the spin motor 2, and the rotation centrifugal force causes the substrate a to rotate.
The photoresist dropped on is spread over the entire surface of the substrate a and applied.

〔考案が解決しようとする課題〕[Problems to be solved by the device]

ところがこのような従来のフォトレジスト塗布装置にお
いては、基板aの裏面に対して、真空吸引孔17…を通
して真空吸引力が直接及ぶ部分と、そうでない部分とが
生じ、これらの部分間で微妙な温度差が生じ、この温度
差がフォトレジストの流動性に影響し、この影響で基板
aの表面上のフォトレジストの膜厚が簿妙に変化し、フ
ォトレジストの膜に真空路13に沿うくもの巣状の縞模
様が生じて膜厚が不均一となり、この結果、フォトレジ
ストのパターニングの際の寸法精度が低下する難点があ
った。
However, in such a conventional photoresist coating apparatus, on the back surface of the substrate a, there are portions where the vacuum suction force is directly exerted through the vacuum suction holes 17 and portions where the vacuum suction force is not exerted, and these portions are delicate. A temperature difference is generated, and this temperature difference influences the fluidity of the photoresist, and the thickness of the photoresist on the surface of the substrate a is changed by this effect, so that the photoresist film follows the vacuum path 13. There is a problem that a nest-like striped pattern is formed and the film thickness becomes non-uniform, and as a result, the dimensional accuracy at the time of patterning the photoresist is lowered.

この考案はこのような点に着目してなされたもので、そ
の目的とするところは、基板の表面の各部にフォトレジ
ストを確実に均一の厚さに塗布してパターニングの際の
寸法精度を良好に保つことができるようにしたフォトレ
ジスト塗布装置を提供することにある。
This invention was made with this point in mind, and its purpose is to ensure that the photoresist is applied to each part of the surface of the substrate to a uniform thickness to achieve good dimensional accuracy during patterning. It is an object of the present invention to provide a photoresist coating apparatus which can be kept at a constant temperature.

〔課題を解決するための手段〕[Means for Solving the Problems]

この考案はこのような目的を達成するために、モータに
連動して回転するベースの上面にそのほぼ全体に亙って
均等的に分布する真空路を形成し、このベースの上面に
多孔質材料からなる基板ステージを取付け、これらベー
スと基板ステージでスピンテーブルを構成し、このスピ
ンテーブルの前記基板ステージの上に基板を配置し、前
記真空路の真空吸引力を基板ステージの多孔質空隙を通
して基板ステージの表面に作用させ、この真空吸引力で
前記基板を基板ステージに固定し、この基板の上にフォ
トレジストを滴下し、このフォトレジストをスピンテー
ブルの回転遠心力で基板の表面の全体に塗布するように
したものである。
In order to achieve such an object, the present invention forms a vacuum path uniformly distributed over the entire upper surface of a base that rotates in conjunction with a motor, and forms a porous material on the upper surface of the base. A substrate stage consisting of a base table and a substrate stage is attached to form a spin table, the substrate is placed on the substrate stage of the spin table, and the vacuum suction force of the vacuum path is passed through the porous gap of the substrate stage. Act on the surface of the stage, fix the substrate to the substrate stage with this vacuum suction force, drop photoresist on this substrate, and apply this photoresist to the entire surface of the substrate by the rotating centrifugal force of the spin table It is something that is done.

〔作用〕[Action]

このような構成においては、真空路の真空吸着力が基板
ステージの多孔質空隙を通して基板に作用するが、この
基板ステージの多孔質空隙はその板面の全体に均一かつ
緻密に分布し、したがって基板の裏面に作用する真空吸
引力がその裏面の全体に均等に及び、このため基板に部
分的な温度差が生じるようなことがなく、これにより基
板の表面に滴下されたフォトレジストがその表面の全体
に均一に拡がって各部が確実に均一の膜厚となるように
塗布される。
In such a configuration, the vacuum suction force of the vacuum path acts on the substrate through the porous voids of the substrate stage, and the porous voids of the substrate stage are uniformly and densely distributed over the entire plate surface, and thus the substrate The vacuum suction force that acts on the back surface of the substrate is evenly distributed over the entire back surface of the substrate, so that a partial temperature difference does not occur in the substrate. It is spread evenly over the entire surface so that each part is surely coated to have a uniform film thickness.

〔実施例〕〔Example〕

以下、この考案の一実施例について第1図ないし第3図
を参照して説明する。
An embodiment of the present invention will be described below with reference to FIGS.

この実施例においては、スピンテーブル3におけるベー
ス11が長方形に形成され、このベース11の上面にこ
の上面のほぼ全体に均等に分布するようくもの巣状の真
空路13が形成され、この真空路13がベース11の下
面側の真空室14に連通孔15を介して連通している。
そしてベース11の上面に前記真空路13の全体を覆う
ように基板ステージ12が接着剤などにより取付固定さ
れている。
In this embodiment, the base 11 of the spin table 3 is formed in a rectangular shape, and a vacuum path 13 in the shape of a web is formed on the upper surface of the base 11 so as to be evenly distributed over the entire upper surface. 13 communicates with the vacuum chamber 14 on the lower surface side of the base 11 via a communication hole 15.
The substrate stage 12 is attached and fixed to the upper surface of the base 11 with an adhesive or the like so as to cover the entire vacuum passage 13.

この基板ステージ12は、基板aよりも硬度の低いポリ
エチレン、ウレタン、テフロン、セラミックスなどの多
孔質材料で形成されている。
The substrate stage 12 is formed of a porous material such as polyethylene, urethane, Teflon, and ceramics, which has a lower hardness than the substrate a.

このような構成においては、真空路13の真空吸引力が
基板ステージ12の微細な多孔質空隙を通して基板ステ
ージ12の表面に作用し、この真空吸引力で基板ステー
ジ12の上に配置された基板aが吸着されて固定され
る。そしてこの状態で基板aの上にフォトレジストが滴
下され、このフォトレジストがスピンテーブル3の回転
遠心力で基板aの全体に拡がって塗布される。
In such a configuration, the vacuum suction force of the vacuum passage 13 acts on the surface of the substrate stage 12 through the fine porous voids of the substrate stage 12, and this vacuum suction force causes the substrate a placed on the substrate stage 12 to move. Are adsorbed and fixed. Then, in this state, the photoresist is dropped onto the substrate a, and the photoresist is spread and applied to the entire substrate a by the centrifugal force of rotation of the spin table 3.

基板ステージ12の多孔質空隙は、この基板ステージ1
2の全体に均一かつ緻密に分布し、したがって基板aの
裏面に作用する真空吸引力はその裏面の全体に均等に及
び、このため基板aに部分的な温度差が生じるようなこ
とがなく、これにより基板aの表面に滴下されたフォト
レジストがその表面の全体に均一に拡がって各部が確実
に均一の膜厚となるように塗布される。
The porous voids of the substrate stage 12 are
2 is uniformly and densely distributed over the entire surface of the substrate a, so that the vacuum suction force acting on the back surface of the substrate a is evenly distributed over the entire back surface thereof, so that a partial temperature difference does not occur in the substrate a. As a result, the photoresist dropped on the surface of the substrate a is evenly spread over the entire surface of the substrate a, and the photoresist is applied so that each portion surely has a uniform film thickness.

したがってフォトレジストのパターニングの際の寸法精
度を良好に保って高精度の例えば電極膜パターンを形成
することができる。
Therefore, it is possible to form a highly accurate electrode film pattern, for example, while maintaining good dimensional accuracy when patterning the photoresist.

〔考案の効果〕[Effect of device]

以上説明したようにこの考案によれば、基板の表面の全
体にフォトレジストを各部が確実に均一の膜厚となるよ
うに塗布することができ、したがってパターニングの際
の寸法精度を良好に保って高精度の電極膜パターンなど
を形成することができるという効果を奏する。
As described above, according to the present invention, the photoresist can be applied to the entire surface of the substrate so that each part has a uniform film thickness. Therefore, the dimensional accuracy during patterning can be kept good. It is possible to form a highly accurate electrode film pattern and the like.

【図面の簡単な説明】[Brief description of drawings]

第1図はこの考案の一実施例を示す断面図、第2図は同
じく平面図、第3図は同実施例におけるベースの平面
図、第4図は従来のフォトレジスト塗布装置の断面図、
第5図は同じく平面図、第6図はそのフォトレジスト塗
布装置におけるスピンテーブルの平面図、第7図はその
スピンテーブルにおけるベースの平面図、第8図は同じ
く断面図である。 2…スピンモータ、3…スピンテーブル、11…ベー
ス、12…基板ステージ、13…真空路、a…基板。
1 is a sectional view showing an embodiment of the present invention, FIG. 2 is a plan view of the same, FIG. 3 is a plan view of a base in the same embodiment, and FIG. 4 is a sectional view of a conventional photoresist coating apparatus.
5 is a plan view of the same, FIG. 6 is a plan view of a spin table in the photoresist coating apparatus, FIG. 7 is a plan view of a base in the spin table, and FIG. 8 is a sectional view of the same. 2 ... Spin motor, 3 ... Spin table, 11 ... Base, 12 ... Substrate stage, 13 ... Vacuum path, a ... Substrate.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 【請求項1】モータに連動して回転するベースの上面に
そのほぼ全体に亙って均等的に分布する真空路を形成
し、このベースの上面に多孔質材料からなる基板ステー
ジを取付け、これらベースと基板ステージでスピンテー
ブルを構成し、このスピンテーブルの前記基板ステージ
の上に基板を配置し、前記真空路の真空吸引力を基板ス
テージの多孔質空隙を通して基板ステージの表面に作用
させ、この真空吸引力で前記基板を基板ステージに固定
し、この基板の上にフォトレジストを滴下し、このフォ
トレジストをスピンテーブルの回転遠心力で基板の表面
の全体に塗布することを特徴とするフォトレジスト塗布
装置。
1. A vacuum path is formed on the upper surface of a base that rotates in conjunction with a motor and is evenly distributed over substantially the entire surface of the base. A substrate stage made of a porous material is attached to the upper surface of the base. A spin table is constituted by a base and a substrate stage, a substrate is placed on the substrate stage of the spin table, and a vacuum suction force of the vacuum path is applied to the surface of the substrate stage through a porous void of the substrate stage. A photoresist characterized in that the substrate is fixed on a substrate stage by a vacuum suction force, a photoresist is dropped on the substrate, and the photoresist is applied to the entire surface of the substrate by a centrifugal force of rotation of a spin table. Coating device.
JP2766389U 1989-03-10 1989-03-10 Photoresist coating device Expired - Lifetime JPH0632674Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2766389U JPH0632674Y2 (en) 1989-03-10 1989-03-10 Photoresist coating device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2766389U JPH0632674Y2 (en) 1989-03-10 1989-03-10 Photoresist coating device

Publications (2)

Publication Number Publication Date
JPH02118926U JPH02118926U (en) 1990-09-25
JPH0632674Y2 true JPH0632674Y2 (en) 1994-08-24

Family

ID=31250348

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2766389U Expired - Lifetime JPH0632674Y2 (en) 1989-03-10 1989-03-10 Photoresist coating device

Country Status (1)

Country Link
JP (1) JPH0632674Y2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001168011A (en) * 1999-12-09 2001-06-22 Dainippon Screen Mfg Co Ltd Membrane forming device
JP2002231609A (en) * 2001-02-02 2002-08-16 Matsushita Electric Ind Co Ltd Device and method for applying chemical
JP2005246228A (en) * 2004-03-03 2005-09-15 Dainippon Printing Co Ltd Spin coater apparatus and spin coating method

Also Published As

Publication number Publication date
JPH02118926U (en) 1990-09-25

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