JPH0627641B2 - スケール - Google Patents

スケール

Info

Publication number
JPH0627641B2
JPH0627641B2 JP2145531A JP14553190A JPH0627641B2 JP H0627641 B2 JPH0627641 B2 JP H0627641B2 JP 2145531 A JP2145531 A JP 2145531A JP 14553190 A JP14553190 A JP 14553190A JP H0627641 B2 JPH0627641 B2 JP H0627641B2
Authority
JP
Japan
Prior art keywords
scale
support
substrate
thermal expansion
layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP2145531A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0324401A (ja
Inventor
ハインツ・クラウス
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dr Johannes Heidenhain GmbH
Original Assignee
Dr Johannes Heidenhain GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dr Johannes Heidenhain GmbH filed Critical Dr Johannes Heidenhain GmbH
Publication of JPH0324401A publication Critical patent/JPH0324401A/ja
Publication of JPH0627641B2 publication Critical patent/JPH0627641B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/0011Arrangements for eliminating or compensation of measuring errors due to temperature or weight
    • G01B5/0014Arrangements for eliminating or compensation of measuring errors due to temperature or weight due to temperature

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Instruments Using Mechanical Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)
JP2145531A 1989-06-07 1990-06-05 スケール Expired - Lifetime JPH0627641B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE3918490.0 1989-06-07
DE3918490A DE3918490C1 (enExample) 1989-06-07 1989-06-07

Publications (2)

Publication Number Publication Date
JPH0324401A JPH0324401A (ja) 1991-02-01
JPH0627641B2 true JPH0627641B2 (ja) 1994-04-13

Family

ID=6382208

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2145531A Expired - Lifetime JPH0627641B2 (ja) 1989-06-07 1990-06-05 スケール

Country Status (4)

Country Link
US (1) US5095637A (enExample)
EP (1) EP0401536B1 (enExample)
JP (1) JPH0627641B2 (enExample)
DE (2) DE3918490C1 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4406798C2 (de) * 1994-03-02 1997-11-27 Heidenhain Gmbh Dr Johannes Positionsmeßeinrichtung
DE19510998C2 (de) * 1995-03-25 1998-09-03 Heidenhain Gmbh Dr Johannes Positionsmeßeinrichtung
DE19700367C2 (de) * 1997-01-08 1999-07-01 Zeiss Carl Jena Gmbh Verfahren und Montagevorrichtung zum gerichteten Anbringen eines Maßbandes
DE19912310B4 (de) * 1999-03-19 2007-11-29 Dr. Johannes Heidenhain Gmbh Positionsmeßeinrichtung
DE19914311A1 (de) 1999-03-29 2000-10-05 Heidenhain Gmbh Dr Johannes Verfahren und Vorrichtung zum Anbringen eines Maßstabes
JP4230810B2 (ja) * 2003-04-24 2009-02-25 株式会社ミツトヨ 測長装置
DE102007031976A1 (de) * 2007-07-10 2009-01-15 Dr. Johannes Heidenhain Gmbh Längenmesseinrichtung

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE7513496U (de) * 1975-09-25 Heidenhain J Gmbh MeBeinrichtung
DE1176382B (de) * 1959-09-30 1964-08-20 Wenczler & Heidenhain Patentve Teilungstraeger fuer Praezisionsteilungen
US3629945A (en) * 1969-10-06 1971-12-28 Bausch & Lomb Optical gage
DE2016253A1 (de) * 1970-04-04 1971-10-14 Heidenhain Johannes Dr Fa Meßteilung
US3816002A (en) * 1972-10-10 1974-06-11 H Wieg Apparatus for measuring displacement between two relatively movable members
DE3637628C1 (de) * 1986-11-05 1988-02-11 Heidenhain Gmbh Dr Johannes Verfahren zur Herstellung einer Massverkoerperung
US4815213A (en) * 1987-10-09 1989-03-28 Brown & Sharpe Manufacturing Co. Apparatus for temperature compensation of sensing means of a machine

Also Published As

Publication number Publication date
EP0401536A3 (de) 1991-04-10
DE3918490C1 (enExample) 1990-09-27
EP0401536B1 (de) 1992-08-12
EP0401536A2 (de) 1990-12-12
JPH0324401A (ja) 1991-02-01
DE59000247D1 (de) 1992-09-17
US5095637A (en) 1992-03-17

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