JPH06242410A - Lcd display body inspecting device - Google Patents

Lcd display body inspecting device

Info

Publication number
JPH06242410A
JPH06242410A JP2705893A JP2705893A JPH06242410A JP H06242410 A JPH06242410 A JP H06242410A JP 2705893 A JP2705893 A JP 2705893A JP 2705893 A JP2705893 A JP 2705893A JP H06242410 A JPH06242410 A JP H06242410A
Authority
JP
Japan
Prior art keywords
light
lcd display
display body
filter plate
contrast
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2705893A
Other languages
Japanese (ja)
Other versions
JPH0830796B2 (en
Inventor
Masahiro Nishino
昌浩 西野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP2705893A priority Critical patent/JPH0830796B2/en
Publication of JPH06242410A publication Critical patent/JPH06242410A/en
Publication of JPH0830796B2 publication Critical patent/JPH0830796B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Liquid Crystal (AREA)

Abstract

PURPOSE:To provide an LCD display body inspecting device which facilitates the adjustment of the relative position relation between a camera, lighting, and a body to be inspected so that the reflection of incident light on the surface of the body to be inspected is evaded. CONSTITUTION:This inspecting device, is provided with a light source 5, the camera 3 which forms an optical image by passing measurement light 27 containing the incident light from an LCD display body 8 through a lens 2, and an image processor 6 which applies an inspection pattern to a liquid crystal display element in the LCD display body and is supplied with a photoelectric conversion output corresponding to the measurement light to collate it with the inspection pattern and then decides whether or not the LCD display body 8 has a defective. Further, this device has a polarizing filter plate 1 which is arranged over the entire surface of the lens 2 and can rotate. A driving control part 7 which drives and rotates the polarizing filter plate 1, and the image processor 6 further equipped with a contrast processing part which calculates how much the contrast of the optical image is spoiled from interference generated between reflected light and the measurement light and sends a control signal out to the driving control part 7 so that the contrast reaches a specific threshold value are provided.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明はLCD(Liquid
Crystal Display)表示体検査装置に関
し、特に被検査物であるLCD表示体からの光学像に生
する障害となる干渉光の影響を抑えたLCD表示体検査
装置に関する。
The present invention relates to an LCD (Liquid).
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a crystal display (LCD) display inspection device, and more particularly, to an LCD display inspection device that suppresses the influence of interference light that interferes with an optical image from an LCD display that is an inspection object.

【0002】[0002]

【従来の技術】代表的なLCD表示体である反射型のL
CD表示体8は、図4の模式図に示すように、TN型の
液晶表示素子21と、駆動電圧を印加する駆動線20
と、液晶表示素子21に照射光を入射させるために後述
のLED(図示せず)の光を反射させる反射板24と、
吸収軸(矢印)の方向に偏光面を有する光を吸収する偏
光板22,23と、きょう体の一部を形成する表面の表
面カバー25とを備えている。偏光板22とおよび23
の吸収軸を互いに直交するように配置した場合には、ノ
ーマリホワイトモードとなり、互いに平行となるように
配置した場合にはノーマリブラックモードとなる。
2. Description of the Related Art A reflection type L which is a typical LCD display
As shown in the schematic view of FIG. 4, the CD display body 8 includes a TN type liquid crystal display element 21 and a drive line 20 for applying a drive voltage.
A reflection plate 24 for reflecting the light of an LED (not shown), which will be described later, so that the irradiation light is incident on the liquid crystal display element 21;
It is provided with polarizing plates 22 and 23 which have a polarization plane in the direction of the absorption axis (arrow) and which absorbs light, and a surface cover 25 which is a surface forming a part of the casing. Polarizers 22 and 23
When the absorption axes are arranged so as to be orthogonal to each other, the normally white mode is set, and when they are arranged so as to be parallel to each other, the normally black mode is set.

【0003】図4の液晶表示素子21自体を検査する装
置の従来例としては、特開昭61−178648および
特開平3−61993に示されるように、偏光板23に
対して互いに吸収軸が直交する2枚の検査用偏光板を偏
光板22の位置におきスライドさせ偏光板23に対して
吸収軸を相対的に直交させたり、平行にしたりしてノー
マリホワイトモード、ノーマリブラックモードを擬似的
に実現して白欠陥又は黒欠陥を検査する装置が知られて
いる。なお所望のモードに応じて偏光板22.23を上
述の吸収軸合わせのうえ液晶表示素子21の表裏に貼付
して構成したLCD表示体は市販されている。また、上
述のLEDは反射板24と偏光板23の間の端部に配置
されて反射板24を照射し、その反射光が偏光板23に
ほぼ直角に入射する構造となっている。反射板24の代
りに、この位置にバックライトを配置して照射する方式
もある。上述のLCD表示体検査装置は上記両モードに
ついて液晶表示素子そのものの欠陥の有無を検出するこ
とはできるものの、2枚の偏光板22,23の各各の表
裏や反射板24の表裏などで生ずる反射光に起因する干
渉の影響には全く配慮していない。一方、大量生産向き
のLCD表示体検査装置の従来例は図3に示すように、
LCD表示体8を照射する光源5と、測定光27の入力
を受けるCCD等を使用したレンズ2付きのカメラ3
と、LCD表示体8の液晶表示素子21に駆動線20,
20Aを介して検査用の特定パタン(文字,全ドット点
灯,全消灯,市松模様点灯等)の印加電圧を出力し、一
方カメラ3で受光され光電変換された信号と送りの特定
パタンとを照合して、表示機能の欠陥の有無を判定する
画像処理装置6Aとから構成されている。次に従来例の
動作における測定光の状態を説明する。図4を併せて参
照すると、光源5からの入射光26は表面カバー25、
偏光板22、液晶表示素子21、偏光板23を経由して
反射板24に入射し、この反射板24で反射される。こ
の反射板24からの反射光は逆の経路を通って測定光2
7となる。図4の例ではノーマリホワイトモードの偏光
板22,23により特定の方向に偏光された光のみが測
定光27として出力される。入射光26の表示体8に対
する入射角は、測定光27がレンズ2に正しく入射する
ように光源5の表示体8に対する相対位置関係の選定に
より設定する。
As a conventional example of a device for inspecting the liquid crystal display element 21 itself shown in FIG. 4, as shown in JP-A-61-178648 and JP-A-3-61993, the absorption axes are orthogonal to each other with respect to the polarizing plate 23. The two inspection polarizing plates are placed at the position of the polarizing plate 22 and slid to make the absorption axis relatively orthogonal to or parallel to the polarizing plate 23 to simulate the normally white mode and the normally black mode. There is known a device that can be realized in real time to inspect a white defect or a black defect. It is to be noted that an LCD display body is commercially available in which the polarizing plates 22.23 are attached to the front and back surfaces of the liquid crystal display element 21 after the above-mentioned absorption axes are aligned according to the desired mode. Further, the above-mentioned LED is arranged at an end portion between the reflection plate 24 and the polarizing plate 23, irradiates the reflection plate 24, and the reflected light is incident on the polarizing plate 23 at a substantially right angle. Instead of the reflection plate 24, there is also a system in which a backlight is arranged at this position for irradiation. Although the above-mentioned LCD display inspection apparatus can detect the presence or absence of defects in the liquid crystal display element itself in both modes, it occurs on the front and back of each of the two polarizing plates 22 and 23 and the front and back of the reflection plate 24. No consideration is given to the influence of interference caused by reflected light. On the other hand, as shown in FIG. 3, the conventional example of the LCD display body inspection apparatus for mass production is as follows.
A light source 5 for illuminating the LCD display body 8 and a camera 3 with a lens 2 using a CCD or the like for receiving the measurement light 27.
And the drive line 20 to the liquid crystal display element 21 of the LCD display body 8,
The applied voltage of a specific pattern for inspection (characters, all dots turned on, all turned off, checkered pattern turned on, etc.) is output via 20A, and the photoelectrically converted signal received by the camera 3 and the sending specific pattern are collated. In addition, the image processing apparatus 6A determines whether or not there is a defect in the display function. Next, the state of the measuring light in the operation of the conventional example will be described. Referring also to FIG. 4, the incident light 26 from the light source 5 has a surface cover 25,
The light enters the reflection plate 24 through the polarization plate 22, the liquid crystal display element 21, and the polarization plate 23, and is reflected by the reflection plate 24. The reflected light from the reflection plate 24 travels in the opposite path to the measurement light 2
It becomes 7. In the example of FIG. 4, only the light polarized in a specific direction by the normally white mode polarization plates 22 and 23 is output as the measurement light 27. The incident angle of the incident light 26 with respect to the display body 8 is set by selecting the relative positional relationship of the light source 5 with respect to the display body 8 so that the measurement light 27 is correctly incident on the lens 2.

【0004】しかし被測定物の表面で反射する光は、カ
メラ3と光源5と被検査物の相対位置関係によりレンズ
2に入射することとなり、所望の測定光との間で干渉を
生じ、カメラ3の内部に形成される表示体8の光学像の
鮮明度を劣化させる。特にLCD素子21の前面に距離
をもって表面カバー25が設置されてある被測定物の場
合には、カバーの不透明部分の陰影が液晶表示素子21
に投影しないように、入射光の入射角を大きくとる必要
があるが、そうするとカメラ3に表面カバー25での反
射光が入射して上記干渉を生ずる可能性が高くなり、カ
メラ3と光源5と被測定物8との相対的位置関係には微
妙な調整を要する。またこの場合被測定物8のカバー2
5と反射板24との間の取付け角度にばらつきがある
と、被測定物1個ごとに上記相対的位置関係の調整が必
要となる。
However, the light reflected on the surface of the object to be measured is incident on the lens 2 due to the relative positional relationship between the camera 3, the light source 5 and the object to be inspected, causing interference with the desired measuring light, and the camera 3 deteriorates the sharpness of the optical image of the display body 8 formed inside 3. Particularly in the case of the object to be measured in which the surface cover 25 is installed in front of the LCD element 21 with a distance, the shadow of the opaque portion of the cover is the liquid crystal display element 21.
It is necessary to make the incident angle of the incident light large so as not to project the light on the surface of the camera 3. However, if this is done, there is a high possibility that the reflected light from the surface cover 25 will enter the camera 3 and cause the above-mentioned interference. The relative positional relationship with the DUT 8 requires delicate adjustment. In this case, the cover 2 of the DUT 8
If there is a variation in the mounting angle between the reflector 5 and the reflection plate 24, it is necessary to adjust the relative positional relationship for each object to be measured.

【0005】[0005]

【発明が解決しようとする課題】上述のとおり、従来の
LCD表示体検査装置においては、被検査物表面での入
射光の反射がカメラのレンズに入射し、表示部からの上
記測定光に干渉してその表示部の光学像の鮮明度すなわ
ちコントラストを劣化させるので、被検査物の欠陥有無
の判断のための画像処理が困難になる欠点がある。その
反射を避けるようにカメラと照明と被検査物との間の相
対的位置関係を設定するには調整を要するという欠点が
ある。
As described above, in the conventional LCD display inspection apparatus, the reflection of the incident light on the surface of the inspection object enters the lens of the camera and interferes with the measurement light from the display section. Then, the sharpness, that is, the contrast, of the optical image on the display portion is deteriorated, which makes it difficult to perform image processing for determining the presence or absence of a defect in the inspection object. There is a drawback that adjustment is required to set the relative positional relationship among the camera, the illumination, and the inspection object so as to avoid the reflection.

【0006】[0006]

【課題を解決するための手段】本発明によると、被検査
物であるLCD表示体を所定の入射角で入射光を供給す
る光源と、前記LCD表示体からの反射光を含む測定光
をレンズを介して受け測定光対応の光学像を生ずるカメ
ラと、検査用パタンに対応する駆動電圧を生成し前記L
CD表示体内の液晶表示素子に印加するとともに前記測
定光対応の光電変換出力の供給を受け前記検査用パタン
との照合を行い前記LCD表示体の欠陥の有無を判定す
る画像処理装置とを有するLCD表示体検査装置におい
て、前記レンズの前面に配置されレンズの光軸を軸とし
て回転可能な偏光フィルタ板と、前記偏光フィルタ板を
回転駆動させる駆動制御部と、前記反射光が測定光との
間で生ずる干渉により前記光学像のコントラストの害な
われる度合を計算しそのコントラストが所定のしきい値
に到達するように前記駆動制御部に制御信号を送出する
コントラスト処理部とをさらに備える画像処理装置とを
有する。
According to the present invention, a light source for supplying incident light to an LCD display body as an object to be inspected at a predetermined incident angle, and a measuring light including reflected light from the LCD display body as a lens. A camera that produces an optical image corresponding to the received measurement light via the lens and a drive voltage corresponding to the inspection pattern is generated.
An LCD having an image processing device which is applied to a liquid crystal display element in a CD display body and is supplied with a photoelectric conversion output corresponding to the measurement light and collated with the inspection pattern to determine whether or not there is a defect in the LCD display body. In the display body inspection apparatus, a polarization filter plate disposed in front of the lens and rotatable about the optical axis of the lens, a drive control unit that rotationally drives the polarization filter plate, and the reflected light between the measurement light. The image processing apparatus further comprising: a contrast processing unit that calculates the degree of the contrast of the optical image that is impaired by the interference caused by the above, and sends a control signal to the drive control unit so that the contrast reaches a predetermined threshold value. Have and.

【0007】[0007]

【実施例】次に、本発明について図面を参照して説明す
る。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, the present invention will be described with reference to the drawings.

【0008】本発明の一実施例の斜視図である図1を参
照すると、この実施例は、被検査物であるLCD表示体
8を支持する支持部材8Aと、後述する画像処理装置か
ら検査パタンの駆動信号を伝達する駆動線20A,20
と、LCD表示体8の光学像を測定光により形成するカ
メラ3と、カメラ3に取り付けられた集光用のレンズ2
と、レンズ2の受光面に取り付けられレンズ2の光軸を
軸として回転可能な円形の偏光フィルター板1と、偏光
フィルター板1を回転させる回転駆動部4と、被検査物
8に照明光を供給する光源5と、カメラ3に接続された
画像処理装置6と、回転駆動部4と画像処理装置6の制
御により駆動電圧を生成するコントローラ7とで構成さ
れる。被検査物8を光源5からの入射光26により照射
しレンズ2への測定光によりカメラ3が被検査物8の光
学像を形成する際に、コントローラ7によって回転駆動
部4を制御し、偏光フィルター板1を回転させながら、
カメラ3からの映像信号aを画像処理装置6により処理
する。偏光フィルター板1はLCD表示体8内の偏光板
22と同じ特性を有し、上記吸収軸と垂直方向の偏光成
分のみを透過させる。したがって、原理的には、偏向フ
ィルター板1の回転に伴う偏光板22と偏光フィルター
1との偏光軸の一致点において、測定光27の透過光量
は最大となる。ここで表面カバー25や偏光板22等か
らの反射光、すなわち表示体8の平面についてランダム
な方向に発生する反射光がレンズ2への入射角が測定光
と一致していても、その変更軸が一致しないので、偏光
フィルター板1で除去することができる。上記駆動信号
のON−OFF切換に伴う測定光光量の変化が最も大き
くなる偏光フィルター板1の回転角度においては、上記
コントラストが高い。
Referring to FIG. 1, which is a perspective view of an embodiment of the present invention, in this embodiment, a support member 8A for supporting an LCD display body 8 as an object to be inspected and an inspection pattern from an image processing apparatus described later are provided. Drive lines 20A, 20 for transmitting the drive signal of
And a camera 3 for forming an optical image of the LCD display body 8 by measuring light, and a condenser lens 2 attached to the camera 3.
The circular polarization filter plate 1 attached to the light receiving surface of the lens 2 and rotatable about the optical axis of the lens 2, the rotation drive unit 4 for rotating the polarization filter plate 1, and the illumination light to the inspection object 8. It comprises a light source 5 to be supplied, an image processing device 6 connected to the camera 3, a rotation drive unit 4 and a controller 7 which generates a drive voltage under the control of the image processing device 6. When the inspection object 8 is irradiated with the incident light 26 from the light source 5 and the camera 3 forms an optical image of the inspection object 8 by the measurement light to the lens 2, the controller 7 controls the rotation driving unit 4 to polarize the light. While rotating the filter plate 1,
The image signal a from the camera 3 is processed by the image processing device 6. The polarizing filter plate 1 has the same characteristics as the polarizing plate 22 in the LCD display body 8 and transmits only the polarized component in the direction perpendicular to the absorption axis. Therefore, in principle, at the point where the polarization axes of the polarization plate 22 and the polarization filter 1 coincide with the rotation of the polarization filter plate 1, the amount of transmitted measurement light 27 becomes maximum. Here, even if the incident light on the lens 2 of the reflected light from the surface cover 25, the polarizing plate 22 or the like, that is, the reflected light generated in a random direction with respect to the plane of the display 8 coincides with the measurement light, the change axis thereof is changed. Since they do not match, they can be removed by the polarizing filter plate 1. The contrast is high at the rotation angle of the polarization filter plate 1 where the change in the amount of the measurement light caused by the ON / OFF switching of the drive signal is the largest.

【0009】このコントラストを最も大にする上記フィ
ルター板1の回転角度を設定する方法は、この発明によ
り画像処理装置6に付加されたコントラスト処理部の処
理手順により行われ、コントローラ7を制御して回転駆
動部4を駆動する。
The method for setting the rotation angle of the filter plate 1 for maximizing the contrast is performed by the processing procedure of the contrast processing unit added to the image processing apparatus 6 according to the present invention, and the controller 7 is controlled. The rotation drive unit 4 is driven.

【0010】このコントラスト処理部の処理手順を図2
のフローチャートにより説明する。まず、液晶表示素子
(LCD)を全非駆動状態にし、上記反射光L2だけが
レンズ2に入射する状態にする(ステップS1)。次に
偏光フィルタ板1の回転を開始する(S2)。この回転
角のピッチΔθごとに反射光L2の光量レベルを順次測
定し記憶する(S3)。この回転角のピッチは干渉の原
因となる上記反射光と測定光との解像度を考慮して決め
られる。偏光フィルター板1を360度回転させた後に
LCDを全部駆動状態に切り換える(S4)。この段階
では上記反射光とLCD素子21、偏光板22,23お
よび反射板24を経た上記の測定光との両方がレンズ2
への入射光となる。この入射光を回転角のピッチΔθご
とに反射光レベルL1として測定し記憶する(S5)。
次に反射光レベルL1のうちの最大値L1Mと対応の回
転角θ1とを抽出する(S6)。この回転角θ1におけ
る上記反射光レベルL2に対する上記最大値L1Mの比
が上記L1M/L2コントラストを表すので、この比の
値を計算する(S7)。この比L1M/L2が画像処理
装置6内で検査パターンの判定を行うために必要なしき
い値Tを超えているかどうかを比較する(S8)。この
比較した結果がYESの場合には、画像処理装置6は本
来の検査パターンを送り(例えば市松模様等)、LCD
表示体8の欠陥有無の判定を行う(S9)。上記比較の
結果がNOの場合には光源5の位置を調整して(S1
0)、ステップ1〜ステップ8までの手順を繰り返して
行う。なお、このコントラスト処理部の手順によりコン
トラストが所定のしきい値Tを満足すれば光源5と、レ
ンズ2を含むカメラ3の相対的位置関係は設定されるの
で、次の被検査物のLCD表示体8の位置が多少ずれ
て、測定光27の偏光軸が変ってもコントラストが大幅
に劣化すれることはない。なお、これまでの説明から明
らかなようにカメラ3より光学像の形成されるLCD表
示体8の表面の範囲を限定することによってLCD表示
素子21の局部的な欠陥検査も可能である。
The processing procedure of this contrast processing section is shown in FIG.
The flowchart will be described. First, the liquid crystal display element (LCD) is brought into a non-driving state so that only the reflected light L2 is incident on the lens 2 (step S1). Next, rotation of the polarization filter plate 1 is started (S2). The light quantity level of the reflected light L2 is sequentially measured and stored for each pitch Δθ of this rotation angle (S3). The pitch of this rotation angle is determined in consideration of the resolutions of the reflected light and the measurement light that cause interference. After the polarizing filter plate 1 is rotated 360 degrees, the LCD is switched to the driving state (S4). At this stage, both the reflected light and the measuring light that has passed through the LCD element 21, the polarizing plates 22 and 23 and the reflector 24 are reflected by the lens 2.
It becomes incident light on. This incident light is measured and stored as the reflected light level L1 for each rotation angle pitch Δθ (S5).
Next, the maximum value L1M of the reflected light level L1 and the corresponding rotation angle θ1 are extracted (S6). Since the ratio of the maximum value L1M to the reflected light level L2 at the rotation angle θ1 represents the L1M / L2 contrast, the value of this ratio is calculated (S7). It is compared whether or not this ratio L1M / L2 exceeds a threshold value T required for determining the inspection pattern in the image processing device 6 (S8). If the result of this comparison is YES, the image processing device 6 sends the original inspection pattern (for example, a checkerboard pattern), and the LCD
Whether or not there is a defect in the display body 8 is determined (S9). If the comparison result is NO, the position of the light source 5 is adjusted (S1
0), steps 1 to 8 are repeated. If the contrast satisfies the predetermined threshold value T by the procedure of the contrast processing section, the relative positional relationship between the light source 5 and the camera 3 including the lens 2 is set, and the LCD display of the next object to be inspected is set. Even if the position of the body 8 is slightly displaced and the polarization axis of the measurement light 27 is changed, the contrast is not significantly deteriorated. As is clear from the above description, the local defect inspection of the LCD display element 21 is possible by limiting the range of the surface of the LCD display 8 on which the optical image is formed by the camera 3.

【0011】[0011]

【発明の効果】以上述べたとおり、本発明のLCD表示
体検査装置は、検査物の表面等における反射光に起因す
る干渉光の影響を最小にする偏光フィルター板の回転角
度を自動的に選択し、その干渉による非検査物の光学像
のコントラスト劣化を最小にできるので、LCD表示素
子の欠陥の検出を容易にする。同様に光源と、カメラと
非検査物との相対的位置関係の調整を容易にする。
As described above, the LCD display inspection apparatus of the present invention automatically selects the rotation angle of the polarizing filter plate that minimizes the influence of the interference light caused by the reflected light on the surface of the inspection object. However, since the deterioration of the contrast of the optical image of the non-inspection object due to the interference can be minimized, the defect of the LCD display element can be easily detected. Similarly, it facilitates adjustment of the relative positional relationship between the light source, the camera, and the non-inspection object.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例の斜視図である。FIG. 1 is a perspective view of an embodiment of the present invention.

【図2】本実施例に含まれる画像処理装置の動作説明の
ためのフローチャートである。
FIG. 2 is a flowchart for explaining the operation of the image processing apparatus included in this embodiment.

【図3】従来例の斜視図である。FIG. 3 is a perspective view of a conventional example.

【図4】一般的なLCD表示体の模式図である。FIG. 4 is a schematic view of a general LCD display body.

【符号の説明】[Explanation of symbols]

1 偏光フィルター板 2 レンズ 3 カメラ 4 フィルター板回転駆動部 5 光源 6,6A 画像処理装置 7 コントローラ 8 LCD表示体 8A 支持部材 20,20A 駆動線 a 映像信号 1 Polarization Filter Plate 2 Lens 3 Camera 4 Filter Plate Rotation Drive Unit 5 Light Source 6, 6A Image Processing Device 7 Controller 8 LCD Display 8A Support Member 20, 20A Drive Line a Video Signal

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 被検査物であるLCD表示体を所定の入
射角で入射光を供給する光源と、前記LCD表示体から
の反射光を含む測定光をレンズを介して受け測定光対応
の光学像を生ずるカメラと、検査用パタンに対応する駆
動電圧を生成し前記LCD表示体内の液晶表示素子に印
加するとともに前記測定光対応の光電変換出力の供給を
受け前記検査用パタンとの照合を行い前記LCD表示体
の欠陥の有無を判定する画像処理装置とを有するLCD
表示体検査装置において、前記レンズの前面に配置され
レンズの光軸を軸として回転可能な偏光フィルタ板と、
前記偏光フィルタ板を回転駆動させる駆動制御部と、前
記反射光が測定光との間で生ずる干渉により前記光学像
のコントラストの害なわれる度合を計算しそのコントラ
ストが所定のしきい値に到達するように前記駆動制御部
に制御信号を送出するコントラスト処理部とをさらに備
える画像処理装置とを有することを特徴とするLCD表
示体検査装置。
1. A light source for supplying incident light to an LCD display body, which is an object to be inspected, at a predetermined incident angle, and measuring light including reflected light from the LCD display body through a lens, and optics corresponding to the measuring light. A camera that produces an image and a drive voltage corresponding to the inspection pattern are generated and applied to a liquid crystal display element in the LCD display body, and a photoelectric conversion output corresponding to the measurement light is supplied and the inspection pattern is collated. LCD having an image processing device for determining the presence or absence of a defect in the LCD display body
In the display body inspection apparatus, a polarizing filter plate arranged on the front surface of the lens and rotatable about the optical axis of the lens,
The degree to which the contrast of the optical image is impaired is calculated by the interference between the drive control unit that rotationally drives the polarization filter plate and the measurement light, and the contrast reaches a predetermined threshold value. An image display apparatus further comprising a contrast processing section for sending a control signal to the drive control section as described above.
【請求項2】 前記コントラスト処理部が前記偏光フィ
ルタ板を回転させLCDを全部非駆動にした状態で所定
の回転角ピッチ△θごとに反射光の光量L2を順次測定
し記憶する手段と、前記偏光フィルタ板の予め定めた回
転角θ1において前記LCDを全部駆動にした状態で反
射光の光量L1を測定し記憶する手段と、前記回転角θ
1における前記光量L1と前記光量L2との比を計算す
る手段と、予め定めたしきい値と前記計算手段の出力と
を比較する手段とを有することを特徴とする請求項1記
載のLCD表示体検査装置。
2. A means for sequentially measuring and storing a light quantity L2 of reflected light for each predetermined rotation angle pitch Δθ in a state where the contrast processing unit rotates the polarization filter plate and all the LCDs are in a non-driving state, A means for measuring and storing the light quantity L1 of the reflected light in a state in which all the LCDs are driven at a predetermined rotation angle θ1 of the polarization filter plate, and the rotation angle θ.
2. The LCD display according to claim 1, further comprising means for calculating a ratio between the light quantity L1 and the light quantity L2 in No. 1 and means for comparing a predetermined threshold value with an output of the calculation means. Physical examination device.
JP2705893A 1993-02-17 1993-02-17 LCD display inspection device Expired - Lifetime JPH0830796B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2705893A JPH0830796B2 (en) 1993-02-17 1993-02-17 LCD display inspection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2705893A JPH0830796B2 (en) 1993-02-17 1993-02-17 LCD display inspection device

Publications (2)

Publication Number Publication Date
JPH06242410A true JPH06242410A (en) 1994-09-02
JPH0830796B2 JPH0830796B2 (en) 1996-03-27

Family

ID=12210471

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2705893A Expired - Lifetime JPH0830796B2 (en) 1993-02-17 1993-02-17 LCD display inspection device

Country Status (1)

Country Link
JP (1) JPH0830796B2 (en)

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Publication number Priority date Publication date Assignee Title
WO2006062379A1 (en) * 2004-12-11 2006-06-15 Macron Co., Ltd. Apparatus for inspecting backlight unit
CN1307469C (en) * 2002-11-29 2007-03-28 鸿富锦精密工业(深圳)有限公司 Backlight module testing instrument
JP2007206550A (en) * 2006-02-03 2007-08-16 Toshiba Corp Defective pixel correcting device for liquid crystal panel
KR100766394B1 (en) * 2006-07-25 2007-10-12 주식회사 브이원텍 Auto denting test equipment
KR20100097999A (en) * 2009-02-27 2010-09-06 엘지디스플레이 주식회사 Apparatus for inspecting back light unit and method thereof
KR101043170B1 (en) * 2008-12-30 2011-06-20 와이즈플래닛(주) coordinate acquisition system possible acquisition of defect-coordinate and thereof.
JP2018515747A (en) * 2015-06-03 2018-06-14 ローデンシュトック ゲーエムベーハー Method and apparatus for determining surface data and / or measurement data relating to the surface of an at least partly transparent object

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CN107085322A (en) * 2017-05-05 2017-08-22 盐城华星光电技术有限公司 LCD LCD screen detection devices

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1307469C (en) * 2002-11-29 2007-03-28 鸿富锦精密工业(深圳)有限公司 Backlight module testing instrument
WO2006062379A1 (en) * 2004-12-11 2006-06-15 Macron Co., Ltd. Apparatus for inspecting backlight unit
JP2007206550A (en) * 2006-02-03 2007-08-16 Toshiba Corp Defective pixel correcting device for liquid crystal panel
KR100766394B1 (en) * 2006-07-25 2007-10-12 주식회사 브이원텍 Auto denting test equipment
KR101043170B1 (en) * 2008-12-30 2011-06-20 와이즈플래닛(주) coordinate acquisition system possible acquisition of defect-coordinate and thereof.
KR20100097999A (en) * 2009-02-27 2010-09-06 엘지디스플레이 주식회사 Apparatus for inspecting back light unit and method thereof
JP2018515747A (en) * 2015-06-03 2018-06-14 ローデンシュトック ゲーエムベーハー Method and apparatus for determining surface data and / or measurement data relating to the surface of an at least partly transparent object
US10337953B2 (en) 2015-06-03 2019-07-02 Rodenstock Gmbh Method and apparatus for determining surface data and/or measurement data relating to a surface of an at least partially transparent object

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