JPH0566381A - Gloss detection device - Google Patents

Gloss detection device

Info

Publication number
JPH0566381A
JPH0566381A JP25852691A JP25852691A JPH0566381A JP H0566381 A JPH0566381 A JP H0566381A JP 25852691 A JP25852691 A JP 25852691A JP 25852691 A JP25852691 A JP 25852691A JP H0566381 A JPH0566381 A JP H0566381A
Authority
JP
Japan
Prior art keywords
liquid crystal
light
image
gloss
polarization
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP25852691A
Other languages
Japanese (ja)
Inventor
Seiichi Fukuda
清一 福田
Tomohiro Yonezawa
友浩 米沢
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Optical Co Ltd filed Critical Olympus Optical Co Ltd
Priority to JP25852691A priority Critical patent/JPH0566381A/en
Publication of JPH0566381A publication Critical patent/JPH0566381A/en
Withdrawn legal-status Critical Current

Links

Abstract

PURPOSE:To detect the degree of gloss on the surface of an object without requiring the adjustment of the thickness and the fitting rotation angle of components corresponding to the variation of a reflecting angle caused by the solid shape of the surface of the object. CONSTITUTION:An irradiating light source 1 for natural light, a collimator lens 2, a polarizer 3 which forms incident light 4 in a linearly polarized state, an analyzer 8 which detects the component of a specified polarized direction in the linearly or the elliptically polarized state of light 6 reflected from the surface of the object 5, an image sensor 10 which detects the image of the reflected light 6 formed by an image forming lens 9, a liquid crystal device 7 which is inserted between the object 5 and the polarizer 3 or the analyzer 8 and which rotates the polarization of the incident light 4 or the reflected light 6, a display device 11 and a gloss detection image processor 12 which are provided on the output side of the sensor 10 and a liquid crystal device driving circuit 13 which is connected between the processor 12 and the device 7 are provided.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、物体表面の外観を検査
する装置に係わり、特に、金属光沢を呈する面などを有
する物体表面の光沢の程度を検出する光沢検査装置に関
するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus for inspecting the appearance of an object surface, and more particularly to a gloss inspection apparatus for detecting the degree of gloss of an object surface having a surface exhibiting metallic luster.

【0002】[0002]

【従来の技術】従来の金属光沢表面を有する物体表面の
外観を検出する装置としては特開昭61−31909号
公報に記載されている立体形状検出装置があり、この装
置は図9に示すように、対象物5上にスリット状の楕円
偏光を照射する偏光レーザ101、波長板102および
シリンドリカルレンズ104から成る楕円偏光光源と、
対象物5上に発生するスリット状の輝線105を上記照
射方向とは異なる方向において特定の偏光成分のみの、
対象物5の断面形状を検出する偏光板8および2次元画
像検出器10から成る画像検出器とから構成されてい
る。
2. Description of the Related Art As a conventional device for detecting the appearance of the surface of an object having a metallic luster surface, there is a three-dimensional shape detecting device described in Japanese Patent Laid-Open No. 61-31909, and this device is shown in FIG. And an elliptically polarized light source comprising a polarized laser 101 for irradiating the object 5 with slit-shaped elliptically polarized light, a wave plate 102 and a cylindrical lens 104,
The slit-shaped bright line 105 generated on the target object 5 has only a specific polarization component in a direction different from the irradiation direction,
It is composed of a polarizing plate 8 for detecting the sectional shape of the object 5 and an image detector including a two-dimensional image detector 10.

【0003】この装置は、光切断法を用い、スリット光
を偏光レーザ101の取付け回転角γと波長板102の
厚さtまたは取り付け回転角αの調整により楕円偏光状
態とし、偏光板8の取付け回転角βとの調整によりスリ
ット輝線の特定の方向の偏光成分のみを検出することに
よって、金属光沢面からの反射光量を低く抑さえて安定
な光切断線の検出を行い得るようにしている。
This device uses the light cutting method to make slit light into an elliptically polarized state by adjusting the attachment rotation angle γ of the polarization laser 101 and the thickness t of the wavelength plate 102 or the attachment rotation angle α, and the polarization plate 8 is attached. By detecting only the polarization component of the slit bright line in a specific direction by adjusting the rotation angle β, the amount of light reflected from the metallic glossy surface can be suppressed to a low level and stable detection of the light cutting line can be performed.

【0004】[0004]

【発明が解決しようとする課題】かかる従来の方法は、
対象物の表面が金属光沢面などの光沢面を含む場合にも
金属光沢面からの正反射成分を低く抑えて光沢の影響を
抑止し正確な立体形状を安定に検出することができる
が、対象物の表面の金属光沢面からの正反射成分の光量
を主に検出して光沢の程度を検出するためのものではな
い。さらに、入射光を楕円偏光状態とし、特定の方向の
偏光成分のみ検出することにより金属光沢面の正反射成
分の光量を低く抑えて乱反射成分を主に検出するため
に、波長板の厚さまたは取付け回転角と、偏光レーザの
取付け回転角と、偏光板の取付け回転角等とを調整する
必要があり、特に対象物表面の立体形状が異なる場合、
それに応じて反射角が相違し偏光成分の方向も異なるた
め、立体形状に応じて容易でない先の調整をその都度行
わなう必要がある。従って、従来の手段では反射角が異
なる立体形状の対象物の表面には満足な機能を呈さな
い。
SUMMARY OF THE INVENTION Such a conventional method is as follows.
Even when the surface of the target object includes a glossy surface such as a metallic glossy surface, the specular reflection component from the metallic glossy surface can be suppressed to a low level to suppress the effect of gloss and to accurately detect a three-dimensional shape. It is not for detecting the degree of gloss by mainly detecting the light amount of the specular reflection component from the metallic glossy surface of the object. Furthermore, the incident light is made into an elliptically polarized state, and by detecting only the polarized component in a specific direction, the light amount of the specular reflection component of the metallic glossy surface is suppressed to a low level, and the diffuse reflection component is mainly detected. It is necessary to adjust the mounting rotation angle, the polarization laser mounting rotation angle, the polarizing plate mounting rotation angle, etc., especially when the three-dimensional shape of the object surface is different,
Since the reflection angle is different and the direction of the polarization component is also different accordingly, it is necessary to perform the above-mentioned adjustment which is not easy depending on the three-dimensional shape. Therefore, the conventional means does not exhibit a satisfactory function on the surface of a three-dimensional object having different reflection angles.

【0005】本発明の目的は、対象物表面の立体形状に
よる反射角の変化に応じた構成部品の厚さ及び取付け回
転角の調整を必要とすることなく、金属光沢を呈する面
などを有する物体表面の光沢の程度を検出し得、しか
も、光沢の影響の抑止を必要とする外観検査装置に利用
し得る光沢検出装置を提供せんとするものである。
An object of the present invention is to provide an object having a surface exhibiting a metallic luster, etc. without the need to adjust the thickness of the component and the mounting rotation angle according to the change of the reflection angle due to the three-dimensional shape of the object surface. An object of the present invention is to provide a gloss detecting device that can detect the degree of gloss of the surface and can be used in an appearance inspection device that needs to suppress the influence of gloss.

【0006】[0006]

【課題を解決するための手段】本発明光沢検出装置は、
自然光照射光源と、コリメータレンズと、直線偏光状態
の入射光を形成する偏光子と、この直線偏光状態の入射
光を対象物に入射してその表面からの反射光の、直線偏
光状態あるいは楕円偏光状態の特定の偏光方向成分を検
出する検光子と、前記反射光の光路内に設けられた結像
レンズと、この結像レンズによる結像を検出するイメー
ジセンサと、前記対象物および偏光子または検光子間に
挿入され前記入射光または反射光の偏光を回転させる、
通常のディスプレイに用いられる液晶表示デバイス(L
CD)における一体構造の偏光子および検光子を取り除
いた構成の液晶デバイスと、前記イメージセンサの出力
側に設けられた表示装置および光沢検出画像処理装置
と、この光沢検出画像処理装置および前記液晶デバイス
間に接続された液晶デバイス駆動回路とを具備すること
を特徴とする。
The gloss detection device of the present invention comprises:
A natural light irradiation light source, a collimator lens, a polarizer that forms incident light in a linearly polarized state, and a linearly polarized state or an elliptically polarized light of the reflected light from the surface when the incident light in this linearly polarized state is incident on an object. An analyzer for detecting a specific polarization direction component of the state, an imaging lens provided in the optical path of the reflected light, an image sensor for detecting imaging by the imaging lens, the object and the polarizer, or Inserted between analyzers to rotate the polarization of the incident or reflected light,
Liquid crystal display device (L
CD), a liquid crystal device having a structure in which the polarizer and the analyzer are removed, a display device and a gloss detection image processing device provided on the output side of the image sensor, the gloss detection image processing device and the liquid crystal device And a liquid crystal device drive circuit connected between them.

【0007】前記目的を達成するための構成は、直線偏
光状態の入射光を形成する光源として、自然光を照射す
る光源1と、コリメータレンズ2と、偏光子3とを設
け、一方では対象物5の表面からの反射光の、直線偏光
状態あるいは楕円偏光状態の特定の偏光方向成分を検出
する検光子8を対象物5の反射光路に挿入し、この反射
光を入射光の照射方向と異なる方向において結像レンズ
9により結像させてこの結像を検出するイメージセンサ
10を前記反射光路に配置し、入射光または反射光の偏
光を回転させる、通常ディスプレイに用いられる液晶表
示デバイス(LCD)7における一体構造の偏光子およ
び検光子を取り除いた液晶デバイス7を前記対象物5と
偏光子3または検光子8との間に挿入する。検光子8と
イメージセンサ10あるいは液晶デバイス7とは対象物
5の表面からの正反射成分が確実に受光できる位置に配
置する。また液晶デバイス7にはこのデバイスを駆動す
るための液晶デバイス駆動回路13を接続し、さらに、
イメージセンサ10の出力側には表示装置11と光沢検
出画像処理装置12とを接続し、この光沢検出画像処理
装置12を液晶デバイス駆動回路13の入力側にも接続
する。
The structure for achieving the above-mentioned object is provided with a light source 1 for irradiating natural light, a collimator lens 2, and a polarizer 3 as a light source for forming incident light in a linearly polarized state, while one of the object 5 is provided. An analyzer 8 for detecting a specific polarization direction component of the linearly polarized state or the elliptically polarized state of the reflected light from the surface of is inserted into the reflected light path of the object 5, and the reflected light is directed in a direction different from the irradiation direction of the incident light. A liquid crystal display device (LCD) 7 normally used for a display in which an image sensor 10 for forming an image by an image forming lens 9 and detecting the image formation is arranged in the reflected light path to rotate the polarization of incident light or reflected light. The liquid crystal device 7 from which the polarizer and the analyzer having the integral structure in (1) are removed is inserted between the object 5 and the polarizer 3 or the analyzer 8. The analyzer 8 and the image sensor 10 or the liquid crystal device 7 are arranged at positions where the specular reflection component from the surface of the object 5 can be reliably received. Further, a liquid crystal device drive circuit 13 for driving this device is connected to the liquid crystal device 7, and further,
The display device 11 and the gloss detection image processing device 12 are connected to the output side of the image sensor 10, and the gloss detection image processing device 12 is also connected to the input side of the liquid crystal device drive circuit 13.

【0008】[0008]

【作用】前記光沢検出装置は、液晶デバイス7の駆動オ
ン/オフによりこれを通過する直線偏光状態あるいは楕
円偏光状態の反射光または入射光の偏光の保持と偏光の
90°回転とを行い、反射光の特定方向の偏光成分のみ
を通す検光子8とイメージセンサ10とによりこの特定
方向の偏光成分を検出することで、反射光の特定方向の
偏光成分とこの方向に対し直角方向の偏光成分とが主と
なる対象物の画像を検出し、この二つの検出画像を比較
し、両画像の光量を得ることにより、光沢の程度の検出
を行うと共に光沢の影響を低く抑えた画像を得ることが
できる。
The gloss detecting apparatus retains the polarization of the reflected light or the incident light passing through the liquid crystal device 7 in the linearly polarized state or the elliptically polarized state and rotating the polarized light by 90 ° by turning the liquid crystal device 7 on / off. By detecting the polarization component in the specific direction by the analyzer 8 and the image sensor 10 that pass only the polarization component in the specific direction of the light, the polarization component in the specific direction of the reflected light and the polarization component in the direction orthogonal to this direction are detected. Detects the image of the main object, compares the two detected images, and obtains the light intensity of both images to detect the degree of gloss and obtain an image with the influence of gloss suppressed to a low level. it can.

【0009】[0009]

【実施例】【Example】

(第1実施例) (構成):図1は本発明による一実施例の構成を示す斜
視ブロック図、図2は図1の液晶デバイス7の詳細を示
す構造図および動作説明図で、(a)は無電界時の動
作、(b)は無電界時のデバイスを通過する偏光した光
の状態、(c)は電界印加時の動作、(d)は電界印加
時のデバイスを通過する偏光した光の状態をそれぞれ示
し、図3は図1の光沢検出画像処理装置12の詳細を示
すブロック回路図である。
(First Embodiment) (Structure): FIG. 1 is a perspective block diagram showing the structure of an embodiment according to the present invention, and FIG. 2 is a structural diagram and an operation explanatory diagram showing details of the liquid crystal device 7 of FIG. ) Is the operation under no electric field, (b) is the state of polarized light passing through the device under no electric field, (c) is the operation under electric field application, (d) is the polarized light passing through the device under electric field application FIG. 3 is a block circuit diagram showing details of the gloss detection image processing device 12 of FIG. 1 respectively showing the states of light.

【0010】図1において、直線偏光状態の入射光4を
形成する光源1とコリメータレンズ2と偏光子3とを設
ける。光源1としては面光源およびスポット光源並びに
スリット光源等を用いることができる。一方で対象物5
(表面実装部品など)の表面からの直線あるいはだ円偏
光状態の反射光6の偏光を回転させる液晶デバイス7
と、この偏光の回転が生じた反射光の特定の偏光方向成
分を検出する検光子8とを対象物5の反射光路内に挿入
し、この反射光6を入射光4の照射方向と異なる方向に
おいて結像レンズ9により結像させ、この結像を検出す
るイメージセンサ10を反射光路内に配置する。これら
液晶デバイス7、検光子8およびイメージセンサ10は
対象物5の表面からの正反射成分が確実に受光できる位
置に配置させるようにする。
In FIG. 1, a light source 1 for forming incident light 4 in a linearly polarized state, a collimator lens 2 and a polarizer 3 are provided. As the light source 1, a surface light source, a spot light source, a slit light source, or the like can be used. On the other hand, object 5
Liquid crystal device 7 for rotating the polarization of reflected light 6 in a linear or elliptical polarization state from the surface (such as surface mount parts)
And an analyzer 8 for detecting a specific polarization direction component of the reflected light in which the rotation of the polarization has occurred are inserted in the reflected light path of the object 5, and the reflected light 6 is directed in a direction different from the irradiation direction of the incident light 4. An image is formed by the image forming lens 9 and an image sensor 10 for detecting this image formation is arranged in the reflected light path. The liquid crystal device 7, the analyzer 8 and the image sensor 10 are arranged at positions where the specular reflection component from the surface of the object 5 can be reliably received.

【0011】液晶デバイス7は図2(a)に示すような
通常ディスプレイに用いられる液晶表示デバイス(LC
D)における一体構造の偏光子および検光子を取り除い
た構成とし、液晶のねじれ角すなわち偏光の回転が90
°の電界効果型のTN形等の液晶を用いることができ
る。
The liquid crystal device 7 is a liquid crystal display device (LC) used for a normal display as shown in FIG.
The configuration is such that the polarizer and the analyzer of the integral structure in D) are removed, and the twist angle of the liquid crystal, that is, the rotation of the polarized light is 90%.
A liquid crystal such as a TN type field-effect type liquid crystal can be used.

【0012】即ち、図2(a)に示すように、本例で用
いる液晶デバイス7は2枚の透明基板21を設け、その
の内側に透明電極22をそれぞれ接着し、これら透明電
極22にそれぞれ液晶分子配向層23を被着し、これら
液晶分子配向層23の両端にシール材26を設けて空所
を設け、この空所内に液晶分子25を含有する液晶を充
てんして形成した液晶層24を設けて構成し、電極22
間に交流電源29を接続して電界を印加し得るようにす
る。
That is, as shown in FIG. 2 (a), the liquid crystal device 7 used in this example is provided with two transparent substrates 21, transparent electrodes 22 are adhered inside the transparent substrates 21, respectively. A liquid crystal layer 24 formed by applying a liquid crystal molecule alignment layer 23, providing a sealing material 26 at both ends of the liquid crystal molecule alignment layer 23 to provide a space, and filling the space with a liquid crystal containing liquid crystal molecules 25. The electrode 22
An AC power supply 29 is connected between them so that an electric field can be applied.

【0013】また、イメージセンサ10としては撮像管
または固体2次元撮像素子を用いたTVカメラ及びポジ
ションセンサ等の2次元センサのほか、リニアセンサま
たはポイントセンサを用いた1次元センサを使用するこ
とができる。
As the image sensor 10, in addition to a two-dimensional sensor such as a TV camera and a position sensor using an image pickup tube or a solid two-dimensional image pickup device, a one-dimensional sensor using a linear sensor or a point sensor can be used. it can.

【0014】また、液晶デバイス7にはこのデバイスを
駆動するための液晶デバイス駆動回路13を接続する。
さらに、イメージセンサ10の出力側にはTVモニタ等
の表示装置11と光沢検出画像処理装置12とを接続
し、この光沢検出画像処理装置12は液晶デバイス駆動
回路13の入力側にも接続する。
The liquid crystal device 7 is connected to a liquid crystal device drive circuit 13 for driving this device.
Further, a display device 11 such as a TV monitor and a gloss detection image processing device 12 are connected to the output side of the image sensor 10, and the gloss detection image processing device 12 is also connected to the input side of the liquid crystal device drive circuit 13.

【0015】前記光沢検出画像処理装置12は、図3に
示すように、この光沢検出画像処理装置12全体を制御
し各部と接続されている制御部31と、前記液晶デバイ
ス7に駆動信号を出力する液晶駆動信号発生回路32
と、前記イメージセンサ10からの出力信号を入力し画
像データを出力する画像入力回路33と、この画像デー
タを入力し格納する画像メモリ34と、この画像データ
を入力し平滑化する平滑化回路35と、平滑化された画
像データを入力する画像Aバッファメモリ36及び画像
Bバッファメモリ37と、この二つのメモリ36および
37に格納されている画像A及びBデータを入力しその
結果を出力する画像A・B間減算回路38と、この結果
を入力し抽出した光沢部を出力し比較参照データメモリ
40が接続されている光沢部抽出回路39と、この光沢
部データを入力し光沢の判定を行い判定基準データメモ
リ42が接続されている光沢判定回路41とから構成す
る。
As shown in FIG. 3, the gloss detection image processing apparatus 12 controls the entire gloss detection image processing apparatus 12 and outputs a drive signal to the control section 31 connected to each section and the liquid crystal device 7. Liquid crystal drive signal generating circuit 32
An image input circuit 33 for inputting an output signal from the image sensor 10 to output image data, an image memory 34 for inputting and storing the image data, and a smoothing circuit 35 for inputting and smoothing the image data. And an image A buffer memory 36 and an image B buffer memory 37 for inputting smoothed image data, and an image for inputting the image A and B data stored in these two memories 36 and 37 and outputting the result. The A / B subtraction circuit 38, the gloss portion extraction circuit 39 to which the result is input and the extracted gloss portion is output and the comparison reference data memory 40 is connected, and the gloss portion data is input to determine the gloss. The judgment reference data memory 42 is connected to the gloss judgment circuit 41.

【0016】(作用):図4は本発明光沢検出装置に用
いる光沢検出画像処理装置12の本実施例の動作のフロ
ーチャート図である。 図1に示すように光源からの照射光をコリメータレンズ
2で平行光とし、さらに偏光子3により直線偏光状態に
された入射光4を金属光沢面を呈する面を有する対象物
5の表面(表面実装部品の電極部またはリード、半田フ
ィレット、ランドの面など)に照射すると、前記特開昭
61−31909号公報にも開示されているように、対
象物5の表面の光沢の程度を示す反射光6の正反射成分
は、直線偏光状態あるいは楕円偏光状態となる。直線偏
光状態においては偏光方向成分とこれに直角方向の成分
とでは光量に差が生じ、楕円偏光状態においては楕円偏
光の長軸に平行の偏光成分の光量とこの長軸と直角方向
の楕円偏光の短軸に平行の偏光成分の光量とに差が生じ
ている。また、乱反射成分の各方向の偏光成分の強度ま
たは光量差は正反射成分のそれより小さい。従って、直
線あるいは楕円偏光状態の反射光6の特定方向の偏光成
分の光量とこの方向に直角方向の偏光成分の光量との差
を検出できれば、正反射成分の光量すなわち光沢の程度
を検出することができる。
(Operation): FIG. 4 is a flow chart of the operation of the present embodiment of the gloss detection image processing apparatus 12 used in the gloss detection apparatus of the present invention. As shown in FIG. 1, the collimator lens 2 collimates the light emitted from the light source, and the incident light 4 linearly polarized by the polarizer 3 has a surface that has a metallic glossy surface (the surface of the object 5). When the electrode part or the lead of the mounted component, the surface of the solder fillet, the land, etc.) is irradiated, the reflection indicating the degree of gloss of the surface of the object 5 is disclosed, as disclosed in the above-mentioned JP-A-61-31909. The specular reflection component of the light 6 becomes a linear polarization state or an elliptically polarization state. In the linear polarization state, there is a difference in the amount of light between the component in the direction of polarization and the component in the direction orthogonal thereto.In the state of elliptically polarized light, the amount of light in the polarization component parallel to the major axis of elliptically polarized light and the elliptically polarized light in the direction orthogonal to this major axis. There is a difference in the amount of light of the polarized component parallel to the short axis of. Further, the intensity or the light amount difference of the polarization component of each direction of the irregular reflection component is smaller than that of the regular reflection component. Therefore, if it is possible to detect the difference between the light amount of the polarized component of the reflected light 6 in the linear or elliptically polarized state in the specific direction and the light amount of the polarized component of the direction orthogonal to this direction, it is possible to detect the light amount of the specular reflected component, that is, the degree of gloss. You can

【0017】液晶デバイス7は図2(a)および図2
(c)に示すように入射光側の液晶分子配向層23のラ
ビング方向と出射光側の液晶分子配向層23のラビング
方向が直交している場合液晶層43のねじれ角は90°
となり、図2(b)に示すように無電界の場合偏光した
入射光27はその偏波面を90°回転させる、すなわ
ち、偏光の90°回転が起こり、また、図2dに示すよ
うに電界印加すなわち液晶を駆動させた場合偏光に対し
て何も作用せず偏光状態を保持したまま光は通過する。
即ち、液晶デバイス7の駆動のオン/オフによりこれを
通過する直線偏光状態あるいは楕円偏光状態の反射光6
の偏光の保持と偏光の90°回転を行い、反射光6の特
定方向の偏光成分のみを透す検光子8とイメージセンサ
10によりこれを検出することで、反射光6の特定方向
の偏光成分とこの方向と直角方向の偏光成分が主となる
対象物5の画像を検出する。検出された画像は光沢検出
画像処理装置12により図4に示す動作フローに基づい
て処理され、対象物5表面の光沢の程度を検出する。
The liquid crystal device 7 is shown in FIGS.
As shown in (c), when the rubbing direction of the liquid crystal molecular alignment layer 23 on the incident light side is orthogonal to the rubbing direction of the liquid crystal molecular alignment layer 23 on the outgoing light side, the twist angle of the liquid crystal layer 43 is 90 °.
In the case of no electric field as shown in FIG. 2 (b), the polarized incident light 27 rotates its plane of polarization by 90 °, that is, 90 ° rotation of polarized light occurs, and as shown in FIG. That is, when the liquid crystal is driven, nothing acts on the polarized light, and the light passes while maintaining the polarized state.
That is, when the liquid crystal device 7 is turned on / off, the reflected light 6 passing through the liquid crystal device 7 is in a linearly polarized state or an elliptically polarized state.
The polarized light component of the reflected light 6 in the specific direction is detected by the analyzer 8 and the image sensor 10 which retain the polarized light and rotate the polarized light by 90 ° and transmit only the polarized light component of the reflected light 6 in the specific direction. Then, the image of the object 5 whose polarization component in the direction perpendicular to this direction is the main is detected. The detected image is processed by the gloss detection image processing device 12 based on the operation flow shown in FIG. 4, and the degree of gloss of the surface of the object 5 is detected.

【0018】制御部31はまず液晶デバイス7の駆動オ
ン指令を液晶駆動信号発生回路32に送り、液晶駆動信
号発生回路32により液晶駆動信号を液晶デバイス駆動
回路13に出力して液晶デバイス7をオン状態とする。
このとき反射光6の偏光保持状態の画像をイメージセン
サ10で検出し、画像入力回路33を介して画像メモリ
34に取込む。かくして取込んだ画像は平滑化回路35
に供給し、ここで乱反射成分などの影響による雑音を除
去するため平滑化し、その後画像Aバッファメモリ36
に格納する(以下この格納された画像を画像Aと称す
る)。次に液晶デバイス7をオフ状態とし、この時の反
射光6の偏光が90°回転状態にある平滑化された画像
(以下画像Bと称する)を同様に画像Bバッファメモリ
37に格納する。
The control section 31 first sends a drive-on command for the liquid crystal device 7 to the liquid crystal drive signal generation circuit 32, and the liquid crystal drive signal generation circuit 32 outputs a liquid crystal drive signal to the liquid crystal device drive circuit 13 to turn on the liquid crystal device 7. State.
At this time, the image of the polarization maintaining state of the reflected light 6 is detected by the image sensor 10 and is taken into the image memory 34 via the image input circuit 33. The image thus captured is smoothed by the smoothing circuit 35.
To the image A buffer memory 36, and smoothing is performed to remove noise due to the influence of diffuse reflection components.
(The image stored in this manner will be referred to as image A hereinafter). Next, the liquid crystal device 7 is turned off, and a smoothed image (hereinafter referred to as image B) in which the polarization of the reflected light 6 is rotated by 90 ° at this time is similarly stored in the image B buffer memory 37.

【0019】画像A・B間減算回路38は画像Aと画像
Bとのヒストグラム等により濃度値の大きい画素数を得
てその多少を比較し、画像Aの画素数が画像Bの画素数
よりも多い場合には対応する画素毎に画像Bの濃度値を
減算し、逆に画像Bの画素数が画像Aの画素数よりも多
い場合には画像Bの画素数から画像Aの画素数を減算し
光沢部抽出回路39にこの画像間減算結果の画像を出力
する。ここで、画像Aおよび画像Bの濃度値の大きい画
素数の多少の比較によって画像Aおよび画像Bの光量差
を得ているので、画像Aの画素数と画像Bの画素数とが
ほぼ等しい場合光沢が無いものと判定する。光沢部抽出
回路39はこの減算結果の画像を例えば2値化のように
比較参照データメモリ40内のデータと比較して光沢部
抽出画像を得る。光沢判定回路41は例えばパターンマ
ッチング法のように判定基準データメモリ42内のデー
タとこの光沢部抽出画像データとをマッチングし光沢の
程度を判定し検出する。
The subtraction circuit 38 between the images A and B obtains the number of pixels having a large density value from the histograms of the images A and B and compares them, and the number of pixels of the image A is larger than that of the image B. If the number is large, the density value of the image B is subtracted for each corresponding pixel. Conversely, if the number of pixels of the image B is larger than the number of pixels of the image A, the number of pixels of the image A is subtracted from the number of pixels of the image B. Then, the image resulting from the inter-image subtraction is output to the glossy portion extraction circuit 39. Here, since the light amount difference between the image A and the image B is obtained by comparing the number of pixels having large density values of the image A and the image B, the number of pixels of the image A and the number of pixels of the image B are almost equal. It is determined that it is not glossy. The glossy portion extraction circuit 39 compares the image of the subtraction result with the data in the comparison reference data memory 40, such as binarization, to obtain the glossy portion extracted image. The gloss determination circuit 41 matches the data in the determination reference data memory 42 with the gloss portion extraction image data by using the pattern matching method, and determines and detects the degree of gloss.

【0020】なお、上述した例では入射光を直線偏光と
し反射光に直線偏光状態あるいは楕円偏光状態を得て光
沢の程度の検出を実施したが、反射光が直線偏光となる
ように入射光を楕円偏光としても上述した所と同様の結
果を得ることができる。
In the above example, the incident light is linearly polarized and the reflected light is linearly polarized or elliptically polarized to detect the degree of gloss, but the incident light is changed so that the reflected light is linearly polarized. With elliptically polarized light, the same result as described above can be obtained.

【0021】(第2実施例)次に、本発明光沢検出装置
の第2実施例を図5により説明する。本実施例は第1実
施例と以下の点のみが異なるものとし、その他の点は上
記実施例と同様であるのでその詳細な説明は省略する。 (構成):図5は第2実施例に用いる図1の液晶デバイ
ス7の詳細を示す構造図及び動作説明図で(a)は無電
界時の動作、(b)は無電界印加時のデバイスを通過す
る偏光した光の状態、(c)は各セル51および52に
対する電界印加時の動作、(d)は各セル51および5
2に対する電界印加時のデバイスを通過する偏光した光
の状態、(e)は両セル51および52に対する電界印
加時の動作、(f)は両セル51および52に対する電
界印加時のデバイスを通過する偏光した光の状態であ
る。
(Second Embodiment) Next, a second embodiment of the gloss detecting device of the present invention will be described with reference to FIG. The present embodiment is different from the first embodiment only in the following points, and the other points are the same as the above-mentioned embodiments, and thus detailed description thereof will be omitted. (Structure): FIG. 5 is a structural diagram and an operation explanatory diagram showing details of the liquid crystal device 7 of FIG. 1 used in the second embodiment. (A) is an operation when no electric field is applied, and (b) is a device when no electric field is applied. State of polarized light passing through the cells, (c) operation when electric field is applied to the cells 51 and 52, (d) cells 51 and 5
2, the state of polarized light passing through the device when an electric field is applied, (e) the operation when an electric field is applied to both cells 51 and 52, and (f) the device when an electric field is applied to both cells 51 and 52. It is the state of polarized light.

【0022】液晶デバイス7は、図5(a)に示すよう
に、通常のディスプレイに用いられる液晶表示デバイス
(LCD)における一体構造の偏光子および検光子を取
り除いた構成とし、液晶のねじれ角すなわち偏光の回転
が90°のπ/2セル51と偏光の回転が240°の4
π/3セル52とを組合わせたものであり、π/2セル
51としては電界効果型のTN形等の液晶を用い、4π
/3セル52としては電界効果型のSTN方式等の液晶
を用いることができる。これら液晶セルの構成の詳細な
説明は第1実施例で説明したものと同様であるため省略
する。
As shown in FIG. 5A, the liquid crystal device 7 has a structure in which a polarizer and an analyzer having an integral structure in a liquid crystal display device (LCD) used for an ordinary display are removed, and the twist angle of the liquid crystal, that is, Polarization rotation 90 ° for π / 2 cell 51 and polarization rotation 240 ° for 4
This is a combination of a π / 3 cell 52, and as the π / 2 cell 51, a field effect type TN liquid crystal or the like is used.
As the / 3 cell 52, a liquid crystal of a field effect type STN system or the like can be used. The detailed description of the structure of these liquid crystal cells is the same as that described in the first embodiment, and will be omitted.

【0023】(作用):図6は本実施例における光沢検
出装置に用いる光沢検出画像処理装置12の動作のフロ
ーチャート図である。
(Operation): FIG. 6 is a flow chart showing the operation of the gloss detection image processing apparatus 12 used in the gloss detection apparatus of this embodiment.

【0024】対象物5の表面からの反射光6の偏光方向
と検光子8が検出する偏光方向とのなす角度が45°の
場合、反射光6の検光子8による検出方向の偏光成分と
この方向と直角方向の偏光成分との光量差は検出されな
い。本実施例の液晶デバイス7は図5に示すようにπ/
2セル51は入射光側の液晶分子配向層23Aのラビン
グ方向と出射光側の液晶分子配向層23Aのラビング方
向とが直交しているので液晶層24Aのねじれ角は90
°となり、図5(a)および図5(b)に示すように無
電界の場合偏光した入射光27はその偏波面を90°回
転し、即ち、偏光の90°回転がおこり、図5(c)お
よび図5(d)に示すように電界印加すなわちこのセル
51を駆動させた場合偏光に対して何も作用せず偏光状
態を保持したまま光は通過する。
When the angle between the polarization direction of the reflected light 6 from the surface of the object 5 and the polarization direction detected by the analyzer 8 is 45 °, the polarization component of the reflected light 6 in the detection direction of the analyzer 8 and this The difference in the amount of light between the polarized components in the direction perpendicular to the direction is not detected. As shown in FIG. 5, the liquid crystal device 7 of the present embodiment has π /
In the 2 cell 51, the rubbing direction of the liquid crystal molecular alignment layer 23A on the incident light side and the rubbing direction of the liquid crystal molecular alignment layer 23A on the outgoing light side are orthogonal to each other, so that the twist angle of the liquid crystal layer 24A is 90.
5 (a) and FIG. 5 (b), the incident light 27 polarized in the case of no electric field rotates its plane of polarization by 90 °, that is, the polarized light rotates by 90 °. As shown in FIG. 5C and FIG. 5D, when an electric field is applied, that is, when this cell 51 is driven, nothing acts on the polarized light, and the light passes while maintaining the polarized state.

【0025】また、4π/3セル52は入射光側の液晶
分子配向層23Bのラビング方向と出射光側の液晶分子
配向層23Bのラビング方向が240°を成しているの
で液晶層24Bのねじれ角は240°となり、図5
(a)および図5(b)に示すように無電界の場合偏光
した入射光はその偏波面を240°回転させる、すなわ
ち、偏光の240°回転が起こり、図5(c)および図
5(d)に示すように電界印加すなわちこのセル52を
駆動させた場合偏光に対して何も作用せず偏光状態を保
持したまま光は通過する。
Further, in the 4π / 3 cell 52, since the rubbing direction of the liquid crystal molecule alignment layer 23B on the incident light side and the rubbing direction of the liquid crystal molecule alignment layer 23B on the outgoing light side are 240 °, the twist of the liquid crystal layer 24B is twisted. The angle is 240 °, as shown in Fig. 5.
In the case of no electric field as shown in (a) and FIG. 5 (b), the incident light that is polarized rotates its plane of polarization by 240 °, that is, the polarization is rotated by 240 °, and FIGS. As shown in d), when an electric field is applied, that is, when the cell 52 is driven, nothing acts on the polarized light and the light passes while maintaining the polarized state.

【0026】液晶デバイス7の各セル51、52の駆動
のオン/オフによりこれを通過する楕円偏光状態の反射
光6の偏光の保持と偏光の90°回転及び240°回転
とを行い、反射光6の特定方向の偏光成分のみを通す検
光子8とイメージセンサ10とによりこれを検出するこ
とにより、図6に示す動作フローに従って、まず、反射
光6の特定方向の偏光成分とこの方向と直角方向の偏光
成分が対象物5の検出画像により光沢の程度の検出結果
が無光沢の場合の検出、次いで、反射光6の特定方向の
偏光成分とこの方向と240°方向の偏光成分が主とな
る対象物5の検出画像により光沢の程度の検出を行う。
By turning on / off the driving of the cells 51 and 52 of the liquid crystal device 7, the polarization of the reflected light 6 passing through the cells 51 and 52 is maintained, and the polarized light is rotated by 90 ° and 240 °. 6 is detected by the analyzer 8 and the image sensor 10 which pass only the polarization component of the specific direction 6, the polarization component of the reflected light 6 in the specific direction and the right angle to this direction according to the operation flow shown in FIG. The polarization component in the direction is detected when the detection result of the degree of gloss is matte according to the detection image of the object 5, and then the polarization component in the specific direction of the reflected light 6 and the polarization component in this direction and the 240 ° direction are mainly The degree of gloss is detected from the detected image of the target object 5.

【0027】(効果):前記作用により対象物5の表面
からの反射光6の偏光方向と検光子8が検出する偏光方
向の成す角度が45°の場合、対象物5表面の光沢の程
度が検出できる。
(Effect): When the angle between the polarization direction of the reflected light 6 from the surface of the object 5 and the polarization direction detected by the analyzer 8 is 45 ° due to the above action, the degree of gloss of the surface of the object 5 is Can be detected.

【0028】(第3実施例)次に、本発明光沢検出装置
の第3実施例を図7により説明する。本実施例は第1実
施例と以下の点で異なるがその他の点は第1実施例と同
様であるため、その詳細な説明は省略する。 (構成):図7は本発明による第3実施例の構成を示す
斜視図である。 図7に示すように、本例では、自然光を照射する光源1
と、コリメータレンズ2と、偏光子3とから成る直線偏
光状態または楕円偏光状態の入射光4を形成する光源
と、対象物5(表面実装部品など)との間に、直線偏光
状態または楕円偏光状態の入射光4の偏光を回転させる
液晶デバイス7を挿入する構成とする。検光子8とイメ
ージセンサ10とは対象物5の表面からの正反射成分が
確実に受光できる位置に配置する。 (作用):本実施例の作用は第1実施例につき説明した
所と同様なのでその詳細な説明は省略する。 (効果):本実施例の構成の装置を、一般に使用される
光沢検出機能の無い外観検査装置として用いる場合、液
晶デバイスの動作を行わずに、液晶デバイスの作用の影
響を受けずに使用することができる。
(Third Embodiment) Next, a third embodiment of the gloss detecting apparatus of the present invention will be described with reference to FIG. This embodiment is different from the first embodiment in the following points, but other points are the same as the first embodiment, and thus detailed description thereof will be omitted. (Structure): FIG. 7 is a perspective view showing the structure of a third embodiment according to the present invention. As shown in FIG. 7, in this example, the light source 1 that emits natural light
, A collimator lens 2, and a light source for forming incident light 4 in a linearly polarized state or an elliptically polarized state, which includes a polarizer 3, and an object 5 (such as a surface-mounted component), a linearly polarized state or an elliptically polarized state. The liquid crystal device 7 for rotating the polarization of the incident light 4 in the state is inserted. The analyzer 8 and the image sensor 10 are arranged at positions where the specular reflection component from the surface of the object 5 can be reliably received. (Operation): Since the operation of this embodiment is the same as that described in the first embodiment, its detailed description is omitted. (Effect): When the apparatus having the configuration of the present embodiment is used as a commonly used appearance inspection apparatus having no gloss detection function, it is used without operating the liquid crystal device and without being affected by the action of the liquid crystal device. be able to.

【0029】(第4実施例)次に、本発明光沢検出装置
の第4実施例を図8により説明する。本実施例は前記実
施例と以下の点で異なるものとし、その他は省略する。 (構成):本実施例の構成自体は他の実施例として同じ
なのでその説明は省略する (作用):図8は本実施例による光沢検出画像処理装置
12のフローチャート図である。
(Fourth Embodiment) Next, a fourth embodiment of the gloss detecting device of the present invention will be described with reference to FIG. This embodiment is different from the above embodiment in the following points, and the others are omitted. (Structure): Since the structure itself of this embodiment is the same as that of the other embodiments, its explanation is omitted. (Operation): FIG. 8 is a flow chart of the gloss detection image processing apparatus 12 according to this embodiment.

【0030】図8に示す動作フローに従って、直線偏光
状態あるいは楕円偏光状態の反射光6の特定方向の偏光
成分の光量と、この方向と直角方向の偏光成分の光量と
の差を比較し、光量の小さい方の偏光成分が主となる画
像を得ることにより、光沢の影響を低く抑えた画像を得
ることができる。
According to the operation flow shown in FIG. 8, the difference between the light quantity of the polarization component of the reflected light 6 in the linearly polarized state or the elliptically polarized state in the specific direction and the light quantity of the polarized component in the direction orthogonal to this direction is compared, and the light quantity is compared. It is possible to obtain an image in which the influence of the gloss is suppressed to a low level by obtaining an image in which the smaller polarized light component is mainly.

【0031】(効果):本発明の装置を光沢の影響を抑
えることが必要な外観検査装置に利用することができ
る。
(Effect): The apparatus of the present invention can be used as a visual inspection apparatus that needs to suppress the influence of gloss.

【0032】[0032]

【発明の効果】上述したように本発明によれば対象物の
表面の立体形状による反射角の変化に応じた構成部品の
厚さ及び取付け回転角等の調整を必要としないで、金属
光沢を呈する面などを有する物体の表面の光沢の程度を
検出でき、しかも、光沢の影響を抑えることが必要な外
観検査装置に利用できる光沢検出装置を提供することが
できる。
As described above, according to the present invention, a metallic luster can be obtained without adjusting the thickness of the component and the mounting rotation angle according to the change of the reflection angle due to the three-dimensional shape of the surface of the object. It is possible to provide a gloss detection device that can detect the degree of gloss of the surface of an object having a surface to be presented and can be used in a visual inspection device that needs to suppress the influence of gloss.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明光沢検出装置の一実施例の構成を示す斜
視ブロック図である。
FIG. 1 is a perspective block diagram showing the configuration of an embodiment of a gloss detection device of the present invention.

【図2】(a)は図1の液晶デバイスの構成の詳細を示
し無電界時の動作を示す構成説明図であり、(b)は図
1の液晶デバイスの無電界時のデバイスを通過する偏光
した光の状態を示す動作説明図であり、(c)は図1の
液晶デバイスの構成の詳細を示し電界印加時の動作を示
す構成説明図であり、(d)は図1の液晶デバイスの電
界印加時のデバイスを通過する偏光した光の状態を示す
動作説明図である。
2A is a configuration explanatory view showing the details of the configuration of the liquid crystal device of FIG. 1 and showing the operation in the absence of an electric field, and FIG. 2B is a diagram illustrating the liquid crystal device of FIG. 2A and 2B are operation explanatory views showing a state of polarized light, FIG. 6C is a detailed configuration view of the liquid crystal device shown in FIG. 1, and an operation when an electric field is applied, and FIG. FIG. 7 is an operation explanatory view showing a state of polarized light passing through the device when the electric field is applied.

【図3】図1の光沢検出画像処理装置の構成の詳細を示
すブロック回路図である。
FIG. 3 is a block circuit diagram showing details of the configuration of the gloss detection image processing apparatus of FIG.

【図4】本発明光沢検出装置に用いる光沢検出画像処理
装置の動作のフローチャート図である。
FIG. 4 is a flowchart of the operation of the gloss detection image processing apparatus used in the gloss detection apparatus of the present invention.

【図5】(a)は第2実施例における図1の液晶デバイ
スの各セルの構成の詳細を示し無電界時の動作を示す構
成説明図であり、(b)は第2実施例における図1の液
晶デバイスの無電界時のデバイスを通過する偏光した光
の状態を示す動作説明図であり、(c)は第2実施例に
おける図1の液晶デバイスの各セルの構成の詳細を示し
電界印加時の動作を示す構成説明図であり、(d)は第
2実施例における図1の液晶デバイスの各セルに対する
電界印加時のデバイスを通過する偏光した光の状態を示
す動作説明図であり、(e)は第2実施例における図1
の液晶デバイスの両セルの構成の詳細を示し電界印加時
の動作を示す構成説明図であり、(f)は第2実施例に
おける図1の液晶デバイスの両セルに対する電界印加時
のデバイスを通過する偏光した光の状態を示す動作説明
図である。
5A is a configuration explanatory view showing the details of the configuration of each cell of the liquid crystal device of FIG. 1 in the second embodiment and showing the operation in the absence of an electric field, and FIG. 5B is a diagram in the second embodiment. FIG. 3 is an operation explanatory view showing a state of polarized light passing through the liquid crystal device of No. 1 when there is no electric field, and (c) shows details of the configuration of each cell of the liquid crystal device of FIG. 1 in the second embodiment. FIG. 9 is a configuration explanatory diagram showing an operation at the time of application, and FIG. 7D is an operation explanatory diagram showing a state of polarized light passing through the device at the time of applying an electric field to each cell of the liquid crystal device of FIG. 1 in the second embodiment. , (E) of FIG. 1 in the second embodiment.
FIG. 6B is a structural explanatory view showing the details of the constitution of both cells of the liquid crystal device of FIG. 6A and showing the operation when an electric field is applied, and FIG. 7F is a view of passing through the device when an electric field is applied to both cells of the liquid crystal device of FIG. 1 in the second embodiment. It is an operation explanatory view showing the state of the polarized light to be.

【図6】本発明による第2実施例における光沢検出装置
に用いる光沢検出画像処理装置の動作のフローチャート
図である。
FIG. 6 is a flow chart of the operation of the gloss detection image processing apparatus used in the gloss detection apparatus according to the second embodiment of the present invention.

【図7】本発明光沢検出装置の第3実施例の構成を示す
斜視図である。
FIG. 7 is a perspective view showing the configuration of a third embodiment of the gloss detection device of the present invention.

【図8】本発明光沢検出装置の第4実施例による光沢検
出画像処理装置のフローチャート図である。
FIG. 8 is a flowchart of a gloss detection image processing device according to a fourth embodiment of the gloss detection device of the present invention.

【図9】従来の光沢検出装置の構成を示す斜視図であ
る。
FIG. 9 is a perspective view showing a configuration of a conventional gloss detection device.

【符号の説明】[Explanation of symbols]

1 光源 2 コリメータレンズ 3 偏光子 4 入射光 5 対象物 6 反射光 7 液晶デバイス 8 検光子 9 結像レンズ 10 イメージセンサ 11 表示装置 12 構成検出画像処理装置 13 液晶デバイス駆動回路 21 透明基板 22 電極 23 液晶分子配向層 24 液晶層 25 液晶分子 26 シール材 27 偏光された通過光 28 偏波面 29 電界印加部 31 制御部 32 液晶駆動信号発生回路 33 画像入力回路 34 画像メモリ 35 平滑化回路 26 画像Aバッファメモリ 37 画像Bバッファメモリ 38 画像A・B間減算回路 39 光沢部抽出回路 40 比較参照データメモリ 41 光沢判定回路 42 判定基準データメモリ 51 π/2セル 52 4π/3セル 102 波長板 103 レンズ 104 シリンドリカルレンズ 105 スリット輝線 106 光切断線抽出 107 欠陥検出 108 基材面 109 テーブル 110 ボールねじ 111 モータ 1 Light Source 2 Collimator Lens 3 Polarizer 4 Incident Light 5 Object 6 Reflected Light 7 Liquid Crystal Device 8 Analyzer 9 Imaging Lens 10 Image Sensor 11 Display Device 12 Configuration Detection Image Processing Device 13 Liquid Crystal Device Drive Circuit 21 Transparent Substrate 22 Electrode 23 Liquid crystal molecule alignment layer 24 Liquid crystal layer 25 Liquid crystal molecules 26 Sealing material 27 Polarized transmitted light 28 Polarization plane 29 Electric field application section 31 Control section 32 Liquid crystal drive signal generation circuit 33 Image input circuit 34 Image memory 35 Smoothing circuit 26 Image A buffer Memory 37 Image B buffer memory 38 Image A / B subtraction circuit 39 Gloss section extraction circuit 40 Comparative reference data memory 41 Gloss determination circuit 42 Judgment standard data memory 51 π / 2 cell 52 4π / 3 cell 102 Wave plate 103 Lens 104 Cylindrical Lens 105 Slit line 106 Light-section line extraction 107 Defect detection 108 Substrate surface 109 Table 110 Ball screw 111 Motor

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.5 識別記号 庁内整理番号 FI 技術表示箇所 G06F 15/62 380 9287−5L H01L 21/66 J 7013−4M H04N 7/18 B 8626−5C ─────────────────────────────────────────────────── ─── Continuation of front page (51) Int.Cl. 5 Identification number Internal reference number FI Technical display location G06F 15/62 380 9287-5L H01L 21/66 J 7013-4M H04N 7/18 B 8626-5C

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 自然光照射光源と、コリメータレンズ
と、直線偏光状態の入射光を形成する偏光子と、この直
線偏光状態の入射光を対象物に入射してその表面からの
反射光の、直線偏光状態あるいは楕円偏光状態の特定の
偏光方向成分を検出する検光子と、前記反射光の光路内
に設けられた結像レンズと、この結像レンズによる結像
を検出するイメージセンサと、前記対象物および偏光子
または検光子間に挿入され前記入射光または反射光の偏
光を回転させる、通常のディスプレイに用いられる液晶
表示デバイス(LCD)における一体構造の偏光子およ
び検光子を取り除いた構成の液晶デバイスと、前記イメ
ージセンサの出力側に設けられた表示装置および光沢検
出画像処理装置と、この光沢検出画像処理装置および前
記液晶表示デバイス間に接続された液晶デバイス駆動回
路とを具備することを特徴とする光沢検出装置。
1. A natural light irradiation light source, a collimator lens, a polarizer for forming incident light in a linearly polarized state, and a linearly reflected light from the surface of the incident light incident on the object. An analyzer for detecting a specific polarization direction component of a polarization state or an elliptically polarized state, an imaging lens provided in the optical path of the reflected light, an image sensor for detecting imaging by the imaging lens, and the target. A liquid crystal having a structure in which a polarizer and an analyzer having an integral structure in a liquid crystal display device (LCD) used in a normal display, which is inserted between an object and a polarizer or an analyzer to rotate the polarization of the incident light or the reflected light, is removed. A device, a display device and a gloss detection image processing device provided on the output side of the image sensor, and a device between the gloss detection image processing device and the liquid crystal display device. And a liquid crystal device drive circuit connected to the gloss detection device.
JP25852691A 1991-09-09 1991-09-09 Gloss detection device Withdrawn JPH0566381A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP25852691A JPH0566381A (en) 1991-09-09 1991-09-09 Gloss detection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP25852691A JPH0566381A (en) 1991-09-09 1991-09-09 Gloss detection device

Publications (1)

Publication Number Publication Date
JPH0566381A true JPH0566381A (en) 1993-03-19

Family

ID=17321439

Family Applications (1)

Application Number Title Priority Date Filing Date
JP25852691A Withdrawn JPH0566381A (en) 1991-09-09 1991-09-09 Gloss detection device

Country Status (1)

Country Link
JP (1) JPH0566381A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07103730A (en) * 1993-09-30 1995-04-18 Sumitomo Metal Mining Co Ltd Apparatus for inspecting lead frame
JP2007003221A (en) * 2005-06-21 2007-01-11 Nsd Corp Inspection method of carved letter and inspection device therefor
JP2009081649A (en) * 2007-09-26 2009-04-16 Sumitomo Electric Ind Ltd Imaging apparatus, and lens abnormality diagnosis system
CN105488782A (en) * 2014-10-06 2016-04-13 松下知识产权经营株式会社 Gloss determination device and gloss determination method
JP2021501892A (en) * 2017-11-02 2021-01-21 トルンプ フォトニック コンポーネンツ ゲゼルシャフト ミット ベシュレンクテル ハフツング Improved depth image reconstruction
US11125679B2 (en) 2019-08-16 2021-09-21 Rolls-Royce Plc Method and apparatus for analysing a component
CN113574433A (en) * 2019-03-28 2021-10-29 脸谱科技有限责任公司 Aligning a polarizing device using a spatially varying polarizing element

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07103730A (en) * 1993-09-30 1995-04-18 Sumitomo Metal Mining Co Ltd Apparatus for inspecting lead frame
JP2007003221A (en) * 2005-06-21 2007-01-11 Nsd Corp Inspection method of carved letter and inspection device therefor
JP2009081649A (en) * 2007-09-26 2009-04-16 Sumitomo Electric Ind Ltd Imaging apparatus, and lens abnormality diagnosis system
JP4650469B2 (en) * 2007-09-26 2011-03-16 住友電気工業株式会社 Imaging apparatus and lens abnormality diagnosis system
CN105488782A (en) * 2014-10-06 2016-04-13 松下知识产权经营株式会社 Gloss determination device and gloss determination method
JP2016075561A (en) * 2014-10-06 2016-05-12 パナソニックIpマネジメント株式会社 Gloss determination device and gloss determination method
US9953237B2 (en) 2014-10-06 2018-04-24 Panasonic Intellectual Property Management Co., Ltd. Gloss determination device and gloss determination method
CN105488782B (en) * 2014-10-06 2020-07-28 松下知识产权经营株式会社 Gloss determination device and gloss determination method
JP2021501892A (en) * 2017-11-02 2021-01-21 トルンプ フォトニック コンポーネンツ ゲゼルシャフト ミット ベシュレンクテル ハフツング Improved depth image reconstruction
CN113574433A (en) * 2019-03-28 2021-10-29 脸谱科技有限责任公司 Aligning a polarizing device using a spatially varying polarizing element
US11125679B2 (en) 2019-08-16 2021-09-21 Rolls-Royce Plc Method and apparatus for analysing a component

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