CN217688596U - Appearance detection device and system - Google Patents
Appearance detection device and system Download PDFInfo
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- CN217688596U CN217688596U CN202221861574.4U CN202221861574U CN217688596U CN 217688596 U CN217688596 U CN 217688596U CN 202221861574 U CN202221861574 U CN 202221861574U CN 217688596 U CN217688596 U CN 217688596U
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Abstract
The application relates to the technical field of industrial vision, in particular to an appearance detection device and system, which can solve the problem that the color of an image to be detected captured by a detection device is not uniform to a certain extent. The appearance detection device comprises a light source module and a shooting module, wherein the light source module comprises a telecentric illumination light source and a polarizer, and the telecentric illumination light source and the polarizer are sequentially arranged on an incident light path, so that light source beams emitted by the telecentric illumination light source can be irradiated on a product to be detected through the polarizer; the shooting module comprises a first telecentric lens and an analyzer; the first telecentric lens and the analyzer are sequentially arranged on the detection light path, so that the detection light beam reflected by the product to be detected can pass through the analyzer and the first telecentric lens; furthermore, the first included angle is the same as the second included angle, the first included angle is the included angle between the incident light path and the product to be detected, and the second included angle is the included angle between the detection light path and the product to be detected, so that the parallelism of the incident light beam is improved, and the parallelism of the detection light beam is improved.
Description
Technical Field
The application relates to the technical field of industrial vision, in particular to an appearance detection device and system.
Background
With the development of industrial vision, more and more products are subjected to appearance detection by industrial vision technology.
In the appearance detection of some electronic products, the appearance detection device mainly emits light irradiating the surface of a product to be detected through a light source, and then receives the light reflected by the surface of the product to be detected through a detection lens and a camera, so as to obtain an image to be detected of the surface of the product to be detected, wherein the light source is arranged around the surface of the product to be detected, and the detection lens and the camera are arranged right above the surface of the product to be detected.
However, the image to be measured captured by the appearance detection device has color unevenness, so that there is interference in appearance detection based on the image to be measured.
SUMMERY OF THE UTILITY MODEL
In order to solve the problem that the color of an image to be detected captured by a detection device is not uniform, the application provides a screen defect detection device and a system.
The embodiment of the application is realized as follows:
a first aspect of an embodiment of the present application provides an appearance detection apparatus, which includes a light source module and a shooting module.
The light source module comprises a telecentric illumination light source and a polarizer; the telecentric illumination light source and the polarizer are sequentially arranged on the incident light path, so that light source beams emitted by the telecentric illumination light source are irradiated on a product to be detected through the polarizer;
the shooting module comprises a first telecentric lens and an analyzer; the first telecentric lens and the analyzer are sequentially arranged on the detection light path, so that the detection light beam reflected by the product to be detected passes through the analyzer and the first telecentric lens;
the first included angle is the same as the second included angle, the first included angle is the included angle between the incident light path and the product to be detected, and the second included angle is the included angle between the detection light path and the product to be detected.
With reference to the first aspect, in a possible implementation manner, the light source module further includes a first wave plate, where the first wave plate is disposed on the incident light path, so that a light source beam emitted by the telecentric illumination light source is irradiated on the product to be measured through the polarizer and the first wave plate;
the shooting module further comprises a second wave plate, and the second wave plate is arranged on the detection light path so that the detection light beam reflected by the product to be detected passes through the second wave plate, the analyzer and the first telecentric lens.
With reference to the first aspect, in one possible implementation manner, the first wave plate is a quarter wave plate, and the second wave plate is a quarter wave plate.
In combination with the first aspect, in a possible implementation manner, the first included angle is 45 °, and the second included angle is 45 °.
With reference to the first aspect, in a possible implementation manner, the method further includes: the telecentric illumination light source is adjustably connected with the polarizer; the first telecentric lens is adjustably connected with the analyzer.
With reference to the first aspect, in one possible implementation manner, the polarizer includes at least one polarizer; the analyzer comprises at least one polarizer.
With reference to the first aspect, in one possible implementation manner, the telecentric illumination light source includes a point light source and a second telecentric lens, so that an incident light beam emitted by the point light source emits a parallel incident light beam through the second telecentric lens.
A second aspect of an embodiment of the present application provides an appearance detection system, including an appearance detection device, a photodetector, and a controller;
the controller is in communication connection with the photoelectric detector and the light source module of the appearance detection device;
the photoelectric detector is detachably connected with a first telecentric lens of a shooting module of the appearance detection device and is used for receiving detection light beams which sequentially pass through the analyzer and the first telecentric lens.
With reference to the second aspect, in a possible implementation manner, the system further includes an image processor, and the image processor is connected in communication with the photodetector;
the image processor is used for acquiring an image to be detected of the product to be detected and acquiring detection data of the product to be detected based on the image to be detected.
In combination with the second aspect, in one possible implementation, the photodetector is a CCD detector or a CMOS detector.
The beneficial effects of the application are that; the light source module comprises a telecentric illumination light source and a polarizer, and the telecentric illumination light source and the polarizer are sequentially arranged on an incident light path, so that light source beams emitted by the telecentric illumination light source can be irradiated on a product to be detected through the polarizer; the shooting module comprises a first telecentric lens and an analyzer; the first telecentric lens and the analyzer are sequentially arranged on the detection light path, so that the detection light beam reflected by the product to be detected can pass through the analyzer and the first telecentric lens; furthermore, the first included angle is the same as the second included angle, the first included angle is the included angle between the incident light path and the product to be detected, and the second included angle is the included angle between the detection light path and the product to be detected, so that the parallelism of the incident light beam is improved, and the parallelism of the detection light beam is improved.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly introduced below, and it is obvious that the drawings in the following description are some embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to these drawings without inventive exercise.
FIG. 1a shows a schematic top view of an appearance inspection device;
FIG. 1b shows a schematic side view of an appearance inspection device;
FIG. 2 is a schematic diagram illustrating an exemplary embodiment of an appearance inspection apparatus of the present application;
FIG. 3 illustrates a schematic diagram of linearly polarized light propagation and vibration according to an embodiment of the present application;
FIG. 4 is a schematic diagram illustrating circularly/elliptically polarized light propagation and vibration according to an embodiment of the present application;
FIG. 5 is a schematic diagram of an appearance detection system according to another embodiment of the present application;
10, the surface of an electronic product; 11-a bar light source; 12-a camera; 13-a detection lens;
110-a light source module; 111-a telecentric illumination source; 112-polarizer; 120-a shooting module; 121-a first telecentric lens; 122-an analyzer; 131-a first included angle; 132-a second angle; 140-product to be tested; 210-a photodetector; 220-controller.
Detailed Description
To make the objects, embodiments and advantages of the present application clearer, the following description of exemplary embodiments of the present application will clearly and completely describe the exemplary embodiments of the present application with reference to the accompanying drawings in the exemplary embodiments of the present application, and it is to be understood that the described exemplary embodiments are only a part of the embodiments of the present application, and not all of the embodiments.
It should be noted that the brief descriptions of the terms in the present application are only for the convenience of understanding the embodiments described below, and are not intended to limit the embodiments of the present application. These terms should be understood in their ordinary and customary meaning unless otherwise indicated.
The terms "first," "second," "third," and the like in the description and claims of this application and in the above-described drawings are used for distinguishing between similar or analogous objects or entities and not necessarily for describing a particular sequential or chronological order, unless otherwise indicated. It is to be understood that the terms so used are interchangeable under appropriate circumstances.
The terms "comprises" and "comprising," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a product or apparatus that comprises a list of elements is not necessarily limited to all elements expressly listed, but may include other elements not expressly listed or inherent to such product or apparatus.
Fig. 1a is a schematic top view and fig. 1b is a schematic side view of a conventional appearance inspection apparatus, in which bar-shaped light sources 11 are used to illuminate the appearance of an electronic product, four bar-shaped light sources 11 illuminate the electronic product from four angles, a detection lens 13 and a camera 12 receive reflected light from the electronic product, that is, the illumination light obliquely illuminates the surface 10 of the electronic product, and the detection light is detected vertically, so that diffuse reflected light on the surface of the electronic product can be detected.
The defects are generated in relation to factors such as parallelism of an illumination light source, parallelism of reflected light, angle of illumination light, polarization states of illumination light and reflected light, color unevenness occurs, and a red component is stronger than green and blue components in specific colors, so that the red screen generally shows a red-emitting characteristic.
The color unevenness in the image to be measured may be caused by the appearance of the electronic product in which color defects related to polarization appear at high frequency are reflected in the image to be measured.
In order to capture an image to be detected with uneven color, the embodiment of the application provides an appearance detection device and system, a light source module comprises a telecentric illumination light source and a polarizer, and the telecentric illumination light source and the polarizer are sequentially arranged on an incident light path, so that light source beams emitted by the telecentric illumination light source can be irradiated on a product to be detected through the polarizer; the shooting module comprises a first telecentric lens and an analyzer; the first telecentric lens and the analyzer are sequentially arranged on the detection light path, so that detection light beams reflected by the product to be detected can pass through the analyzer and the first telecentric lens; furthermore, the first included angle is the same as the second included angle, the first included angle is the included angle between the incident light path and the product to be detected, and the second included angle is the included angle between the detection light path and the product to be detected, so that the parallelism of the incident light beam is improved, the parallelism of the detection light beam is improved, and the uneven color of the detection light beam is improved.
The appearance inspection device and system according to the embodiments of the present application will be described in detail below with reference to the accompanying drawings.
Fig. 2 is a schematic structural diagram of an appearance inspection apparatus according to an embodiment of the present disclosure, and as shown in fig. 2, the appearance inspection apparatus according to the embodiment of the present disclosure includes a light source module 110 and a camera module 120.
The light source module 110 includes a telecentric illumination light source 111 and a polarizer 112; the telecentric illumination light source 111 and the polarizer 112 are sequentially arranged on the incident light path, so that the light source beam emitted by the telecentric illumination light source 111 irradiates on the product 140 to be measured through the polarizer 112.
In some embodiments, the telecentric illumination source 111 comprises a point source and a second telecentric lens such that an incident beam from the point source passes through the second telecentric lens to emit a parallel incident beam.
It should be understood that light emitted from the point light source of the telecentric illumination light source 111 passes through the second telecentric lens and then is emitted in parallel, so as to realize the effect of parallel light illumination, and passes through the polarizer 112 arranged behind the telecentric illumination light source 111, so as to adjust the polarization state of the parallel light into linearly polarized light, and irradiate the linearly polarized light onto the product 140 to be measured.
As shown in fig. 2, the photographing module 120 includes a first telecentric lens 121 and an analyzer 122; the first telecentric lens 121 and the analyzer 122 are sequentially disposed on the detection light path, so that the detection light beam reflected by the product 140 to be detected passes through the analyzer 122 and the first telecentric lens 121.
It should be understood that the probe beam reflected by the product 140 to be measured is received by the first telecentric lens 121 through the analyzer 122, and stray light is removed.
The first telecentric lens 121 and the telecentric illumination source 111 form a double telecentric system, so that too bright light spots are prevented from appearing in the main light beam.
The first included angle 131 is the same as the second included angle 132, the first included angle 131 is an included angle between the incident light path and the product 140 to be detected, and the second included angle 132 is an included angle between the detection light path and the product 140 to be detected.
For example, the first angle 131 is 45 °, the second angle 132 is 45 °, that is, the angle between the incident light path and the detection light path is a right angle.
In some embodiments, the polarizer 112 may comprise a polarizer and the analyzer 122 may comprise a polarizer.
For example, the polarizer 112 includes a first polarizer, the analyzer 122 includes a second polarizer, light emitted from the point light source of the telecentric illumination light source 111 passes through the second telecentric lens and then is emitted in parallel, so as to realize the parallel light illumination effect, and the polarization state of the parallel light is adjusted to be linearly polarized light by the first polarizer arranged behind the telecentric illumination light source 111 and then is irradiated onto the product 140 to be measured; the detection beam reflected by the product 140 to be detected passes through the second polarizer and is received by the first telecentric lens 121.
In some embodiments, the telecentric illumination source 111 and the polarizer 112 are adjustably connected; the first telecentric lens 121 is adjustably coupled to the analyzer 122.
When the light source module is arranged, a product to be detected can not be arranged at first, the angle of the polarizer can be set randomly, the polarizer is connected with the telecentric illumination light source in an adjustable mode, the first telecentric lens is connected with the analyzer in an adjustable mode, the polarizer and the analyzer are rotated, the angle of the polarizer and the angle of the analyzer are perpendicular to each other, and the effect of complete extinction can be achieved.
Then, a product to be detected is added, and the product is a polarizing device, so that the state of the detection light reflected by the product to be detected is changed, and the detection light is reflected according to the light intensity formula I = I 0 cos 2 Theta (in the formula, I) 0 Is the incident light intensity, I is the emergent light intensity I, and θ is the included angle between the incident light and the emergent light), i.e. the emergent light intensity is certainly greater than zero, therefore, the detection light beam can be received by the shooting module.
It should be understood that a light wave is an electromagnetic wave, and when propagating, the electric field intensity vector may have various vibration directions in a plane perpendicular to the propagation direction, which is called polarization of light. As shown in fig. 3, when the light propagation direction is the Z axis, the vibration direction is vertical vibration along the Y axis at this time, and no vibration is generated in the X axis direction, and a state where such vibration locus is a straight line is referred to as a linear polarization state, and light having the linear polarization state is referred to as linearly polarized light.
It should also be understood that if the vibration direction is not along the Y-axis, but is continuously rotated on the XY-plane, the light vector can be divided into circularly polarized light and elliptically polarized light according to the locus of the rotation end point.
As shown in fig. 4. The polarization states of linearly polarized light, circularly polarized light and elliptically polarized light are determined, they always vibrate in a single direction or rotate at a fixed speed, and are therefore referred to as fully polarized light, in addition to which unpolarized light and partially polarized light are present. The non-polarized light is as the name implies, the vibration state of the non-polarized light is completely uncertain, and the natural light is the non-polarized light; the superposition of partially unpolarized light on the basis of fully polarized light results in partially polarized light, the vibration direction of which is also not fixed, but is significantly more pronounced in a certain direction.
If a beam of natural light in a non-polarized state is to be changed into linearly polarized light, a common mode is to let the natural light pass through a polarizer, the principle of the polarizer is not described herein any more, and the polarizer has a direction, that is, the polarizer has a function of screening the vibration direction of any passing light beam, only the vibration component consistent with the direction of the polarizer can pass through the polarizer, and the light in other vibration directions cannot pass through the polarizer, so that the passing light beams are linearly polarized light, and the light intensity is reduced to some extent.
When a linearly polarized light passes through the polarizer, if the two directions are completely the same, no light intensity will pass through, and if the two directions are perpendicular, no light will pass through, and the light intensity is zero.
In some embodiments, the light source module further comprises a first wave plate, and the first wave plate is arranged on the incident light path, so that the light source beam emitted by the telecentric illumination light source passes through the polarizer and the first wave plate to irradiate on the product to be measured; the shooting module further comprises a second wave plate, and the second wave plate is arranged on the detection light path so that the detection light beam reflected by the product to be detected passes through the second wave plate, the analyzer and the first telecentric lens.
For example, the first wave plate is a quarter wave plate and the second wave plate is a quarter wave plate.
It should be understood that light emitted by a point light source of the telecentric illumination light source is emitted in parallel after passing through the second telecentric lens, so that the parallel light illumination effect is realized, and the light irradiates on a product to be measured through a polarizer and a quarter wave plate arranged behind the telecentric illumination light source. The detection light beam reflected by the product to be detected is received by the first telecentric lens through the quarter-wave plate and the analyzer.
When a beam of light is incident on the surface of the medium and is reflected and refracted, if the surface is not smooth, the polarization state of the beam of light can be correspondingly changed along with the incident and emergent angles; if the surface is smooth, whether the state changes is related to the angle of incidence. For smooth surfaces: when the incident light is unpolarized light, the emergent light is necessarily unpolarized light; when the incident light is linearly polarized light, the emergent light is still linearly polarized light, the vibration direction is unchanged, and the polarization state of the stray light on the non-smooth surface or outside the main light is uncertain and is regarded as non-polarized light.
The surface of the product to be tested is smooth, and the surface can be regarded as a reflection type polaroid. For a product to be detected with defects, the polarization directions of the surface of the product to be detected are uneven, so that the reflected light of different areas presents different polarization states, and the defect area can be positioned, detected or measured in a range according to the detection light (namely the intensity of the reflected light) by combining a light intensity formula.
For example, when the surface of the product to be measured is an electronic device screen, the screen itself is smooth and is considered as a reflective polarizer.
In some embodiments, the appearance detection device occupies a small detection space in industrial detection, is convenient to set in simple or complex industrial equipment, is convenient to improve the industrial detection rate of the whole industrial equipment, improves the integration level of the detection equipment, and simplifies the manufacturing process of the detection equipment for mounting on the industrial equipment.
The light source module comprises a telecentric illumination light source and a polarizer, and the telecentric illumination light source and the polarizer are sequentially arranged on an incident light path, so that light source beams emitted by the telecentric illumination light source can be irradiated on a product to be detected through the polarizer; the shooting module comprises a first telecentric lens and an analyzer; the first telecentric lens and the analyzer are sequentially arranged on the detection light path, so that the detection light beam reflected by the product to be detected can pass through the analyzer and the first telecentric lens; furthermore, the first included angle is the same as the second included angle, the first included angle is the included angle between the incident light path and the product to be detected, and the second included angle is the included angle between the detection light path and the product to be detected, so that the parallelism of the incident light beam is improved, and the parallelism of the detection light beam is improved.
Fig. 5 is a schematic structural diagram of an appearance inspection system according to an embodiment of the present application, and as shown in fig. 5, the embodiment of the present application provides an appearance inspection system including an appearance inspection device, a photodetector 210, and a controller 220.
The controller 220 is electrically connected to the photodetector 210 and the light source module of the appearance inspection apparatus.
It should be understood that the connection of the controller 220 to the photodetector 210 and the light source module may include a communication connection and may also include a power line connection.
In some embodiments, the controller 220 may be a device having a control function, a power supply function, and the like, and the device may be composed of a control chip and other chips, and the control of each module is implemented by the control chip. Or the controller 220 may be a controller that is configured with a computer device, and the implementation of each function is controlled by upper software.
In other embodiments, the controller 220 may further include an image processing function, which is used to perform image processing on the image to be detected obtained by the photodetector 210, so as to obtain an accurate image detection result.
The photoelectric detector 210 is detachably connected to a first telecentric lens of a shooting module of the appearance detection apparatus, and the photoelectric detector 210 is configured to receive a detection light beam sequentially passing through the analyzer and the first telecentric lens.
In some embodiments, the photodetector 210 is a CCD detector or a CMOS detector.
The appearance detection device comprises a light source module and a shooting module, wherein the light source module comprises a telecentric illumination light source and a polarizer; the telecentric illumination light source and the polarizer are sequentially arranged on the incident light path, so that light source beams emitted by the telecentric illumination light source are irradiated on a product to be detected through the polarizer, and the shooting module comprises a first telecentric lens and an analyzer; the first telecentric lens and the analyzer are sequentially arranged on the detection light path, so that the detection light beam reflected by the product to be detected passes through the analyzer and the first telecentric lens.
The telecentric illumination light source comprises a point light source and a second telecentric lens, so that an incident beam emitted by the point light source emits a parallel incident beam through the second telecentric lens.
It should be understood that light emitted by a point light source of the telecentric illumination light source is emitted in parallel after passing through the second telecentric lens, so that the parallel light illumination effect is realized, the polarizer arranged behind the telecentric illumination light source is used for adjusting the polarization state of the parallel light into linearly polarized light to irradiate on a product to be detected, a detection light beam reflected by the product to be detected is received by the first telecentric lens through the analyzer, and after passing through the photoelectric detector 210, the image to be detected is obtained after photoelectric conversion.
The first telecentric lens and the telecentric illumination light source form a double telecentric system, so that over-bright light spots are prevented from appearing in the main light beam.
The first included angle is the same as the second included angle, the first included angle is the included angle between the incident light path and the product to be detected, and the second included angle is the included angle between the detection light path and the product to be detected.
For example, the incident light path and the detection light path form a right angle.
The polarizer and the analyzer are introduced to ensure that the defects caused by the change of the polarization state are detected, thereby achieving the detection purposes of detecting the details to be detected and neglecting the characteristics not to be detected.
In some embodiments, the light source module further includes a first wave plate disposed in the incident light path, so that the light source beam emitted by the telecentric illumination light source irradiates the product to be measured through the polarizer and the first wave plate; the shooting module further comprises a second wave plate, and the second wave plate is arranged on the detection light path so that the detection light beam reflected by the product to be detected passes through the second wave plate, the analyzer and the first telecentric lens.
In some embodiments, the appearance detection system includes an image processor communicatively coupled to the photodetector 210.
It should be understood that when the controller 220 does not have the image processing function, an image processor may be added for obtaining the image to be tested of the product to be tested and obtaining the detection data of the product to be tested based on the image to be tested.
In some embodiments, the appearance detection system occupies a small detection space in industrial detection, is convenient to set in simple or complex industrial equipment, is convenient to improve the industrial detection rate of the whole industrial equipment, improves the integration level of the detection equipment, and simplifies the manufacturing process of the detection equipment for mounting on the industrial equipment.
The light source module in the appearance detection device comprises a telecentric illumination light source and a polarizer, and the telecentric illumination light source and the polarizer are sequentially arranged on an incident light path, so that light source beams emitted by the telecentric illumination light source can be irradiated on a product to be detected through the polarizer; the shooting module comprises a first telecentric lens and an analyzer; the first telecentric lens and the analyzer are sequentially arranged on the detection light path, so that the detection light beam reflected by the product to be detected can pass through the analyzer and the first telecentric lens; further the first included angle is the same as the second included angle, the first included angle is the included angle of an incident light path and a product to be detected, the second included angle is the included angle of a detection light path and the product to be detected, the controller is in communication connection with the photoelectric detector and the light source module of the appearance detection device, the photoelectric detector is detachably connected with the first telecentric lens of the shooting module of the appearance detection device, and the photoelectric detector is used for receiving detection light beams which sequentially pass through the polarization analyzer and the first telecentric lens. The parallelism of the incident beam is improved, and the parallelism of the probe beam is improved.
The following paragraphs will comparatively list the Chinese terms referred to in this specification and their corresponding English terms for easy reading and understanding.
The foregoing description, for purposes of explanation, has been presented in conjunction with specific embodiments. However, the foregoing discussion in some embodiments is not intended to be exhaustive or to limit the implementations to the precise forms disclosed above. Many modifications and variations are possible in light of the above teaching. The embodiments were chosen and described in order to best explain the principles and the practical application, to thereby enable others skilled in the art to best utilize the embodiments and various embodiments with various modifications as are suited to the particular use contemplated.
Claims (10)
1. An appearance inspection device, comprising:
the light source module comprises a telecentric illumination light source and a polarizer; the telecentric illumination light source and the polarizer are sequentially arranged on an incident light path, so that light source beams emitted by the telecentric illumination light source irradiate on a product to be detected through the polarizer;
the shooting module comprises a first telecentric lens and an analyzer; the first telecentric lens and the analyzer are sequentially arranged on a detection light path, so that a detection light beam reflected by the product to be detected passes through the analyzer and the first telecentric lens;
the first included angle is the same as the second included angle, the first included angle is the included angle between the incident light path and the product to be detected, and the second included angle is the included angle between the detection light path and the product to be detected.
2. The appearance detecting device according to claim 1, characterized in that:
the light source module further comprises a first wave plate, and the first wave plate is arranged on an incident light path so that a light source beam emitted by the telecentric illumination light source irradiates on a product to be measured through the polarizer and the first wave plate;
the shooting module further comprises a second wave plate, and the second wave plate is arranged on the detection light path so that the detection light beam reflected by the product to be detected passes through the second wave plate, the analyzer and the first telecentric lens.
3. The appearance inspection device according to claim 2, wherein the first wave plate is a quarter wave plate and the second wave plate is a quarter wave plate.
4. The visual inspection device of claim 1, wherein the first included angle is 45 ° and the second included angle is 45 °.
5. The appearance inspection device according to claim 1, further comprising:
the telecentric illumination light source is adjustably connected with the polarizer;
the first telecentric lens is adjustably connected with the analyzer.
6. The appearance inspection device according to claim 1 or 5, wherein the polarizer comprises at least one polarizing plate; the analyzer comprises at least one polarizer.
7. The visual inspection device of claim 1, wherein the telecentric illumination source comprises a point source and a second telecentric lens such that the incident beam from the point source passes through the second telecentric lens to emit a parallel incident beam.
8. An appearance inspection system comprising the appearance inspection apparatus according to any one of claims 1 to 7, a photodetector, and a controller;
the controller is in communication connection with the photoelectric detector and the light source module of the appearance detection device;
the photoelectric detector with the connection can be dismantled to the first telecentric mirror head of outward appearance detection device's shooting module, photoelectric detector is used for receiving the detection beam that passes through analyzer, first telecentric mirror head in proper order.
9. The appearance inspection system of claim 8, further comprising an image processor communicatively coupled to the photodetector;
the image processor is used for acquiring an image to be detected of a product to be detected and acquiring detection data of the product to be detected based on the image to be detected.
10. The appearance inspection system of claim 8, wherein the photodetector is a CCD detector or a CMOS detector.
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| CN202221861574.4U CN217688596U (en) | 2022-07-19 | 2022-07-19 | Appearance detection device and system |
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| CN202221861574.4U CN217688596U (en) | 2022-07-19 | 2022-07-19 | Appearance detection device and system |
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