JPH0622909U - Film thickness meter - Google Patents

Abstract

(57) [Summary] [Purpose] To facilitate the key operation when setting standard values. [Structure] A detection signal from a probe 1 to be brought into contact with a portion to be measured is input to a microcomputer 3. The microcomputer 3 calculates the input signal and moves the first calculated value up and down by the up and down movement keys of the keyboard 5 until it becomes a standard value. The value at that time is displayed on the display unit 4.
Next, as a result of the second standard value measurement, if the standard value is not reached, operate with the up / down movement keys until the standard value is reached. It becomes the standard value set in the first time, and it does not change to a value higher or lower. After that, the reference value is set in the microcomputer 3 by operating the same several times.

Description

[Detailed description of the device]

[0001]

[Industrial applications]

 The present invention relates to a film thickness meter for measuring the film thickness of a coating coated on a metal surface.

[0002]

[Prior art]

 For steel structures such as ships, bridges, automobiles, equipment, etc., the metal surface is painted, but it is desirable that the paint film be as uniform as possible. If the coating film thickness is less than the specified value, the coating film is likely to peel off due to changes over time, causing metal corrosion. Further, if the coating film is too thick, it is economically disadvantageous.

For the coating of the steel structure as described above, in the case of a single coating, after coating is completed, in the case of a plurality of coatings, an arbitrary plurality of locations are selected at the time when a predetermined coating is completed, and a film is formed. Use a thickness meter to measure the film thickness.

Generally, a film thickness meter is composed of a probe that is brought into close contact with a coated surface, a calculation unit that calculates a signal detected by this probe, and a display unit that displays the result calculated by this calculation unit. The film thickness meter is roughly classified into an electromagnetic type and an eddy current type. In the former electromagnetic type film thickness meter, when an AC voltage is applied to the coil containing the iron core and the tip of the iron core is brought close to the object to be measured (for example, iron) through the coating film, the tip of the iron core and the object to be measured are separated. The coil inductance changes in response to a slight change in the distance. This change is calculated by the calculation unit to measure the coating film thickness on the surface of the object to be measured. The latter eddy-current type film thickness meter uses the electrical correlation between the magnitude of the eddy current induced on the metal surface by the high-frequency electric field and the thickness of the surface film to perform surface treatment on a metal substrate other than iron. The thickness of the insulating film is measured.

[0005]

The above-mentioned film thickness meter employs a means for first calibrating with a standard thickness plate and then measuring the thickness of the coated surface. However, when calibrating with the standard thickness plate, the up and down keys of the film thickness meter must be operated so that the numerical value displayed on the display unit reaches the standard value.

This operation is extremely delicate, and it is difficult to adjust it to the standard value. If the standard value is exceeded, it must be restored by key operation. Since such a procedure is repeated about 10 times to set the standard value in the film thickness meter, there is a problem that a considerable time is required for setting and considerable skill is required. An object of the present invention is to provide a film thickness meter in which the operation of the key in the standard value setting operation is facilitated in order to solve the above problems.

[0007]

[Means for Solving the Problems]

 In order to achieve the above-mentioned object, the present invention comprises a probe to be brought into contact with a standard thickness plate and a measuring instrument main body to which a signal of the standard thickness plate detected by this probe is input. Measure the thickness of the standard thickness plate by touching the probe with, and move it up and down with the up / down movement key until the displayed value of the first measured value reaches the standard value, then move it up and down after the second time. When the displayed value reaches the standard value set in the first time by key operation, the microcomputer that calculates so that the value does not change above or below that standard value, and the display unit that displays the standard value calculated by this microcomputer And a vertical keyboard that changes the standard value displayed on this display.

[0008]

[Action]

 When the probe is brought into contact with the part to be measured, the detection signal is input from the probe to the microcomputer in the measuring instrument body. The microcomputer calculates the input signal and measures the first standard value. When inputting the standard value after the second time, if you keep pressing the up / down key, the measured value on the display will automatically become the standard value for the first time, and the measured value will rise or fall below or above it. do not do. Thus, the standard thickness plate is measured 10 times and used as the reference value.

[0009]

【Example】

 An embodiment of the present invention will be described in detail below with reference to the drawings. In FIG. 1, reference numeral 1 is a probe of an electromagnetic type or eddy current type film thickness meter that is brought into contact with the measured part, and the tip of the probe 1 measures the thickness of a standard thickness plate (standard value) as a test body. The standard value signal detected by the probe 1 is input to the microcomputer 3 of the measuring instrument body 2. When the first standard value is input, the microcomputer 3 displays this value on the display unit 4. If the value displayed on the display unit 4 is far from the preset standard value, the value is moved up and down using the up / down movement keys (not shown) of the keyboard 5 until the standard value is reached, and the values are matched.

Next, the second measurement value is input to the microcomputer 3, and the value at that time is displayed on the display unit 4. When the displayed value is lower than the first standard value, for example, the up / down movement key is used to increase the value. When the value reaches the standard value set for the first time, the display value on the display unit 4 shows the standard value for the first time, and the value does not exceed it. Therefore, the display value does not change even if the up / down movement key is continuously operated. The key operation for the third time is the same as that for the second time. If a standard value is measured 10 times and this value is input to the microcomputer 3, it can be used as a reference value when actually measuring the thickness of the coated surface.

[0011]

[Effect of device]

 According to the present invention described above, there is an advantage that the key operation in the standard value setting operation becomes easy, and no skill is required for the standard value setting operation repeated several times.

[Brief description of drawings]

FIG. 1 is a block diagram showing an embodiment of the present invention.

[Explanation of symbols]

 1 probe 2 measuring instrument body 3 microcomputer 4 display section 5 keyboard

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[Procedure amendment]

[Submission date] March 11, 1993

[Procedure Amendment 1]

[Document name to be corrected] Drawing

[Correction target item name] All drawings

[Correction method] Change

[Correction content]

[Figure 1]

Claims (1)

[Scope of utility model registration request] 1. A probe which is brought into contact with a standard thickness plate, and a measuring instrument main body to which a signal of the standard thickness plate detected by this probe is inputted. The measuring instrument main body is made by contacting the probe with the standard thickness plate in advance. Measure the thickness of the standard thickness plate and move it up and down with the up / down movement keys until the display value of the first measured value reaches the standard value. From the second time onward, move the up / down key to display the first displayed value. When the standard value set in step 1, the microcomputer operates so that the value does not change above or below the standard value, the display section that displays the standard value calculated by this microcomputer, and the standard displayed on this display section. A film thickness meter comprising a vertical keyboard for changing a value.