JPH06194399A - Inspection method for printed wiring board - Google Patents

Inspection method for printed wiring board

Info

Publication number
JPH06194399A
JPH06194399A JP4311438A JP31143892A JPH06194399A JP H06194399 A JPH06194399 A JP H06194399A JP 4311438 A JP4311438 A JP 4311438A JP 31143892 A JP31143892 A JP 31143892A JP H06194399 A JPH06194399 A JP H06194399A
Authority
JP
Japan
Prior art keywords
conductive line
inspection
conductive
printed wiring
flexible
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4311438A
Other languages
Japanese (ja)
Other versions
JP3230857B2 (en
Inventor
Takumi Suda
工 須田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shin Etsu Polymer Co Ltd
Shin Etsu Chemical Co Ltd
Original Assignee
Shin Etsu Polymer Co Ltd
Shin Etsu Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shin Etsu Polymer Co Ltd, Shin Etsu Chemical Co Ltd filed Critical Shin Etsu Polymer Co Ltd
Priority to JP31143892A priority Critical patent/JP3230857B2/en
Publication of JPH06194399A publication Critical patent/JPH06194399A/en
Application granted granted Critical
Publication of JP3230857B2 publication Critical patent/JP3230857B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

PURPOSE:To eliminate the need of precise alignment of probe while simplifying an inspection equipment and shortening the time required for arrangement by inspecting disconnection of a conductive line while touching an inspection probe and a flexible conductive piece, respectively, to one and the other ends of the conductive line. CONSTITUTION:An inspection probe 8 is held by a holder 6 while touching one ends of the conductive lines 3 of 8 plurality of printed wiring circuits 1 formed on a printed circuit board 4 mounted on a table 5. A flexible conductive piece 9 of such size as covering other conductive line 3 together touches the other end of the conductive line 3 while being aligned roughly, thus inspecting disconnection of the conductive line 3. A presser having a power source of pneumatic pressure or an electromagnet is employed for touching the flexible conductive piece 9 to the conductive line 3 and connecting them electrically. When the conductive line 3 is not disconnected, a closed circuit is established between the inspection probe 8 and the flexible conductive piece 9 and propriety of the conductive line can be decided basing on the number of pulses being produced.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、導電インクを用いて形
成した印刷配線回路の検査方法に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for inspecting a printed wiring circuit formed using conductive ink.

【0002】[0002]

【従来の技術】一般に印刷配線回路1は、図3に示すよ
うに、電気絶縁性樹脂よりなる基板2上に複数の導電ラ
イン3を印刷して形成したものである。この印刷配線回
路1を製造する際は、生産効率をあげるため基板2の一
面にこれを複数個形成して印刷回路原板4とし、ついで
これをカットして個々の印刷配線回路1を得る。
2. Description of the Related Art Generally, a printed wiring circuit 1 is formed by printing a plurality of conductive lines 3 on a substrate 2 made of an electrically insulating resin, as shown in FIG. When this printed wiring circuit 1 is manufactured, a plurality of substrates 2 are formed on one surface of the substrate 2 to form a printed circuit board 4, and then the printed wiring circuits 1 are cut to obtain individual printed wiring circuits 1.

【0003】近時導電ラインは微細化して断線し易くな
っている。この不良を検出するには印刷配線回路1個の
もつ導電ラインの本数に相当する数の検査用触針を配置
したプローブカードを個々の印刷配線回路に位置合わせ
し、検査用触針を導電ラインの両端に接触させて検査し
たり(第1の検査方法)、導電ラインが平行線パターン
である時には、特開昭63-85468に開示されるように、ピ
ン、プローブ、ピン受け等から構成される検査装置を走
査し、2本の検査用触針を導電ラインの両端に接触させ
検査(第2の検査方法)していた。
Recently, the conductive lines are becoming finer and are likely to be broken. In order to detect this defect, a probe card in which the number of inspection stylus corresponding to the number of conductive lines of one printed wiring circuit is arranged is aligned with each printed wiring circuit, and the inspection stylus is connected to the conductive line. When the conductive lines have a parallel line pattern and are inspected by contacting both ends of the wire (first inspection method), as disclosed in JP-A-63-85468, it is composed of pins, probes, pin receivers, etc. The inspection device is scanned, and two inspection stylus are brought into contact with both ends of the conductive line for inspection (second inspection method).

【0004】[0004]

【発明が解決しようとする課題】しかしながら第1の検
査方法では、検査の対象となる印刷配線回路の種類(パ
ターン)毎にプローブカードを用意する必要があって費
用がかさむほか、精密なピッチで検査用触針を配置して
いるために、保管、精度管理に細心の注意を払う必要が
あり、さらに使用にあたっては、プローブカードを精密
に位置合わせして、導電ラインに検査用触針を正確に接
触させなければならないため、かなり高い精度を有する
検査装置を用いなければならない。
However, in the first inspection method, it is necessary to prepare a probe card for each type (pattern) of the printed wiring circuit to be inspected, which is costly and requires a precise pitch. Since the inspection stylus is placed, it is necessary to pay close attention to storage and quality control.In addition, when using it, align the probe card precisely to ensure that the inspection stylus is accurately aligned with the conductive line. Since it has to be in contact with the inspection equipment, it is necessary to use an inspection device having a considerably high accuracy.

【0005】一方第2の検査方法は、印刷配線回路の種
類(パターン)毎にプローブカードを用意する必要はな
く、導電ラインが平行等間隔のパターンである場合に広
く用いられている。このプローブによる検査の手順は、
図3に示すように、印刷回路原板4をテーブル5上に載
置固定し、ホルダー6に保持したプローブ7の先端に取
りつけた検査用触針8が印刷回路原板4上の印刷配線回
路1を構成する導電ライン3に接触するよう、ホルダー
6を導電ライン3に平行方向、直角方向に移動調整し
て、導電ライン3上を走査することにより、1本の導電
ラインの両端に接触させた検査用触針8に生ずるパルス
の有無を検出器(図示しない)で検出するものである。
On the other hand, the second inspection method does not need to prepare a probe card for each type (pattern) of the printed wiring circuit, and is widely used when the conductive lines have a pattern of parallel equal intervals. The procedure of inspection with this probe is
As shown in FIG. 3, the printed circuit board 4 is placed and fixed on the table 5, and the inspection stylus 8 attached to the tip of the probe 7 held in the holder 6 fixes the printed wiring circuit 1 on the printed circuit board 4. An inspection in which the holder 6 is moved in parallel and at right angles to the conductive line 3 so as to be in contact with the conductive line 3, and scanning is performed on the conductive line 3 so that the holder 6 is in contact with both ends of one conductive line. A detector (not shown) detects the presence or absence of a pulse generated on the stylus 8.

【0006】ところが印刷配線回路を使用する電子機器
の高度化、小型化とともに導電ラインの微細化が極端に
進み、前記した第1の検査方法ではもちろん、第2の検
査方法においても、印刷回路原板上の導電ラインと2本
の検査用触針をたがいに精密に直角を保ちながら走査し
なければ、正確に導電ライン両端に検査用触針を接触さ
せ続けることができないため、両方法ともに高精度の検
査装置を必要とする不利があった。さらに第2の検査方
法では、導電ラインの形状が平行等間隔のものに限定さ
れるため、自由形状を容易に形成可能であるという印刷
配線回路の特徴を生かしたものを除外せざるを得ず、従
ってその適用範囲が限定される。
However, as electronic equipments using printed wiring circuits have become more sophisticated and miniaturized, the miniaturization of conductive lines has been extremely advanced. Therefore, not only in the first inspection method described above, but also in the second inspection method, the printed circuit board is printed. Both methods are highly accurate because it is not possible to keep the inspection stylus accurately in contact with both ends of the conductive line unless the upper conductive line and the two inspection stylus are accurately scanned at right angles. Had the disadvantage of needing inspection equipment. Furthermore, in the second inspection method, the shapes of the conductive lines are limited to those having parallel and even intervals, so that it is inevitable to exclude those that make use of the feature of the printed wiring circuit that a free shape can be easily formed. Therefore, its application range is limited.

【0007】[0007]

【課題を解決するための手段】本発明は、上記した従来
の問題点を解決し、迅速かつ正確に印刷回路原板上の導
電ラインの断線を検査できる印刷配線回路の検査方法を
提供するもので、これは電気絶縁性樹脂よりなる基板上
に形成した印刷配線回路を構成する導電ラインの電気特
性の検査方法において、導電ラインの一端に検査用触針
を、他端に可撓性導電片を接触させ、導電ラインの断線
を検査することを特徴とする印刷配線回路の検査方法を
要旨とする。
SUMMARY OF THE INVENTION The present invention provides a method for inspecting a printed wiring circuit, which solves the above-mentioned conventional problems and can inspect the disconnection of a conductive line on a printed circuit board in a quick and accurate manner. , This is a method for inspecting the electrical characteristics of a conductive line that forms a printed wiring circuit formed on a substrate made of an electrically insulating resin, in which one end of the conductive line has a probe for inspection and the other end has a flexible conductive piece. A gist is a method for inspecting a printed wiring circuit, which is characterized by contacting and inspecting a disconnection of a conductive line.

【0008】検査用触針は、導電ライン上を走査した時
に同時に2本以上の導電ラインと接触してはならないか
ら、太さ、および取付角度が限定されるが、近時の印刷
配線回路が 0.2mmピッチ程度まで小さくなっていること
から、直径1mm以下好ましくは 0.5mm以下とし、先端を
円錐形状とするのがよく、 0.2mm未満となった場合に
は、検査用触針の加工および、強度の点から好ましいも
のとは言えない。
Since the inspection stylus must not contact two or more conductive lines at the same time when scanning the conductive lines, the thickness and the mounting angle are limited. Since the diameter is reduced to about 0.2 mm pitch, the diameter should be 1 mm or less, preferably 0.5 mm or less, and the tip should be conical, and if it is less than 0.2 mm, processing of the inspection stylus and It is not preferable in terms of strength.

【0009】検査用触針の取付角度は、印刷回路原板面
に対して90°とすると、電気的接触を十分安定なものと
するための検査用触針に与える圧力によって導電ライン
が損傷するおそれがあり、また極端に低角度になると、
取付方法に支障をきたすので20°〜60°好ましくは30°
〜45°とするのがよい。
If the mounting angle of the inspection stylus is 90 ° with respect to the surface of the printed circuit board, the conductive line may be damaged by the pressure applied to the inspection stylus to make the electrical contact sufficiently stable. And at extremely low angles,
20 ° to 60 °, preferably 30 °, as it interferes with the mounting method
It is good to set it to ~ 45 °.

【0010】検査用触針の材質は、導電性が高く、また
耐摩耗性に優れていることが要求されるので、ニッケ
ル、銅、タングステン、鋼等から選ばれるが、ニッケ
ル、銅、鋼等は酸化して接触抵抗が上昇するおそれがあ
り、金めっき等による防蝕処理を要する。しかしなが
ら、金めっき等防蝕処理したものでは耐摩耗性に優れた
ものはないので、最も好ましくはタングステンとするの
がよい。
Since the material of the inspection stylus is required to have high conductivity and excellent wear resistance, it is selected from nickel, copper, tungsten, steel, etc., but nickel, copper, steel, etc. May oxidize and increase contact resistance, and thus requires anticorrosion treatment such as gold plating. However, no anticorrosion treatment such as gold plating has excellent wear resistance, so tungsten is most preferable.

【0011】検査用触針を保持固定するプローブは、上
述したように、従来は検査用触針と導電ラインを精密に
位置合わせする必要があったため、検査用触針を導電ラ
インに対して直角方向および平行方向に微動させる機構
を要し、複雑かつ高価なものとなっていたが、本発明に
おいては、その必要がなく、構造は単純で、安価なもの
とすることができる。
As described above, the probe for holding and fixing the inspection stylus has conventionally required precise alignment between the inspection stylus and the conductive line, so that the inspection stylus is perpendicular to the conductive line. Although a mechanism for finely moving in the parallel and parallel directions is required, which is complicated and expensive, the present invention does not require it, and the structure can be simple and inexpensive.

【0012】またこのプローブには、検査用触針を導電
ラインに確実に接触させる必要があることから、板ばね
等によって与圧を加えるのが好ましい。この与圧は、小
さすぎると導電ラインとの接触が不確実になるし、大き
すぎた場合には導電ラインを損傷するおそれがあるの
で、 0.5〜5g 好ましくは1〜2g の範囲とするのがよ
い。
Further, since it is necessary to surely bring the probe for inspection into contact with the conductive line, it is preferable to apply a pressure to the probe with a leaf spring or the like. If the applied pressure is too small, contact with the conductive line becomes uncertain, and if too large, the conductive line may be damaged. Therefore, the applied pressure should be in the range of 0.5 to 5 g, preferably 1 to 2 g. Good.

【0013】検査を要する導電ラインの一端に接触させ
る検査用触針と他端に接触させる可撓性導電片は、ポリ
イミド、ポリエステル等可撓性基材に銅箔、アルミ箔等
を積層接着した従来公知のものでよく、また、上記のよ
うな可撓性基材に検査対象のごとく印刷によって配線を
施したものであってよい。
The inspection stylus to be brought into contact with one end of the conductive line requiring inspection and the flexible conductive piece to be brought into contact with the other end are laminated and adhered with copper foil, aluminum foil, etc. on a flexible base material such as polyimide or polyester. It may be a conventionally known one, or may be one in which wiring is provided by printing on the above-mentioned flexible base material as an inspection target.

【0014】導電ラインの他端に接触させる可撓性導電
片は検査対象となる印刷配線回路の凹凸に追従可能とす
るため可撓性であることが必要とされ、上述したポリイ
ミド、ポリエステル等のフィルムを用いる場合、10〜50
μm、好ましくは20〜40μmの厚みとするのがよい。可
撓性導電片には上記したフィルムの少なくとも片面に導
電性を付与し、検査器とリード線により結線すればよい
ので、特別パターンを形成する必要がない。ポリイミ
ド、ポリエステル等フィルムと同等の可撓性が得られれ
ば、銅箔、アルミ箔等その他金属箔そのものでもよい。
The flexible conductive piece to be brought into contact with the other end of the conductive line is required to be flexible so as to be able to follow the irregularities of the printed wiring circuit to be inspected. 10 to 50 when using film
The thickness is preferably μm, preferably 20 to 40 μm. Since the flexible conductive piece may be provided with conductivity on at least one surface of the above-mentioned film and connected by the inspection device and the lead wire, it is not necessary to form a special pattern. Other metal foils such as copper foil, aluminum foil and the like may be used as long as they have the same flexibility as films such as polyimide and polyester.

【0015】[0015]

【作用】以下図によって本発明になる印刷配線回路の検
査方法を説明すると、図1に示すように、テーブル5上
に載置した印刷回路原板4に複数個形成・面付けされた
印刷配線回路1の導電ライン3の一端に接触するよう、
検査用触針8を保持したホルダー6と、他端を他の導電
ラインも一緒に覆う大きさの可撓性導電片9をおおまか
に位置合わせして接触させ、導電ラインの断線を検査す
る。この時、導電ラインに断線がなければ検査用触針と
可撓性導電片の間に閉回路が形成されるので、生ずるパ
ルス数により導電ラインの良否が判定される。他の導電
ラインも検査用触針だけを移動させてつぎつぎに判定す
るすることができる。
The method for inspecting a printed wiring circuit according to the present invention will be described below with reference to the drawings. As shown in FIG. 1, a plurality of printed wiring circuits are formed / imposed on a printed circuit board 4 placed on a table 5. So that it contacts one end of the conductive line 3 of 1.
The holder 6 holding the inspection stylus 8 and the flexible conductive piece 9 of a size that covers the other conductive line together at the other end are roughly aligned and brought into contact with each other to inspect the disconnection of the conductive line. At this time, if there is no disconnection in the conductive line, a closed circuit is formed between the inspection stylus and the flexible conductive piece, so that the quality of the conductive line is determined by the number of generated pulses. Other conductive lines can be judged one after another by moving only the inspection stylus.

【0016】この可撓性導電片を導電ラインに接触させ
て電気的に接続するには、図2(a)に示すように、圧
縮空気圧または電磁石を動力源としたシリンダー等従来
公知の押圧器10を用いてよい。11は可撓性導電片に
接続したリード線である。この場合圧力を均一に分布さ
せるため、および、印刷回路原板の凹凸に追従して接触
を十分に保つためスポンジ12を介して押圧するのがよ
い。検査の対象となる印刷配線回路がフィルム状である
場合や、常磁性のものである場合には、図2(b)に示
すように、可撓性導電片9を検査する印刷配線回路1の
導電ライン3の他端に接触させた状態で永久磁石13で
挟むよう固定してもよい。永久磁石としては可撓性であ
るマグネットテープMGO−1016(住友スリーエム社製
品名)等が好適である。
In order to electrically connect the flexible conductive piece to the conductive line by contacting it, as shown in FIG. 2A, a conventionally known pressing device such as a cylinder powered by compressed air pressure or an electromagnet is used. 10 may be used. Reference numeral 11 is a lead wire connected to the flexible conductive piece. In this case, it is preferable to press through the sponge 12 in order to evenly distribute the pressure and to follow the irregularities of the printed circuit board to maintain sufficient contact. When the printed wiring circuit to be inspected is in the form of a film or is paramagnetic, as shown in FIG. 2B, the printed wiring circuit 1 inspecting the flexible conductive piece 9 is tested. It may be fixed so as to be sandwiched by the permanent magnets 13 while being in contact with the other end of the conductive line 3. As the permanent magnet, a flexible magnetic tape MGO-1016 (product name of Sumitomo 3M Ltd.) or the like is suitable.

【0017】[0017]

【発明の効果】以上これまで述べてきたように、本発明
の検査方法によれば、導電ラインの一端に検査用触針
を、他端に可撓性導電片を接触するので、プローブの位
置合わせを精密に行う必要がなく、検査装置の単純化、
段取り時間の低減を図ることが可能となった。さらに検
査対象の導電ラインの形状は平行等間隔のものに限定さ
れず、汎用的に検査が可能である。
As described above, according to the inspection method of the present invention, one end of the conductive line is brought into contact with the inspection stylus and the other end is brought into contact with the flexible conductive piece. There is no need to perform precise alignment, simplification of inspection equipment,
It has become possible to reduce the setup time. Further, the shapes of the conductive lines to be inspected are not limited to those having equal intervals in parallel, and general-purpose inspection is possible.

【図面の簡単な説明】[Brief description of drawings]

【図1】印刷配線回路を検査する本発明の方法の説明
図。
FIG. 1 is an illustration of a method of the present invention for inspecting printed wiring circuits.

【図2】平行等間隔の導電ラインをもつ印刷配線回路の
従来の検査方法の説明図。
FIG. 2 is an explanatory diagram of a conventional inspection method for a printed wiring circuit having parallel evenly spaced conductive lines.

【図3】(a)は空圧または電磁石を動力源とする押圧
器により可撓性導電片を導電ラインに押圧する場合の説
明図、(b)は永久磁石により可撓性導電片を導電ライ
ンに押圧する場合の説明図。
FIG. 3 (a) is an explanatory view of a case where a flexible conductive piece is pressed against a conductive line by a pressing device using pneumatic pressure or an electromagnet as a power source, and FIG. 3 (b) shows a flexible conductive piece conductive by a permanent magnet. Explanatory drawing at the time of pressing on a line.

【符号の説明】[Explanation of symbols]

1…印刷配線回路 2…基板 3…導電ライン 4…印刷回路原板 5…テーブル 6…ホルダー 7…プローブ 8…検査用触針 9…可撓性導電片 10…押圧器 11…リード線 12…スポンジ 13…永久磁石 DESCRIPTION OF SYMBOLS 1 ... Printed wiring circuit 2 ... Substrate 3 ... Conductive line 4 ... Printed circuit board 5 ... Table 6 ... Holder 7 ... Probe 8 ... Inspection stylus 9 ... Flexible conductive piece 10 ... Pusher 11 ... Lead wire 12 ... Sponge 13 ... Permanent magnet

─────────────────────────────────────────────────────
─────────────────────────────────────────────────── ───

【手続補正書】[Procedure amendment]

【提出日】平成5年12月17日[Submission date] December 17, 1993

【手続補正1】[Procedure Amendment 1]

【補正対象書類名】明細書[Document name to be amended] Statement

【補正対象項目名】図2[Name of item to be corrected] Figure 2

【補正方法】変更[Correction method] Change

【補正内容】[Correction content]

【図2】(a)は空圧または電磁石を動力源とする押圧
器により可撓性導電片を導電ラインに押圧する場合の説
明図、(b)は永久磁石により可撓性導電片を導電ライ
ンに押圧する場合の説明図。 ─────────────────────────────────────────────────────
FIG. 2 (a) is a pressing force using pneumatic pressure or an electromagnet as a power source.
Of pressing a flexible conductive piece against a conductive line with a container
As shown in the figure, (b) shows a flexible conductive piece made of a permanent magnet.
Explanatory diagram of the case for pressing the down. ─────────────────────────────────────────────────── ───

【手続補正書】[Procedure amendment]

【提出日】平成5年12月17日[Submission date] December 17, 1993

【手続補正1】[Procedure Amendment 1]

【補正対象書類名】明細書[Document name to be amended] Statement

【補正対象項目名】図3[Name of item to be corrected] Figure 3

【補正方法】変更[Correction method] Change

【補正内容】[Correction content]

【図3】平行等間隔の導電ラインをもつ印刷配線回路の
従来の検査方法の説明図。
FIG. 3 shows a printed wiring circuit having parallel evenly spaced conductive lines.
Explanatory drawing of the conventional inspection method .

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 電気絶縁性樹脂よりなる基板上に形成し
た印刷配線回路を構成する導電ラインの電気特性の検査
方法において、導電ラインの一端に検査用触針を、他端
に可撓性導電片を接触させ、導電ラインの断線を検査す
ることを特徴とする印刷配線回路の検査方法。
1. A method for inspecting the electrical characteristics of a conductive line that forms a printed wiring circuit formed on a substrate made of an electrically insulating resin, wherein an inspection stylus is provided at one end of the conductive line and a flexible conductive layer is provided at the other end. A method for inspecting a printed wiring circuit, which comprises inspecting a disconnection of a conductive line by bringing pieces into contact with each other.
【請求項2】 導電ラインの他端に、可撓性導電片を空
圧、電磁力を動力源とするシリンダーにより接触させる
請求項1に記載の検査方法。
2. The inspection method according to claim 1, wherein the flexible conductive piece is brought into contact with the other end of the conductive line by a cylinder using pneumatic pressure and electromagnetic force as a power source.
【請求項3】 導電ラインの他端に、可撓性導電片を永
久磁石により接触させる請求項1に記載の検査方法。
3. The inspection method according to claim 1, wherein the flexible conductive piece is brought into contact with the other end of the conductive line by a permanent magnet.
JP31143892A 1992-10-27 1992-10-27 Inspection method of printed wiring circuit Expired - Lifetime JP3230857B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP31143892A JP3230857B2 (en) 1992-10-27 1992-10-27 Inspection method of printed wiring circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP31143892A JP3230857B2 (en) 1992-10-27 1992-10-27 Inspection method of printed wiring circuit

Publications (2)

Publication Number Publication Date
JPH06194399A true JPH06194399A (en) 1994-07-15
JP3230857B2 JP3230857B2 (en) 2001-11-19

Family

ID=18017220

Family Applications (1)

Application Number Title Priority Date Filing Date
JP31143892A Expired - Lifetime JP3230857B2 (en) 1992-10-27 1992-10-27 Inspection method of printed wiring circuit

Country Status (1)

Country Link
JP (1) JP3230857B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20020091691A (en) * 2001-05-31 2002-12-06 주식회사 현대 디스플레이 테크놀로지 Liquid crystal display test frame
KR100382344B1 (en) * 2001-03-14 2003-05-09 엘지전자 주식회사 measure system and method of flexible printed circuit board

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100382344B1 (en) * 2001-03-14 2003-05-09 엘지전자 주식회사 measure system and method of flexible printed circuit board
KR20020091691A (en) * 2001-05-31 2002-12-06 주식회사 현대 디스플레이 테크놀로지 Liquid crystal display test frame

Also Published As

Publication number Publication date
JP3230857B2 (en) 2001-11-19

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