JPH06177595A - Measurement of mounting accuracy of electronic component recognition mounting machine and measuring jig - Google Patents

Measurement of mounting accuracy of electronic component recognition mounting machine and measuring jig

Info

Publication number
JPH06177595A
JPH06177595A JP4331299A JP33129992A JPH06177595A JP H06177595 A JPH06177595 A JP H06177595A JP 4331299 A JP4331299 A JP 4331299A JP 33129992 A JP33129992 A JP 33129992A JP H06177595 A JPH06177595 A JP H06177595A
Authority
JP
Japan
Prior art keywords
lead
mounting
electronic component
flat plate
pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4331299A
Other languages
Japanese (ja)
Inventor
Keiji Iketani
啓司 池谷
Masayuki Seno
眞透 瀬野
Kanji Uchida
完司 内田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP4331299A priority Critical patent/JPH06177595A/en
Publication of JPH06177595A publication Critical patent/JPH06177595A/en
Pending legal-status Critical Current

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Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Supply And Installment Of Electrical Components (AREA)

Abstract

PURPOSE:To provide a method capable of measuring the mounting accuracy of a mounting machine without being exerted an effect due to a bend of the leads of an electronic component. CONSTITUTION:A positional deviation of mounting is not measured using an actual electronic component, but a light-transmitting flat plate 11 recorded with lead patterns 10 is mounted on a glass flat plate 9 recorded with land patterns 13 by a mounting machine and the positional deviation of the patterns 10 from the patterns 13 is measured to find the mounting accuracy of the mounting machine.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、電子部品の形状を認識
してプリント配線板に装着する実装機の装着精度の測定
方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a mounting accuracy measuring method for a mounting machine which recognizes the shape of an electronic component and mounts it on a printed wiring board.

【0002】[0002]

【従来の技術】以下に従来の測定方法について説明す
る。従来、電子部品認識実装精度の測定方法は、図5に
示すような実際の電子部品Aまたはリード幅1、リード
ピッチ2のリード3を金型から打ち抜き成型することで
作られるダミー部品を実装機で装着し、図6に示すリー
ド3とランドパターン5とのセンターの装着位置ずれa
を測定し、これを実装機の装着精度を測定としている。
装着位置ずれaの測定には工具顕微鏡などを使用して測
定が実施されている。
2. Description of the Related Art A conventional measuring method will be described below. Conventionally, the electronic component recognition mounting accuracy measuring method is carried out by mounting an actual electronic component A as shown in FIG. 5 or a dummy component made by punching a lead 3 having a lead width of 1 and a lead pitch of 2 from a die. And the mounting position deviation a between the lead 3 and the land pattern 5 shown in FIG.
Is measured and the mounting accuracy of the mounting machine is measured.
The measurement of the mounting position deviation a is performed using a tool microscope or the like.

【0003】[0003]

【発明が解決しようとする課題】電子部品のリードのフ
ァインピッチ化にともない図7にも示すように電子部品
A、あるいはダミー部品のリード幅1、リードピッチ2
は狭くなり、リード厚4は薄くなるためリードの強度が
低下し、その取扱い時で図8に示すような曲がったリー
ド7が発生する。そのため部品の精度が実装機の装着精
度の測定に影響をおよぼすという問題を有している。
As the lead pitch of the electronic component becomes finer, the lead width 1 and lead pitch 2 of the electronic component A or the dummy component as shown in FIG. 7 are obtained.
Becomes narrower and the lead thickness 4 becomes thinner, so that the strength of the lead is lowered, and a bent lead 7 as shown in FIG. Therefore, there is a problem that the accuracy of parts affects the measurement of the mounting accuracy of the mounting machine.

【0004】また、装着位置ずれaの寸法を工具顕微鏡
などで高精度に読み取る作業は非常に煩わしいものであ
る。本発明は実装機自身の装着精度を測定できる方法を
提供することを目的とする。
Further, the work of highly accurately reading the dimension of the mounting position deviation a with a tool microscope or the like is very troublesome. An object of the present invention is to provide a method capable of measuring the mounting accuracy of the mounting machine itself.

【0005】また、工具顕微鏡などでの測定作業におい
て容易に高精度の測定値が得られるものを提供すること
を目的とする。
Another object of the present invention is to provide a tool which can easily obtain a highly accurate measured value in a measuring operation using a tool microscope or the like.

【0006】[0006]

【課題を解決するための手段】請求項1に記載の装着精
度測定方法は、取り扱う電子部品のリード形状に一致し
た不透光域のリードパターンが記録された透光性平板
を、前記電子部品のリード間隔に対応してランドパター
ンが記録された平板の上に実装機で実装し、前記透光性
平板を通して前記リードパターンと前記ランドパターン
の位置ずれを測定することを特徴とする。 請求項2に
記載の装着精度測定治具は、取り扱う電子部品のリード
形状に一致したリードパターンが等間隔で記録された透
光性平板と、前記リード形状と同形状でピッチに一定量
のずれをもって記録されたランドパターンとからなるこ
とを特徴とする。
According to a first aspect of the present invention, there is provided a mounting accuracy measuring method, wherein a transparent flat plate having a lead pattern in an opaque region corresponding to a lead shape of an electronic component handled is recorded on the transparent plate. Is mounted on a flat plate on which a land pattern is recorded in correspondence with the lead spacing by a mounting machine, and the positional deviation between the lead pattern and the land pattern is measured through the transparent flat plate. The mounting accuracy measuring jig according to claim 2 is a translucent flat plate on which lead patterns matching the lead shape of an electronic component to be handled are recorded at equal intervals, and a fixed amount of deviation in pitch with the same shape as the lead shape. And a land pattern recorded with.

【0007】[0007]

【作用】請求項1の構成によると、実際の電子部品を使
用して装着位置ずれを測定するのではなくて、リードパ
ターンが記録された透光性平板を実装機でランドパター
ンが記録された平板の上に実装して、リードパターンと
ランドパターンの位置ずれを測定するので、電子部品の
リードの曲がりなどの影響を受けずに、正確な装着位置
ずれを測定できる。
According to the structure of the first aspect, the land pattern is recorded by the mounter on the translucent flat plate on which the lead pattern is recorded, instead of measuring the mounting position deviation by using an actual electronic component. Since it is mounted on a flat plate and the positional deviation between the lead pattern and the land pattern is measured, the accurate mounting positional deviation can be measured without being affected by bending of the leads of the electronic component.

【0008】請求項2の構成によると、リード形状と同
形状でピッチに一定量のずれをもって記録されたランド
パターンの上にリードパターンが等間隔で記録された透
光性平板を装着することによって、リードパターンとラ
ンドパターンの正確に重なり合っている部分を認識する
ことで装着位置ずれ量を決定できる。
According to the second aspect of the present invention, the translucent flat plate in which the lead patterns are recorded at equal intervals is mounted on the land patterns which are recorded in the same shape as the lead shape with a certain amount of pitch deviation. By recognizing the portion where the lead pattern and the land pattern are accurately overlapped with each other, the mounting position deviation amount can be determined.

【0009】[0009]

【実施例】以下、本発明の装着精度測定方法を図1〜図
4に示す具体的な実施例に基づいて説明する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS The mounting accuracy measuring method of the present invention will be described below with reference to specific embodiments shown in FIGS.

【0010】図1〜図3は第1の実施例を示す。実装機
の装着精度の測定に際しては図1に示す第1の治具8と
第2の治具としてのガラス平板9が使用される。第1の
治具8は、CADデータによる電子部品のリード3の形
状に一致した不透光域のリードパターン10が印刷された
透光性平板としてのポジフィルム11に、電子部品のモー
ルドを形どったプラスチック製の平板12を接着剤によっ
て接着して構成されている。ガラス平板9には電子部品
のリード間隔と同一ピッチのランドパターン13がCAD
データによって印刷されている。
1 to 3 show a first embodiment. When measuring the mounting accuracy of the mounting machine, the first jig 8 and the glass flat plate 9 as the second jig shown in FIG. 1 are used. The first jig 8 forms a mold of an electronic component on a positive film 11 as a light-transmissive flat plate on which a lead pattern 10 in an opaque area that matches the shape of the lead 3 of the electronic component according to CAD data is printed. The flat plate 12 made of plastic is bonded by an adhesive. The land pattern 13 having the same pitch as the lead interval of the electronic component is CAD on the glass plate 9.
Printed by data.

【0011】測定を受ける実装機は図2に示すように、
第1の治具8のプラスチック平板12を吸着ノズル14によ
って吸着して、実装機の上のCCDカメラによる認識位
置補正を行うステーションDへと運ばれ、ここで位置補
正を行い、実装機によって回路基板Cの上に載せられた
第2の治具としてのガラス平板9の上へ装着される。
As shown in FIG. 2, the mounting machine to be measured is
The plastic flat plate 12 of the first jig 8 is sucked by the suction nozzle 14 and is conveyed to the station D where the CCD camera on the mounting machine corrects the recognition position. It is mounted on a glass plate 9 as a second jig placed on the substrate C.

【0012】図3はこのようにして実装された治具8の
リードパターン10とガラス板9の上に印刷されたランド
パターン13の位置ずれの様子を示し、ポジフィルム11の
透光域を通して装着位置ずれaを工具顕微鏡で測定する
ことによって装着精度がもとめられる。
FIG. 3 shows how the lead pattern 10 of the jig 8 thus mounted and the land pattern 13 printed on the glass plate 9 are misaligned and mounted through the transparent area of the positive film 11. The mounting accuracy can be obtained by measuring the displacement a with a tool microscope.

【0013】この測定方法によれば、実際の電子部品ま
たはダミー部品のリード曲がりが装着位置精度に与える
影響を除外でき、実装機自身の装着精度の測定が可能と
なる。
According to this measuring method, it is possible to exclude the influence of the lead bending of the actual electronic component or dummy component on the mounting position accuracy, and it is possible to measure the mounting accuracy of the mounting machine itself.

【0014】上記の第1の実施例では、従来の部品、ダ
ミー部品、ランドの形状をCADデータによって印刷し
たポジフィルム11、ガラス平板10を使用したが、図4に
示す第2の実施例のようにピッチに一定量のずれをもっ
てランドが印刷されたガラス平板19を使用することによ
って装着位置ずれaの測定が容易になる。
In the first embodiment described above, the positive film 11 and the glass flat plate 10 in which the shapes of the conventional parts, the dummy parts, and the lands are printed by the CAD data are used, but in the second embodiment shown in FIG. By using the glass flat plate 19 on which the lands are printed with a certain amount of deviation in pitch, the mounting position deviation a can be easily measured.

【0015】具体的には、図4の(a)に示すように部
品のリード長さ14、リードピッチ2のリード10が印刷さ
れたポジフィルム11と、モールドを形どったプラスチッ
ク製の平板12から成る第1の治具8と、図4の(b)に
示すようにランドパターン18のピッチが第1の実施例と
は異なる第2の治具としてのガラス平板19が使用され
る。ランドパターン18については、ランド幅15とランド
長さ16がそれぞれリード幅1とリード長さ14と同じで、
ランドピッチ17は等ピッチであるけれどもリードピッチ
2の寸法とは異ならせてランドパターン18が印刷されい
る。第1の治具8を第2の治具としてのガラス平板19に
実装機で装着し、図4の(c)のようにリードパターン
10とランドパターン18の重なりあった部分20から装着精
度を測定工具であるノギスに見られる副尺の原理で読み
取る。
Specifically, as shown in FIG. 4 (a), a positive film 11 on which leads 10 of parts and leads 10 of lead pitch 2 are printed, and a plastic flat plate 12 in the shape of a mold. A first jig 8 composed of the above and a glass plate 19 as a second jig having a land pattern 18 having a pitch different from that of the first embodiment as shown in FIG. 4B are used. Regarding the land pattern 18, the land width 15 and the land length 16 are the same as the lead width 1 and the lead length 14, respectively,
Although the land pitch 17 is the same pitch, the land pattern 18 is printed differently from the size of the lead pitch 2. The first jig 8 is mounted on the glass flat plate 19 as the second jig by the mounting machine, and the lead pattern is formed as shown in FIG.
The mounting accuracy is read from the overlapping portion 20 of the land pattern 18 and the land pattern 18 according to the vernier principle found in the caliper measuring tool.

【0016】ここでは、リード幅W1、リード長さL
1、リードピッチP1のリードが印刷されてあるポジフ
ィルム11を、ランド幅W2、ランド長さL2、ランドピ
ッチP2のランドパターン18が印刷されているガラス平
板19の上へ実装し、重なり部分20で示す部分ような重な
り得られた場合には、装着位置精度として図4の紙面に
おいて左右方向に(P1−P2)、上下方向に“2・
(P1−P2)”の結果が得られる。
Here, the lead width W1 and the lead length L
1. The positive film 11 on which the leads of the lead pitch P1 are printed is mounted on the glass flat plate 19 on which the land pattern W of the land width W2, the land length L2 and the land pitch P2 is printed, and the overlapping portion 20 In the case where overlaps such as those indicated by are obtained, the mounting position accuracy is (P1-P2) in the horizontal direction and "2.
The result of (P1-P2) "is obtained.

【0017】[0017]

【発明の効果】請求項1記載の装着精度測定方法による
と、取り扱う電子部品のリード形状に一致した不透光域
のリードパターンが記録された透光性平板を、前記電子
部品のリード間隔に対応してランドパターンが記録され
た平板の上に実装機で実装し、前記透光性平板を通して
前記リードパターンと前記ランドパターンの位置ずれを
測定するため、実際の電子部品を使用して装着位置ずれ
を測定する場合のような電子部品のリードの曲がりなど
の影響を受けずに、ランドパターンと透光性平板のリー
ドパターンとの位置ずれから正確な装着位置ずれを測定
できる。 請求項2に記載の装着精度測定治具は、ま
た、取り扱う電子部品のリード形状に一致したリードパ
ターンが等間隔で記録された透光性平板と、前記リード
形状と同形状でピッチに一定量のずれをもって記録され
たランドパターンとからなる装着精度測定治具を用いた
場合には、工具顕微鏡などで読み取る際に、容易に高精
度の寸法読み取りを達成できるものである。
According to the mounting accuracy measuring method of the first aspect, a transparent flat plate having a lead pattern of an opaque region corresponding to the lead shape of the electronic component to be handled is recorded on the lead interval of the electronic component. Correspondingly, a mounting machine is used to mount on a flat plate on which the land pattern is recorded, and the position deviation between the lead pattern and the land pattern is measured through the translucent flat plate. Accurate mounting position deviation can be measured from the positional deviation between the land pattern and the lead pattern of the translucent flat plate without being affected by bending of the leads of the electronic component as in the case of measuring the deviation. The mounting accuracy measuring jig according to claim 2, further comprising: a translucent flat plate on which lead patterns corresponding to the lead shape of the electronic component to be handled are recorded at equal intervals, and the same shape as the lead shape and a fixed amount at a pitch. When a mounting accuracy measuring jig including a land pattern recorded with a deviation is used, it is possible to easily achieve highly accurate dimension reading when reading with a tool microscope or the like.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の第1の実施例の構成図FIG. 1 is a configuration diagram of a first embodiment of the present invention.

【図2】同実施例の測定過程の説明図FIG. 2 is an explanatory diagram of a measurement process of the same example.

【図3】同実施例の装着位置測定結果の読み取り時の平
面図
FIG. 3 is a plan view at the time of reading the mounting position measurement result of the same embodiment.

【図4】第2の実施例の要部の平面図FIG. 4 is a plan view of an essential part of the second embodiment.

【図5】従来の装着位置精度測定に用いる部品またはダ
ミー部品の斜視図
FIG. 5 is a perspective view of a conventional component or dummy component used for measuring the mounting position accuracy.

【図6】従来の装着位置精度の測定結果の読み取り時の
平面図
FIG. 6 is a plan view when reading a conventional measurement result of the mounting position accuracy.

【図7】電子部品またはダミー部品のリード部拡大図FIG. 7 is an enlarged view of a lead portion of an electronic component or a dummy component.

【図8】電子部品またはダミー部品のリード曲がりの説
明図
FIG. 8 is an explanatory diagram of lead bending of an electronic component or a dummy component.

【符号の説明】[Explanation of symbols]

8 第1の治具 9 ガラス平板〔第2の治具〕 10 リードパターン 11 ポジフィルム〔透光性平板〕 13,18 ランドパターン 8 First jig 9 Glass flat plate [Second jig] 10 Lead pattern 11 Positive film [Translucent flat plate] 13,18 Land pattern

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 取り扱う電子部品のリード形状に一致し
た不透光域のリードパターンが記録された透光性平板
を、前記電子部品のリード間隔に対応してランドパター
ンが記録された平板の上に実装機で実装し、前記透光性
平板を通して前記リードパターンと前記ランドパターン
の位置ずれを測定する電子部品認識実装機における装着
精度測定方法。
1. A translucent flat plate on which a lead pattern of an opaque region corresponding to a lead shape of an electronic component to be handled is recorded, on a flat plate on which a land pattern is recorded corresponding to a lead interval of the electronic component. A mounting accuracy measuring method in an electronic component recognizing mounting machine, in which the mounting pattern is mounted on a mounting machine, and the positional deviation between the lead pattern and the land pattern is measured through the transparent plate.
【請求項2】 取り扱う電子部品のリード形状に一致し
たリードパターンが等間隔で記録された透光性平板と、
前記リード形状と同形状でピッチに一定量のずれをもっ
て記録されたランドパターンとからなる装着精度測定治
具。
2. A translucent flat plate on which lead patterns corresponding to lead shapes of electronic parts to be handled are recorded at equal intervals.
A mounting accuracy measuring jig having the same shape as the lead shape and a land pattern recorded with a certain amount of deviation in pitch.
JP4331299A 1992-12-11 1992-12-11 Measurement of mounting accuracy of electronic component recognition mounting machine and measuring jig Pending JPH06177595A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4331299A JPH06177595A (en) 1992-12-11 1992-12-11 Measurement of mounting accuracy of electronic component recognition mounting machine and measuring jig

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4331299A JPH06177595A (en) 1992-12-11 1992-12-11 Measurement of mounting accuracy of electronic component recognition mounting machine and measuring jig

Publications (1)

Publication Number Publication Date
JPH06177595A true JPH06177595A (en) 1994-06-24

Family

ID=18242136

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4331299A Pending JPH06177595A (en) 1992-12-11 1992-12-11 Measurement of mounting accuracy of electronic component recognition mounting machine and measuring jig

Country Status (1)

Country Link
JP (1) JPH06177595A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015023119A (en) * 2013-07-18 2015-02-02 株式会社リコー Mounting evaluation substrate and method for evaluating mount position accuracy
WO2019155643A1 (en) * 2018-02-12 2019-08-15 株式会社Fuji Mounting accuracy measurement chip and mounting accuracy measurement kit

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015023119A (en) * 2013-07-18 2015-02-02 株式会社リコー Mounting evaluation substrate and method for evaluating mount position accuracy
WO2019155643A1 (en) * 2018-02-12 2019-08-15 株式会社Fuji Mounting accuracy measurement chip and mounting accuracy measurement kit
CN111543125A (en) * 2018-02-12 2020-08-14 株式会社富士 Chip for measuring mounting accuracy and kit for measuring mounting accuracy
JPWO2019155643A1 (en) * 2018-02-12 2021-01-28 株式会社Fuji Mounting accuracy measurement chip and mounting accuracy measurement kit
CN111543125B (en) * 2018-02-12 2021-06-29 株式会社富士 Chip for measuring mounting accuracy and kit for measuring mounting accuracy

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