JPH0616244B2 - Positioning device for laser beam - Google Patents

Positioning device for laser beam

Info

Publication number
JPH0616244B2
JPH0616244B2 JP59075231A JP7523184A JPH0616244B2 JP H0616244 B2 JPH0616244 B2 JP H0616244B2 JP 59075231 A JP59075231 A JP 59075231A JP 7523184 A JP7523184 A JP 7523184A JP H0616244 B2 JPH0616244 B2 JP H0616244B2
Authority
JP
Japan
Prior art keywords
laser beam
photodetector
light source
positioning device
laser
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59075231A
Other languages
Japanese (ja)
Other versions
JPS60218123A (en
Inventor
博 土井
光仁 亀井
利郎 中島
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP59075231A priority Critical patent/JPH0616244B2/en
Publication of JPS60218123A publication Critical patent/JPS60218123A/en
Publication of JPH0616244B2 publication Critical patent/JPH0616244B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/26Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G01B11/27Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
    • G01B11/272Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes using photoelectric detection means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Mechanical Light Control Or Optical Switches (AREA)
  • Control Of Position Or Direction (AREA)

Description

【発明の詳細な説明】 [発明の技術分野] この発明は、レーザビームを用いて速度や変位等の物理
量を計測する際、計測対象にレーザビームを照射するた
めに用いられるレーザビームの位置決め装置に関するも
のである。
Description: TECHNICAL FIELD The present invention relates to a laser beam positioning device used for irradiating a laser beam on a measurement target when measuring a physical quantity such as velocity or displacement using the laser beam. It is about.

[従来技術] 第1図は従来のレーザビーム位置決め装置の構成図であ
る。図において、(1)はレーザ光源、(2)は光偏向器、
(3)は光偏向器(2)のコントロール回路、(4)は偏向され
たレーザビーム、(5)は光検出器である。
[Prior Art] FIG. 1 is a block diagram of a conventional laser beam positioning apparatus. In the figure, (1) is a laser light source, (2) is an optical deflector,
(3) is a control circuit for the optical deflector (2), (4) is a deflected laser beam, and (5) is a photodetector.

つぎに動作について説明する。レーザ光源(1)より出射
されたレーザビーム(4)は、光偏向器(2)により、光検出
器(5)の設置された平面内を2次元走査される。レーザ
ビーム走査時に、光検出器(5)でレーザビーム(4)が検出
された時、該光検出器(5)が光偏向器(2)のコントロール
回路(3)に信号を送出する。これにより、レーザビーム
(4)は光検出器(5)の方向へ位置決めされる。
Next, the operation will be described. A laser beam (4) emitted from a laser light source (1) is two-dimensionally scanned by a light deflector (2) in a plane where a photodetector (5) is installed. When the laser beam (4) is detected by the photodetector (5) during laser beam scanning, the photodetector (5) sends a signal to the control circuit (3) of the optical deflector (2). This allows the laser beam
(4) is positioned in the direction of the photodetector (5).

従来のレーザビームの位置決め装置は、以上のようにレ
ーザビーム(4)を2次元走査して該レーザビーム(4)を位
置決めする構成のため、位置決めに要する時間が長い欠
点があった。
The conventional laser beam positioning device has a drawback that it takes a long time to perform the positioning because the laser beam (4) is two-dimensionally scanned to position the laser beam (4) as described above.

[発明の概要] この発明は上記のような従来のものの欠点を除去するた
めになされたもので、レーザビームを光偏向器を用いて
2次元走査する代わりに、光学的粗面物体を用いてレー
ザビームを拡散させ、2次元の強度分布を持った干渉パ
ターンを発生させることにより、2次元走査に比して短
時間の位置決めができるレーザビームの位置決め装置を
提供することを目的としている。
SUMMARY OF THE INVENTION The present invention has been made in order to eliminate the above-mentioned drawbacks of the conventional ones. Instead of two-dimensionally scanning a laser beam using an optical deflector, an optically rough surfaced object is used. An object of the present invention is to provide a laser beam positioning device that can perform positioning in a shorter time than two-dimensional scanning by diffusing a laser beam and generating an interference pattern having a two-dimensional intensity distribution.

[発明の実施例] 以下、この発明の一実施例を図面について説明する。BEST MODE FOR CARRYING OUT THE INVENTION Embodiments of the present invention will be described below with reference to the drawings.

第2図はこの発明に係るレーザビームの位置決め装置の
一例を示すもので、第1図と同一部所には同一符号を付
して説明を省略する。
FIG. 2 shows an example of a laser beam positioning apparatus according to the present invention. The same parts as those in FIG. 1 are designated by the same reference numerals and the description thereof will be omitted.

同図において、(21)はすりガラスのような光学的粗面物
体で、レーザ光源(1)からのレーザビーム(4)を位相変調
して拡散照射させるものである。(22)は粗面物体(21)の
回転機構であり、レーザビーム(4)の照射されている点
を中心に該粗面物体(21)を回転させるようになってい
る。(23)は光検出器(5)からの出力の時間変動を測定す
る信号処理回路、(24)は上記レーザ光源(1)や粗面物体
(21)からなるブロックの駆動機構で、上記信号処理回路
(23)からの出力を受けて上記時間変動が小さくなるよう
に上記光源(1)の向きを変移させるものである。
In the figure, (21) is an optically rough surfaced object such as frosted glass, which is for phase-modulating the laser beam (4) from the laser light source (1) to diffusely irradiate it. Reference numeral (22) is a rotating mechanism for the rough surface object (21), and is adapted to rotate the rough surface object (21) around the point where the laser beam (4) is irradiated. (23) is a signal processing circuit for measuring the time variation of the output from the photodetector (5), (24) is the laser light source (1) or a rough surface object
(21) A block drive mechanism comprising the above signal processing circuit.
The direction of the light source (1) is changed by receiving the output from (23) so that the time variation becomes small.

上記信号処理回路(23)は、たとえば第5図に示すように
光検出器(5)の出力から直流成分を除去する直流成分除
去回路(51)、絶対値回路もしくはこの例の2乗回路(52)
および平滑化回路(53)から構成されている。
The signal processing circuit (23) is, for example, as shown in FIG. 5, a DC component removing circuit (51) for removing a DC component from the output of the photodetector (5), an absolute value circuit or a square circuit ( 52)
And a smoothing circuit (53).

つぎに、上記構成の動作について説明する。Next, the operation of the above configuration will be described.

レーザ光源(1)より発射されるレーザビーム(4)は、粗面
物体(21)により位相変調されて拡散照射される。このた
めに、光検出器(5)が置かれた観測面では、スペックル
パターンと呼ばれる粒状の強度分布をもつ干渉パターン
があらわれ、さらに粗面物体(21)が、レーザビーム(4)
が照射されている点を中心として、回転機構(22)によっ
て回転されていることにより、スペックルパターンも回
転運動を行なう。光検出器(5)で検出される光強度は、
レーザビーム(4)の中心よりはずれた場合、第3図のよ
うに光強度の時間変動が大きく、中心に近づくに従っ
て、第4図のように変動が小さくなる。そこで、光検出
器(5)で検出された光強度の時間変動を、信号処理回路
(23)を用いて測定する。つまり、上記光検出器(5)から
の出力である光強度信号(第6図(A))は信号処理回路
(23)の直流成分除去回路(51)で、第6図(B)のように直
流成分が除去されたのち、2乗回路(52)に入力される。
2乗回路(52)からの出力(第6図(C))は平滑化回路(5
3)で第6図(D)のように平滑され、換言すれば上記時間
変動に比例した直流電圧が得られることになる。これを
測定信号として、駆動機構(24)に印加すれば、駆動機構
(24)は上記時間変動が小さくなる方向へレーザビーム
(4)を位置決めする。
A laser beam (4) emitted from a laser light source (1) is phase-modulated by a rough surface object (21) and diffused and irradiated. For this reason, on the observation surface where the photodetector (5) is placed, an interference pattern having a granular intensity distribution called a speckle pattern appears, and the rough surface object (21) is further affected by the laser beam (4).
The speckle pattern also rotates by being rotated by the rotating mechanism (22) about the point where is irradiated. The light intensity detected by the photodetector (5) is
When the laser beam (4) deviates from the center, the temporal fluctuation of the light intensity is large as shown in FIG. 3, and the fluctuation becomes smaller as it approaches the center as shown in FIG. Therefore, the time variation of the light intensity detected by the photodetector (5) is analyzed by the signal processing circuit.
Measure using (23). That is, the light intensity signal (Fig. 6 (A)) output from the photodetector (5) is a signal processing circuit.
The direct-current component removing circuit (51) of (23) removes the direct-current component as shown in FIG. 6 (B), and then inputs it to the squaring circuit (52).
The output from the squaring circuit (52) (Fig. 6 (C)) is the smoothing circuit (5
In 3), smoothing is performed as shown in FIG. 6 (D), in other words, a DC voltage proportional to the above time fluctuation is obtained. By applying this to the drive mechanism (24) as a measurement signal, the drive mechanism
(24) is the laser beam in the direction in which the above time fluctuation is reduced
Position (4).

ここで、上記粗面物体(21)を用いてレーザビーム(4)を
拡散させて2次元の強度分布をもった干渉パターンを発
生させ、これの検出出力の時間的変動が小さくなる方向
へレーザビーム(4)の発射方向を制御するため、2次元
走査するものの走査時間に比して短い時間でレーザビー
ム(4)の位置決めを行なうことができる。
Here, the rough surface object (21) is used to diffuse the laser beam (4) to generate an interference pattern having a two-dimensional intensity distribution, and the laser output is directed in a direction in which the temporal fluctuation of the detection output thereof is reduced. Since the emission direction of the beam (4) is controlled, the laser beam (4) can be positioned in a shorter time than the scanning time of two-dimensional scanning.

[発明の効果] 以上のように、この発明によれば光学的粗面物体にレー
ザビームを照射して2次元の強度分布をもつ干渉パター
ンを発生させ、これを検出した出力から、光源の向き、
つまり、レーザービームの発射方向を制御するように構
成したので、従来のように、レーザービームを2次元走
査する必要がなくなり、干渉パターンの性質、かなわ
ち、レーザービームの照射方向に延長した直線とそれに
直交する平面との交点から遠いほど干渉パターンが速く
移動するといった性質を利用して、レーザビームの位置
決めを短時間で実現することができる。
As described above, according to the present invention, the optically rough surfaced object is irradiated with the laser beam to generate an interference pattern having a two-dimensional intensity distribution, and the direction of the light source is detected from the detected output. ,
In other words, since it is configured to control the emission direction of the laser beam, there is no need to perform two-dimensional scanning with the laser beam as in the conventional case, and the nature of the interference pattern, that is, the straight line extended in the irradiation direction of the laser beam The laser beam can be positioned in a short time by utilizing the property that the interference pattern moves faster as the distance from the intersection with the plane orthogonal thereto increases.

【図面の簡単な説明】[Brief description of drawings]

第1図は、従来のレーザビームの位置決め装置を示すブ
ロック図、第2図はこの発明に係るレーザビームの位置
決め装置の一例を示すブロック図、第3図および第4図
それぞれ光強度の時間に対する変動が大きい状態および
小さい状態での光強度・時間関係図、第5図は信号処理
回路の具体的構成を示すブロック図、第6図(A)〜(D)は
上記信号処理回路の各部の信号波形図である。 (1)……レーザ光源、(4)……レーザビーム、(5)……光
検出器、(21)……光学的粗面物体、(22)……回転機構、
(23)……信号処理回路、(24)……駆動機構。 なお、図中同一符号は同一もしくは相当部分を示す。
FIG. 1 is a block diagram showing a conventional laser beam positioning device, FIG. 2 is a block diagram showing an example of a laser beam positioning device according to the present invention, and FIGS. FIG. 5 is a block diagram showing a concrete configuration of a signal processing circuit in the state of large and small fluctuations, FIG. 5 (A) to (D) is a diagram of each part of the signal processing circuit. It is a signal waveform diagram. (1) …… laser light source, (4) …… laser beam, (5) …… photodetector, (21) …… optically rough surface object, (22) …… rotating mechanism,
(23) …… Signal processing circuit, (24) …… Drive mechanism. The same reference numerals in the drawings indicate the same or corresponding parts.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】レーザー光源と、このレーザー光源からの
レーザービームを拡散して2次元の強度分布をもつ干渉
パターンを発生させる光学的粗面物体と、この粗面物体
および上記干渉パターンをレーザービームの照射点を中
心に回転させる回転機構と、上記レーザービームの光検
出器と、この光検出器により検出された光強度信号のレ
ーザービームの中心から遠いほど大きくなる時間変動を
検出して、その時間変動に比例した信号を出力する信号
処理回路と、この信号処理回路からの信号を受けて上記
時間変動が小さくなる方向へ上記光源の向きを変移させ
る駆動機構とを具備したレーザービームの位置決め装
置。
1. A laser light source, an optically rough object for diffusing a laser beam from the laser light source to generate an interference pattern having a two-dimensional intensity distribution, a laser beam for the rough surface object and the interference pattern. A rotation mechanism for rotating the irradiation point of the center, a photodetector of the laser beam, and a time variation that increases as the distance from the center of the laser beam of the light intensity signal detected by this photodetector is detected, Positioning device for laser beam provided with a signal processing circuit that outputs a signal proportional to time variation, and a drive mechanism that receives a signal from the signal processing circuit and shifts the direction of the light source in a direction in which the time variation is reduced. .
JP59075231A 1984-04-13 1984-04-13 Positioning device for laser beam Expired - Lifetime JPH0616244B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59075231A JPH0616244B2 (en) 1984-04-13 1984-04-13 Positioning device for laser beam

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59075231A JPH0616244B2 (en) 1984-04-13 1984-04-13 Positioning device for laser beam

Publications (2)

Publication Number Publication Date
JPS60218123A JPS60218123A (en) 1985-10-31
JPH0616244B2 true JPH0616244B2 (en) 1994-03-02

Family

ID=13570239

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59075231A Expired - Lifetime JPH0616244B2 (en) 1984-04-13 1984-04-13 Positioning device for laser beam

Country Status (1)

Country Link
JP (1) JPH0616244B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07291348A (en) * 1994-04-19 1995-11-07 Fuji Mach Co Ltd Sandwich package

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58167907A (en) * 1982-03-30 1983-10-04 Agency Of Ind Science & Technol Device for detecting central position of rotation of rotary body

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07291348A (en) * 1994-04-19 1995-11-07 Fuji Mach Co Ltd Sandwich package

Also Published As

Publication number Publication date
JPS60218123A (en) 1985-10-31

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