JPH0615392Y2 - 高周波誘導結合プラズマ質量分析計 - Google Patents
高周波誘導結合プラズマ質量分析計Info
- Publication number
- JPH0615392Y2 JPH0615392Y2 JP11797787U JP11797787U JPH0615392Y2 JP H0615392 Y2 JPH0615392 Y2 JP H0615392Y2 JP 11797787 U JP11797787 U JP 11797787U JP 11797787 U JP11797787 U JP 11797787U JP H0615392 Y2 JPH0615392 Y2 JP H0615392Y2
- Authority
- JP
- Japan
- Prior art keywords
- inductively coupled
- high frequency
- coupled plasma
- frequency inductively
- argon gas
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11797787U JPH0615392Y2 (ja) | 1987-07-31 | 1987-07-31 | 高周波誘導結合プラズマ質量分析計 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11797787U JPH0615392Y2 (ja) | 1987-07-31 | 1987-07-31 | 高周波誘導結合プラズマ質量分析計 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6423867U JPS6423867U (enExample) | 1989-02-08 |
| JPH0615392Y2 true JPH0615392Y2 (ja) | 1994-04-20 |
Family
ID=31361922
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11797787U Expired - Lifetime JPH0615392Y2 (ja) | 1987-07-31 | 1987-07-31 | 高周波誘導結合プラズマ質量分析計 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0615392Y2 (enExample) |
-
1987
- 1987-07-31 JP JP11797787U patent/JPH0615392Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6423867U (enExample) | 1989-02-08 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPH05251038A (ja) | プラズマイオン質量分析装置 | |
| CA2796819C (en) | Oxidation resistant induction devices | |
| Kaneco et al. | Optimization of operating conditions in individual airborne particle analysis by inductively coupled plasma mass spectrometry | |
| JPH0615392Y2 (ja) | 高周波誘導結合プラズマ質量分析計 | |
| JPH0518844Y2 (enExample) | ||
| JP2000164169A (ja) | 質量分析計 | |
| JPH0518845Y2 (enExample) | ||
| Pisonero-Castro et al. | Further development of a simple glow discharge source for direct solid analysis by on-axis time of flight mass spectrometry | |
| JPH06203790A (ja) | 質量分析装置 | |
| JPH07123035B2 (ja) | 高周波誘導結合プラズマ・質量分析装置 | |
| JP2836190B2 (ja) | 高周波誘導結合プラズマ分析装置 | |
| JPH0638372Y2 (ja) | 高周波誘導結合プラズマ質量分析装置 | |
| JPH0736324B2 (ja) | 高周波誘導結合プラズマ・質量分析計 | |
| JPH0518842Y2 (enExample) | ||
| JPH05121041A (ja) | 高周波誘導結合プラズマ質量分析計 | |
| JPH06342697A (ja) | Icpトーチ | |
| JPH0541496Y2 (enExample) | ||
| JP3038839B2 (ja) | 高周波誘導結合プラズマ質量分析計 | |
| JPS6398948A (ja) | 高周波誘導結合プラズマ・質量分析計 | |
| JPH0448628Y2 (enExample) | ||
| JPH04104449A (ja) | 高周波誘導プラズマ質量分析計 | |
| JPH02227653A (ja) | 高周波誘導結合プラズマ質量分析計 | |
| JP2789641B2 (ja) | 高周波誘導結合プラズマ質量分析計 | |
| JP2982189B2 (ja) | 高周波誘導結合プラズマ質量分析計 | |
| JPS63308857A (ja) | 誘導結合プラズマ・質量分析計 |