JPH0615390Y2 - 試料予備室を備えた電子顕微鏡 - Google Patents
試料予備室を備えた電子顕微鏡Info
- Publication number
- JPH0615390Y2 JPH0615390Y2 JP7633088U JP7633088U JPH0615390Y2 JP H0615390 Y2 JPH0615390 Y2 JP H0615390Y2 JP 7633088 U JP7633088 U JP 7633088U JP 7633088 U JP7633088 U JP 7633088U JP H0615390 Y2 JPH0615390 Y2 JP H0615390Y2
- Authority
- JP
- Japan
- Prior art keywords
- chamber
- sample
- electron microscope
- preparatory
- vacuum
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7633088U JPH0615390Y2 (ja) | 1988-06-10 | 1988-06-10 | 試料予備室を備えた電子顕微鏡 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7633088U JPH0615390Y2 (ja) | 1988-06-10 | 1988-06-10 | 試料予備室を備えた電子顕微鏡 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH01179351U JPH01179351U (US20090163788A1-20090625-C00002.png) | 1989-12-22 |
JPH0615390Y2 true JPH0615390Y2 (ja) | 1994-04-20 |
Family
ID=31301360
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7633088U Expired - Lifetime JPH0615390Y2 (ja) | 1988-06-10 | 1988-06-10 | 試料予備室を備えた電子顕微鏡 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0615390Y2 (US20090163788A1-20090625-C00002.png) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4063503B2 (ja) * | 2001-04-10 | 2008-03-19 | 日本電子株式会社 | 電子顕微鏡 |
CN111948240B (zh) * | 2020-08-17 | 2023-12-22 | 浙江祺跃科技有限公司 | 一种原位高温蠕变疲劳扫描电子显微镜 |
-
1988
- 1988-06-10 JP JP7633088U patent/JPH0615390Y2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH01179351U (US20090163788A1-20090625-C00002.png) | 1989-12-22 |
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