JPH0613384A - Formation method for electrode of ic chip - Google Patents

Formation method for electrode of ic chip

Info

Publication number
JPH0613384A
JPH0613384A JP17036892A JP17036892A JPH0613384A JP H0613384 A JPH0613384 A JP H0613384A JP 17036892 A JP17036892 A JP 17036892A JP 17036892 A JP17036892 A JP 17036892A JP H0613384 A JPH0613384 A JP H0613384A
Authority
JP
Japan
Prior art keywords
chip
resist
electrode
electrodes
permanent
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17036892A
Other languages
Japanese (ja)
Inventor
Kazuji Azuma
和司 東
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP17036892A priority Critical patent/JPH0613384A/en
Publication of JPH0613384A publication Critical patent/JPH0613384A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To form a permanent resist for protecting the surfaces of IC chips used for various kinds of electronic equipment, and joining electrodes capable of maintaining the narrow distance between the electrodes simultaneously. CONSTITUTION:Using a negative-type photosensitive polyimide 2a, permanent resist 2 is formed on an IC chip 1 excluding the parts of the aluminum electrodes 4 of the IC chip 1. Following this, gold plating 7 processing of the aluminum electrodes 4 are performed, after temporary resist 5 is formed on the permanent resist 2 using positive-type photosensitive resist 5a. Then the temporary resist 5 is removed, and joining electrodes in the shape of a rectangular parallelopiped are formed. This method prevents the generation of surface flaws of the IC chip 1, and increases the reliability. In addition, it becomes possible to maintain the narrow distance between the electrodes and reduce the size of the IC chip 1.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、各種電子機器に用いる
ICチップに直方体形状の接合用の電極を形成するIC
チップの電極形成方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an IC for forming rectangular parallelepiped bonding electrodes on an IC chip used in various electronic devices.
The present invention relates to a chip electrode forming method.

【0002】[0002]

【従来の技術】近年、電子部品は、より小形化,より軽
量化を目指して発達している。その一環として、TA
B,ベアICチップの実装工法においては、ICチップ
に接合用の電極が形設されている。
2. Description of the Related Art In recent years, electronic parts have been developed aiming at further downsizing and weight reduction. As part of that, TA
B. In the bare IC chip mounting method, electrodes for bonding are formed on the IC chip.

【0003】以下に従来のICチップの電極形成方法に
ついて説明する。図2(a)に示すように、アルミ電極
4を配設したICチップ1上に数ミクロンの感光性レジ
ストを用いて一時レジスト8を形設した後、アルミ電極
4上に金電極9を形設し、一時レジスト8を除去して、
図2(b)に示すように、アルミ電極4に接合用の金電
極9を形成する方法がある。
A conventional method for forming electrodes of an IC chip will be described below. As shown in FIG. 2A, after a temporary resist 8 is formed on the IC chip 1 having the aluminum electrode 4 by using a photosensitive resist of several microns, a gold electrode 9 is formed on the aluminum electrode 4. And remove the temporary resist 8
As shown in FIG. 2B, there is a method of forming a gold electrode 9 for bonding on the aluminum electrode 4.

【0004】また、図3に示すように、数ミクロンの感
光性ポリイミドを用いて、ICチップ1の表面を保護す
る永久レジスト10を形設した後、アルミ電極4上に接
合用の金電極9を形成する方法がある。
Further, as shown in FIG. 3, a permanent resist 10 for protecting the surface of the IC chip 1 is formed by using a photosensitive polyimide of several microns, and then a gold electrode 9 for bonding is formed on the aluminum electrode 4. There is a method of forming.

【0005】これらの両者ともに金電極9は、アルミ電
極4上にはみ出すので、アルミ電極4の所定の狭い電極
間距離を維持できない。
In both of these, since the gold electrode 9 protrudes above the aluminum electrode 4, it is not possible to maintain a predetermined narrow interelectrode distance of the aluminum electrode 4.

【0006】この対策として、図4(a)に示すよう
に、ICチップ1のアルミ電極4以外の部分に感光性レ
ジスト12を厚く塗布してから、アルミ電極4上に金電
極11を直方体形状に、形設した後、感光性レジスト1
2を除去して、図4(b)に示すように、直方体形状の
接合用の金電極11を形成する方法がある。
As a countermeasure against this, as shown in FIG. 4 (a), a thick photosensitive resist 12 is applied to a portion other than the aluminum electrode 4 of the IC chip 1, and then a gold electrode 11 is formed on the aluminum electrode 4 in a rectangular parallelepiped shape. Then, after forming, a photosensitive resist 1
There is a method of removing 2 to form a rectangular parallelepiped gold electrode 11 for bonding as shown in FIG.

【0007】[0007]

【発明が解決しようとする課題】しかしながら上記の従
来の方法では、ICチップ1の表面を保護するための永
久レジストの形設と所定の狭い電極間距離を維持する接
合用の電極を同時に形成することができないという問題
点を有していた。
However, in the above-mentioned conventional method, a permanent resist for protecting the surface of the IC chip 1 and an electrode for bonding which maintains a predetermined narrow electrode distance are simultaneously formed. It had a problem that it could not.

【0008】本発明は上記従来の問題点を解決するもの
で、ICチップの表面を保護する永久レジストと、狭い
電極間距離を維持する接合用の電極を同時に形成するI
Cチップの電極形成方法を提供することを目的とする。
The present invention solves the above-mentioned problems of the prior art by simultaneously forming a permanent resist for protecting the surface of an IC chip and a bonding electrode for maintaining a narrow inter-electrode distance.
An object of the present invention is to provide a method for forming an electrode for a C chip.

【0009】[0009]

【課題を解決するための手段】この目的を達成するため
に本発明のICチップの電極形成方法は、ICチップ上
にネガ型の感光性ポリイミドを用いて、ICチップ上の
アルミ電極の部分を除いて永久レジストを形設し、つい
でポジ型の感光性レジストを用いて、永久レジスト上に
一時レジスト上を形設した後、アルミ電極に金めっき処
理し、ついで一時レジストを除去して直方体形状の接合
用の電極を形成させる方法である。
In order to achieve this object, an electrode forming method of an IC chip according to the present invention uses a negative photosensitive polyimide on the IC chip to form an aluminum electrode portion on the IC chip. Except for this, a permanent resist is formed, and then a positive photosensitive resist is used to form a temporary resist on the permanent resist.The aluminum electrode is then plated with gold, and then the temporary resist is removed to form a rectangular parallelepiped shape. This is a method of forming an electrode for bonding of.

【0010】[0010]

【作用】この方法において、ICチップの表面を保護す
る永久レジストと所定の狭い電極間距離を維持する接合
用の電極を同時に形成することとなる。
In this method, the permanent resist for protecting the surface of the IC chip and the bonding electrode for maintaining a predetermined narrow distance between the electrodes are simultaneously formed.

【0011】[0011]

【実施例】以下、本発明の一実施例について図面を参照
しながら説明する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to the drawings.

【0012】図1(a)に示すように、アルミ電極4を
配設したICチップにネガ型の感光性ポリイミド2aを
塗布し、露光マスク3をアルミ電極4に合わせて露光,
現像して、図1(b)に示すように、ICチップ1上の
アルミ電極4の部分の感光性ポリイミド2aを除去して
永久レジスト2を形設させる。
As shown in FIG. 1A, an IC chip having an aluminum electrode 4 is coated with a negative photosensitive polyimide 2a, and an exposure mask 3 is aligned with the aluminum electrode 4 for exposure.
After development, as shown in FIG. 1B, the photosensitive polyimide 2a on the aluminum electrode 4 on the IC chip 1 is removed to form the permanent resist 2.

【0013】ついで、図1(c)に示すように、ポジ型
の感光性レジスト5aを塗布し、露光マスク6を永久レ
ジスト2に合わせて露光,現像して、図1(d)に示す
ように、ICチップ1上にそのアルミ電極4の部分が開
口された状態で永久レジスト2と一時レジスト5を2段
重ねで形設する。
Then, as shown in FIG. 1C, a positive type photosensitive resist 5a is applied, and an exposure mask 6 is exposed and developed in accordance with the permanent resist 2, and as shown in FIG. 1D. Then, the permanent resist 2 and the temporary resist 5 are formed in two steps on the IC chip 1 with the aluminum electrode 4 portion opened.

【0014】ついで、図1(e)に示すように、アルミ
電極4上に金めっき処理した後一時レジスト5を除去し
て、図1(f)に示すように、永久レジスト2と所定の
狭い電極間距離を維持した直方体形状のアルミ電極4に
金めっき7した接合用の電極を形成させる。
Then, as shown in FIG. 1 (e), the aluminum electrode 4 is plated with gold, and then the temporary resist 5 is removed. As shown in FIG. 1 (f), a permanent resist 2 and a predetermined narrow space are formed. An electrode for bonding plated with gold 7 is formed on an aluminum electrode 4 having a rectangular parallelepiped shape in which the distance between the electrodes is maintained.

【0015】以上のように本実施例によれば、従来の方
法では同時に形成できなかった永久レジストと所定の狭
い電極間距離を維持する直方体形状の接合用の電極とが
同時に形成できて、ICチップ1の表面傷の発生を防止
して信頼性を向上でき、かつ狭い電極間距離を絶縁して
ICチップ1を小形化できる。
As described above, according to this embodiment, the permanent resist, which cannot be formed simultaneously by the conventional method, and the rectangular parallelepiped bonding electrode which maintains a predetermined narrow interelectrode distance, can be formed at the same time. The surface damage of the chip 1 can be prevented and reliability can be improved, and the IC chip 1 can be miniaturized by insulating a narrow inter-electrode distance.

【0016】[0016]

【発明の効果】以上の実施例の説明からも明らかなよう
に本発明は、ICチップ上にネガ型の感光性ポリイミド
を用いて、ICチップ上のアルミ電極の部分を除いて永
久レジストを形設し、ついで、ポジ型の感光性レジスト
を用いて、永久レジスト上に一時レジストを形設した
後、アルミ電極に金めっき処理し、一時レジストを除去
して直方体形状の接合用の電極を形成させる方法によ
り、ICチップの表面を保護する永久レジストと、狭い
電極間距離を維持する接合用の電極を同時に形成できる
優れたICチップの電極形成方法を実現できるものであ
る。
As is apparent from the above description of the embodiments, the present invention uses a negative photosensitive polyimide on an IC chip to form a permanent resist except the aluminum electrode portion on the IC chip. Then, using a positive-type photosensitive resist, a temporary resist is formed on the permanent resist, and then the aluminum electrode is gold-plated and the temporary resist is removed to form a rectangular parallelepiped-shaped bonding electrode. By this method, it is possible to realize an excellent electrode forming method for an IC chip, which can simultaneously form a permanent resist for protecting the surface of the IC chip and an electrode for bonding which maintains a narrow inter-electrode distance.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例のICチップの電極形成方法
の概念を工程順に示した断面略図
FIG. 1 is a schematic cross-sectional view showing the concept of an electrode forming method for an IC chip according to an embodiment of the present invention in the order of steps.

【図2】従来のICチップの電極形成方法の感光性レジ
ストを用いて電極を形成する概念を示した断面略図
FIG. 2 is a schematic cross-sectional view showing the concept of forming electrodes using a photosensitive resist in the conventional method for forming electrodes of IC chips.

【図3】同ICチップの電極形成方法の永久レジストを
用いて形成した電極を示した断面略図
FIG. 3 is a schematic sectional view showing an electrode formed by using a permanent resist in the electrode forming method of the IC chip.

【図4】同ICチップの電極形成方法の直方体形状の電
極を形成する概念を示した断面略図
FIG. 4 is a schematic cross-sectional view showing the concept of forming a rectangular parallelepiped-shaped electrode in the electrode forming method of the same IC chip.

【符号の説明】[Explanation of symbols]

1 ICチップ 2 永久レジスト 2a 感光性ポリイミド 4 アルミ電極 5 一時レジスト 5a 感光性レジスト 7 金めっき 1 IC Chip 2 Permanent Resist 2a Photosensitive Polyimide 4 Aluminum Electrode 5 Temporary Resist 5a Photosensitive Resist 7 Gold Plating

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 ICチップ上にネガ型の感光性ポリイミ
ドを塗布した後、露光・現像させて、前記ICチップの
アルミ電極の部分を除いて永久レジストを形設し、つい
でポジ型の感光性レジストを塗布した後、露光・現像さ
せて、前記永久レジスト上に一時レジストを形設し、つ
いで前記アルミ電極上に金めっき処理し、前記一時レジ
ストを除去して、直方体形状の接合用の電極を形成する
ICチップの電極形成方法。
1. A negative photosensitive polyimide is applied on an IC chip, exposed and developed to form a permanent resist except the aluminum electrode portion of the IC chip, and then a positive photosensitive resin. After applying a resist, it is exposed and developed to form a temporary resist on the permanent resist, and then gold plating is performed on the aluminum electrode, and the temporary resist is removed to form a rectangular parallelepiped bonding electrode. A method for forming an electrode of an IC chip for forming a substrate.
JP17036892A 1992-06-29 1992-06-29 Formation method for electrode of ic chip Pending JPH0613384A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17036892A JPH0613384A (en) 1992-06-29 1992-06-29 Formation method for electrode of ic chip

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17036892A JPH0613384A (en) 1992-06-29 1992-06-29 Formation method for electrode of ic chip

Publications (1)

Publication Number Publication Date
JPH0613384A true JPH0613384A (en) 1994-01-21

Family

ID=15903642

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17036892A Pending JPH0613384A (en) 1992-06-29 1992-06-29 Formation method for electrode of ic chip

Country Status (1)

Country Link
JP (1) JPH0613384A (en)

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