JPH06131510A - Contactless type ic card and its testing device - Google Patents

Abstract

PURPOSE:To set up a card to a test mode in a contactless state by outputting a data signal and a reset signal from an antenna to a contactless IC card at prescribed timing. CONSTITUTION:A contactless type IC card 22 includes an antenna 5 for transfering a data signal 23 as a radio wave, an antenna 6 for receiving a reset signal 24 as a radio wave and a MODEM, a reader/ writer 33 includes an antenna 27 for transfering the data signal 23 to/from the card 22 and an antenna 28 for reset. Both the card 22 and reader/writer 33 are connected to a transfering circuit 29. In the case of setting up the card 22 to a test mode, an I/O control circuit 30 in the reader/writer 33 controls the circuit 29 so as to transmit both signals 23, 24 at the same timing as that for setting up the test mode in a contact state. Consequently a testing terminal can be removed from the card 22, the generation of surge destruction or the like can be prevented and environment protection can be improved.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a non-contact type IC card test device and a non-contact type IC card for performing a non-contact type functional test of a non-contact type IC card.

[0002]

2. Description of the Related Art FIG. 16 shows a non-contact type IC card (hereinafter referred to as a card) which exchanges data with a non-contact medium, and is a block diagram of a non-contact type card using radio waves as an example. Is. In the figure, 1 is a contactless card, 2
Is an IC in which circuits necessary for the non-contact type card 1 to achieve various purposes are built in, 3 is a component such as a resistor, a capacitor, and an oscillator, and 4 is the non-contact type card 1 operates. A battery serving as a power source for the battery, 5 is an antenna formed of a coil antenna used for exchanging data with the outside through radio waves, and 6 is a reset signal for resetting the contactless card 1. The reset antenna is composed of a coil antenna. 2-6 above
Is built into card 1.

Reference numeral 7 is a data receiving RXD terminal for directly exchanging data, 8 is a data transmitting TXD terminal,
Reference numeral 9 is an RST terminal for resetting the card 1, 10 is a Vcc terminal, and 11 is a GND terminal. The items 7 to 11 are provided on the surface of the card 1.

FIG. 17 is a diagram showing the functional blocks in the card 1. The card 1 has a CPU 12 for executing a program.
An input / output control circuit for controlling input / output of data between a ROM 13 for storing a program for driving the CPU 12 and fixed data, a RAM 14 for storing temporary data and variable data, and an external device. 15, a bus 16 for transmitting data and address, and an antenna 5
A modulation / demodulation circuit 17 for converting the radio signal received in step 1 into a digital signal and the digital signal into an analog signal for transmitting the radio signal, and input data 18 and output data 19 other than the radio
RXD terminal 7 and TXD terminal 8 which can directly exchange the data, and RST terminal 9 and Vcc which can directly input the reset signal 20.
It incorporates a terminal 10 and a GND terminal 11.

FIG. 18 is a test flowchart for testing the card 1, and FIG. 19 is a timing chart showing an example of the input timing of each signal when entering the test mode. FIG. 20 is a configuration diagram of a contactless reader / writer (hereinafter referred to as R / W) used to operate the card 1. An antenna 100 for transmitting / receiving data by radio waves to the R / W and an input / output control circuit 10 for controlling what data is transmitted / received from the antenna 100.
1 and a modulation / demodulation circuit 102 for demodulating a radio wave into a digital signal or modulating the digital signal as a radio wave. The input / output control circuit 101 is connected to the personal computer 103.

Next, the operation will be described. In addition to the normal operation mode, the card 1 stores the input data 18 in the RAM 14 in the card 1, and when the data input is completed, a test mode in which the input data 18 is executed as a test program in the card 1 There is a so-called mode, and the CPU 12 monitors the RXD terminal 7 and the RST terminal 9, and the test mode is set only when a specific timing, for example, a signal as shown in FIG. 19 is directly input through the RST terminal 9 and the RXD terminal 7. It is supposed to enter.
In FIG. 19, when the RXD terminal 7 is L, the RST terminal 9
Becomes L, and the RXD signal also rises from L to H within a predetermined time T after the reset signal 20 rises from L to H, the test mode is entered.

After entering this test mode, the card 1
Runs all test programs and reset signal 20
The CPU 12 continues to operate until is input. The result executed in the card as a test program is TX
It is adapted to be returned as output data 19 through the D terminal 8.

As can be seen from the structure of the R / W in FIG. 20, the conventional R / W is provided with the antenna 100 for exchanging data with the card 1, but the card 1 is reset. No reset coil for outputting a reset signal for resetting, a reset signal generating circuit, and the like are provided. In this antenna 100, only the transmission / reception of data is performed using the input / output control circuit 101 and the modulation / demodulation circuit 102, so that the reset signal cannot be added at the same time as the data in the non-contact state.

Therefore, since the test in the test mode cannot be performed by using the R / W, the conventional R as shown above is used.
XD7, TXD8, RST9, Vcc10, GND11
The test was conducted by using a test device such as an LSI tester through each terminal. The data transfer between the tester and the card 1 at this time is performed by the flowchart shown in FIG. 18, and as the initial setting in step ST1, the tester and the card are made to have the same data and transmission speed immediately after the start of the operation, thereby exchanging data with each other. Can be performed normally. Then, in the next step ST2, the RXD terminals 7, R
The ST terminal 9 is monitored to check the input timing as shown in FIG. 19. If there is no input timing, the normal operation user mode is executed in step ST3. When the input timing is detected, the test mode is entered in step ST4, and the test programs are sequentially executed in step ST5.

During the test, it is checked in step ST6 whether or not the reset signal 20 is input, and while the reset signal 20 is not input, the test in step ST5 is continued. If the reset signal 20 is input in step ST6 or all the programs are completed in step ST7, the test mode is terminated in step ST8, and step ST2 is executed.
Return to.

In the test mode of step ST5, step S51 is performed while monitoring whether or not reception of all data from the tester has been completed.
The received data is sequentially executed as a test program at T52, and the test result is returned to the R / W at step ST53.

[0012]

Since the conventional non-contact type card is constructed as described above, an LSI tester or the like is used to directly input a signal to each terminal when performing a functional test of the card. I was exchanging data and testing. Therefore, at least the data input / output terminals 7 and 9 for entering the test mode, the reset terminal 10 and the power supply 4 and the ground terminals 11 are exposed on the surface of the card, which may cause electrostatic breakdown or terminals. There are problems such as various defects caused by exposure.

Further, even though it is a non-contact type card, each terminal 7 to 11 is exposed on the surface, and there is a contradiction that the functional test is conducted in a contact state. Further, the transmission strength and the reception sensitivity of the card were measured by measuring the communication distance using the R / W actually used, which was not preferable in the card test. Further, even if it is determined that the communication distance is poor, there is a problem that it is not immediately understood whether the transmission strength is weak and the reception is poor, or the reception sensitivity is poor and the transmission is poor. There is also a method of measuring the transmission characteristics of the card by using an electric field strength meter, but there is a problem in that the measuring device (equipment) becomes oversized and there is an inconvenience that it cannot be easily measured.

The invention of claim 1 has been made to solve the above problems, and a test apparatus capable of putting the card in a test mode in a non-contact state by removing all terminals from the surface of the card. Aim to get.

According to a second aspect of the present invention, when a card is to be removed from the R / W during the test mode, a test device can be forcibly reset in a non-contact state to stop the operation of the card. With the goal.

It is an object of the present invention to provide a test device capable of analyzing the functional test contents of a card in a non-contact manner by using the test device.

According to the invention of claim 4, all the data in the card can be read in a non-contact state, and this function can be used only in the test mode. It is an object of the present invention to obtain a non-contact type IC card which can prevent reading of data.

It is an object of the present invention to obtain a test apparatus capable of increasing the data transmission speed during the test and shortening the test time by increasing the resonance frequency of the transmitting / receiving antenna only in the test mode. And

It is an object of the present invention to provide a test apparatus capable of measuring the transmission strength of a card by determining the strength of radio waves from the card by using a plurality of demodulation circuits having different receiving sensitivities. And

According to a seventh aspect of the present invention, by changing the transmission intensity of the transmission circuit, it is possible to determine the strength of the radio wave which the card operates to obtain a test device capable of measuring the reception sensitivity of the card. The purpose is to

[0021]

According to a first aspect of the present invention, there is provided a non-contact type IC card test apparatus which outputs a data signal and a reset signal from an antenna to a non-contact type IC card at a predetermined timing. It is the one.

In the non-contact type IC card test apparatus according to the second aspect of the present invention, when the detecting means detects the state of the card being present and the state of the card being not present, a reset signal is output to the non-contact type IC card. It is the one.

A non-contact type IC card test apparatus according to a third aspect of the present invention receives and analyzes the data indicating the test execution result sent from the tested non-contact type IC card and analyzes the test result. It was decided to judge.

A non-contact type IC card according to a fourth aspect of the present invention is such that when a predetermined signal is received from a test device, all the data in the memory is read and transmitted.

A non-contact type IC card test apparatus according to a fifth aspect of the present invention is provided with switching means for switching the resonance frequency of the antenna resonance circuit of the antenna.

According to a sixth aspect of the present invention, there is provided a non-contact type IC card test apparatus which receives a signal from a non-contact type IC card by a plurality of receiving circuits having different receiving sensitivities, and which receiving circuit normally receives data. It is determined whether or not was received.

According to a seventh aspect of the present invention, there is provided a non-contact type IC card test apparatus in which a transmission / reception state of data is judged by controlling a transmission intensity of a transmission circuit.

[0028]

In the non-contact type IC card test apparatus according to the present invention, a signal is transmitted from the data signal antenna and the reset antenna to the card, the card receives the signal, and the Enter the test mode in the contact state.

In the noncontact IC card test apparatus according to the second aspect of the present invention, when the card is about to be removed from the apparatus, the detecting means provided in the apparatus sends a reset signal to the card to stop the operation of the card. Let

In the non-contact type IC card test device according to the third aspect of the present invention, all control of data exchange with the card is performed by the control device such as a personal computer, and the test result returned by the card is executed in the control device. , It is judged whether it is normal or not, and the result is displayed so that the test executor can see the result.

The non-contact type IC card according to the invention of claim 4 returns all the data in the memory in the card upon receiving a specific signal.

In the noncontact IC card test apparatus according to the fifth aspect of the present invention, the switching means for switching the resonance frequency of the antenna resonance circuit of the antenna is provided.
The resonance frequency of the antenna can be increased only in the test mode, so that the transmission / reception frequency between the test device and the card can be set accordingly to increase the data transmission rate.

In the non-contact type IC card test apparatus according to the sixth aspect of the present invention, a plurality of demodulation circuits having different reception sensitivities are used, and data is transmitted and received by each of the reception circuits. If the radio waves from the cards at the same position receive the same strength, the strength of the radio waves transmitted from the card can be determined by changing the reception sensitivity and exchanging data.

In the non-contact type IC card test apparatus according to the seventh aspect of the present invention, the strength of the radio wave is changed by changing the transmission strength. If the cards are located at the same position, the strength of reception of the card changes in proportion to the strength of the radio wave, so that the reception sensitivity of the card can be determined by the change of the transmission strength.

[0035]

【Example】

Example 1. An embodiment of the invention of claim 1 will be described below with reference to the drawings. It should be noted that the same parts or corresponding parts in FIGS. FIG. 1 is a block diagram of a non-contact type IC card according to the present invention, in which a non-contact type card 22 is a conventional card 2
2 All the terminals 7 to 11 of FIG. 16 exposed on the surface are removed. FIG. 2 is a functional block diagram of the non-contact type card 22 and an R / W as a test device, and 33 is an R / W (reader / writer). The contactless card 22 includes an antenna 5 for transmitting and receiving a data signal 23 in radio waves and a reset antenna 6 for receiving a reset signal 24 in radio waves.
And the signal received by each antenna coil is the data signal 2
5. A modulation / demodulation circuit 17 for converting the reset signal 26 is incorporated. Further, the R / W 33 has a built-in antenna 27 for transmitting / receiving the data signal 23 to / from the card 22, and a reset antenna 28, which are connected to the transmitting / receiving circuit 29 and the input / output control circuit 30, respectively. FIG. 3 is a timing chart showing the signals 25 and 26.

Next, the operation will be described. There is no terminal on the surface of the card 22 and the R / W33
The antenna coil 27 and the reset coil 28 therein are arranged at positions where the signals 23 and 24 can be normally transmitted to the corresponding antennas 5 and 6 of the card 22. If you try to put the card 22 into test mode with this test system,
A transmission / reception circuit that transmits the data signal 23 and the reset signal 24 at the same timing as when the input / output control circuit 30 in the R / W 33 enters the test mode in the contact state instead of directly inputting the signal from the terminal 29 to send a signal to each corresponding antenna 5, 5 of the card 22. The card 22 converts the received signal into the respective digital signals 25 and 26 through the modulation / demodulation circuit 17.

As shown in FIG. 3, the signals 25 and 26 are the same as those in FIG. 19 in terms of timing. Therefore, even in the non-contact state, the R / W 33 has the built-in antenna 27 for resetting the card and the antenna 28 for exchanging data, and by transmitting the data and the reset signal to the card 22 at the same timing as the timing of entering the test mode. The card can be put into test mode without contact.

Example 2. FIG. 4 is a perspective view showing an embodiment of the invention of claim 2. A push switch 31 is provided at a position where the card of the R / W 33 is placed as a detecting means for turning the switch ON or OFF depending on whether the card 22 is placed on the R / W 33. In addition, this card 22
The position where the card is placed is a position where the card 22 can be put into the test mode in a non-contact state and a test can be normally performed.

FIG. 5A shows the push switch 31 in the OFF state when the non-contact card 22 is placed on the R / W 33, and FIG. 5B shows the push switch 31 when the non-contact card 22 is removed. It is the figure which showed that it was in an ON state intelligibly. FIG. 6 is a block diagram of a circuit that outputs the reset signal 24 when the card 22 is removed from the R / W 33 using the push switch 31.
A push switch O is provided at the next stage of the push switch 31.
A reset signal generator 32 that outputs a reset signal 24 when N or OFF is connected.

Next, the operation will be described. In the test mode, the card continues to operate until all tests are completed or reset is performed. Therefore, when the test was completed in the middle, the reset signal was directly input to the RST terminal 9 to interrupt the test. Was. In this test system, RS
Since the T terminal 9 is not provided on the card, the reset signal generation circuit 32 is built in the R / W 33, it is judged whether the card 22 is present or not, and if the card is to be removed during the test, it is forced from the R / W 33. Specifically, the reset signal 24 is transmitted to stop the operation of the card. For example, the push switch 31 is set to O by the weight of the card 22.
Card 22 is R / W as a switch that turns off and on
When the card 22 is placed on 33, it is in the OFF state shown in FIG. 5A, when the card 22 is removed from the R / W 33, it is in the ON state shown in FIG.
If the reset signal generating circuit 32 that outputs the reset signal 24 when the switch 31 is turned on is connected, the reset signal is forcibly output if the card 22 is removed during the test. , Stop the operation of the card.

Example 3. In the second embodiment, the R / W
The push switch 31 for turning on / off the weight of the card 22 is used to determine whether or not the card 22 on the 33 is in a position where a normal test can be performed. However, the presence or absence of the card is detected. Anything may be used, and a sensor such as an infrared sensor may be used.

Example 4. FIG. 7 is a block diagram showing an embodiment of the invention of claim 3, wherein a control device such as a personal computer 103 is connected to the R / W 33, and the R / W 33 and the card 22 are connected.
All the data between are controlled by the personal computer 103. FIG. 8 is a flowchart showing the test operation.

Next, the operation will be described. First, in step ST81, the card 22 is put into the test mode in the non-contact state as in the first embodiment. After confirming that the card 22 has entered the test mode in the R / W 33, the test program of each test item is transmitted as data from the R / W 33 to the card 22 in step ST82.
When the card 22 finishes receiving the data in step ST83, the data is executed as a test program in the card in step ST84. The test program also includes a program routine for returning the execution result of the test, and the card 22 performs a functional test in the card and returns the result to the R / W 33. When the R / W 33 receives the data in step ST85, step ST8
Compared with the expected value of the test result previously obtained in 6,
Whether the card 22 is normal or defective is determined and displayed in step ST87. In step ST85, if the data is not returned from the card after a certain period of time, in step ST88, the reception T is received in the R / W 33.
An IME error occurs, and the test item is determined to be NG in step ST89.

The above routine is executed for all test items, and various tests can be performed in the card. When all the tests are completed in step ST90, the card 22 exits the test mode and shifts to the normal operation mode in step ST91. It should be noted that the result of this test is a system that uses a control device such as the personal computer 103 to notify the tester by means of a display or sound, so that the test executor can know which item was NG. There is.

Example 5. FIG. 9 is a flowchart showing the operation of the non-contact type card 22 according to the invention of claim 4 during a test. A program routine for transmitting all the contents of the RAM 14 to the R / W 33 when a specific code is received from the R / W 33 is installed in advance in the ROM 13 in the card 22. When the test mode is entered in step ST95 and the specific code is received in step ST96, RAM data is sent in step ST97. As a result, R /
W33 can see all the RAM data in the card 22. After observing the RAM data, the card 22 is reset in step ST98 to stop the operation and shift the operation mode to the normal operation. When a specific code is not received after entering the test mode, various tests are executed according to the procedure shown in the fourth embodiment in step ST99. The RAM data is transmitted by the input / output control circuit 15 in the card 22. The RAM 14 is a memory.

Example 6. FIG. 10 shows an embodiment of the R / W 33 according to the invention of claim 6. The resonance circuit portion 38 of the antenna in the R / W 33 is provided with an electronic switch 34 that switches between the capacitors 37a and 37b in the resonance circuit in order to increase the resonance frequency. This switch is switched by the switching signal 36 output from the input / output control circuit 35.
Is controlled using. The electronic switch 34 and the capacitors 37a and 37b form a switching means.
FIG. 11 is a flowchart when performing a test.

Next, the operation will be described. From the viewpoint of shortening the test time even in the test method of exchanging data through the conventional terminal, the baud rate, which is the data transmission rate, was increased during the test mode to perform the test. Since data is exchanged using radio waves as a non-contact medium, simply setting the baud rate too fast will not allow the carrier frequency corresponding to the baud rate to be set sufficiently to allow normal data transfer. In the present embodiment, the antenna resonance circuit 3 is used together with the setting change of the transmission / reception frequency and the baud rate in the test mode.
The electronic switch 34 is used to change the resonance frequency of 8 so that the data can be transmitted and received normally. The switching signal 36 output from the input / output control circuit 35 is used. By changing the capacitors 37a and 37b in the electronic switch 34, it is possible to cope with the change of the resonance frequency.

In step ST111 of FIG. 11, initial setting is performed and the transmission / reception frequency and the baud rate of the card 22 and the R / W 33 are adjusted to normal values. After the card 22 is set to the test mode by the method of the first embodiment in step ST112,
In step ST113, the resonance frequency and the baud rate of the card 22 and the R / W 33 are set higher. Next, in step ST113, the switching signal 36 is set so as to match the value set above.
Thus, the electronic switch 34 is switched to change the resonance frequency. Then, in step ST115, the test mode is executed by the method of the fourth embodiment. When the test mode ends in step ST116, the resonance frequency and the baud rate are set to normal values in step ST117, and then step ST11.
At 8, the electronic switch 34 is switched by the switching signal 36 to return to the normal resonance frequency.

Example 7. FIG. 12 is a flow chart showing the test operation of the test apparatus according to the invention of claim 6,
9 is a flow chart for measuring at what level of transmission intensity each analog gate can normally measure a signal using a dummy signal by using analog gates having different reception levels in / W33. FIG. 13 shows R / W3 obtained in FIG.
3 is a flowchart for measuring the transmission strength from the card based on the performance of each receiving circuit of FIG.

Next, the operation will be described. The R / W 33 according to this embodiment has a plurality of receiving circuits (analog gates) having different receiving sensitivities. According to the flow chart shown in FIG. 12, each receiving circuit measures how much transmission intensity it can receive data normally by using a dummy signal. First, in step ST121, initial setting is performed, and R /
After matching the transmission / reception frequency and the baud rate of W33 and the external dummy antenna, in step ST122, the reception circuit is set to the circuit having the lowest reception sensitivity. Next, in step ST123, the dummy antenna is used to set the transmission strength at which the R / W 33 can normally receive data from a certain position, and in step ST124 the dummy antenna outputs the data. If the R / W 33 can normally receive the data in step ST125, step ST12
At 6, the analog gate of the receiving circuit and the transmission output from the dummy antenna at this time are measured at the same distance as the R / W 33 using an electric field intensity meter. Next, step ST127
After slightly lowering the transmission output from the dummy antenna, the process returns to step ST124, the data is transmitted again to the R / W 33 from the same position, and it is determined in step ST125 whether the data can be normally received. R /
Repeat until W33 can no longer receive data normally. If the data cannot be received normally in step ST125, the setting of the analog gate of the receiving circuit of the R / W 33 is changed to a circuit having good receiving sensitivity in step ST128. Then, from step ST129 to step ST12
Returning to step 4, the data is again output from the dummy antenna. This flow chart is repeated until the analog gate with the highest reception sensitivity is used in step ST129. Finally, it is possible to measure the receiving sensitivity of how much electric field strength each receiving circuit of the R / W 33 normally operates.

The transmission strength of the card 22 can be measured by executing the flowchart shown in FIG. 13 based on the result measured in FIG. First, in step ST131, the card 22 and R / W 33 are initialized, and then step S
At T132, the setting of the receiving circuit in the R / W 33 is set to the gate having the highest receiving sensitivity. Next, step ST133.
Then, the R / W 33 causes the card 22 to execute an instruction to return data from the same position where the test shown in FIG. 12 is performed. In step ST134, it is determined whether the data from the card can be normally received.
At 135, the setting is changed to a circuit having a slightly poor reception sensitivity, and the card 22 is made to execute a command for returning data again from the same position. Repeat the above. If the data from the card 22 cannot be received normally, the setting of the receiving circuit of the R / W 33 at that time is read in step ST136, and the performance of the receiving circuit of the R / W 33 obtained by the method of FIG. 12 is obtained in step ST137. By comparing, the transmission strength of the card can be measured.

Example 8. FIG. 14 is a flow chart showing the test operation of the test apparatus according to the invention of claim 7,
7 is a flowchart for measuring the relationship between the transmission output level of R / W 33 and the transmission intensity (electric field intensity) using a transmission circuit that can arbitrarily change the transmission output level in / W33. FIG. 15 shows the reception performance of the card by checking at which level the output from the R / W 33 normally operates based on the output level and electric field strength of the R / W 33 transmission circuit obtained in FIG. It is a flowchart which measures.

Next, the operation will be described. The R / W 33 according to the present embodiment has a transmission circuit whose transmission output can be freely changed. According to the flowchart shown in FIG. 14, the relationship between the output level setting of the R / W transmission circuit and the transmission intensity is measured using the dummy signal. First, in step ST141, initialization is performed to match the R / W transmission frequency with the baud level, and then in step ST142, the R / W is set.
Set the output level of the transmitter circuit inside to the lowest output level. Next, in step ST143, dummy data is output from the R / W, and in step ST144, the transmission strength (electric field strength) at a certain predetermined distance from the R / W 33 is calculated as R.
/ W33 Measure with the output level setting. Next, in step ST145, the output level of the R / W 33 is slightly increased, and the transmission level and the electric field strength of the R / W 33 are similarly measured. This measurement is repeated until the transmission output level of the R / W 33 is set to the highest level in step ST146, and when it reaches the highest level, this measurement is ended. Eventually R
The relationship between the setting of the output level of the / W33 transmitter circuit and the electric field strength can be measured.

The reception performance of the card 22 can be measured by executing the flowchart shown in FIG. 15 on the basis of the result measured in FIG. First, step ST151
After initial setting in step ST152, the setting of the receiving circuit of the R / W 33 is set to the gate having the highest receiving sensitivity in step ST152. In steps ST153 and ST154, the card 22 is placed at the same position as the distance measured in FIG. 14, and a data return command is executed for the card. If data can be exchanged normally with the card 22 in step ST155, the transmission output level of the R / W 33 is slightly lowered in step ST156, and data exchange with the card 22 is similarly performed. Repeat the above. If it becomes impossible to normally exchange data with the card 22 in step ST157, step S157
The level setting of the transmitter circuit of the R / W 33 at that time is read by T157 and ST158, and the R value obtained by the method of FIG.
The reception sensitivity of the card 22 can be measured from the performance of the transmission circuit of / W33.

[0055]

As described above, according to the first aspect of the invention, the data signal and the reset signal are output from the antenna to the non-contact type IC card at a predetermined timing. Therefore, it is possible to eliminate the terminals for testing, and therefore it is possible to eliminate all defects such as surge damage, corrosion from the terminal joint part due to exposed terminals, and to obtain a reliable card with excellent environmental resistance. There is an effect that can be.

According to the second aspect of the invention, when the detecting means detects the card-free state from the card-free state, the reset signal is output to the non-contact type IC card. There is an effect that the continuous operation state of the inside card can be stopped and the battery voltage drop of the card due to useless operation can be prevented.

According to the third aspect of the invention, since the data indicating the test execution result sent from the non-contact type IC card on which the test is performed is received and analyzed, the test result is judged. Normal R / W for card function test
Therefore, there is an effect that it becomes possible to perform a test easily without learning a complicated operation method of a test device such as an LSI tester.

According to the fourth aspect of the present invention, all the data in the memory is read out and transmitted when a predetermined signal is received from the test apparatus. Therefore, the failure analysis at the time of returning the defective product from the customer. Moreover, there is an effect that it can be effectively used for debugging when changing the specifications of the program.

According to the fifth aspect of the invention, since the switching means for switching the resonance frequency of the antenna resonance circuit of the antenna is provided, the resonance frequency of the antenna can be increased only in the test mode, and therefore data transmission / reception is possible. The data transmission rate can be increased together with the frequency, and as a result, the test time can be shortened.

According to the sixth aspect of the present invention, the signal from the non-contact type IC card is received by a plurality of receiving circuits having different receiving sensitivities, and it is determined which receiving circuit normally received the data. In addition to the function test in the test mode, it is possible to measure the transmission strength of the card by using the same R / W.

According to the invention of claim 7, the transmission / reception state of the data is judged by controlling the transmission intensity of the transmission circuit. Therefore, the same R / W is used in addition to the function test in the test mode. There is an effect that the reception sensitivity of the card can be measured.

[Brief description of drawings]

FIG. 1 is a configuration diagram of a contactless card according to an embodiment of the present invention.

FIG. 2 is a block diagram of a test apparatus according to an embodiment of the invention of claim 1;

FIG. 3 is a timing chart showing an input timing to a test mode according to the invention of claim 1.

FIG. 4 is a perspective view of a test system according to an embodiment of the present invention.

FIG. 5 is a configuration diagram showing an operation of an embodiment of the invention of claim 2;

FIG. 6 is a block diagram of a reset signal generating portion of the invention of claim 2;

FIG. 7 is a perspective view showing an embodiment of the invention of claim 3;

FIG. 8 is a flow chart showing a flow of a test system according to an embodiment of the invention of claim 3;

FIG. 9 is a flowchart showing a flow of the test system according to the embodiment of the invention of claim 4;

FIG. 10 is a configuration diagram showing an embodiment of the invention of claim 5;

FIG. 11 is a flowchart showing the flow of a test system according to an embodiment of the invention of claim 5;

FIG. 12 is a flowchart for measuring the reception performance of the test apparatus according to the invention of claim 6;

FIG. 13 is a flow chart showing the flow of a test system according to an embodiment of the invention of claim 6;

FIG. 14 is a flowchart for measuring the transmission performance of the test apparatus according to the invention of claim 7;

FIG. 15 is a flow chart showing the flow of a test system according to an embodiment of the invention of claim 7;

FIG. 16 is a configuration diagram of a conventional non-contact card.

FIG. 17 is a block diagram of a conventional non-contact card.

FIG. 18 is a flowchart showing a flow of a conventional contactless card test system.

FIG. 19 is a timing chart showing the input timing to the test mode of the conventional contactless card test system.

FIG. 20 Conventional contactless card R / W (reader / writer)
It is a block diagram of.

[Explanation of symbols]

 14 RAM (memory) 15 Input / output control circuit (judgment means) 22 Non-contact type IC card 23 Data signal 24 Reset signal 27 Antenna 28 Antenna 30 Input / output control circuit 31 Push switch (detection means) 33 Reader / writer (test device) 34 Electronic switch (switching means) 37a, 37b Capacitor (switching means) 38 Antenna resonance circuit 103 Personal computer (control device)

Claims (7)

[Claims] 1. A non-contact type IC card test device, wherein a data signal including a test program is transmitted from an antenna to a non-contact type IC card and a reset signal is transmitted to execute a test. A non-contact type IC card test apparatus comprising an antenna for transmitting a signal and an input / output control circuit for outputting the data signal and the reset signal at a predetermined timing. 2. A non-contact type IC card configured to transmit a data signal including a test program from an antenna to a non-contact type IC card mounted at a predetermined position and to transmit a reset signal to execute a test. In the test apparatus, the detecting means for detecting the presence or absence of the non-contact type IC card at the predetermined position, and resetting the non-contact type IC card when the detecting means detects the state without the card from the state with the card A non-contact type IC card test device comprising an input / output control circuit for outputting a signal. 3. A non-contact type IC card test apparatus, wherein a data signal including a test program is transmitted from an antenna to a non-contact type IC card to execute a test. A non-contact type IC card test apparatus comprising a control device for receiving and analyzing data indicating a test execution result sent from an IC card and determining a test result. 4. A non-contact type IC card configured to receive a data signal including a test program from a test device and execute the test, when the test is performed.
A non-contact type IC card comprising an input / output control circuit for reading and transmitting all data in a memory when a predetermined signal is received from the test device. 5. A non-contact type IC card test apparatus, wherein a data signal including a test program is transmitted from an antenna to a non-contact type IC card to perform a test, wherein the antenna resonance circuit of the antenna resonates. A non-contact type IC card test device comprising switching means for switching frequencies. 6. A non-contact type IC card test apparatus, wherein a data signal including a test program is transmitted from an antenna to a non-contact type IC card to execute a test, and a plurality of receptions each having different reception sensitivity are provided. A non-contact type IC card, comprising a circuit and a judging means for receiving a signal from the non-contact type IC card by each of the receiving circuits and judging which receiving circuit normally receives the data. Test equipment. 7. A non-contact type IC card test device, wherein a data signal including a test program is transmitted from an antenna to a non-contact type IC card to execute a test, and a transmission circuit having a variable transmission intensity, A non-contact type IC card test device, comprising: a determination unit that determines a data transmission / reception state by controlling a transmission intensity of the transmission circuit.