JPH061173B2 - Curved property inspection device - Google Patents

Curved property inspection device

Info

Publication number
JPH061173B2
JPH061173B2 JP63112054A JP11205488A JPH061173B2 JP H061173 B2 JPH061173 B2 JP H061173B2 JP 63112054 A JP63112054 A JP 63112054A JP 11205488 A JP11205488 A JP 11205488A JP H061173 B2 JPH061173 B2 JP H061173B2
Authority
JP
Japan
Prior art keywords
light
hue
curved surface
unit
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP63112054A
Other languages
Japanese (ja)
Other versions
JPH01282410A (en
Inventor
茂樹 小林
保明 谷村
輝久 四ツ谷
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omron Corp
Original Assignee
Omron Tateisi Electronics Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omron Tateisi Electronics Co filed Critical Omron Tateisi Electronics Co
Priority to JP63112054A priority Critical patent/JPH061173B2/en
Priority to DE68925901T priority patent/DE68925901T2/en
Priority to US07/601,722 priority patent/US5245671A/en
Priority to SG1996003498A priority patent/SG66545A1/en
Priority to KR1019900700025A priority patent/KR920006031B1/en
Priority to PCT/JP1989/000470 priority patent/WO1989011093A1/en
Priority to DE68929481T priority patent/DE68929481T2/en
Priority to EP95113574A priority patent/EP0687901B1/en
Priority to SG1996004112A priority patent/SG47736A1/en
Priority to AT89905170T priority patent/ATE135110T1/en
Priority to EP95113579A priority patent/EP0685732B1/en
Priority to DE68929062T priority patent/DE68929062T2/en
Priority to SG1996003459A priority patent/SG47652A1/en
Priority to AU35436/89A priority patent/AU3543689A/en
Priority to EP89905170A priority patent/EP0413817B1/en
Publication of JPH01282410A publication Critical patent/JPH01282410A/en
Publication of JPH061173B2 publication Critical patent/JPH061173B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • G01N21/95684Patterns showing highly reflecting parts, e.g. metallic elements
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)

Description

【発明の詳細な説明】 〈産業上の利用分野〉 この発明は、表面の曲面性状が異なる方向に配向してい
る多数の曲面要素の集合より成る鏡面反射性の曲面体に
つき、各曲面要素の配向生を検出するのに適用される曲
面性状検査装置に関連し、殊にこの発明は、基板上に実
装された部品につき、そのハンダ付け部分の形状などを
検査するのに好適な曲面性状検査装置に関する。
DETAILED DESCRIPTION OF THE INVENTION <Industrial field of application> The present invention relates to a specularly reflective curved surface body composed of a set of many curved surface elements whose surface curved surface properties are oriented in different directions. The present invention relates to a curved surface property inspection apparatus applied to detect orientation defects, and in particular, the present invention relates to a curved surface property inspection apparatus suitable for inspecting the shape of a soldered part of a component mounted on a board. Regarding the device.

〈従来の技術〉 多配向性曲面をもつ鏡面反射性の曲面体として、基板上
に実装された部品におけるハンダ付け部位の表面形状が
その代表例に挙げられる。従来このハンダ付け部位は、
目視検査により検査されており、ハンダ付け状態の良
否、すなわちハンダの有無、量、溶解性、短絡、導通不
良などがこの目視検査によって判定されている。
<Prior Art> As a specularly reflective curved surface body having a multi-orientation curved surface, a representative example thereof is a surface shape of a soldering portion of a component mounted on a substrate. Conventionally, this soldering part is
It is inspected by visual inspection, and whether or not the soldering condition is good, that is, the presence or absence of solder, the amount, the solubility, the short circuit, the poor continuity, and the like are determined by this visual inspection.

ところがこのような目視検査による方法では、検査ミス
の発生が避けられず、判定結果も検査する者によりまち
まちであり、また検査処理能力にも限界がある。
However, such a method by visual inspection inevitably causes the occurrence of inspection errors, the judgment result varies depending on the inspector, and the inspection processing capacity is limited.

そこで近年、この種の検査を自動的に行うことができる
自動検査装置が各種提案されている。
Therefore, in recent years, various automatic inspection devices capable of automatically performing this type of inspection have been proposed.

ところでハンダ付け部位の表面形状は、3次元の拡がり
をもつ立体形状であって、これを検査するには、3次元
の形状情報を検出できることが不可欠の条件となる。
By the way, the surface shape of the soldered portion is a three-dimensional shape having a three-dimensional spread, and in order to inspect this, it is indispensable to be able to detect three-dimensional shape information.

第3図はこの条件を満たす自動検査装置の一例を示すも
のであり、レーザなどの光源から板状をなすスリット光
1を基板2上のハンダ付け部位へ照射している。このス
リット光1の照射により、ハンダ付け部位を含む基板2
の表面には、立体形状に沿って歪を受けた光切断線3が
生成されるもので、その光切断線3の反射光像を撮像装
置4で撮像して、その撮像パターンの歪状態をチェック
することにより、ハンダ付け部位の立体形状を検出す
る。
FIG. 3 shows an example of an automatic inspection apparatus that satisfies this condition. A plate-like slit light 1 is emitted from a light source such as a laser to a soldering portion on a substrate 2. By irradiating the slit light 1, the substrate 2 including the soldered portion
An optical cutting line 3 which is distorted along the three-dimensional shape is generated on the surface of the image pickup device. By checking, the three-dimensional shape of the soldered part is detected.

ところがこの検査方法の場合、スリット光1が照射され
た部分の形状情報が得られるのみであって、それ以外の
部分の立体形状を把握することは困難である。しかもハ
ンダ付け部位の表面は、その配向方向が基板2の垂直方
向に対して不定であるため、光源と撮像装置4との組み
合わせが少なくとも4組以上は必要であり、これがため
装置が複雑化し、かつ高精度の組立作業が必要となり、
コスト高を招くなどの問題がある。
However, in the case of this inspection method, only the shape information of the portion irradiated with the slit light 1 is obtained, and it is difficult to grasp the three-dimensional shape of other portions. Moreover, since the orientation of the surface of the soldered portion is indefinite with respect to the vertical direction of the substrate 2, at least four or more combinations of the light source and the imaging device 4 are required, which complicates the device. And high precision assembly work is required,
There are problems such as high costs.

そこでこの種問題を解消した方法として、検査対象であ
る曲面体の表面へ入射角が異なる光を照射し、曲面体の
表面からの各反射光像を撮像して、それぞれの撮像パタ
ーンより曲面体の有する各曲面要素の配向性を検出する
という方法が存在する。この方法の原理は、3次元像情
報検出のひとつである「アクティブ・センシング法」に
属するものである。すなわちこの方法は、一定のパター
ンをもった光束を検査対象に投光したとき、その検査対
象から得られる反射光束のパターンが検査対象の立体的
形状に対応して変形を受けることに着目したもので、そ
の変形パターンから検査対象の形状を推定するという方
法である。
Therefore, as a method of solving this kind of problem, the surface of the curved surface object to be inspected is irradiated with light having different incident angles, each reflected light image from the surface of the curved surface object is imaged, and the curved surface object is obtained from each imaging pattern. There is a method of detecting the orientation of each curved surface element of. The principle of this method belongs to "active sensing method" which is one of three-dimensional image information detection. That is, this method focuses on the fact that when a light beam having a certain pattern is projected onto the inspection target, the pattern of the reflected light beam obtained from the inspection target is deformed in accordance with the three-dimensional shape of the inspection target. Then, the shape of the inspection target is estimated from the deformation pattern.

第4図は、この方法の原理説明図であり、投光装置5と
撮像装置6とから成る検出系と、検査対象である曲面体
7との位置関係を示している。
FIG. 4 is an explanatory view of the principle of this method, and shows the positional relationship between the detection system including the light projecting device 5 and the image pickup device 6 and the curved surface body 7 to be inspected.

同図において、投光装置5より曲面体7の表面に対して
入射角iで光束8を投光すると、角度i′(=i)の反
射光束9が真上に置かれた撮像装置6に入射して検出さ
れる。これにより前記光束8で照明された曲面体7の曲
面要素は基準面10に対してiの角度をなして配向して
いることが検出されたことになる。従ってもし曲面体7
の表面形状が、ハンダ付け面のように異なる方向に配向
している多数の曲面要素から成るものであれば、入射角
が異なる複数の投光装置を用いて曲面体7の表面に投光
すれば、それぞれの入射角に対応する曲面要素の群が撮
像装置6により検出され、これにより曲面体7表面の各
曲面要素がそれぞれどんな配向をしているか、すなわち
ハンダ付け部位の表面形状がどのようであるかを検出で
きる。
In the figure, when a light beam 8 is projected from the light projecting device 5 onto the surface of the curved body 7 at an incident angle i, a reflected light beam 9 at an angle i ′ (= i) is projected onto the imaging device 6 directly above. It is incident and detected. As a result, it is detected that the curved surface elements of the curved body 7 illuminated by the light flux 8 are oriented at an angle of i with respect to the reference plane 10. Therefore if curved surface 7
If the surface shape of the object is composed of a large number of curved surface elements oriented in different directions such as a soldering surface, it is possible to project light onto the surface of the curved surface body 7 using a plurality of light projecting devices having different incident angles. For example, a group of curved surface elements corresponding to the respective incident angles is detected by the image pickup device 6, and as a result, the orientation of each curved surface element on the surface of the curved body 7 is determined, that is, the surface shape of the soldered portion is determined. Can be detected.

また投光装置5が、入射角がi+Δiからi−Δiまで
2Δiの幅をもつ光束8を投光するならば、その幅に対
応した幅を有する反射光束9が撮像装置6により検出す
ることになる。すなわちこの場合は、基準面10となす
傾斜角がi+Δiからi−Δiまでの幅の角度をもつ曲
面要素が検出できることになる。
If the light projecting device 5 projects a light beam 8 having an incident angle of 2Δi from i + Δi to i−Δi, a reflected light beam 9 having a width corresponding to the width is detected by the imaging device 6. Become. That is, in this case, it is possible to detect a curved surface element having an angle of inclination of i + Δi to i−Δi with the reference surface 10.

さらに投光装置5が、第5図に示す如く、基準面10に
対して水平に設置されたリング状のものであれば、曲面
体7が基準面10に垂直な軸に対してどのような回転角
をもっていても、投光装置5と曲面体7との距離は一定
であり、曲面要素の回転角方向の配向性は消去されるの
で、基準面10となす傾斜角だけが検出されることにな
る。
Further, as shown in FIG. 5, if the light projecting device 5 is a ring-shaped device that is installed horizontally with respect to the reference plane 10, what is the curved body 7 with respect to the axis perpendicular to the reference plane 10? Even if there is a rotation angle, the distance between the light projecting device 5 and the curved surface member 7 is constant, and the orientation of the curved surface element in the rotation angle direction is erased. Therefore, only the tilt angle with the reference plane 10 can be detected. become.

またこの第5図に示すように、投光装置5を曲面体7へ
の入射角が異なる複数のリング状発光体11,12,1
3をもって構成すれば、各発光体による光束14,1
5,16の入射角に対応した配向をもつ曲面要素がそれ
だけ詳細に検出できることは前述したとおりである。
Further, as shown in FIG. 5, the light projecting device 5 is provided with a plurality of ring-shaped light emitting bodies 11, 12, 1 having different incident angles to the curved surface body 7.
If it is configured with 3, the luminous fluxes 14 and 1 by the respective light emitters
As described above, the curved surface elements having the orientations corresponding to the incident angles of 5 and 16 can be detected in detail.

いま半径がr(ただしn=1,2,3)の3個のリング状
の発光体11,12,13を基準面10に対して高さh
(n=1,2,3)の位置に水平に設置すれば、曲面体7
への各光束14,15,16の入射角はそれぞれi
(n=1,2,3)となり、曲面体7における傾斜角がそ
れぞれiである各曲面要素を撮像装置6により検出す
ることができる。このとき各発光体11,12,13か
ら曲面体7の表面を経て撮像装置6に至る全光路長に比
して曲面要素の大きさが十分に小さいので、次式により
入射角、すなわち検出しようとする曲面要素の傾斜角を
定めればよい。
Now, the height h of the three ring-shaped light-emitting bodies 11, 12, 13 having a radius of r n (where n = 1, 2, 3) with respect to the reference plane 10 is set.
If it is installed horizontally at the position n (n = 1,2,3), the curved surface 7
The incident angles of the respective light beams 14, 15, 16 on
n (n = 1,2,3), and the respective curved surface elements inclined angle is i n, respectively, in curved body 7 can be detected by the imaging device 6. At this time, since the size of the curved surface element is sufficiently smaller than the total optical path length from each light emitting body 11, 12, 13 to the image pickup device 6 through the surface of the curved surface body 7, let's detect the incident angle, that is, by the following equation. The angle of inclination of the curved surface element is defined.

上記の原理に基づきハンダ付け部位の外観を検査する方
法として、前記の各発光体11,12,13に白色光源
を用いたものが提案されている(特開昭61-293657
号)。この検査方法においては、ハンダ付け面に対する
入射角の異なる3個の発光体11,12,13による反
射光像を相互に識別するために、それぞれ発光体11,
12,13を時間的に異なったタイミングで点灯し、ま
た消灯している。
As a method for inspecting the external appearance of the soldered portion based on the above principle, a method using a white light source for each of the light emitting bodies 11, 12 and 13 has been proposed (JP-A-61-293657).
issue). In this inspection method, in order to distinguish reflected light images from three light emitters 11, 12, 13 having different incident angles with respect to the soldering surface from each other, the light emitters 11, 12,
12 and 13 are turned on and off at different timings with respect to time.

〈発明が解決しようとする問題点〉 しかしながらこのような方法では、異なる投光タイミン
グで得た各画像を貯蔵するためのメモリや、これら画像
を同一視野像として演算処理するための演算装置や、各
発光体を瞬間的に点灯動作させるための点灯装置などが
必要であり、技術面での煩雑さが多く、またそれがコス
ト面や信頼性の面で課題となっている。
<Problems to be Solved by the Invention> However, in such a method, a memory for storing each image obtained at different light projection timings, an arithmetic unit for arithmetically processing these images as the same visual field image, A lighting device or the like for instantaneously lighting each light emitter is required, which is complicated in terms of technology, and is a problem in terms of cost and reliability.

そこで、このようなタイム・シェアリング方式の課題を
一挙に解消する方法として、ワイヤのような線状物体を
検査する装置として提案された方法が存在する(特開昭
62-127617号)。この方法では、検査対象に対する入射
角の異なる3個の発光体として、赤、緑、青の三原色光
源を用いており、検査対象からの赤色、緑色、青色の各
反射光像をカラーテレビカメラのような色相感知型の撮
像装置により同一タイミングで分離して検出するもので
ある。
Therefore, as a method for solving all of the problems of the time sharing method at once, there is a method proposed as an apparatus for inspecting a linear object such as a wire (Japanese Patent Laid-Open No. Sho 61-206).
62-127617). In this method, three primary color light sources of red, green, and blue are used as three light emitters having different incident angles with respect to the inspection target, and red, green, and blue reflected light images from the inspection target are captured by a color television camera. Such a color sensing type image pickup device separates and detects at the same timing.

この方法をハンダ付け部位の自動検査装置に適用する
と、ハンダ付け部位の曲面性状を短時間で検出すること
は理論上可能となるが、基板上の各部位に関する情報
(例えば部品番号、極性、カラーコードなど)や基板パ
ターン情報(種々のマークなど)のような基板実装部品
の自動検査に不可欠な周辺情報を検出する工夫がなされ
ているため、このままでは装置の実用化は到底困難であ
る。
When this method is applied to an automatic inspection device for soldered parts, it is theoretically possible to detect the curved surface property of the soldered part in a short time, but information on each part on the board (for example, part number, polarity, color Since it is devised to detect peripheral information such as codes) and board pattern information (various marks, etc.) which are indispensable for automatic inspection of board-mounted components, it is very difficult to put the apparatus to practical use as it is.

この発明は、上記問題に着目してなされたもので、各発
光体の照射光を合成すると白色光となるように工夫する
ことにより、ハンダ付け部位のような鏡面反射性の曲面
体の曲面性状を短時間で検出でき、しかも実際の検査に
不可欠な周辺情報の検出をも可能とした曲面性状検査装
置を提供することを目的とする。
The present invention has been made in view of the above problems, and by devising such that the irradiation light of each light-emitting body is combined into white light, the curved surface characteristics of a specularly reflective curved surface body such as a soldered part It is an object of the present invention to provide a curved surface property inspecting apparatus that can detect the above in a short time and can also detect the peripheral information that is essential for the actual inspection.

〈問題点を解決するための手段〉 上記目的を達成するため、この発明では、第1の色相
光、第2の色相光、第3の色相光をそれぞれ発生するリ
ング状をなす3個の発光体が、鏡面反射性の曲面体の表
面への各色相光の入射角が異なるように配置されて成る
投光手段と、前記鏡面反射性の曲面体の表面からの反射
光像を各色相別に撮像するための撮像手段と、前記撮像
手段で得られた撮像パターンより前記鏡面反射性の曲面
体を有する各曲面要素の傾斜角を検出するための処理手
段とで曲面性状検査装置を構成している。そして前記投
光手段の各発光体は、それぞれの色相光の合成により白
色光となるような対波長発光エネルギー分布を有すると
共に、前記投光手段には、各発光体による色相光を合成
したとき白色光となるように各発光体の光量を調整する
ための光量調節手段が接続している。
<Means for Solving the Problems> In order to achieve the above object, in the present invention, three ring-shaped light emissions each generating a first hue light, a second hue light, and a third hue light are provided. The body is arranged so that the incident angle of each hue light on the surface of the specularly reflective curved surface body is different, and the reflected light image from the surface of the specularly reflective curved surface body for each hue. A curved surface property inspection device is configured by an image pickup means for picking up an image and a processing means for detecting an inclination angle of each curved surface element having the specularly curved surface body from an image pickup pattern obtained by the image pickup means. There is. Each of the light emitters of the light projecting means has a light emission energy distribution with respect to wavelength so that white light is obtained by combining the respective hue lights, and when the light projecting means combines the hue light of each light emitter. A light amount adjusting means for adjusting the light amount of each light emitter so as to obtain white light is connected.

〈作用〉 鏡面反射性の曲面体の表面に対し異なる入射角をもって
各発光体から第1の色相光、第2の色相光、第3の色相
光が照射されると、前記曲面体の表面からの第1の色相
光、第2の色相光、第3の色相光の各反射光像が撮像手
段により同時に分離して検出される。この場合に、各発
光体は、それぞれの色相光の構成により白色光となるよ
うな対波長発光エネルギー分布を有し、各発光体による
色相光を合成したとき、白色光となるように各発光体の
光量が調整されるため、実装部品のハンダ検査などで
は、ハンダ付け部位の曲面性状に関する情報を加えて、
部品に関する情報のような周辺情報も同時に検出される
ことになる。
<Operation> When the first hue light, the second hue light, and the third hue light are emitted from the respective light emitters with different incident angles with respect to the surface of the specularly reflective curved surface body, the surface of the curved surface body is irradiated. The respective reflected light images of the first hue light, the second hue light, and the third hue light are simultaneously separated and detected by the image pickup means. In this case, each light emitting body has a distribution energy of counter wavelength emission which becomes white light due to the constitution of each hue light, and when the hue light from each light emitting body is combined, each light emission becomes white light. Since the amount of light of the body is adjusted, in the solder inspection of mounted parts, etc., add information about the curved surface property of the soldered part,
Peripheral information such as information about parts will also be detected at the same time.

〈実施例〉 第1図は、この発明の一実施例にかかる基板検査装置の
概略構成を示している。
<Embodiment> FIG. 1 shows a schematic structure of a substrate inspection apparatus according to an embodiment of the present invention.

図示例の基板検査装置は、位置決め基板20Sを撮像して
得られた前記位置決め基板20S上にある各部品21S
の検査領域のパラメータ(判定データ)と、被検査基板
20Tを撮像して得られた前記被検査基板20T上にあ
る各部品21Tの検査領域のパラメータ(被検査デー
タ)とを比較して、これらの各部品21Tが正しく実装
されかつハンダ付けされているかどうかを検査するため
のものであって、X軸テーブル軸22、Y軸テーブル部
23、投光部24、撮像部25、処理部26などをその
構成として含んでいる。
The board inspecting apparatus of the illustrated example has components 21S on the positioning board 20S obtained by imaging the positioning board 20S.
Of the inspection area (determination data) and the parameters (inspection data) of the inspection area of each component 21T on the inspected substrate 20T obtained by imaging the inspected substrate 20T are compared, It is for inspecting whether each component 21T is correctly mounted and soldered, and includes an X-axis table shaft 22, a Y-axis table unit 23, a light projecting unit 24, an imaging unit 25, a processing unit 26, and the like. Is included as its composition.

X軸テーブル部22およびY軸テーブル部23は、それ
ぞれ処理部26からの制御信号に基づいて動作するモー
タ(図示せず)を備えており、これらモータの駆動によ
りX軸テーブル部22が撮像部25をX方向へ移動さ
せ、またY軸テーブル部23が基板20S,20Tを支
持するコンベヤ27をY方向へ移動させる。
The X-axis table unit 22 and the Y-axis table unit 23 each include a motor (not shown) that operates based on a control signal from the processing unit 26, and the X-axis table unit 22 is driven by the motors to drive the X-axis table unit 22. 25 is moved in the X direction, and the Y-axis table portion 23 moves the conveyor 27 supporting the substrates 20S and 20T in the Y direction.

これら基板20S,20Tは、投光部24からの照射光
を受けつつ撮像部25により撮像される。
The substrates 20S and 20T are imaged by the imaging unit 25 while receiving the irradiation light from the light projecting unit 24.

投光部24は、処理部26からの制御信号に基づき赤色
光、緑色光、青色光をそれぞれ発生するリング状をなす
3個の発光体28,29,30を備えている。各発光体
28,29,30は、検査対象への各色相光の入射角が
異なるように配置されており、これら発光体28,2
9,30を発した三原色光の混合した光が前記基板20
S,20Tへ投光される。撮像部25は前記基板20
S,20Tでの反射光像を得てこれを電気信号に変換す
る。この実施例の場合、前記の各発光体28,29,3
0は白色光源に赤色、緑色、青色の各フィルタを被せた
構造のものを用いているが、三原色の各色相光を発生さ
せるものであれば、このような構成に限られないことは
勿論である。
The light projecting unit 24 is provided with three ring-shaped light emitting bodies 28, 29, 30 that generate red light, green light, and blue light, respectively, based on a control signal from the processing unit 26. The respective light emitters 28, 29, 30 are arranged so that the incident angles of the respective hue lights on the inspection object are different.
The mixed light of the three primary colors emitted from 9, 30 is the substrate 20.
It is projected to S, 20T. The imaging unit 25 is the substrate 20.
The reflected light image at S, 20T is obtained and converted into an electric signal. In the case of this embodiment, each of the aforementioned luminous bodies 28, 29, 3
No. 0 uses a structure in which a red light source, a green color filter, and a blue color filter are covered on a white light source. However, it is needless to say that the present invention is not limited to such a configuration as long as it can generate each hue light of the three primary colors. is there.

またこの投光部24は、その照明下で基板20S,20
T上の部品に関する情報(部品番号、極性、カラーコー
ドなど)や基板パターン情報(種々のマークなど)を検
出することを可能となすため、各発光体28,29,3
0が発する各色相の光が混色されると完全な白色光とな
るような工夫を施してある。すなわち各発光体28,2
9,30は、混色により白色光となるような対波長発光
エネルギー分布を有する赤色光スペクトル、緑色光スペ
クトル、青色光スペクトルの光を発する発光体をもって
構成すると共に、各発光体28,29,30から照射さ
れた赤色光、緑色光、青色光が混色して白色光となるよ
うに、撮像コントローラ31により各色相光の光量の調
整を可能としている。
In addition, the light projecting section 24 is configured so that the substrates 20S, 20
Since it is possible to detect the information (part number, polarity, color code, etc.) about the parts on the T and the board pattern information (various marks, etc.), each light emitter 28, 29, 3
When the light of each hue emitted by 0 is mixed, it is devised so that it becomes a completely white light. That is, each light emitter 28, 2
9 and 30 are composed of light emitters that emit light of red light spectrum, green light spectrum, and blue light spectrum having a light emission energy distribution with respect to wavelength so as to become white light by color mixing, and each light emitter 28, 29, 30 The light amount of each hue light can be adjusted by the image pickup controller 31 so that the red light, the green light, and the blue light emitted from are mixed into white light.

つぎに撮像部25は、前記投光部24の上方に位置させ
たカラーテレビカメラ32を備えており、前記基板20
Sまたは20Tからの反射光はこのカラーテレビカメラ
32によって三原色のカラー信号R,G,Bに変換され
て処理部26へ供給される。
Next, the imaging unit 25 includes a color television camera 32 located above the light projecting unit 24, and the substrate 20 is provided.
The reflected light from S or 20T is converted by the color television camera 32 into color signals R, G, B of the three primary colors and supplied to the processing unit 26.

処理部26は、A/D変換部33、メモリ38、ティー
チングテーブル35、画像処理部34、判定部36、
X,Yテーブルコントローラ37、撮像コントローラ3
1、CRT表示部41、プリンタ42、キーボード4
0、フロッピディスク装置43、制御部(CPU)39
などから構成されるもので、ティーチングモードのと
き、位置決め基板20Sについてのカラー信号R,G,
Bを処理しハンダ付け状態が良好な各部品21Sの所定
領域につき赤色、緑色、青色の各色相パターンを検出し
て判定データファイルを作成し、また検査モードのと
き、被検査基板20Tについてのカラー信号R,G,B
を処理し基板上の各部品21Tの所定領域につき同様の
各色相パターンを検出して被検査データファイルを作成
する。そしてこの被検査データファイルと前記判定デー
タファイルとを比較して、この比較結果から被検査基板
20T上の所定の部品21Tにつきハンダ付け部分の
良、不良を自動的に判定する。
The processing unit 26 includes an A / D conversion unit 33, a memory 38, a teaching table 35, an image processing unit 34, a determination unit 36,
X, Y table controller 37, imaging controller 3
1, CRT display unit 41, printer 42, keyboard 4
0, floppy disk device 43, control unit (CPU) 39
In the teaching mode, the color signals R, G, and
B is processed to detect each hue pattern of red, green, and blue for each predetermined area of each component 21S that is in a good soldering state, and a judgment data file is created. Signals R, G, B
Is processed to detect each similar hue pattern in a predetermined area of each component 21T on the substrate to create an inspection data file. Then, the inspected data file is compared with the determination data file, and based on the comparison result, the good or bad of the soldered portion is automatically determined for the predetermined component 21T on the inspected substrate 20T.

第2図は、ハンダ付けが良好であるとき、部品が欠陥し
ているとき、ハンダ不足の状態にあるときのそれぞれハ
ンダ44の断面形態と、各場合の撮像パターン、赤色パ
ターン、緑色パターン、青色パターンとの関係を一覧表
で示したものであり、いずれかの色相パターン間には明
確な差異が現われるため、部品の有無やハンダ付けの良
否が判定できることになる。
FIG. 2 is a cross-sectional view of the solder 44 when the soldering is good, when the component is defective, and when the solder is insufficient, and the image pickup pattern, red pattern, green pattern, and blue in each case. The relationship with the pattern is shown in a list, and since a clear difference appears between any of the hue patterns, it is possible to determine the presence or absence of parts and the quality of soldering.

第1図に戻って、A/D変換部33は前記撮像部25か
らカラー信号R,G,Bが供給されたときに、これをア
ナログ・ディジタル変換して制御部39へ出力する。メ
モリ38はRAMなどを備え、制御部39の作業エリア
として使われる。画像処理部34は制御部39を介して
供給された画像データを画像処理して前記被検査データ
ファイルや判定データファイルを作成し、これらを制御
部39や判定部36へ供給する。
Returning to FIG. 1, when the color signals R, G, B are supplied from the image pickup section 25, the A / D conversion section 33 converts the color signals R, G, B from analog to digital and outputs them to the control section 39. The memory 38 has a RAM and the like and is used as a work area of the control unit 39. The image processing unit 34 performs image processing on the image data supplied via the control unit 39 to create the inspection data file and the judgment data file, and supplies these to the control unit 39 and the judgment unit 36.

ティーチングテーブル35はティーチング時に制御部3
9から判定データファイルが供給されたとき、これを記
憶し、また検査時に制御部39が転送要求を出力したと
き、この要求に応じて判定データファイルを読み出し
て、これを制御部39や判定部36などへ供給する。
The teaching table 35 is used by the control unit 3 during teaching.
9 stores the judgment data file when it is supplied, and when the control unit 39 outputs a transfer request at the time of inspection, the judgment data file is read out in response to this request, and this is read out by the control unit 39 or the judgment unit. 36, etc.

判定部36は、検査時に制御部39から供給された判定
データファイルと、前記画像処理部34から転送された
被検査データファイルとを比較して、その被検査基板2
0Tにつきハンダ付け状態の良否を判定し、その判定結
果を制御部39へ出力する。
The determination unit 36 compares the determination data file supplied from the control unit 39 at the time of inspection with the inspection data file transferred from the image processing unit 34, and the inspection target substrate 2
For 0T, the quality of the soldering state is determined, and the determination result is output to the control unit 39.

撮像コントローラ31は、制御部39と投光部24およ
び撮像部25とを接続するインターフェースなどを備
え、制御部39の出力に基づき投光部24の各発光体2
8,29,30の光量を調整したり、撮像部25のカラ
ーテレビカメラ32の各色光出力の相互バランスを保つ
などの制御を行う。
The imaging controller 31 includes an interface that connects the control unit 39 to the light projecting unit 24 and the image capturing unit 25, and based on the output of the control unit 39, each light emitter 2 of the light projecting unit 24.
Controls such as adjusting the light amounts of 8, 29, 30 and maintaining the mutual balance of the respective color light outputs of the color television camera 32 of the imaging unit 25 are performed.

X,Yテーブルコントローラ37は制御部39と前記X
軸テーブル部22およびY軸テーブル部23とを接続す
るインターフェースなどを備え、制御部39の出力に基
づきX軸テーブル部22およびY軸テーブル部23を制
御する。
The X, Y table controller 37 includes a control unit 39 and the X
An interface for connecting the axis table unit 22 and the Y-axis table unit 23 is provided, and the X-axis table unit 22 and the Y-axis table unit 23 are controlled based on the output of the control unit 39.

CRT表示部41はブラウン管(CRT)を備え、制御
部39から画像データ、判定結果、キー入力データなど
が供給されたとき、これを画面上に表示する。プリンタ
42は制御部39から判定結果などが供給されたとき、
これを予め決められた書式(フォーマット)でプリント
アウトする。キーボート40は操作情報や位置決め基板
20Sに関するデータ、この位置決め基板20S上の部
品21Sに関するデータなどを入力するのに必要な各種
キーを備えており、このキーボード40から入力された
情報やデータなどは制御部39へ供給される。
The CRT display unit 41 includes a cathode ray tube (CRT), and when image data, determination results, key input data, and the like are supplied from the control unit 39, this is displayed on the screen. When the printer 42 receives the determination result from the control unit 39,
This is printed out in a predetermined format. The keyboard 40 is provided with various keys necessary for inputting operation information, data regarding the positioning board 20S, data regarding the parts 21S on the positioning board 20S, and the information and data entered through the keyboard 40 are controlled. It is supplied to the section 39.

制御部39は、マイクロプロセッサなどを備えており、
つぎに述べる手順に沿って動作する。
The control unit 39 includes a microprocessor and the like,
It operates according to the procedure described below.

まず新たな被検査基板20Tを検査するときには、制御
部39は、ティーチングを実行するために装置各部を制
御して投光部24や撮像部25をオンし、また撮像条件
やデータの処理条件を整える。つぎにY軸テーブル部2
3上に位置決め基板20Sがセットされると、制御部3
9はX軸テーブル部22およびY軸テーブル部23を制
御して位置決め基板20Sを位置出しした後、撮像部2
5に位置決め基板20Sを撮像させる。この撮像動作で
得られた三原色のカラー信号R,G,BはA/D変換部
33でA/D変換され、その変換結果はメモリ38にリ
アルタイムで記憶される。
First, when inspecting a new substrate 20T to be inspected, the control unit 39 controls each unit of the apparatus to turn on the light projecting unit 24 and the image pickup unit 25 in order to execute teaching, and also sets the image pickup condition and the data processing condition. Arrange. Next, the Y-axis table unit 2
When the positioning substrate 20S is set on the control unit 3, the control unit 3
Reference numeral 9 controls the X-axis table unit 22 and the Y-axis table unit 23 to position the positioning substrate 20S, and thereafter, the imaging unit 2
The positioning board 20S is imaged on the display 5. The color signals R, G, B of the three primary colors obtained by this imaging operation are A / D converted by the A / D converter 33, and the conversion result is stored in the memory 38 in real time.

ついで制御部39は、前記メモリ38より各色相に対応
する画像データを画像処理部34へ転送させ、この画像
処理部34にて各色相の画像データを各色相別の適当な
しきい値で2値化するなどして、赤色、緑色、青色のパ
ターンを検出する。また制御部39は、画像処理部34
を制御し、各部品21Sの撮像パターンにつき各部分
(電極など)の明度をチェックするなどして各部品21
Sの電極の位置や極性マークの位置などを識別させる。
Then, the control unit 39 transfers the image data corresponding to each hue from the memory 38 to the image processing unit 34, and the image processing unit 34 binary-processes the image data of each hue with an appropriate threshold value for each hue. Then, the red, green, and blue patterns are detected. The control unit 39 also controls the image processing unit 34.
Is controlled to check the brightness of each part (such as an electrode) in the image pickup pattern of each part 21S.
The position of the S electrode and the position of the polarity mark are identified.

この後制御部39は、前記の各色相パターンと前記の識
別結果とに基づいて、被検査基板20Tを検査するのに
必要な判定データファイルを作成し、これをティーチン
グテーブル35に記憶させた後、ティーチングを終了す
る。
After that, the control unit 39 creates a determination data file necessary for inspecting the inspected substrate 20T based on the hue patterns and the identification result, and stores the determination data file in the teaching table 35. , Teaching ends.

つぎに検査モードに移行すると、制御部39はティーチ
ングテーブル35やキーボード40からその日の日付デ
ータや、被検査基板20TのIDナンバ(識別番号)を
取り込むとともに、ティーチングテーブル35から判定
データファイルを読み出して、これを判定部36に供給
する。
Next, when shifting to the inspection mode, the control unit 39 reads the date data of the day and the ID number (identification number) of the inspected substrate 20T from the teaching table 35 and the keyboard 40, and reads the determination data file from the teaching table 35. , And supplies this to the determination unit 36.

この後、制御部39は、撮像条件やデータの処理条件を
整えた後、Y軸テーブル部23上に被検査基板20Tが
セットされたかどうかをチェックする。
After that, the control unit 39 adjusts the imaging condition and the data processing condition, and then checks whether or not the inspected substrate 20T is set on the Y-axis table unit 23.

もしセットされておれば、制御部39は前記と同様、画
像処理部34にて各色相パターンの検出および電極や極
性マークの識別を順次行わせた後、各色相パターンと前
記の識別結果とに基づき被検査データファイルを作成す
る。ついで制御部39は、前記被検査データファイルを
判定部36に転送させ、この被検査データファイルと前
記判定データファイルとを比較させて、被検査基板20
T上の所定の部品21Tにつきハンダ付けの良否を判定
させると共に、この判定結果やCRT表示部41やプリ
ンタ42に供給して、これらを表示させ、またプリント
アウトさせる。
If set, the control unit 39 causes the image processing unit 34 to sequentially detect the hue patterns and identify the electrodes and the polar marks, as described above, and then determines the hue patterns and the identification results. Based on this, create a data file to be inspected. Then, the control unit 39 transfers the inspected data file to the determination unit 36, compares the inspected data file with the determined data file, and inspects the inspected substrate 20.
The quality of soldering is determined for the predetermined component 21T on the T, and the determination result and the CRT display unit 41 and the printer 42 are supplied to display and print them out.

〈発明の効果〉 この発明は上記の如く、鏡面反射性の曲面体の表面に対
し異なる入射角をもってリング状の各発光体から第1、
第2、第3の各色相光を照射して、前記曲面体の表面か
らの反射光像を各色相別に同時に得るように構成したか
ら、各色相パターンを用いて鏡面反射性の曲面体の性状
を短時間で検出できる。しかも各発光体は、それぞれの
光の合成により白色色となるような対波長発光エネルギ
ー分布を有すると共に、各発光体による色相光を合成し
たとき白色光となるように各発光体の光量を調整するよ
うに構成したから、実装部品のハンダ検査において必要
不可欠な周辺情報の検出も可能であり、ハンダ検査の自
動化を実現するなど、発明目的を達成した顕著な効果を
奏する。
<Effects of the Invention> As described above, the present invention is characterized in that each of the ring-shaped light emitters has a different incident angle with respect to the surface of the specularly curved curved surface member.
Since the reflected light image from the surface of the curved body is simultaneously obtained for each hue by irradiating the second and third hue light, the characteristics of the specularly reflective curved body using each hue pattern. Can be detected in a short time. Moreover, each light emitter has an emission energy distribution with respect to wavelength so that a white color is produced by combining the respective lights, and the light amount of each light emitter is adjusted so that the hue light by each light emitter becomes white light when combined. Since it is configured as described above, it is possible to detect the peripheral information that is indispensable in the solder inspection of the mounted component, and the remarkable effect of achieving the object of the invention is achieved, such as the automation of the solder inspection.

【図面の簡単な説明】[Brief description of drawings]

第1図はこの発明の一実施例にかかる基板検査装置の全
体構成を示す説明図、第2図はハンダ付け状態の良否と
パターンとの関係を示す説明図、第3図は従来のハンダ
付け状態の自動検査装置を示す原理説明図、第4図およ
び第5図はこの発明の原理を示す原理説明図である。 24…投光部 25…撮像部 26…処理部 28,29,30…発光体 31…撮像コントローラ
FIG. 1 is an explanatory diagram showing the overall structure of a substrate inspection apparatus according to an embodiment of the present invention, FIG. 2 is an explanatory diagram showing the relationship between the quality of a soldering state and a pattern, and FIG. 3 is a conventional soldering method. FIG. 4 is a principle explanatory view showing an automatic state inspection device, and FIGS. 4 and 5 are principle explanatory views showing the principle of the present invention. 24 ... Projector 25 ... Imaging 26 ... Processing 28, 29, 30 ... Light emitter 31 ... Imaging controller

───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 昭61−293657(JP,A) 特開 昭62−127617(JP,A) 特開 昭59−153108(JP,A) ─────────────────────────────────────────────────── ─── Continuation of front page (56) References JP-A-61-293657 (JP, A) JP-A-62-127617 (JP, A) JP-A-59-153108 (JP, A)

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】第1の色相光、第2の色相光、第3の色相
光をそれぞれ発生するリング状をなす3個の発光体が、
鏡面反射性の曲面体の表面への各色相光の入射角が異な
るように配置されて成る投光手段と、 前記鏡面反射性の曲面体の表面からの反射光像を各色相
別に撮像するための撮像手段と、 前記撮像手段で得られた撮像パターンより前記鏡面反射
性の曲面体の有する各曲面要素の傾斜角を検出するため
の処理手段とから成る曲面性状検査装置であって、 前記投光手段の各発光体は、それぞれの色相光の合成に
より白色光となるような対波長発光エネルギー分布を有
すると共に、前記投光手段には、各発光体による色相光
を合成したとき白色光となるように各発光体の光量を調
整するための光量調節手段が接続されて成る曲面性状検
査装置。
1. A ring-shaped three light-emitting body for respectively generating a first hue light, a second hue light and a third hue light,
A light projecting unit which is arranged so that the incident angles of the respective hue lights on the surface of the specularly reflective curved surface body are different, and for capturing the reflected light image from the surface of the specularly reflective curved surface object for each hue. And a processing means for detecting the inclination angle of each curved surface element of the specular curved surface body from the imaging pattern obtained by the imaging means. Each illuminant of the light means has a counter wavelength emission energy distribution such that it becomes white light by combining the respective hue lights, and the light projecting means produces white light when the hue light by each illuminant is combined. A curved surface property inspection device, which is connected with a light amount adjusting means for adjusting the light amount of each light emitter.
JP63112054A 1988-05-09 1988-05-09 Curved property inspection device Expired - Lifetime JPH061173B2 (en)

Priority Applications (15)

Application Number Priority Date Filing Date Title
JP63112054A JPH061173B2 (en) 1988-05-09 1988-05-09 Curved property inspection device
DE68925901T DE68925901T2 (en) 1988-05-09 1989-05-02 SUBSTRATE TEST DEVICE
US07/601,722 US5245671A (en) 1988-05-09 1989-05-02 Apparatus for inspecting printed circuit boards and the like, and method of operating same
SG1996003498A SG66545A1 (en) 1988-05-09 1989-05-02 Apparatus for inspecting printed circuit boards and the like and method of operating the same
KR1019900700025A KR920006031B1 (en) 1988-05-09 1989-05-02 Substrate examining apparatus and method of operating same
PCT/JP1989/000470 WO1989011093A1 (en) 1988-05-09 1989-05-02 Substrate examining apparatus and method of operating same
DE68929481T DE68929481T2 (en) 1988-05-09 1989-05-02 Device and method for displaying the results of a printed circuit board test
EP95113574A EP0687901B1 (en) 1988-05-09 1989-05-02 Apparatus for and method of displaying results of printed circuit board inspection
SG1996004112A SG47736A1 (en) 1988-05-09 1989-05-02 Printed circuit board inspecting apparatus
AT89905170T ATE135110T1 (en) 1988-05-09 1989-05-02 SUBSTRATE TESTING DEVICE
EP95113579A EP0685732B1 (en) 1988-05-09 1989-05-02 Printed circuit board inspecting apparatus
DE68929062T DE68929062T2 (en) 1988-05-09 1989-05-02 Device for testing printed circuit boards
SG1996003459A SG47652A1 (en) 1988-05-09 1989-05-02 Apparatus for and method of displaying results of printed circuit board inspection
AU35436/89A AU3543689A (en) 1988-05-09 1989-05-02 Substrate examining apparatus and method of operating same
EP89905170A EP0413817B1 (en) 1988-05-09 1989-05-02 Substrate examining apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63112054A JPH061173B2 (en) 1988-05-09 1988-05-09 Curved property inspection device

Publications (2)

Publication Number Publication Date
JPH01282410A JPH01282410A (en) 1989-11-14
JPH061173B2 true JPH061173B2 (en) 1994-01-05

Family

ID=14576875

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63112054A Expired - Lifetime JPH061173B2 (en) 1988-05-09 1988-05-09 Curved property inspection device

Country Status (1)

Country Link
JP (1) JPH061173B2 (en)

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EP1612569A2 (en) 2004-06-30 2006-01-04 Omron Corporation Method and apparatus for substrate surface inspection using multi-color light emission system
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