JPH0611464Y2 - 抵抗測定用プローブ - Google Patents
抵抗測定用プローブInfo
- Publication number
- JPH0611464Y2 JPH0611464Y2 JP1987181944U JP18194487U JPH0611464Y2 JP H0611464 Y2 JPH0611464 Y2 JP H0611464Y2 JP 1987181944 U JP1987181944 U JP 1987181944U JP 18194487 U JP18194487 U JP 18194487U JP H0611464 Y2 JPH0611464 Y2 JP H0611464Y2
- Authority
- JP
- Japan
- Prior art keywords
- probe
- main body
- pin
- electrode
- probe pin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Measuring Leads Or Probes (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1987181944U JPH0611464Y2 (ja) | 1987-12-01 | 1987-12-01 | 抵抗測定用プローブ |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1987181944U JPH0611464Y2 (ja) | 1987-12-01 | 1987-12-01 | 抵抗測定用プローブ |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0187256U JPH0187256U (hu) | 1989-06-08 |
JPH0611464Y2 true JPH0611464Y2 (ja) | 1994-03-23 |
Family
ID=31473406
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1987181944U Expired - Lifetime JPH0611464Y2 (ja) | 1987-12-01 | 1987-12-01 | 抵抗測定用プローブ |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0611464Y2 (hu) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5157426B2 (ja) * | 2007-12-27 | 2013-03-06 | 富士通セミコンダクター株式会社 | 検査冶具及びそれを使用した静電容量測定方法 |
JP6046426B2 (ja) * | 2012-09-13 | 2016-12-14 | 日置電機株式会社 | 基板検査装置および基板検査方法 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5741169U (hu) * | 1980-08-20 | 1982-03-05 | ||
JPS5768046A (en) * | 1980-10-16 | 1982-04-26 | Nec Corp | Probe card |
JPS5997469U (ja) * | 1982-12-20 | 1984-07-02 | 株式会社東芝 | 半導体チツプ測定用探針 |
JPS62217165A (ja) * | 1986-03-19 | 1987-09-24 | Toshiba Corp | 検査用接触体 |
-
1987
- 1987-12-01 JP JP1987181944U patent/JPH0611464Y2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH0187256U (hu) | 1989-06-08 |
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