JPH05867Y2 - - Google Patents

Description

[Detailed Description of the Invention] "Industrial Application Field" This invention relates to a testing aid used for testing electronic equipment that includes a plurality of switching elements such as relay contacts and switching transistors.

"Conventional technology" In the conventional testing of electronic devices including switch elements, various diagnostic items are performed according to the diagnostic program according to the set test, and if a defect is detected, at which stage is the defect detected? A number display will appear indicating whether the switch has changed, and the inspector will refer to the comparison table from that number to know the on/off state of each switch element that should be normal at that time. The state of the switch is checked to determine which switch element is defective.

Because the normal on/off state of each switch element is known from the comparison table in this way, it is difficult to intuitively know the position of each switch element on the circuit diagram of the device under test. In other words, it is necessary to use the number of a switch element in the comparison table to find the switch element with the same number on the circuit diagram of the device under test and to know which switch element is defective, which takes a lot of time for the inspection.

"Means for Solving Problems" According to the test aid of this invention, the first and second mounts are stacked and held rotatably with respect to each other, and the circuit of the device under test is placed on the first mount above the first and second mounts. A diagram is displayed,
A plurality of parts in the circuit diagram in which switch elements are to be displayed are located eccentrically from the center of rotation,
Each part has a hole in the first mount. A reference position is provided on the first mount, and a plurality of test condition positions that can be adjusted to the reference position by rotating the second mount,
When the test condition position is aligned with the reference position, the switch elements are displayed on the second mount so that they appear in the on/off state during normal operation according to the test conditions at the positions of the plurality of holes. .

When the test condition position on the second mount that matches the display number when the defective result occurred is aligned with the reference position on the first mount, the normal on/off state of each switch element will appear in each hole, so each switch The location of the element on the circuit diagram and the correct on/off state can be immediately known.

``Example'' The figure shows an example of the test aid according to this invention. In this example, circular mounts 11 and 12 are stacked and held so that they can rotate about the same axis. On the mount 11 above it is the circuit diagram 1 of the device under test.
3 is displayed. In this circuit diagram 13, a plurality of switch elements 14 are located eccentrically with respect to the rotation centers of the mounts 11 and 12.
In the portion 4, a hole 15 is made in the mount 11.

A reference position 16 is provided on the mount 11 in the form of an arrow on the periphery in this example. The diameter of mount 12 is mount 1
1, and a plurality of test condition positions 17 are provided at equal intervals with arrows on the periphery of the mount 12,
By rotating the lower mount 12, one of the test condition positions 17 can be selectively aligned with the reference position 16.

With one of the test condition positions 17 aligned with the reference position 16, the switch elements 14 are displayed on the lower mount 12 so that the normal on/off state of each switch element 14 under that test condition appears at the position of the hole 15.

Further, in this example, a hole 18 is drilled in the mount 11 near the output terminal in the circuit diagram 13, and an output level display 19 of the circuit under the test condition is attached to the mount 12 so that it appears at the hole 18. There is. Furthermore, a hole 21 is formed in the mount 11 apart from the center of rotation of the mounts 11 and 12, and the input/output level ratio (gain,
Place the mount 1 so that the attenuation rate display 22 appears in the hole 21.
It is attached to 2.

With this structure, when a defect is detected when testing an electronic device, the testing aid of this invention, which shows the circuit of the electronic device, is used to determine the test conditions under which the defect occurred. When the matching test condition position 17 of the mount 12 is aligned with the reference position 16, the normal on/off state of each switch element 14 at that time appears in the hole 15. Since this switch element 14 is displayed at the position of the circuit diagram of the device under test, it is possible to immediately know which switch element on the circuit diagram is defective.

Additionally, in this example, the output level and input/output ratio under the test conditions are displayed, so it is easier to check whether the measured output from the test is correct than by looking at a comparison.

[Brief explanation of the drawing]

The figure is a plan view showing an example of the testing aid according to this invention. 11, 12...Mount, 13...Circuit diagram, 14...
...Switch element display, 15, 18, 21...
Hole, 16...Reference position, 17...Test condition position.

Claims (1)

[Claims for Utility Model Registration] The first and second mounts are stacked and held rotatably with respect to each other, and the circuit diagram of the device under test is displayed on the first mount above them, and the switch in the circuit diagram is displayed on the first mount above them. portions in which the elements are to be displayed are located away from the center of rotation;
Each part has a hole in the first mount, a reference position is provided in the first mount, and a hole is provided in the second mount.
A plurality of test condition positions are provided on the mount, which can be aligned with the above reference position by rotating the mount, and when the test condition positions are aligned with the above reference position,
A test aid, wherein switch elements are displayed on the second mount so that the switch elements appear in the on and off states during normal operation according to the test conditions at the positions of the plurality of holes.