JPS62108873U - - Google Patents

Info

Publication number
JPS62108873U
JPS62108873U JP20249585U JP20249585U JPS62108873U JP S62108873 U JPS62108873 U JP S62108873U JP 20249585 U JP20249585 U JP 20249585U JP 20249585 U JP20249585 U JP 20249585U JP S62108873 U JPS62108873 U JP S62108873U
Authority
JP
Japan
Prior art keywords
mount
displayed
test
reference position
positions
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP20249585U
Other languages
Japanese (ja)
Other versions
JPH05867Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP20249585U priority Critical patent/JPH05867Y2/ja
Publication of JPS62108873U publication Critical patent/JPS62108873U/ja
Application granted granted Critical
Publication of JPH05867Y2 publication Critical patent/JPH05867Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Keying Circuit Devices (AREA)
  • Electronic Switches (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

図はこの考案による試験用補助具の一例を示す
平面図である。 11,12;台紙、13;回路図、14;スイ
ツチ素子の表示、15,18,21;孔、16;
基準位置、17;試験条件位置。
The figure is a plan view showing an example of the testing aid according to this invention. 11, 12; mount, 13; circuit diagram, 14; display of switch element, 15, 18, 21; hole, 16;
Reference position, 17; test condition position.

Claims (1)

【実用新案登録請求の範囲】 第1、第2台紙が重ねられて互に回転自在に保
持され、 その上側の第1台紙上に被試験機器の回路図が
表示され、 その回路図中のスイツチ素子が表示されるべき
複数の部分は上記回転の中心から離れて位置し、
その各部分は第1台紙に孔が開けられ、 上記第1台紙に基準位置が設けられ、上記第2
台紙に、これを回転することにより上記基準位置
に合せることができる試験条件位置が複数設けら
れ、 その試験条件位置を上記基準位置に合せると、
上記複数の孔の位置に、スイツチ素子が、その試
験条件に応じた正常動作時のオン、オフ状態でそ
れぞれ現われるように上記第2台紙に表示されて
いる試験用補助具。
[Claims for Utility Model Registration] The first and second mounts are stacked and held rotatably with respect to each other, and the circuit diagram of the device under test is displayed on the first mount above them, and the switch in the circuit diagram is displayed on the first mount above them. portions in which the elements are to be displayed are located away from the center of rotation;
Each part has a hole in the first mount, a reference position is provided in the first mount, and a hole is provided in the second mount.
A plurality of test condition positions are provided on the mount, which can be aligned with the above reference position by rotating the mount, and when the test condition positions are aligned with the above reference position,
A test aid wherein switch elements are displayed at the positions of the plurality of holes on the second mount so that the switch elements appear in an on state and an off state during normal operation according to the test conditions.
JP20249585U 1985-12-25 1985-12-25 Expired - Lifetime JPH05867Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20249585U JPH05867Y2 (en) 1985-12-25 1985-12-25

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20249585U JPH05867Y2 (en) 1985-12-25 1985-12-25

Publications (2)

Publication Number Publication Date
JPS62108873U true JPS62108873U (en) 1987-07-11
JPH05867Y2 JPH05867Y2 (en) 1993-01-11

Family

ID=31166930

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20249585U Expired - Lifetime JPH05867Y2 (en) 1985-12-25 1985-12-25

Country Status (1)

Country Link
JP (1) JPH05867Y2 (en)

Also Published As

Publication number Publication date
JPH05867Y2 (en) 1993-01-11

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