JPH058531Y2 - - Google Patents

Info

Publication number
JPH058531Y2
JPH058531Y2 JP1985114835U JP11483585U JPH058531Y2 JP H058531 Y2 JPH058531 Y2 JP H058531Y2 JP 1985114835 U JP1985114835 U JP 1985114835U JP 11483585 U JP11483585 U JP 11483585U JP H058531 Y2 JPH058531 Y2 JP H058531Y2
Authority
JP
Japan
Prior art keywords
contact
electronic component
lead wire
contact pieces
point
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1985114835U
Other languages
English (en)
Japanese (ja)
Other versions
JPS6224371U (enrdf_load_stackoverflow
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1985114835U priority Critical patent/JPH058531Y2/ja
Publication of JPS6224371U publication Critical patent/JPS6224371U/ja
Application granted granted Critical
Publication of JPH058531Y2 publication Critical patent/JPH058531Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP1985114835U 1985-07-26 1985-07-26 Expired - Lifetime JPH058531Y2 (enrdf_load_stackoverflow)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1985114835U JPH058531Y2 (enrdf_load_stackoverflow) 1985-07-26 1985-07-26

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1985114835U JPH058531Y2 (enrdf_load_stackoverflow) 1985-07-26 1985-07-26

Publications (2)

Publication Number Publication Date
JPS6224371U JPS6224371U (enrdf_load_stackoverflow) 1987-02-14
JPH058531Y2 true JPH058531Y2 (enrdf_load_stackoverflow) 1993-03-03

Family

ID=30997934

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1985114835U Expired - Lifetime JPH058531Y2 (enrdf_load_stackoverflow) 1985-07-26 1985-07-26

Country Status (1)

Country Link
JP (1) JPH058531Y2 (enrdf_load_stackoverflow)

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61176456U (enrdf_load_stackoverflow) * 1985-04-24 1986-11-04

Also Published As

Publication number Publication date
JPS6224371U (enrdf_load_stackoverflow) 1987-02-14

Similar Documents

Publication Publication Date Title
KR101860659B1 (ko) 프로브 핀, 및, 이것을 이용한 전자 디바이스
EP0164672A2 (en) A multiple mode buckling beam probe assembly
WO2007094237A1 (ja) 導電性接触子および導電性接触子ユニット
WO2013145521A1 (ja) 電線対基板コネクタ
JPH058531Y2 (enrdf_load_stackoverflow)
US2543036A (en) Electrical contact spring assembly
US4768972A (en) Test clip for PLCC
US3392366A (en) Multiconnector having an insulating base and plural resilient contact strips
US4812745A (en) Probe for testing electronic components
JPH075419Y2 (ja) 表面抵抗測定装置
JPH0785444B2 (ja) 抵抗路又は摺動子通路のための摺動子
JPH0658955A (ja) 4端子抵抗測定用プローブヘッド
JPH0745021Y2 (ja) プローブの接点構造
JPH04144083A (ja) 電気的接触子およびicソケット
JPH0519823Y2 (enrdf_load_stackoverflow)
JPS6225433A (ja) 半導体素子特性測定装置
JP2967509B2 (ja) フラットケーブル接続用コネクタ
JP3663539B2 (ja) 検出スイッチ
JPH0141237Y2 (enrdf_load_stackoverflow)
JPH057525Y2 (enrdf_load_stackoverflow)
JPH0745020Y2 (ja) プローブの接点構造
JPS5987605U (ja) 接触式プロ−ブ装置
JPS605479Y2 (ja) スイッチ装置
JPH0742140Y2 (ja) プローブのアース構造
JPS6220964Y2 (enrdf_load_stackoverflow)