JPH058531Y2 - - Google Patents
Info
- Publication number
- JPH058531Y2 JPH058531Y2 JP1985114835U JP11483585U JPH058531Y2 JP H058531 Y2 JPH058531 Y2 JP H058531Y2 JP 1985114835 U JP1985114835 U JP 1985114835U JP 11483585 U JP11483585 U JP 11483585U JP H058531 Y2 JPH058531 Y2 JP H058531Y2
- Authority
- JP
- Japan
- Prior art keywords
- contact
- electronic component
- lead wire
- contact pieces
- point
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1985114835U JPH058531Y2 (enrdf_load_stackoverflow) | 1985-07-26 | 1985-07-26 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1985114835U JPH058531Y2 (enrdf_load_stackoverflow) | 1985-07-26 | 1985-07-26 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6224371U JPS6224371U (enrdf_load_stackoverflow) | 1987-02-14 |
JPH058531Y2 true JPH058531Y2 (enrdf_load_stackoverflow) | 1993-03-03 |
Family
ID=30997934
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1985114835U Expired - Lifetime JPH058531Y2 (enrdf_load_stackoverflow) | 1985-07-26 | 1985-07-26 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH058531Y2 (enrdf_load_stackoverflow) |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61176456U (enrdf_load_stackoverflow) * | 1985-04-24 | 1986-11-04 |
-
1985
- 1985-07-26 JP JP1985114835U patent/JPH058531Y2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPS6224371U (enrdf_load_stackoverflow) | 1987-02-14 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR101860659B1 (ko) | 프로브 핀, 및, 이것을 이용한 전자 디바이스 | |
EP0164672A2 (en) | A multiple mode buckling beam probe assembly | |
WO2007094237A1 (ja) | 導電性接触子および導電性接触子ユニット | |
WO2013145521A1 (ja) | 電線対基板コネクタ | |
JPH058531Y2 (enrdf_load_stackoverflow) | ||
US2543036A (en) | Electrical contact spring assembly | |
US4768972A (en) | Test clip for PLCC | |
US3392366A (en) | Multiconnector having an insulating base and plural resilient contact strips | |
US4812745A (en) | Probe for testing electronic components | |
JPH075419Y2 (ja) | 表面抵抗測定装置 | |
JPH0785444B2 (ja) | 抵抗路又は摺動子通路のための摺動子 | |
JPH0658955A (ja) | 4端子抵抗測定用プローブヘッド | |
JPH0745021Y2 (ja) | プローブの接点構造 | |
JPH04144083A (ja) | 電気的接触子およびicソケット | |
JPH0519823Y2 (enrdf_load_stackoverflow) | ||
JPS6225433A (ja) | 半導体素子特性測定装置 | |
JP2967509B2 (ja) | フラットケーブル接続用コネクタ | |
JP3663539B2 (ja) | 検出スイッチ | |
JPH0141237Y2 (enrdf_load_stackoverflow) | ||
JPH057525Y2 (enrdf_load_stackoverflow) | ||
JPH0745020Y2 (ja) | プローブの接点構造 | |
JPS5987605U (ja) | 接触式プロ−ブ装置 | |
JPS605479Y2 (ja) | スイッチ装置 | |
JPH0742140Y2 (ja) | プローブのアース構造 | |
JPS6220964Y2 (enrdf_load_stackoverflow) |