JPH0582477B2 - - Google Patents
Info
- Publication number
- JPH0582477B2 JPH0582477B2 JP5457485A JP5457485A JPH0582477B2 JP H0582477 B2 JPH0582477 B2 JP H0582477B2 JP 5457485 A JP5457485 A JP 5457485A JP 5457485 A JP5457485 A JP 5457485A JP H0582477 B2 JPH0582477 B2 JP H0582477B2
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- raw material
- thin film
- pulsed light
- material gas
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000010409 thin film Substances 0.000 claims description 31
- 238000006243 chemical reaction Methods 0.000 claims description 28
- 239000002994 raw material Substances 0.000 claims description 28
- 239000000758 substrate Substances 0.000 claims description 25
- 238000000034 method Methods 0.000 claims description 10
- 239000012808 vapor phase Substances 0.000 claims description 8
- 239000010408 film Substances 0.000 claims description 4
- 230000015572 biosynthetic process Effects 0.000 claims description 3
- 230000003213 activating effect Effects 0.000 claims 1
- 239000007789 gas Substances 0.000 description 29
- 230000003287 optical effect Effects 0.000 description 8
- 230000000694 effects Effects 0.000 description 5
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 4
- 229910052721 tungsten Inorganic materials 0.000 description 4
- 239000010937 tungsten Substances 0.000 description 4
- 230000031700 light absorption Effects 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 125000004435 hydrogen atom Chemical class [H]* 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 230000036632 reaction speed Effects 0.000 description 1
- 238000004611 spectroscopical analysis Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
- NXHILIPIEUBEPD-UHFFFAOYSA-H tungsten hexafluoride Chemical compound F[W](F)(F)(F)(F)F NXHILIPIEUBEPD-UHFFFAOYSA-H 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
Landscapes
- Chemical Vapour Deposition (AREA)
- Electrodes Of Semiconductors (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5457485A JPS61217575A (ja) | 1985-03-20 | 1985-03-20 | 光化学気相薄膜形成装置及び方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5457485A JPS61217575A (ja) | 1985-03-20 | 1985-03-20 | 光化学気相薄膜形成装置及び方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS61217575A JPS61217575A (ja) | 1986-09-27 |
JPH0582477B2 true JPH0582477B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1993-11-19 |
Family
ID=12974461
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5457485A Granted JPS61217575A (ja) | 1985-03-20 | 1985-03-20 | 光化学気相薄膜形成装置及び方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61217575A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2544156B2 (ja) * | 1987-09-22 | 1996-10-16 | 財団法人半導体研究振興会 | 金属・半導体接触の形成方法 |
-
1985
- 1985-03-20 JP JP5457485A patent/JPS61217575A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS61217575A (ja) | 1986-09-27 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US4678536A (en) | Method of photochemical surface treatment | |
JPH0582477B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | ||
Taguchi et al. | Enhancement of film deposition rate due to the production of Si2H6 as an intermediate in the photodecomposition of SiH4 using an ArF excimer laser | |
Yabushita et al. | Hydrogen peroxide formation following the vacuum ultraviolet photodissociation of water ice films at 90K | |
US5112647A (en) | Apparatus for the preparation of a functional deposited film by means of photochemical vapor deposition process | |
JPS62183512A (ja) | レ−ザ誘起薄膜堆積装置 | |
JPH07105350B2 (ja) | 光反応装置 | |
EP0216933B1 (en) | Method for fabricating an insulating oxide layer on semiconductor substrate surface | |
JP4094127B2 (ja) | アモルファスシリコン製造装置 | |
JP2608456B2 (ja) | 薄膜形成装置 | |
JPS63317675A (ja) | プラズマ気相成長装置 | |
Uesugi et al. | Direct projection patterning of aluminum on the SiO2 surface by using synchrotron radiation induced growth initiation of thermal chemical vapor deposition | |
Xin et al. | State resolved probe of an energetic surface reaction: Phosgene on silver | |
JPS61143585A (ja) | 薄膜形成方法 | |
JPS6345377A (ja) | 成膜装置 | |
Seki et al. | Laser-induced chemical vapor deposition of aluminum from trimethylaluminum: wavelength and temperature dependence | |
JPH0257145B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | ||
JPH0459769B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | ||
JP4291193B2 (ja) | 光処理装置及び処理装置 | |
Yoshimoto et al. | In-situ reflection high-energy electron diffraction observation of laser-triggered GaP growth in chemical beam epitaxy | |
JPS6156278A (ja) | 成膜方法 | |
JPH0563552B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | ||
JPS6156279A (ja) | 成膜方法 | |
JP2008144277A (ja) | アモルファスシリコン薄膜製造方法 | |
JPS61288431A (ja) | 絶縁層の製造方法 |