JPH0574119U - Electric wire terminal processing condition inspection device - Google Patents

Electric wire terminal processing condition inspection device

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Publication number
JPH0574119U
JPH0574119U JP2180892U JP2180892U JPH0574119U JP H0574119 U JPH0574119 U JP H0574119U JP 2180892 U JP2180892 U JP 2180892U JP 2180892 U JP2180892 U JP 2180892U JP H0574119 U JPH0574119 U JP H0574119U
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JP
Japan
Prior art keywords
core wire
state
wire
electric wire
predetermined value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2180892U
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Japanese (ja)
Other versions
JP2532025Y2 (en
Inventor
隆弘 浅野
正弘 池知
伸雄 佐藤
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Shinmaywa Industries Ltd
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Shinmaywa Industries Ltd
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Priority to JP1992021808U priority Critical patent/JP2532025Y2/en
Publication of JPH0574119U publication Critical patent/JPH0574119U/en
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Publication of JP2532025Y2 publication Critical patent/JP2532025Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Manufacturing Of Electrical Connectors (AREA)
  • Removal Of Insulation Or Armoring From Wires Or Cables (AREA)
  • Processing Of Terminals (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

(57)【要約】 【目的】 電線端末2における裸出芯線部10の広がり
を検査して、端子圧着部からの素線のはみ出しによる不
良製品の発生を未然に防止する電線の端末処理状態検査
装置を提供する。 【構成】 電線端末2の移送経路上に、裸出芯線部10
の基端部10aおよび先端部10bの通過の時間に対応
した長さの通過信号をそれぞれ与える光ファイバセンサ
12a,12b,12cを設ける。基端部通過信号と先
端部通過信号の長さを比較して、その差が所定値より大
きいとき芯線状態不良と判定し、所定値以下のとき芯線
状態良と判定する処理回路を設ける。
(57) [Abstract] [Purpose] Inspecting the spread of the bare core wire portion 10 in the wire end 2 to prevent the occurrence of defective products due to the protruding wire from the terminal crimping part. Provide a device. [Structure] The bare core wire portion 10 is provided on the transfer path of the electric wire terminal 2.
The optical fiber sensors 12a, 12b, 12c are provided to provide passage signals of lengths corresponding to the passage time of the base end portion 10a and the tip end portion 10b. A processing circuit is provided for comparing the lengths of the base end passage signal and the tip end passage signal, determining that the core wire state is defective when the difference is greater than a predetermined value, and determining the core wire state when the difference is less than the predetermined value.

Description

【考案の詳細な説明】[Detailed description of the device]

【0001】[0001]

【産業上の利用分野】[Industrial applications]

本考案は、被覆剥取処理を施して芯線部を裸出させた電線端末の芯線部の状態 を検査する電線の端末処理状態検査装置に関するものである。 The present invention relates to an electric wire end treatment state inspection device for inspecting the state of a core wire portion of an electric wire end in which a core wire portion is exposed by performing a coating stripping process.

【0002】[0002]

【従来の技術】[Prior Art]

電線端末の被覆を剥取る処理工程と、その剥取部分に端子を圧着する処理工程 とからなる端子圧着処理を連続かつ自動的に行うように構成された自動端子圧着 装置がある。そして自動端子圧着装置の処理経路(電線端末の移送経路)上に被 覆剥取状態検査装置が配置され、電線の被覆剥取処理が良好に行われたかどうか を検査し、被覆剥取不良による不良製品の発生を未然に防止していた。 There is an automatic terminal crimping device that is configured to continuously and automatically perform a terminal crimping process including a process of stripping the coating of the wire end and a process of crimping the terminal to the stripped portion. An uncovered stripping condition inspection device is placed on the processing path of the automatic terminal crimping device (wire terminal transfer path) to inspect whether or not the wire stripping process has been successfully performed, and it is determined that the stripping failure has occurred. The occurrence of defective products was prevented in advance.

【0003】[0003]

【考案が解決しようとする課題】[Problems to be solved by the device]

しかしながら、電線端末の被覆剥取処理が確実に行われていた場合であっても 、被覆剥取処理によって裸出された芯線部が、被覆剥取処理時や移送時における 他の部材との接触等によってバラケが生じ、先端部側が広がっている場合がある 。 However, even when the coating stripping treatment is performed on the wire end securely, the bare core part of the coating stripping treatment may come into contact with other members during the coating stripping treatment or transfer. There is a case where the tip end side is widened due to the occurrence of disparity due to such factors.

【0004】 この裸出芯線部のバラケ状態で、端子圧着処理工程により端子の圧着が行われ た場合に、芯線部を構成する素線の一部が端子の圧着部からはみ出すことがあり 、製品の品質の低下を招くおそれがあった。When the terminals are crimped in the terminal crimping process with the bare core wire being in a loose state, a part of the wires forming the core wire may protrude from the crimping part of the terminal. There was a risk that the quality of the product would deteriorate.

【0005】 そこで、本考案は上記問題点に鑑み、裸出芯線部の広がりを検知して素線のは み出しによる不良製品の発生を未然に防止し、製品の品質向上を図る電線の端末 処理状態検査装置を提供することを目的とする。Therefore, in view of the above problems, the present invention detects the spread of the bare core wire portion to prevent the occurrence of defective products due to the sticking out of the wires, thereby improving the quality of the product. An object is to provide a processing state inspection device.

【0006】[0006]

【課題を解決するための手段】[Means for Solving the Problems]

上記目的を達成するための技術的手段は、被覆剥取処理により裸出された電線 端末の芯線部の状態を端子圧着処理工程前に検査する電線の端末処理状態検査装 置であって、電線端末の移送経路上に配置されて、電線端末の裸出芯線部の残留 被覆部側基端部および他端側先端部の通過をそれぞれ非接触で検知し、該通過の 時間に対応した長さの第1および第2の通過信号をそれぞれ与える第1および第 2の検知手段と、前記第1および第2の通過信号の長さを比較して、その差が所 定値より大きいとき芯線状態不良と判定し、所定値以下のとき芯線状態良と判定 する判定手段とを備えてなる点にある。 The technical means for achieving the above object is an electric wire end treatment condition inspection device for inspecting the condition of the core wire portion of the electric wire end exposed by the stripping treatment before the terminal crimping process. It is placed on the transfer path of the terminal and detects the non-contact detection of the passing of the residual coating part side base end part and the other end side tip part of the bare core wire part of the wire end, and the length corresponding to the passing time. Of the first and second passing signals, respectively, and the lengths of the first and second passing signals are compared, and when the difference is larger than a predetermined value, the core wire state is defective. And a determination unit that determines that the core wire state is good when the value is equal to or less than a predetermined value.

【0007】[0007]

【作用】[Action]

本考案によれば、被覆剥取処理により裸出された電線端末の芯線部が、移送経 路上において、第1および第2の検知手段によって検知され、その裸出芯線部の 残留被覆部側基端部および他端側先端部の通過の時間に対応した長さの第1およ び第2の通過信号が導出される。 According to the present invention, the core wire portion of the wire end barely exposed by the coating stripping process is detected by the first and second detecting means on the transfer path, and the bare coating core side group of the bare core wire portion is detected. First and second passing signals having a length corresponding to the passing time of the end portion and the tip portion on the other end side are derived.

【0008】 この際、裸出芯線部の先端部側が広がっていない場合には、第1および第2の 通過信号の長さの差は小さく、逆に、裸出芯線部の先端部側が広がっている場合 には、第1および第2の通過信号の長さの差は大きくなる。At this time, when the tip side of the bare core wire portion is not widened, the difference in length between the first and second passing signals is small, and conversely, the tip side of the bare core wire portion is widened. If so, the difference between the lengths of the first and second passing signals becomes large.

【0009】 そして、判定手段は、第1および第2の通過信号の長さを比較して、その差が 所定値より大きいとき芯線状態不良と判定し、所定値以下のとき芯線状態良と判 定する。Then, the judging means compares the lengths of the first and second passing signals, judges that the core wire state is defective when the difference is larger than a predetermined value, and judges that the core wire state is good when the difference is less than the predetermined value. Set.

【0010】 ここに、芯線状態不良の電線が検知でき、不良製品の発生を未然に防止できる 。Here, an electric wire having a defective core wire state can be detected, and a defective product can be prevented from occurring.

【0011】[0011]

【実施例】【Example】

以下、本考案の第1実施例を図面に基づいて説明すると、図1乃至図3におい て、1はセンサ支持ブロックで、自動端子圧着装置の所定位置に配置されており 、電線端末2の移送経路に対応した電線通過路3を備えた側面視コ字状に形成さ れている。 Hereinafter, a first embodiment of the present invention will be described with reference to the drawings. In FIGS. 1 to 3, reference numeral 1 is a sensor support block, which is arranged at a predetermined position of an automatic terminal crimping device and is used for transferring an electric wire terminal 2. It is formed in a U-shape when viewed from the side, with an electric wire passage 3 corresponding to the path.

【0012】 一方、被覆剥取処理が施された電線端末2は、対の搬送爪5a,5bにより根 元を把持されて、図1および図2に示される如く、処理のための移送経路上を矢 印で示す如く右側(上流)から左側(下流)へと移送される。例えば、前述の自 動端子圧着装置であれば、図示の上流側には被覆剥取処理部が存在し、下流側に は端子圧着処理部が存在する。On the other hand, the electric wire terminal 2 that has been subjected to the coating stripping process has its root gripped by the pair of transfer claws 5a and 5b, and as shown in FIG. 1 and FIG. Is transferred from the right side (upstream) to the left side (downstream) as indicated by the arrow. For example, in the case of the above-mentioned automatic terminal crimping apparatus, the coating stripping processing section exists on the upstream side and the terminal crimping processing section exists on the downstream side in the figure.

【0013】 センサ支持ブロック1の電線通過路3をはさんで上下に対向する各支持アーム 7a,7bには、移送経路に沿って移送される電線端末2の残留被覆部9、裸出 芯線部10の残留被覆部9側基端部10aおよび他端側先端部10bの通過位置 に対応してそれぞれ透過式の光ファイバセンサ12a,12b,12cが備えら れており、非接触で検知する第1,第2,第3の検知手段を構成している。Each of the support arms 7a and 7b, which vertically oppose each other across the wire passage 3 of the sensor support block 1, has a residual coating portion 9 of the wire terminal 2 transferred along the transfer path and a bare core wire portion. The transmission type optical fiber sensors 12a, 12b, 12c corresponding to the passage positions of the residual coating portion 9 side proximal end portion 10a and the other end side distal end portion 10b of 10 are provided, respectively. It constitutes first, second and third detection means.

【0014】 各光ファイバセンサ12a,12b,12cは投光器、受光器の対からなる光 電スイッチ13a,13b,13cと、各光電スイッチ13a,13b,13c の検出ヘッド部にそれぞれ連結された光ファイバ14a,14b,14cとから なり、それぞれの対の光ファイバ14a,14b,14cが電線通過路3をはさ んで、光軸が一致するように対向して配置されている。そして光軸が一致してい るため、各光電スイッチ13a,13b,13cの投光器から出た光16a,1 6b,16cは、対の各光ファイバ14a,14b,14cを通じて常時は受光 器側に案内されるが、図3に示される如く、残留被覆部9および裸出芯線部10 がこの光16a,16b,16cを遮光すると、各光電スイッチ13a,13b ,13cの受光器は検知信号を生じる。これらの検知信号は光16a,16b, 16cが遮光されている間継続するため、その長さはそれぞれ、残留被覆部9, 裸出芯線部10の基端部10aおよび先端部10bの通過の時間と対応したもの となる。Each of the optical fiber sensors 12a, 12b, 12c is an optical fiber connected to a photoelectric switch 13a, 13b, 13c composed of a pair of a light emitter and a light receiver, and a detection head portion of each photoelectric switch 13a, 13b, 13c. 14a, 14b, and 14c, and the optical fibers 14a, 14b, and 14c of each pair are arranged so as to face each other with the optical axes aligned with each other with the electric wire passage 3 interposed therebetween. Since the optical axes coincide with each other, the lights 16a, 16b, 16c emitted from the projectors of the photoelectric switches 13a, 13b, 13c are always guided to the receiver side through the pair of optical fibers 14a, 14b, 14c. However, as shown in FIG. 3, when the residual coating portion 9 and the bare core wire portion 10 shield this light 16a, 16b, 16c, the photodetectors of the photoelectric switches 13a, 13b, 13c generate detection signals. Since these detection signals continue while the lights 16a, 16b, 16c are shielded, their lengths are the time taken for the residual coating portion 9 and the proximal end portion 10a and the distal end portion 10b of the bare core wire portion 10 to pass, respectively. It corresponds to.

【0015】 このようにして各光ファイバセンサ12a,12b,12cから導出された検 知信号は、それぞれ残留被覆部通過信号、裸出芯線部10の基端部通過信号およ び先端部通過信号として後述の処理回路に与えられ、被覆剥取良否および芯線状 態良否の判定のための利用に供される。The detection signals derived from the respective optical fiber sensors 12a, 12b, 12c in this way are the residual coating portion passing signal, the base end portion passing signal of the bare core wire portion 10 and the tip end passing signal, respectively. Is provided to the processing circuit described later, and is used to judge whether the coating is peeled off or not and whether the core wire is in good condition or not.

【0016】 図6はそのような処理回路を示す概略ブロック図であり、その各部の波形を図 7の波形図に示す。処理回路は、図7(A)に示すクロックパルスを発生するク ロック発生器18と、各光ファイバセンサ12a,12b,12cからの残留被 覆部通過信号、裸出芯線部10の基端部通過信号および先端部通過信号を上記ク ロックとそれぞれAND処理するANDゲート19a,19b,19cと、各A NDゲート19a,19b,19cの出力をそれぞれカウントするカウンタ20 a,20b,20cと、それぞれ対となるカウンタ20a,20b,およびカウ ンタ20b,20cの各出力カウント値をそれぞれ比較する比較演算回路21a ,21bとから構成されており、被覆剥取の良否および芯線状態の良否を判定す る判定手段として機能する。FIG. 6 is a schematic block diagram showing such a processing circuit, and the waveform of each part thereof is shown in the waveform diagram of FIG. The processing circuit includes a clock generator 18 for generating the clock pulse shown in FIG. 7A, a residual covered portion passing signal from each of the optical fiber sensors 12a, 12b, 12c, and a base end portion of the bare core wire portion 10. AND gates 19a, 19b and 19c for ANDing the pass signal and the tip pass signal with the clock, and counters 20a, 20b and 20c for counting the outputs of the AND gates 19a, 19b and 19c, respectively. It is composed of counters 20a, 20b forming a pair, and comparison operation circuits 21a, 21b for comparing the output count values of the counters 20b, 20c, respectively, and determines the quality of stripping and the quality of the core wire. It functions as a judgment means.

【0017】 まず第一に、被覆剥取が良好な場合の動作について述べれば、この場合光ファ イバセンサ12aから導出される残留被覆部通過信号は図7(B)に示す如くな り、光ファイバセンサ12bから導出される裸出芯線部10の基端部通過信号は 図7(D)実線に示す如くなる。尚通過信号の時間幅は図2に示す残留被覆部9 および裸出芯線部10の基端部10aの横幅に対応するものである。First, to describe the operation in the case where the stripping of the coating is good, in this case, the residual coating portion passing signal derived from the optical fiber sensor 12a is as shown in FIG. The base end passing signal of the bare core wire portion 10 derived from the sensor 12b is as shown by the solid line in FIG. 7 (D). The time width of the passing signal corresponds to the width of the residual coating portion 9 and the base end portion 10a of the bare core wire portion 10 shown in FIG.

【0018】 ANDゲート19aは、図7(A)のクロック信号と図7(B)の残留被覆部 通過信号とを受けてAND処理し、図7(C)に示す信号を出力する。またAN Dゲート19bは、図7(A)のクロック信号と図7(D)実線の基端部通過信 号とを受けてAND処理し、図7(E)実線に示す信号を出力する。これらAN Dゲート19a,19bの出力信号に含まれているパルス数は、それぞれの通過 信号の時間幅に比例している。The AND gate 19a receives the clock signal of FIG. 7 (A) and the residual cover portion passing signal of FIG. 7 (B), performs an AND process, and outputs a signal shown in FIG. 7 (C). Further, the AND gate 19b receives the clock signal of FIG. 7A and the base end passing signal of the solid line of FIG. 7D, performs AND processing, and outputs the signal shown by the solid line of FIG. 7E. The number of pulses included in the output signals of the AND gates 19a and 19b is proportional to the time width of each passing signal.

【0019】 これらのパルス数はカウンタ20a,20bにおいてそれぞれカウントされ、 そのカウント値は比較演算回路21aに与えられる。比較演算回路21aは両カ ウント値を比較し、その差が所定値よりも大きいかどうかを判定する。差が所定 値よりも大きいときは、残留被覆部9と裸出芯線部10とでその横幅に十分な差 があり、被覆剥取が良好に行われたということがわかる。従ってこの場合は、比 較演算回路21aから剥取良を示す判定信号が出力される。一方、差が所定値以 下のときは、残留被覆部9と裸出芯線部10とでその横幅に十分な差がなく、被 覆剥取が良好に行われていないということがわかる。従ってこの場合は、比較演 算回路21aから剥取不良を示す判定信号が出力される。例えば上記所定値とし て最も簡単にゼロを選択すれば、両カウント値が等しいか否かにより剥取の良否 を判定することになる。もちろん、電線の形状に応じて、適当な所定値を予め設 定するようにしてもよい。The numbers of these pulses are respectively counted by the counters 20a and 20b, and the count values are given to the comparison operation circuit 21a. The comparison operation circuit 21a compares the two count values and determines whether the difference is larger than a predetermined value. When the difference is larger than the predetermined value, there is a sufficient difference in the lateral width between the residual coating portion 9 and the bare core wire portion 10, and it can be seen that the coating was peeled off satisfactorily. Therefore, in this case, the comparison calculation circuit 21a outputs a determination signal indicating that the peeling is good. On the other hand, when the difference is less than the predetermined value, there is no sufficient difference in the lateral width between the residual coating portion 9 and the bare core wire portion 10, and it can be seen that the stripping is not performed well. Therefore, in this case, the comparison calculation circuit 21a outputs the determination signal indicating the peeling failure. For example, if zero is most easily selected as the above-mentioned predetermined value, the quality of peeling will be determined by whether or not both count values are equal. Of course, an appropriate predetermined value may be preset according to the shape of the electric wire.

【0020】 いま、所定値としてゼロを選択していると仮定すれば、図7(C)および図7 (E)実線に示すANDゲート19a,19bの出力パルス数はそれぞれ16お よび8であるので、比較演算回路21aは16−8>0つまり16>8と判定し 、剥取良を示す判定信号を出力する。Assuming that zero is selected as the predetermined value, the numbers of output pulses of the AND gates 19a and 19b shown by the solid lines in FIGS. 7C and 7E are 16 and 8, respectively. Therefore, the comparison operation circuit 21a determines that 16-8> 0, that is, 16> 8, and outputs a determination signal indicating good stripping.

【0021】 次に、被覆剥取が不良な場合について述べる。この場合は裸出すべき芯線部1 0に被覆がついたままになっており、光ファイバセンサ12bから導出される裸 出芯線部10の基端部通過信号は、図7(D)2点鎖線に示す如く、図7(B) の残留被覆部通過信号と同様の時間幅のものとなる。従って図7(E)2点鎖線 に示すように、ANDゲート19bの出力パルス数(=16)は、図7(C)に 示すANDゲートー19aの出力パルス数(=16)と等しくなる。そして比較 演算回路21aは16−16=0つまり16=16と判定し、剥取不良を示す判 定信号を出力する。Next, a case where the coating stripping is defective will be described. In this case, the core wire portion 10 to be exposed barely remains covered, and the signal passing through the base end portion of the bare core wire portion 10 derived from the optical fiber sensor 12b is the two-dot chain line in FIG. As shown in FIG. 7, the time width is similar to that of the residual coating portion passing signal in FIG. 7 (B). Therefore, as shown by the two-dot chain line in FIG. 7 (E), the number of output pulses (= 16) of the AND gate 19b becomes equal to the number of output pulses (= 16) of the AND gate 19a shown in FIG. 7 (C). Then, the comparison operation circuit 21a determines that 16-16 = 0, that is, 16 = 16, and outputs a determination signal indicating a peeling defect.

【0022】 さらに、裸出芯線部10の芯線状態が良好な場合の動作について述べれば、こ の場合光ファイバセンサ12bから導出される裸出芯線部10の基端部通過信号 は図7(D)実線に示す如くなり、光ファイバセンサ12cから導出される裸出 芯線部10の先端部通過信号は図7(F)に示す如くなる。両通過信号の時間幅 は図2に示す裸出芯線部10の基端部10aおよび先端部10bの横幅に対応す るものである。Further, to describe the operation when the bare core wire portion 10 is in a good core state, in this case, the signal passing through the base end portion of the bare core wire portion 10 derived from the optical fiber sensor 12b is as shown in FIG. ) As shown by the solid line, the signal passing through the tip of the bare core wire portion 10 derived from the optical fiber sensor 12c is as shown in FIG. 7 (F). The time width of both passing signals corresponds to the lateral width of the base end portion 10a and the tip end portion 10b of the bare core wire portion 10 shown in FIG.

【0023】 ANDゲート19bは、図7(A)のクロック信号と図7(D)実線の基端部 通過信号とを受けてAND処理し、図7(E)実線に示す信号を出力する。また ANDゲート19cは、図7(A)のクロック信号と図7(F)の先端部通過信 号とを受けてAND処理し、図7(G)に示す信号を出力する。これらANDゲ ート19b,19cの出力信号に含まれているパルス数は、それぞれの通過信号 の時間幅に比例している。The AND gate 19b receives the clock signal of FIG. 7A and the signal passing through the base end portion of the solid line of FIG. 7D, performs an AND process, and outputs the signal shown by the solid line of FIG. 7E. Further, the AND gate 19c receives the clock signal of FIG. 7A and the leading edge passing signal of FIG. 7F, performs an AND process, and outputs a signal shown in FIG. 7G. The number of pulses included in the output signals of the AND gates 19b and 19c is proportional to the time width of each passing signal.

【0024】 これらのパルス数はカウンタ20b,20cにおいてそれぞれカウントされ、 そのカウント値は比較演算回路21bに与えられる。比較演算回路21bは両カ ウント値を比較し、その差が所定値よりも大きいかどうかを判別する。差が所定 値以下のときは、裸出芯線部10の基端部10aと先端部10bとでその横幅に 十分な差がなく、ここに裸出芯線部10にバラケによる広がりが生じておらず、 芯線状態が良好であるということがわかる。従ってこの場合は、比較演算回路2 1bから芯線状態良を示す判定信号が出力される。一方、差が所定値よりも大き いときは、基端部10aと先端部10bとでその横幅に十分な差があり、ここに 裸出芯線部10にバラケによる広がりが生じており、芯線状態が不良であるとい うことがわかる。従ってこの場合は、比較演算回路21bから芯線状態不良を示 す判定信号が出力される。例えば上記所定値として2を選択すれば、両カウント 値が2より大きいか小さいかにより芯線状態の良否を判定することになる。もち ろん、電線の形状に応じて、適当な所定値を予め設定するようにしてもよい。The numbers of these pulses are respectively counted by the counters 20b and 20c, and the count value is given to the comparison operation circuit 21b. The comparison calculation circuit 21b compares the two count values and determines whether the difference is larger than a predetermined value. When the difference is less than the predetermined value, there is not a sufficient difference in the lateral width between the base end portion 10a and the tip end portion 10b of the bare core wire portion 10, and the bare core wire portion 10 does not spread due to variation. It can be seen that the core wire condition is good. Therefore, in this case, the comparison calculation circuit 21b outputs a determination signal indicating that the core state is good. On the other hand, when the difference is larger than the predetermined value, there is a sufficient difference in the lateral width between the base end portion 10a and the tip end portion 10b, and the bare core wire portion 10 has a spread due to variation, and the core wire state It can be seen that is defective. Therefore, in this case, the comparison calculation circuit 21b outputs a determination signal indicating a core wire state defect. For example, if 2 is selected as the above-mentioned predetermined value, the quality of the core wire state is determined depending on whether both count values are larger or smaller than 2. Of course, an appropriate predetermined value may be preset depending on the shape of the electric wire.

【0025】 いま、所定値として2を選択していると仮定すれば、図7(E)実線および図 7(G)に示すANDゲート19b,19cの出力パルス数はそれぞれ8である ので、比較演算回路21bは8−8=0≦2と判定し、芯線状態良を示す判定信 号を出力する。Assuming that 2 is selected as the predetermined value, the number of output pulses of the AND gates 19b and 19c shown in the solid line of FIG. 7E and FIG. The arithmetic circuit 21b determines that 8-8 = 0.ltoreq.2 and outputs a determination signal indicating good core condition.

【0026】 次に、図4に示される如く、裸出芯線部10がバラケ状態となっている芯線状 態が不良な場合について述べる。この場合、基端部10a側は残留被覆部9によ り広がりが規制されているため、光ファイバセンサ12bから導出される基端部 通過信号は図7(D)実線に示す如く前述同様であり、一方、先端部10bは広 がっているため、光ファイバセンサ12cから導出される先端部通過信号は図7 (H)に示す如く、時間幅が広くなる。従って図7(E)実線に示すANDゲー ト19bの出力パルス数(=8)と、図7(I)に示すANDゲート19cの出 力パルス数(=14)との差が大きくなる。ここに比較演算回路21bは14− 8=6>2と判定し、芯線状態不良を示す判定信号を出力する。Next, as shown in FIG. 4, a case where the bare core wire portion 10 is in a discontinuous state and the core wire state is defective will be described. In this case, since the spread on the base end portion 10a side is restricted by the residual coating portion 9, the base end portion passing signal derived from the optical fiber sensor 12b is the same as described above as shown by the solid line in FIG. 7 (D). On the other hand, since the front end portion 10b is widened, the front end portion passing signal derived from the optical fiber sensor 12c has a wide time width as shown in FIG. 7 (H). Therefore, the difference between the output pulse number (= 8) of the AND gate 19b shown by the solid line in FIG. 7 (E) and the output pulse number (= 14) of the AND gate 19c shown in FIG. 7 (I) becomes large. Here, the comparison operation circuit 21b determines that 14-8 = 6> 2, and outputs a determination signal indicating a defective core state.

【0027】 なお、図5に示される如く、裸出芯線部10の一部が広がった状態にあっては 、光ファイバセンサ12cから導出される先端部通過信号は図7(J)に示す如 く、広がった一部のみを検知し、時間幅が短いものとなる。従って図7(E)実 線に示すANDゲート19bの出力パルス数(=8)と、図7(K)に示すAN Dゲート19cの出力パルス数(=1)との差が大きくなり、比較演算回路21 bは8−1=7>2と判定し、芯線状態不良を示す判定信号を出力する。Note that, as shown in FIG. 5, when a part of the bare core wire portion 10 is expanded, the tip end passing signal derived from the optical fiber sensor 12c is as shown in FIG. 7 (J). However, the time width is short because only part of the spread is detected. Therefore, the difference between the output pulse number (= 8) of the AND gate 19b shown by the solid line in FIG. 7E and the output pulse number (= 1) of the AND gate 19c shown in FIG. The arithmetic circuit 21b determines that 8-1 = 7> 2, and outputs a determination signal indicating a defective core state.

【0028】 以上のようにして得られた被覆剥取の良否を示す判定信号や、芯線状態の良否 を示す判定信号は、所定の制御を行うために利用される。例えば、剥取不良もし くは芯線状態不良のいずれかの不良を示す判定信号に応答して、自動端子圧着装 置の作動を非常停止して不良電線を手動除去可能とすると共に、警報器を作動さ せてオペレータに剥取不良や芯線状態不良の不良状態を通報するようにしてもよ い。また例えば、剥取不良もしくは芯線状態不良のいずれかの不良を示す判定信 号に応答して不良電線が自動的に選別除去されるよう、自動端子圧着装置を構成 することも可能である。The determination signal indicating the quality of the stripping and the determination signal indicating the quality of the core wire obtained as described above are used for performing predetermined control. For example, in response to a judgment signal indicating a defect such as a stripping defect or a core wire condition defect, the operation of the automatic terminal crimping device is stopped in an emergency to allow the defective wire to be manually removed, and an alarm is activated. It may be activated to notify the operator of a defective state such as peeling failure or core wire state failure. Further, for example, it is possible to configure the automatic terminal crimping device so that the defective electric wire is automatically selected and removed in response to the judgment signal indicating any one of the defective peeling and the defective core state.

【0029】 図8および図9は、判定手段としての処理回路の別の実施例を示す概略ブロッ ク図である。これらの処理回路は、図6の処理回路が残留被覆部9、裸出芯線部 10のそれぞれの幅をディジタル値(パルス数)に変換したのに対し、これらの 幅を積分回路23a,23b,23cを通じてアナログ値(電圧値)に変換する ものである。FIG. 8 and FIG. 9 are schematic block diagrams showing another embodiment of the processing circuit as the judging means. These processing circuits convert the width of each of the residual coating portion 9 and the bare core wire portion 10 into a digital value (the number of pulses) in the processing circuit of FIG. 6, whereas these widths are integrated circuits 23a, 23b, 23c to convert into an analog value (voltage value).

【0030】 図8の実施例において、積分回路23a,23b,23cは光ファイバセンサ 12a,12b,12cから図7(B),(D),(F)の通過信号をそれぞれ 受けてこれを積分し、各通過信号の時間幅に対応した大きさの電圧値に変換する 。これらの電圧値は、電圧比較器24a,24bに与えられる。一方の電圧比較 器24aはこれらの電圧値を比較し、その差が所定値よりも大きいときは剥取良 を示す判定信号を出力し、所定値以下のときは剥取不良を示す判定信号を出力し 、他方の電圧比較器24bはこれらの電圧値を比較し、その差が所定値以下のと きは芯線状態良を示す判定信号を出力し、所定値よりも大きいときは芯線状態不 良を示す判定信号を出力する。この比較は前述した比較演算回路21a,21b における比較と同様であり、その説明は省略する。In the embodiment of FIG. 8, the integrating circuits 23a, 23b and 23c receive the passing signals of the optical fiber sensors 12a, 12b and 12c from FIGS. 7B, 7D and 7F respectively and integrate them. Then, it is converted into a voltage value of a magnitude corresponding to the time width of each passing signal. These voltage values are given to the voltage comparators 24a and 24b. One of the voltage comparators 24a compares these voltage values, outputs a judgment signal indicating good peeling when the difference is larger than a predetermined value, and outputs a judgment signal indicating defective peeling when the difference is less than the predetermined value. The other voltage comparator 24b compares these voltage values, and outputs a determination signal indicating that the core wire condition is good when the difference is less than or equal to a predetermined value, and when the difference is greater than the predetermined value, the core wire condition is not good. Is output. This comparison is similar to the comparison in the comparison operation circuits 21a and 21b described above, and the description thereof is omitted.

【0031】 図9の実施例は、図8の実施例と類似しているが、積分回路23a,23b, 23cの出力電圧値をそれぞれA/D変換器25a,25b,25cを通じてデ ィジタル値に変換した後にこれらを比較するものであるという点において、図8 の実施例と異なっている。A/D変換器25a,25b,25cの出力ディジタ ル値は、図7(B),(D),(F)に示す光ファイバセンサ12a,12b, 12cからの各通過信号の時間幅とそれぞれ対応したものとなり、比較演算回路 26a,26bはこれらのディジタル値について前述と同様の比較動作を行い、 被覆剥取の良否および芯線状態の良否を示す判定信号を出力する。The embodiment of FIG. 9 is similar to the embodiment of FIG. 8, but the output voltage values of the integrating circuits 23a, 23b, 23c are converted into digital values via the A / D converters 25a, 25b, 25c, respectively. It differs from the embodiment of FIG. 8 in that these are compared after conversion. The output digital values of the A / D converters 25a, 25b, 25c are the time widths of the passing signals from the optical fiber sensors 12a, 12b, 12c shown in FIGS. 7 (B), (D), and (F), respectively. Correspondingly, the comparison operation circuits 26a and 26b perform the same comparison operation as described above with respect to these digital values, and output a determination signal indicating whether the coating stripping is good or the core wire state is good.

【0032】 上記各実施例において、3組の光ファイバセンサ12a,12b,12cを用 いて、電線端末2の被覆剥取の良否および芯線状態の良否を同じ通過位置で検知 する構造としているため、装置全体のコンパクト化が図れる。In each of the above-described embodiments, three sets of optical fiber sensors 12a, 12b, 12c are used to detect the quality of stripping of the wire end 2 and the quality of the core wire state at the same passing position. The entire device can be made compact.

【0033】 しかしながら、被覆剥取の良否を判定する検知装置と芯線状態の良否を判定す る検知装置とを別構造とし、電線端末2の移送経路に沿って順に配設する構造で あってもよい。However, even if the detection device for determining the quality of stripping and the detection device for determining the quality of the core wire have different structures and are arranged in sequence along the transfer path of the wire terminal 2. Good.

【0034】 また、上記各実施例において、通過信号を導出するための検知手段として透過 式の光ファイバセンサ12a,12b,12cを用いた構造を示しているが、残 留被覆部9,裸出芯線10の通過を非接触で検知し、該通過の時間に対応した長 さの通過信号を出力し得る検知手段であればよく、例えば反射形の光電スイッチ であってもよい。Further, in each of the above-mentioned embodiments, the structure using the transmission type optical fiber sensors 12a, 12b, 12c as the detecting means for deriving the passing signal is shown. Any detection means capable of detecting the passage of the core wire 10 in a non-contact manner and outputting a passage signal of a length corresponding to the passage time, for example, a reflection type photoelectric switch may be used.

【0035】[0035]

【考案の効果】[Effect of the device]

以上のように、本考案の電線の端末処理状態検査装置によれば、電線端末の移 送経路上に配置されて、電線端末の裸出芯線部の残留被覆部側基端部および他端 側先端部の通過をそれぞれ非接触で検知し、該通過の時間に対応した長さの第1 および第2の通過信号をそれぞれ与える第1および第2の検知手段と、前記第1 および第2の通過信号の長さを比較して、その差が所定値より大きいとき芯線状 態不良と判定し、所定値以下のとき芯線状態良と判定する判定手段とを備えてな るものであり、裸出芯線部が広がった芯線状態不良の電線が予め検知でき、端子 圧着部からの素線のはみ出しによる不良製品の発生を未然に防止でき、ここに製 品の品質向上を図ることができる。 As described above, according to the wire end treatment condition inspection device of the present invention, the wire end is disposed on the transfer path of the wire end, and the bare end of the wire end is covered with the residual coating portion on the base end side and the other end side. First and second detection means for respectively detecting the passage of the tip end without contact and providing first and second passage signals of lengths corresponding to the passage time, and the first and second detectors. The length of the passing signal is compared, and if the difference is larger than a predetermined value, it is judged that the core wire state is defective, and if it is less than the predetermined value, it is judged that the core wire state is good. It is possible to detect in advance the defective core wire in which the core wire has spread, and it is possible to prevent the occurrence of defective products due to the wires protruding from the terminal crimping part, which can improve the quality of the product.

【図面の簡単な説明】[Brief description of drawings]

【図1】本考案の一実施例を示す要部斜視図である。FIG. 1 is a perspective view of an essential part showing an embodiment of the present invention.

【図2】同概略平面説明図である。FIG. 2 is a schematic plan view of the same.

【図3】同概略側面説明図である。FIG. 3 is a schematic side view illustrating the same.

【図4】芯線状態不良の電線端末平面図である。FIG. 4 is a plan view of an electric wire terminal in a defective core wire state.

【図5】芯線状態不良の電線端末平面図である。FIG. 5 is a plan view of an electric wire terminal with a poor core wire state.

【図6】処理回路を示す概略ブロック図である。FIG. 6 is a schematic block diagram showing a processing circuit.

【図7】図6各部の波形図である。7 is a waveform diagram of each part in FIG.

【図8】処理回路の別の実施例を示す概略ブロック図で
ある。
FIG. 8 is a schematic block diagram showing another embodiment of the processing circuit.

【図9】処理回路の別の実施例を示す概略ブロック図で
ある。
FIG. 9 is a schematic block diagram showing another embodiment of the processing circuit.

【符号の説明】[Explanation of symbols]

2 電線端末 9 残留被覆部 10 裸出芯線部 10a 基端部 10b 先端部 12a,12b,12c 光ファイバセンサ 18 クロック発生器 19a,19b,19c ANDゲート 20a,20b,20c カウンタ 21a,20b 比較演算回路 2 wire end 9 residual coating part 10 bare core wire part 10a base end part 10b tip part 12a, 12b, 12c optical fiber sensor 18 clock generator 19a, 19b, 19c AND gate 20a, 20b, 20c counter 21a, 20b comparative operation circuit

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 【請求項1】 被覆剥取処理により裸出された電線端末
の芯線部の状態を端子圧着処理工程前に検査する電線の
端末処理状態検査装置であって、 電線端末の移送経路上に配置されて、電線端末の裸出芯
線部の残留被覆部側基端部および他端側先端部の通過を
それぞれ非接触で検知し、該通過の時間に対応した長さ
の第1および第2の通過信号をそれぞれ与える第1およ
び第2の検知手段と、 前記第1および第2の通過信号の長さを比較して、その
差が所定値より大きいとき芯線状態不良と判定し、所定
値以下のとき芯線状態良と判定する判定手段とを備えて
なることを特徴とする電線の端末処理状態検査装置。
1. An end treatment state inspection device for an electric wire, which inspects a state of a core wire portion of an electric wire end exposed by a stripping process before a terminal crimping process, which is arranged on a transfer route of the electric wire end. The non-contact detection of the passage of the residual coating portion side proximal end portion and the other end side distal end portion of the bare core wire portion of the wire end, and the first and second passages of lengths corresponding to the passage time. The lengths of the first and second passing signals are compared with the first and second detecting means for giving a signal, respectively, and when the difference is larger than a predetermined value, it is determined that the core wire state is defective, and the core wire state is below the predetermined value. An electric wire end treatment state inspection device, comprising: a determining unit that determines that the core wire state is good.
JP1992021808U 1992-03-10 1992-03-10 Inspection equipment for wire termination Expired - Lifetime JP2532025Y2 (en)

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Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1992021808U JP2532025Y2 (en) 1992-03-10 1992-03-10 Inspection equipment for wire termination

Publications (2)

Publication Number Publication Date
JPH0574119U true JPH0574119U (en) 1993-10-08
JP2532025Y2 JP2532025Y2 (en) 1997-04-09

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ID=12065359

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
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Publication number Priority date Publication date Assignee Title
JP2008234986A (en) * 2007-03-20 2008-10-02 Furukawa Electric Co Ltd:The Terminal deformation detecting method and terminal deformation detecting device
JP2012256615A (en) * 2012-09-21 2012-12-27 Shin Meiwa Ind Co Ltd Electric wire processing device
JP2015172522A (en) * 2014-03-12 2015-10-01 ユニオンマシナリ株式会社 Method for inspecting attached state of wire seal
JP2022084201A (en) * 2020-11-26 2022-06-07 新明和工業株式会社 Conductor inspection device

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JPS431088Y1 (en) * 1964-04-15 1968-01-19
JPS57198850A (en) * 1981-06-01 1982-12-06 Hitachi Ltd Monitoring method for state or exfoliation of insulation coating of electric wire
JPS5895911A (en) * 1981-12-01 1983-06-07 新明和工業株式会社 Device for treating end of wire
JPS59123413A (en) * 1982-12-28 1984-07-17 日本端子株式会社 Improper detector for strip line
JPS61154412A (en) * 1984-12-27 1986-07-14 新明和工業株式会社 Terminal treated state inspector for wire
JPH0291411U (en) * 1988-12-27 1990-07-19

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS431088Y1 (en) * 1964-04-15 1968-01-19
JPS57198850A (en) * 1981-06-01 1982-12-06 Hitachi Ltd Monitoring method for state or exfoliation of insulation coating of electric wire
JPS5895911A (en) * 1981-12-01 1983-06-07 新明和工業株式会社 Device for treating end of wire
JPS59123413A (en) * 1982-12-28 1984-07-17 日本端子株式会社 Improper detector for strip line
JPS61154412A (en) * 1984-12-27 1986-07-14 新明和工業株式会社 Terminal treated state inspector for wire
JPH0291411U (en) * 1988-12-27 1990-07-19

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008234986A (en) * 2007-03-20 2008-10-02 Furukawa Electric Co Ltd:The Terminal deformation detecting method and terminal deformation detecting device
JP4691058B2 (en) * 2007-03-20 2011-06-01 古河電気工業株式会社 Terminal deformation detection method and terminal deformation detection device
JP2012256615A (en) * 2012-09-21 2012-12-27 Shin Meiwa Ind Co Ltd Electric wire processing device
JP2015172522A (en) * 2014-03-12 2015-10-01 ユニオンマシナリ株式会社 Method for inspecting attached state of wire seal
JP2022084201A (en) * 2020-11-26 2022-06-07 新明和工業株式会社 Conductor inspection device

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